{"id":"https://openalex.org/W2066936736","doi":"https://doi.org/10.1063/1.3117525","title":"Low dielectric loss and non-Debye relaxation of gamma-Y2Si2O7 ceramic at elevated temperature in X-band","display_name":"Low dielectric loss and non-Debye relaxation of gamma-Y2Si2O7 ceramic at elevated temperature in X-band","publication_year":2009,"publication_date":"2009-05-15","ids":{"openalex":"https://openalex.org/W2066936736","doi":"https://doi.org/10.1063/1.3117525","mag":"2066936736"},"language":"en","primary_location":{"id":"doi:10.1063/1.3117525","doi":"https://doi.org/10.1063/1.3117525","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.3117525","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100740018","display_name":"Mao\u2010Sheng Cao","orcid":"https://orcid.org/0000-0001-6810-9422","observed_orcids":["https://orcid.org/0000-0001-6810-9422"]},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mao-Sheng Cao","raw_affiliation_strings":["Beijing Institute of Technology 1 School of Materials Science and Engineering, , Beijing 100081, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Institute of Technology 1 School of Materials Science and Engineering, , Beijing 100081, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033572457","display_name":"Zhi\u2010Ling Hou","orcid":"https://orcid.org/0000-0001-8450-4975","observed_orcids":["https://orcid.org/0000-0001-8450-4975"]},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]},{"id":"https://openalex.org/I75390827","display_name":"Beijing University of Chemical Technology","ror":"https://ror.org/00df5yc52","country_code":"CN","type":"education","lineage":["https://openalex.org/I75390827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhi-Ling Hou","raw_affiliation_strings":["Beijing Institute of Technology 1 School of Materials Science and Engineering, , Beijing 100081, China","Beijing University of Chemical Technology 2 School of Science, , Beijing 100029, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Institute of Technology 1 School of Materials Science and Engineering, , Beijing 100081, China","institution_ids":["https://openalex.org/I125839683"]},{"raw_affiliation_string":"Beijing University of Chemical Technology 2 School of Science, , Beijing 100029, China","institution_ids":["https://openalex.org/I75390827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100753367","display_name":"Jie Yuan","orcid":"https://orcid.org/0009-0005-0799-1630","observed_orcids":["https://orcid.org/0009-0005-0799-1630"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jie Yuan","raw_affiliation_strings":["Central University for Nationalities 3 School of Information Engineering, , Beijing 100081, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Central University for Nationalities 3 School of Information Engineering, , Beijing 100081, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010810222","display_name":"Lan Tian Xiong","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lan-Tian Xiong","raw_affiliation_strings":["Beijing Institute of Technology 1 School of Materials Science and Engineering, , Beijing 100081, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Institute of Technology 1 School of Materials Science and Engineering, , Beijing 100081, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070376523","display_name":"Xiaoling Shi","orcid":"https://orcid.org/0000-0002-9033-544X","observed_orcids":["https://orcid.org/0000-0002-9033-544X"]},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiao-Ling Shi","raw_affiliation_strings":["Beijing Institute of Technology 1 School of Materials Science and Engineering, , Beijing 100081, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Institute of Technology 1 School of Materials Science and Engineering, , Beijing 100081, China","institution_ids":["https://openalex.org/I125839683"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3500,"currency":"USD","value_usd":3500},"apc_paid":null,"fwci":1.4137,"has_fulltext":false,"cited_by_count":55,"citation_normalized_percentile":{"value":0.79385437,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":99},"biblio":{"volume":"105","issue":"10","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13249","display_name":"Dielectric properties of ceramics","score":0.923799991607666,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13249","display_name":"Dielectric properties of ceramics","score":0.923799991607666,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12155","display_name":"Microwave Dielectric Ceramics Synthesis","score":0.05209999904036522,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10132","display_name":"Advanced ceramic materials synthesis","score":0.009100000374019146,"subfield":{"id":"https://openalex.org/subfields/2503","display_name":"Ceramics and Composites"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/y2si2o7","display_name":"Y2Si2O7","score":0.7559999823570251},{"id":"https://openalex.org/keywords/dielectric-loss","display_name":"dielectric loss","score":0.847000002861023},{"id":"https://openalex.org/keywords/non-debye-relaxation","display_name":"non-Debye relaxation","score":0.9959999918937683},{"id":"https://openalex.org/keywords/high-temperature-dielectric-properties","display_name":"high-temperature dielectric properties","score":0.9010000228881836},{"id":"https://openalex.org/keywords/x-band","display_name":"X-band","score":0.7850000262260437},{"id":"https://openalex.org/keywords/ionic-conductivity","display_name":"ionic conductivity","score":0.7329999804496765},{"id":"https://openalex.org/keywords/ceramic-synthesis","display_name":"ceramic synthesis","score":0.4860000014305115}],"concepts":[{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.8248943090438843},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8065691590309143},{"id":"https://openalex.org/C91066073","wikidata":"https://www.wikidata.org/wiki/Q1417868","display_name":"Dielectric loss","level":3,"score":0.7322931289672852},{"id":"https://openalex.org/C2776029896","wikidata":"https://www.wikidata.org/wiki/Q3935810","display_name":"Relaxation (psychology)","level":2,"score":0.6869078874588013},{"id":"https://openalex.org/C134132462","wikidata":"https://www.wikidata.org/wiki/Q45621","display_name":"Ceramic","level":2,"score":0.6664189696311951},{"id":"https://openalex.org/C40899509","wikidata":"https://www.wikidata.org/wiki/Q40603","display_name":"Debye","level":2,"score":0.5927464962005615},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.5317476987838745},{"id":"https://openalex.org/C25376523","wikidata":"https://www.wikidata.org/wiki/Q1151031","display_name":"Debye model","level":2,"score":0.5146006345748901},{"id":"https://openalex.org/C75733527","wikidata":"https://www.wikidata.org/wiki/Q727049","display_name":"Cole\u2013Cole equation","level":3,"score":0.47963958978652954},{"id":"https://openalex.org/C205049153","wikidata":"https://www.wikidata.org/wiki/Q2698605","display_name":"Polarization (electrochemistry)","level":2,"score":0.4278672933578491},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.3220456540584564},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.2971342206001282},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.12077316641807556},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.11880317330360413},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.06486949324607849},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C77805123","wikidata":"https://www.wikidata.org/wiki/Q161272","display_name":"Social psychology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.3117525","doi":"https://doi.org/10.1063/1.3117525","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.3117525","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1481462211","https://openalex.org/W1978634913","https://openalex.org/W1981591888","https://openalex.org/W1982177162","https://openalex.org/W2041718584","https://openalex.org/W2045805594","https://openalex.org/W2048820334","https://openalex.org/W2062453337","https://openalex.org/W2080626658","https://openalex.org/W2107588872","https://openalex.org/W2133169885","https://openalex.org/W2143501464","https://openalex.org/W2145512954","https://openalex.org/W2151377079","https://openalex.org/W2155390414","https://openalex.org/W2156172170","https://openalex.org/W2312945280","https://openalex.org/W2951539343"],"related_works":["https://openalex.org/W2053583249","https://openalex.org/W2889136696","https://openalex.org/W1977774092","https://openalex.org/W4405856128","https://openalex.org/W1640687496","https://openalex.org/W2050515303","https://openalex.org/W1982055844","https://openalex.org/W4206358876","https://openalex.org/W3048611750","https://openalex.org/W2981427786"],"abstract_inverted_index":{"Bulk":[0],"single-phase":[1],"gamma-Y2Si2O7":[2,40],"ceramic":[3],"has":[4],"been":[5],"synthesized":[6],"from":[7,28,50],"a":[8],"mixture":[9],"of":[10,52],"Y2O3":[11],"powder":[12],"and":[13,45],"SiO2":[14],"nanopowder":[15],"at":[16,24,92],"1400":[17,32],"\u00b0C.":[18],"The":[19,36,54],"dielectric":[20,43,82,90],"properties":[21],"are":[22],"reported":[23],"the":[25,61],"temperature":[26,30],"ranging":[27],"room":[29],"to":[31,60],"\u00b0C":[33],"in":[34,77],"X-band.":[35],"results":[37],"show":[38],"that":[39,51,72],"exhibits":[41],"low":[42,81],"loss":[44,83],"non\u2013Debye":[46],"relaxation":[47,56,63],"behavior":[48],"different":[49],"SiO2.":[53],"peculiar":[55],"peak":[57],"is":[58],"attributed":[59],"structural":[62,68],"polarization":[64],"caused":[65],"by":[66],"thermal-excitation":[67],"defects,":[69],"which":[70],"implies":[71],"no":[73],"ionic":[74],"conductance":[75],"exists":[76],"this":[78],"material.":[79],"Such":[80],"will":[84],"draw":[85],"much":[86],"attention":[87],"for":[88],"potential":[89],"applications":[91],"high":[93],"temperature.":[94]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":10},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":5},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":3},{"year":2012,"cited_by_count":3}],"updated_date":"2026-09-25T08:18:29.962427","created_date":"2016-06-24T00:00:00"}