{"id":"https://openalex.org/W2070516420","doi":"https://doi.org/10.1063/1.326430","title":"Ion-beam deposition of thin films of ferroelectric lead zirconate titanate (PZT)","display_name":"Ion-beam deposition of thin films of ferroelectric lead zirconate titanate (PZT)","publication_year":1979,"publication_date":"1979-06-01","ids":{"openalex":"https://openalex.org/W2070516420","doi":"https://doi.org/10.1063/1.326430","mag":"2070516420"},"language":"en","primary_location":{"id":"doi:10.1063/1.326430","doi":"https://doi.org/10.1063/1.326430","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.326430","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016406096","display_name":"R. N. Castellano","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"R. N. Castellano","raw_affiliation_strings":["Bell Telephone Laboratories, Incorporated, 555 Union Boulevard, Allentown, Pennsylvania 18103"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bell Telephone Laboratories, Incorporated, 555 Union Boulevard, Allentown, Pennsylvania 18103","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024364170","display_name":"L.G. Feinstein","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"L. G. Feinstein","raw_affiliation_strings":["Bell Telephone Laboratories, Incorporated, 555 Union Boulevard, Allentown, Pennsylvania 18103"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bell Telephone Laboratories, Incorporated, 555 Union Boulevard, Allentown, Pennsylvania 18103","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3500,"currency":"USD","value_usd":3500},"apc_paid":null,"fwci":3.1177,"has_fulltext":false,"cited_by_count":194,"citation_normalized_percentile":{"value":0.91631988,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"50","issue":"6","first_page":"4406","last_page":"4411"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.002300000051036477,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10886","display_name":"Multiferroics and related materials","score":0.00139999995008111,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/lead-zirconate-titanate","display_name":"lead zirconate titanate","score":0.9980000257492065},{"id":"https://openalex.org/keywords/ferroelectric-thin-films","display_name":"ferroelectric thin films","score":0.9049999713897705},{"id":"https://openalex.org/keywords/focused-ion-beam-sputtering","display_name":"focused ion beam sputtering","score":0.9049999713897705},{"id":"https://openalex.org/keywords/ion-beam-deposition","display_name":"ion beam deposition","score":0.8960000276565552},{"id":"https://openalex.org/keywords/substrate-temperature","display_name":"substrate temperature","score":0.5590000152587891},{"id":"https://openalex.org/keywords/pyrochlore-phase","display_name":"pyrochlore phase","score":0.8970000147819519},{"id":"https://openalex.org/keywords/perovskite-structure","display_name":"perovskite structure","score":0.9190000295639038},{"id":"https://openalex.org/keywords/post-deposition-annealing","display_name":"post-deposition annealing","score":0.8700000047683716},{"id":"https://openalex.org/keywords/oxygen-loss","display_name":"oxygen loss","score":0.8040000200271606},{"id":"https://openalex.org/keywords/remanent-polarization","display_name":"remanent polarization","score":0.8579999804496765},{"id":"https://openalex.org/keywords/coercive-field","display_name":"coercive field","score":0.9819999933242798},{"id":"https://openalex.org/keywords/dielectric-properties","display_name":"dielectric properties","score":0.675000011920929},{"id":"https://openalex.org/keywords/crystal-structure","display_name":"crystal structure","score":0.5299999713897705}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8432160019874573},{"id":"https://openalex.org/C79090758","wikidata":"https://www.wikidata.org/wiki/Q1045739","display_name":"Ferroelectricity","level":3,"score":0.7833658456802368},{"id":"https://openalex.org/C2781128178","wikidata":"https://www.wikidata.org/wiki/Q883484","display_name":"Lead zirconate titanate","level":4,"score":0.7085903882980347},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.6048186421394348},{"id":"https://openalex.org/C126530901","wikidata":"https://www.wikidata.org/wiki/Q432635","display_name":"Coercivity","level":2,"score":0.5298861265182495},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.48213836550712585},{"id":"https://openalex.org/C155011858","wikidata":"https://www.wikidata.org/wiki/Q3036449","display_name":"Perovskite (structure)","level":2,"score":0.4737975001335144},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.46389320492744446},{"id":"https://openalex.org/C2779000267","wikidata":"https://www.wikidata.org/wiki/Q420124","display_name":"Lead titanate","level":4,"score":0.4495387077331543},{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.432065486907959},{"id":"https://openalex.org/C199289684","wikidata":"https://www.wikidata.org/wiki/Q83353","display_name":"Mineralogy","level":1,"score":0.43074777722358704},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.29982343316078186},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.22237542271614075},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.13962966203689575},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.13882365822792053},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.08215203881263733},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.07594731450080872},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.326430","doi":"https://doi.org/10.1063/1.326430","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.326430","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1969229990","https://openalex.org/W1975000332","https://openalex.org/W1976947213","https://openalex.org/W1991792434","https://openalex.org/W2014324448","https://openalex.org/W2056698102","https://openalex.org/W2061172167","https://openalex.org/W2077949691","https://openalex.org/W2127053898"],"related_works":["https://openalex.org/W2092849791","https://openalex.org/W2112109533","https://openalex.org/W2005820149","https://openalex.org/W1996177862","https://openalex.org/W2121048015","https://openalex.org/W2077707088","https://openalex.org/W2131066876","https://openalex.org/W1984359327","https://openalex.org/W1975168151","https://openalex.org/W2093141792"],"abstract_inverted_index":{"Lead":[0],"zirconate":[1],"titanate":[2],"is":[3,125],"a":[4,22,142,153,161],"solid":[5],"solution":[6],"with":[7,114],"nominal":[8],"composition":[9,62,72],"Pb(ZrxTi1\u2212x)O3.":[10],"Ferroelectric":[11,148],"thin":[12],"films":[13,32,65],"of":[14,47,63,70,73,144,157,164],"this":[15,133],"material":[16,58],"have":[17],"been":[18],"successfully":[19],"deposited":[20,96,120],"by":[21],"focused":[23],"ion-beam":[24],"sputtering":[25],"technique":[26],"in":[27,141],"an":[28],"O2":[29,135],"atmosphere.":[30],"These":[31],"were":[33,59,103,119],"characterized":[34],"according":[35],"to":[36,82],"composition,":[37],"crystal":[38],"structure,":[39],"and":[40,42,54,56,160],"dielectric":[41],"ferroelectric":[43,116],"properties.":[44],"The":[45,61,85],"effects":[46],"deposition":[48,128],"temperature,":[49],"heat":[50],"treatment":[51],"after":[52],"deposition,":[53],"substrate":[55,79,90,98],"target":[57,77],"investigated.":[60],"the":[64,71,74,108,115,126,145],"was":[66,111],"within":[67],"1":[68],"at.%":[69],"multicomponent":[75],"PZT":[76],"for":[78,89,132],"temperatures":[80,91,99],"up":[81],"200":[83,93],"\u00b0C.":[84,94],"Pb":[86],"concentration":[87],"decreased":[88],"above":[92,121],"Films":[95,113],"at":[97],"below":[100],"250":[101],"\u00b0C":[102],"microcrystalline.":[104],"At":[105],"300":[106],"\u00b0C,":[107,123],"pyrochlore":[109],"phase":[110],"obtained.":[112],"perovskite":[117,146],"structure":[118],"400":[122],"which":[124],"lowest":[127],"temperature":[129],"ever":[130],"reported":[131],"phase.":[134],"losses":[136],"during":[137],"postdeposition":[138],"annealing":[139],"resulted":[140],"collapse":[143],"structure.":[147],"hysteresis":[149],"loop":[150],"measurements":[151],"indicated":[152],"saturation":[154],"remanent":[155],"polarization":[156],"4.9":[158],"\u03bcC/cm2":[159],"coercive":[162],"field":[163],"25.2":[165],"kV/cm.":[166]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":5}],"updated_date":"2026-11-08T12:12:28.789561","created_date":"2016-06-24T00:00:00"}