{"id":"https://openalex.org/W2072833320","doi":"https://doi.org/10.2514/6.2002-2221","title":"Advanced Optical Diagnostics for HF Laser Development","display_name":"Advanced Optical Diagnostics for HF Laser Development","publication_year":2002,"publication_date":"2002-05-20","ids":{"openalex":"https://openalex.org/W2072833320","doi":"https://doi.org/10.2514/6.2002-2221","mag":"2072833320"},"language":"en","primary_location":{"id":"doi:10.2514/6.2002-2221","doi":"https://doi.org/10.2514/6.2002-2221","is_oa":false,"landing_page_url":"https://doi.org/10.2514/6.2002-2221","pdf_url":null,"source":{"id":"https://openalex.org/S4306499064","display_name":"AIAA Plasmadynamics and Lasers Conference","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"33rd Plasmadynamics and Lasers Conference","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085979748","display_name":"Wilson T. Rawlins","orcid":"https://orcid.org/0000-0002-7806-2995","observed_orcids":["https://orcid.org/0000-0002-7806-2995"]},"institutions":[{"id":"https://openalex.org/I4210113003","display_name":"Physical Sciences (United States)","ror":"https://ror.org/021qvjc46","country_code":"US","type":"company","lineage":["https://openalex.org/I4210113003"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"W. Rawlins","raw_affiliation_strings":["Physical Sciences Inc"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physical Sciences Inc","institution_ids":["https://openalex.org/I4210113003"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071341147","display_name":"David B. Oakes","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210113003","display_name":"Physical Sciences (United States)","ror":"https://ror.org/021qvjc46","country_code":"US","type":"company","lineage":["https://openalex.org/I4210113003"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Oakes","raw_affiliation_strings":["Physical Sciences Inc"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physical Sciences Inc","institution_ids":["https://openalex.org/I4210113003"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108718554","display_name":"Phillip A. Mulhall","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210113003","display_name":"Physical Sciences (United States)","ror":"https://ror.org/021qvjc46","country_code":"US","type":"company","lineage":["https://openalex.org/I4210113003"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. Mulhall","raw_affiliation_strings":["Physical Sciences Inc"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physical Sciences Inc","institution_ids":["https://openalex.org/I4210113003"]}]},{"author_position":"middle","author":{"id":null,"display_name":"S. Davis","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210113003","display_name":"Physical Sciences (United States)","ror":"https://ror.org/021qvjc46","country_code":"US","type":"company","lineage":["https://openalex.org/I4210113003"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Davis","raw_affiliation_strings":["Physical Sciences Inc"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Physical Sciences Inc","institution_ids":["https://openalex.org/I4210113003"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075807012","display_name":"Roland H. Wright","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]},{"id":"https://openalex.org/I2801919071","display_name":"University of Illinois System","ror":"https://ror.org/05e94g991","country_code":"US","type":"education","lineage":["https://openalex.org/I2801919071"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Wright","raw_affiliation_strings":["University of Illinois"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Illinois","institution_ids":["https://openalex.org/I157725225","https://openalex.org/I2801919071"]}]},{"author_position":"middle","author":{"id":null,"display_name":"D. Carroll","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]},{"id":"https://openalex.org/I2801919071","display_name":"University of Illinois System","ror":"https://ror.org/05e94g991","country_code":"US","type":"education","lineage":["https://openalex.org/I2801919071"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Carroll","raw_affiliation_strings":["University of Illinois"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Illinois","institution_ids":["https://openalex.org/I157725225","https://openalex.org/I2801919071"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038900659","display_name":"Lee H. Sentman","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]},{"id":"https://openalex.org/I2801919071","display_name":"University of Illinois System","ror":"https://ror.org/05e94g991","country_code":"US","type":"education","lineage":["https://openalex.org/I2801919071"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"L. Sentman","raw_affiliation_strings":["University of Illinois"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Illinois","institution_ids":["https://openalex.org/I157725225","https://openalex.org/I2801919071"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3754,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.51598657,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12760","display_name":"Laser Design and Applications","score":0.4846000075340271,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12760","display_name":"Laser Design and Applications","score":0.4846000075340271,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10781","display_name":"Low-Pressure Plasma Processing and Diagnostics","score":0.350600004196167,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11111","display_name":"Spectroscopy and Laser Applications","score":0.13600000739097595,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hydrogen-fluoride-chemical-laser","display_name":"hydrogen fluoride chemical laser","score":0.718999981880188},{"id":"https://openalex.org/keywords/hyperspectral-imaging","display_name":"hyperspectral imaging","score":0.9819999933242798},{"id":"https://openalex.org/keywords/fabry-perot-interferometer","display_name":"Fabry-Perot interferometer","score":0.9919999837875366},{"id":"https://openalex.org/keywords/species-concentration-measurement","display_name":"species concentration measurement","score":0.777999997138977},{"id":"https://openalex.org/keywords/optical-gain","display_name":"optical gain","score":0.8899999856948853},{"id":"https://openalex.org/keywords/beam-profile","display_name":"beam profile","score":0.8149999976158142},{"id":"https://openalex.org/keywords/reacting-flow","display_name":"reacting flow","score":0.8870000243186951},{"id":"https://openalex.org/keywords/laser-development","display_name":"laser development","score":0.4880000054836273}],"concepts":[{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.5688207149505615},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38295871019363403},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.38192126154899597},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3740912973880768},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.37022918462753296},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20667630434036255}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.2514/6.2002-2221","doi":"https://doi.org/10.2514/6.2002-2221","is_oa":false,"landing_page_url":"https://doi.org/10.2514/6.2002-2221","pdf_url":null,"source":{"id":"https://openalex.org/S4306499064","display_name":"AIAA Plasmadynamics and Lasers Conference","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"33rd Plasmadynamics and Lasers Conference","raw_type":"proceedings-article"},{"id":"pmh:ADA405308","doi":null,"is_oa":false,"landing_page_url":"http://oai.dtic.mil/oai/oai?&verb=getRecord&metadataPrefix=html&identifier=ADA405308","pdf_url":null,"source":{"id":"https://openalex.org/S4406923043","display_name":"Defense Technical Information Center (DTIC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"DTIC AND NTIS","raw_type":"Text"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320338294","display_name":"Air Force Research Laboratory","ror":"https://ror.org/02e2egq70"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W234813878","https://openalex.org/W306720839","https://openalex.org/W1562648202","https://openalex.org/W2017169071","https://openalex.org/W2054834459","https://openalex.org/W3010866734"],"related_works":["https://openalex.org/W2105642610","https://openalex.org/W2070651473","https://openalex.org/W2008114556","https://openalex.org/W7046772685","https://openalex.org/W2313338864","https://openalex.org/W12173857","https://openalex.org/W1558855383","https://openalex.org/W2026824802","https://openalex.org/W3017840425","https://openalex.org/W3023586142"],"abstract_inverted_index":{"We":[0,57],"present":[1],"results":[2],"from":[3],"a":[4,8,33,50,65],"study":[5],"that":[6],"used":[7],"non-intrusive":[9],"diagnostic":[10],"for":[11,21],"mixing,":[12],"species":[13],"concentration,":[14],"optical":[15],"gain,":[16],"and":[17,46],"spatial":[18],"beam":[19],"profile":[20],"HF":[22,67],"chemical":[23,68],"lasers.":[24],"The":[25,38],"instrument":[26],"is":[27,44],"based":[28],"on":[29],"hyperspectral":[30],"imaging":[31],"using":[32],"low":[34],"order":[35],"Fabry-Perot":[36],"interferometer.":[37],"basic":[39],"theory":[40],"behind":[41],"this":[42,62],"technology":[43],"described":[45],"several":[47],"applications":[48],"to":[49,64],"chemically":[51],"reacting":[52],"flow":[53],"field":[54],"are":[55],"presented.":[56],"also":[58],"discuss":[59],"application":[60],"of":[61],"device":[63],"subsonic":[66],"laser.":[69]},"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2026-10-05T09:50:58.205359","created_date":"2016-06-24T00:00:00"}