{"id":"https://openalex.org/W2071956454","doi":"https://doi.org/10.1117/12.506305","title":"Interferometric measurement of the vibrational characteristics of light-weight mirrors","display_name":"Interferometric measurement of the vibrational characteristics of light-weight mirrors","publication_year":2004,"publication_date":"2004-01-05","ids":{"openalex":"https://openalex.org/W2071956454","doi":"https://doi.org/10.1117/12.506305","mag":"2071956454"},"language":"en","primary_location":{"id":"doi:10.1117/12.506305","doi":"https://doi.org/10.1117/12.506305","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.506305","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033276871","display_name":"James E. Millerd","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210163383","display_name":"4D Technology (United States)","ror":"https://ror.org/00b2x9z76","country_code":"US","type":"company","lineage":["https://openalex.org/I4210163383"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James E. Millerd","raw_affiliation_strings":["4D Technology Corp. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"4D Technology Corp. (United States)","institution_ids":["https://openalex.org/I4210163383"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040363283","display_name":"Mark Schmucker","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210163383","display_name":"4D Technology (United States)","ror":"https://ror.org/00b2x9z76","country_code":"US","type":"company","lineage":["https://openalex.org/I4210163383"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mark Schmucker","raw_affiliation_strings":["4D Technology Corp. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"4D Technology Corp. (United States)","institution_ids":["https://openalex.org/I4210163383"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111463920","display_name":"John B. Hayes","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210163383","display_name":"4D Technology (United States)","ror":"https://ror.org/00b2x9z76","country_code":"US","type":"company","lineage":["https://openalex.org/I4210163383"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John B. Hayes","raw_affiliation_strings":["4D Technology Corp. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"4D Technology Corp. (United States)","institution_ids":["https://openalex.org/I4210163383"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017874598","display_name":"Ron Eng","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294504835","display_name":"Marshall Space Flight Center","ror":"https://ror.org/02epydz83","country_code":"US","type":"facility","lineage":["https://openalex.org/I1294504835","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ron Eng","raw_affiliation_strings":["NASA Marshall Space Flight Ctr. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NASA Marshall Space Flight Ctr. (United States)","institution_ids":["https://openalex.org/I1294504835"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010065581","display_name":"John Lassiter","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294504835","display_name":"Marshall Space Flight Center","ror":"https://ror.org/02epydz83","country_code":"US","type":"facility","lineage":["https://openalex.org/I1294504835","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John Lassiter","raw_affiliation_strings":["NASA Marshall Space Flight Ctr. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NASA Marshall Space Flight Ctr. (United States)","institution_ids":["https://openalex.org/I1294504835"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112333522","display_name":"H. Philip Stahl","orcid":"https://orcid.org/0000-0002-2336-7054","observed_orcids":["https://orcid.org/0000-0002-2336-7054"]},"institutions":[{"id":"https://openalex.org/I1294504835","display_name":"Marshall Space Flight Center","ror":"https://ror.org/02epydz83","country_code":"US","type":"facility","lineage":["https://openalex.org/I1294504835","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H. Philip Stahl","raw_affiliation_strings":["NASA Marshall Space Flight Ctr. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NASA Marshall Space Flight Ctr. (United States)","institution_ids":["https://openalex.org/I1294504835"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Ted Rogers","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I82495205","display_name":"University of Alabama in Huntsville","ror":"https://ror.org/02zsxwr40","country_code":"US","type":"education","lineage":["https://openalex.org/I82495205"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ted Rogers","raw_affiliation_strings":["Univ. of Alabama/Huntsville (United States)","University Of Alabama, Huntsville (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. of Alabama/Huntsville (United States)","institution_ids":["https://openalex.org/I82495205"]},{"raw_affiliation_string":"University Of Alabama, Huntsville (United States)","institution_ids":["https://openalex.org/I82495205"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033445892","display_name":"James B. Hadaway","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I82495205","display_name":"University of Alabama in Huntsville","ror":"https://ror.org/02zsxwr40","country_code":"US","type":"education","lineage":["https://openalex.org/I82495205"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James B. Hadaway","raw_affiliation_strings":["Univ. of Alabama/Huntsville (United States)","University Of Alabama, Huntsville (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. of Alabama/Huntsville (United States)","institution_ids":["https://openalex.org/I82495205"]},{"raw_affiliation_string":"University Of Alabama, Huntsville (United States)","institution_ids":["https://openalex.org/I82495205"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012781269","display_name":"Joseph M. Geary","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I82495205","display_name":"University of Alabama in Huntsville","ror":"https://ror.org/02zsxwr40","country_code":"US","type":"education","lineage":["https://openalex.org/I82495205"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Joseph Geary","raw_affiliation_strings":["Univ. of Alabama/Huntsville (United States)","University Of Alabama, Huntsville (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. of Alabama/Huntsville (United States)","institution_ids":["https://openalex.org/I82495205"]},{"raw_affiliation_string":"University Of Alabama, Huntsville (United States)","institution_ids":["https://openalex.org/I82495205"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7474,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.66729078,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"5180","issue":null,"first_page":"211","last_page":"211"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.5727999806404114,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.5727999806404114,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11484","display_name":"Adaptive optics and wavefront sensing","score":0.3449999988079071,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.01720000058412552,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/lightweight-mirrors","display_name":"lightweight mirrors","score":0.7250000238418579},{"id":"https://openalex.org/keywords/mirror-vibration","display_name":"mirror vibration","score":0.6209999918937683},{"id":"https://openalex.org/keywords/resonant-response","display_name":"resonant response","score":0.9070000052452087},{"id":"https://openalex.org/keywords/transient-response","display_name":"transient response","score":0.9990000128746033}],"concepts":[{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.8860464096069336},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.7075333595275879},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.6525383591651917},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6171783208847046},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.554900586605072},{"id":"https://openalex.org/C23576306","wikidata":"https://www.wikidata.org/wiki/Q17004698","display_name":"Astronomical interferometer","level":3,"score":0.49504581093788147},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.45245441794395447},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.27056777477264404},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.506305","doi":"https://doi.org/10.1117/12.506305","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.506305","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1485468957","https://openalex.org/W1526888822","https://openalex.org/W2042528460","https://openalex.org/W2057927157","https://openalex.org/W2061023212"],"related_works":["https://openalex.org/W1525771625","https://openalex.org/W2042528460","https://openalex.org/W291193960","https://openalex.org/W2050726970","https://openalex.org/W6992833931","https://openalex.org/W2004587376","https://openalex.org/W2081585959","https://openalex.org/W2999059255","https://openalex.org/W2076824828","https://openalex.org/W1979769218"],"abstract_inverted_index":{"We":[0,39],"present":[1,40],"a":[2,25,71],"technique":[3,23],"to":[4,35],"characterize":[5],"and":[6,13,54,57],"quantitatively":[7],"measure":[8],"the":[9,36,41,44,59,65],"vibrational":[10],"mode":[11],"shapes":[12],"amplitudes":[14],"of":[15,43,49,64],"mirrors":[16],"concurrently":[17],"with":[18],"surface":[19],"figure":[20],"testing.":[21],"The":[22,62],"utilizes":[24],"fast":[26],"interferometer":[27],"that":[28],"does":[29],"not":[30],"introduce":[31],"any":[32],"mass":[33],"loading":[34],"test":[37,74],"structure.":[38],"fundamentals":[42],"technique,":[45],"discuss":[46],"sevral":[47],"modes":[48],"operation,":[50],"such":[51],"as":[52],"resonant":[53],"transient":[55],"response,":[56],"analyze":[58],"operational":[60],"limits.":[61],"performance":[63],"measurement":[66],"system":[67],"is":[68],"characterized":[69],"using":[70],"small":[72],"ambient":[73],"mirror.":[75]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-09-29T14:09:16.559479","created_date":"2016-06-24T00:00:00"}