{"id":"https://openalex.org/W2073528512","doi":"https://doi.org/10.1063/1.2798586","title":"Annealing properties of vacancy-type defects in ion-implanted GaN studied by monoenergetic positron beams","display_name":"Annealing properties of vacancy-type defects in ion-implanted GaN studied by monoenergetic positron beams","publication_year":2007,"publication_date":"2007-10-15","ids":{"openalex":"https://openalex.org/W2073528512","doi":"https://doi.org/10.1063/1.2798586","mag":"2073528512"},"language":"en","primary_location":{"id":"doi:10.1063/1.2798586","doi":"https://doi.org/10.1063/1.2798586","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.2798586","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068817003","display_name":"Akira Uedono","orcid":"https://orcid.org/0000-0001-6224-4869","observed_orcids":["https://orcid.org/0000-0001-6224-4869"]},"institutions":[{"id":"https://openalex.org/I146399215","display_name":"University of Tsukuba","ror":"https://ror.org/02956yf07","country_code":"JP","type":"education","lineage":["https://openalex.org/I146399215"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"A. Uedono","raw_affiliation_strings":["University of Tsukuba Institute of Applied Physics, , Tsukuba, Ibaraki, 305-8573, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Tsukuba Institute of Applied Physics, , Tsukuba, Ibaraki, 305-8573, Japan","institution_ids":["https://openalex.org/I146399215"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038703811","display_name":"Kenichi Ito","orcid":"https://orcid.org/0000-0002-6112-5128","observed_orcids":["https://orcid.org/0000-0002-6112-5128"]},"institutions":[{"id":"https://openalex.org/I146399215","display_name":"University of Tsukuba","ror":"https://ror.org/02956yf07","country_code":"JP","type":"education","lineage":["https://openalex.org/I146399215"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Ito","raw_affiliation_strings":["University of Tsukuba Institute of Applied Physics, , Tsukuba, Ibaraki, 305-8573, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Tsukuba Institute of Applied Physics, , Tsukuba, Ibaraki, 305-8573, Japan","institution_ids":["https://openalex.org/I146399215"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080368072","display_name":"H. Nakamori","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I146399215","display_name":"University of Tsukuba","ror":"https://ror.org/02956yf07","country_code":"JP","type":"education","lineage":["https://openalex.org/I146399215"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Nakamori","raw_affiliation_strings":["University of Tsukuba Institute of Applied Physics, , Tsukuba, Ibaraki, 305-8573, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Tsukuba Institute of Applied Physics, , Tsukuba, Ibaraki, 305-8573, Japan","institution_ids":["https://openalex.org/I146399215"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040860926","display_name":"Kazuteru Mori","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I146399215","display_name":"University of Tsukuba","ror":"https://ror.org/02956yf07","country_code":"JP","type":"education","lineage":["https://openalex.org/I146399215"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Mori","raw_affiliation_strings":["University of Tsukuba Institute of Applied Physics, , Tsukuba, Ibaraki, 305-8573, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Tsukuba Institute of Applied Physics, , Tsukuba, Ibaraki, 305-8573, Japan","institution_ids":["https://openalex.org/I146399215"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103219317","display_name":"Yoshitaka Nakano","orcid":"https://orcid.org/0000-0002-7259-3509","observed_orcids":["https://orcid.org/0000-0002-7259-3509"]},"institutions":[{"id":"https://openalex.org/I4210165351","display_name":"Toyota Central Research and Development Laboratories (Japan)","ror":"https://ror.org/05mjgqe69","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125472","https://openalex.org/I4210165351"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Nakano","raw_affiliation_strings":["Toyota Central Research and Development Laboratories, Inc. , Nagakute, Aichi 480-1192, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Toyota Central Research and Development Laboratories, Inc. , Nagakute, Aichi 480-1192, Japan","institution_ids":["https://openalex.org/I4210165351"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049989419","display_name":"Tetsu Kachi","orcid":"https://orcid.org/0000-0002-4300-5720","observed_orcids":["https://orcid.org/0000-0002-4300-5720"]},"institutions":[{"id":"https://openalex.org/I4210165351","display_name":"Toyota Central Research and Development Laboratories (Japan)","ror":"https://ror.org/05mjgqe69","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125472","https://openalex.org/I4210165351"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Kachi","raw_affiliation_strings":["Toyota Central Research and Development Laboratories, Inc. , Nagakute, Aichi 480-1192, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Toyota Central Research and Development Laboratories, Inc. , Nagakute, Aichi 480-1192, Japan","institution_ids":["https://openalex.org/I4210165351"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042319192","display_name":"Shoji Ishibashi","orcid":"https://orcid.org/0000-0002-4896-3530","observed_orcids":["https://orcid.org/0000-0002-4896-3530"]},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Ishibashi","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology Research Institute for Computational Sciences, , Tsukuba, Ibaraki, 305-8568, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology Research Institute for Computational Sciences, , Tsukuba, Ibaraki, 305-8568, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113526173","display_name":"Toshiyuki Ohdaira","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Ohdaira","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology Research Institute of Instrumentation Frontier, , Tsukuba, Ibaraki, 305-8568, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology Research Institute of Instrumentation Frontier, , Tsukuba, Ibaraki, 305-8568, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013573921","display_name":"Ryoichi Suzuki","orcid":"https://orcid.org/0000-0002-9957-1027","observed_orcids":["https://orcid.org/0000-0002-9957-1027"]},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"R. Suzuki","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology Research Institute of Instrumentation Frontier, , Tsukuba, Ibaraki, 305-8568, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology Research Institute of Instrumentation Frontier, , Tsukuba, Ibaraki, 305-8568, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3500,"currency":"USD","value_usd":3500},"apc_paid":null,"fwci":6.2228,"has_fulltext":false,"cited_by_count":45,"citation_normalized_percentile":{"value":0.96285368,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"102","issue":"8","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12579","display_name":"Muon and positron interactions and applications","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12579","display_name":"Muon and positron interactions and applications","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.003599999938160181,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/gan","display_name":"GaN","score":0.7749999761581421},{"id":"https://openalex.org/keywords/ion-implantation","display_name":"ion implantation","score":0.828000009059906},{"id":"https://openalex.org/keywords/vacancy-defects","display_name":"vacancy defects","score":0.8230000138282776},{"id":"https://openalex.org/keywords/defect-annealing","display_name":"defect annealing","score":0.7570000290870667},{"id":"https://openalex.org/keywords/positron-annihilation","display_name":"positron annihilation","score":0.8080000281333923},{"id":"https://openalex.org/keywords/doppler-broadening","display_name":"Doppler broadening","score":0.9049999713897705},{"id":"https://openalex.org/keywords/positron-lifetime","display_name":"positron lifetime","score":0.9490000009536743},{"id":"https://openalex.org/keywords/ga-vacancies","display_name":"Ga vacancies","score":0.7570000290870667},{"id":"https://openalex.org/keywords/divacancies","display_name":"divacancies","score":0.9589999914169312},{"id":"https://openalex.org/keywords/silicon-ion-implantation","display_name":"silicon ion implantation","score":0.7429999709129333},{"id":"https://openalex.org/keywords/defect-agglomeration","display_name":"defect agglomeration","score":0.9139999747276306},{"id":"https://openalex.org/keywords/metal-organic-chemical-vapor-deposition","display_name":"metalorganic chemical vapor deposition","score":0.7609999775886536},{"id":"https://openalex.org/keywords/first-principles-calculations","display_name":"first-principles calculations","score":0.8579999804496765}],"concepts":[{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.7855225205421448},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7222188711166382},{"id":"https://openalex.org/C41823505","wikidata":"https://www.wikidata.org/wiki/Q1436752","display_name":"Ion implantation","level":3,"score":0.6983027458190918},{"id":"https://openalex.org/C114221277","wikidata":"https://www.wikidata.org/wiki/Q899743","display_name":"Vacancy defect","level":2,"score":0.6868978142738342},{"id":"https://openalex.org/C62103226","wikidata":"https://www.wikidata.org/wiki/Q902598","display_name":"Doppler broadening","level":3,"score":0.6614350080490112},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.5770247578620911},{"id":"https://openalex.org/C202100949","wikidata":"https://www.wikidata.org/wiki/Q3229","display_name":"Positron","level":3,"score":0.5682658553123474},{"id":"https://openalex.org/C2778711141","wikidata":"https://www.wikidata.org/wiki/Q3966593","display_name":"Positron annihilation spectroscopy","level":5,"score":0.559721827507019},{"id":"https://openalex.org/C57410435","wikidata":"https://www.wikidata.org/wiki/Q505668","display_name":"Chemical vapor deposition","level":2,"score":0.5318417549133301},{"id":"https://openalex.org/C71987851","wikidata":"https://www.wikidata.org/wiki/Q7216430","display_name":"Impurity","level":2,"score":0.47047072649002075},{"id":"https://openalex.org/C164675345","wikidata":"https://www.wikidata.org/wiki/Q898226","display_name":"Crystallographic defect","level":2,"score":0.4492807984352112},{"id":"https://openalex.org/C4839761","wikidata":"https://www.wikidata.org/wiki/Q212111","display_name":"Spectral line","level":2,"score":0.40419965982437134},{"id":"https://openalex.org/C2985595821","wikidata":"https://www.wikidata.org/wiki/Q1206668","display_name":"Positron annihilation","level":4,"score":0.39769649505615234},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.37403035163879395},{"id":"https://openalex.org/C41999313","wikidata":"https://www.wikidata.org/wiki/Q489328","display_name":"Molecular physics","level":1,"score":0.3325667381286621},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.25203561782836914},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.17448872327804565},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.16903892159461975},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.13070964813232422},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.12032374739646912},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.06698054075241089},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.2798586","doi":"https://doi.org/10.1063/1.2798586","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.2798586","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1577528903","https://openalex.org/W1966682948","https://openalex.org/W1970127494","https://openalex.org/W1973421563","https://openalex.org/W1973801701","https://openalex.org/W1981368803","https://openalex.org/W1985060678","https://openalex.org/W1991386679","https://openalex.org/W2000579845","https://openalex.org/W2005535893","https://openalex.org/W2009401286","https://openalex.org/W2012425365","https://openalex.org/W2015189864","https://openalex.org/W2020969161","https://openalex.org/W2025224618","https://openalex.org/W2030182207","https://openalex.org/W2032843489","https://openalex.org/W2039091554","https://openalex.org/W2041145557","https://openalex.org/W2042671299","https://openalex.org/W2044349116","https://openalex.org/W2047471022","https://openalex.org/W2056037332","https://openalex.org/W2066573810","https://openalex.org/W2073539140","https://openalex.org/W2077212289","https://openalex.org/W2087116976","https://openalex.org/W2115719017","https://openalex.org/W2164964510","https://openalex.org/W2479585044","https://openalex.org/W2987637782"],"related_works":["https://openalex.org/W7081920767","https://openalex.org/W7204065092","https://openalex.org/W4392285950","https://openalex.org/W2603619624","https://openalex.org/W4324328486","https://openalex.org/W2020969161","https://openalex.org/W2349517814","https://openalex.org/W2947931940","https://openalex.org/W4280638354","https://openalex.org/W1971481300"],"abstract_inverted_index":{"Defects":[0],"in":[1,113],"ion-implanted":[2],"GaN":[3,33],"and":[4,22,31,79,108,118,122],"their":[5],"annealing":[6,75,96],"properties":[7,97],"were":[8,26,44,100],"studied":[9],"by":[10,35,52],"using":[11],"monoenergetic":[12],"positron":[13,24],"beams.":[14],"Doppler":[15],"broadening":[16],"spectra":[17],"of":[18,71,91,98,115],"the":[19,23,36,53,58,80,85,88,92,105],"annihilation":[20],"radiation":[21],"lifetimes":[25],"measured":[27],"for":[28],"Si+,":[29],"O+,":[30],"Be+-implanted":[32],"grown":[34],"metal-organic":[37],"chemical":[38],"vapor":[39],"deposition":[40],"technique.":[41],"First-principles":[42],"calculations":[43],"also":[45],"used":[46],"to":[47,102],"identify":[48],"defect":[49,60,81,116],"species":[50,61],"introduced":[51],"implantation.":[54],"For":[55],"as-implanted":[56],"samples,":[57],"major":[59],"was":[62],"identified":[63],"as":[64],"Ga":[65],"vacancies":[66],"and/or":[67],"divacancies.":[68],"An":[69],"agglomeration":[70],"defects":[72,93,99],"starts":[73],"after":[74],"at":[76],"400":[77],"\u00b0C,":[78],"profile":[82],"shifted":[83],"toward":[84],"surface":[86],"with":[87],"open":[89],"volumes":[90],"increasing.":[94],"The":[95],"found":[101],"depend":[103],"on":[104],"ion":[106],"species,":[107],"they":[109],"are":[110],"discussed":[111],"here":[112],"terms":[114],"concentrations":[117],"interactions":[119],"between":[120],"impurities":[121],"defects.":[123]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":4},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2026-10-01T08:54:57.152042","created_date":"2016-06-24T00:00:00"}
