{"id":"https://openalex.org/W2065799758","doi":"https://doi.org/10.1016/s0007-8506(07)60737-9","title":"Measuring Form and Radius of Spheres with Interferometry","display_name":"Measuring Form and Radius of Spheres with Interferometry","publication_year":2004,"publication_date":"2004-01-01","ids":{"openalex":"https://openalex.org/W2065799758","doi":"https://doi.org/10.1016/s0007-8506(07)60737-9","mag":"2065799758"},"language":"en","primary_location":{"id":"doi:10.1016/s0007-8506(07)60737-9","doi":"https://doi.org/10.1016/s0007-8506(07)60737-9","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0007-8506(07)60737-9","pdf_url":null,"source":{"id":"https://openalex.org/S2898225552","display_name":"CIRP Annals","issn_l":"0007-8506","issn":["0007-8506","1660-2773","1726-0604"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-1","norway-2","poland-200","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"CIRP Annals","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5042955413","display_name":"Ulf Griesmann","orcid":"https://orcid.org/0000-0001-6882-9729","observed_orcids":["https://orcid.org/0000-0001-6882-9729"]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I4210151571","display_name":"Engineering Laboratory","ror":"https://ror.org/03v61g875","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210151571"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"U. Griesmann","raw_affiliation_strings":["National Institute of Standards and Technology (NIST), Manufacturing Engineering Laboratory, Gaithersburg, MD 20899-8223, U.S.A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology (NIST), Manufacturing Engineering Laboratory, Gaithersburg, MD 20899-8223, U.S.A","institution_ids":["https://openalex.org/I1321296531","https://openalex.org/I4210151571"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064484064","display_name":"Johannes A. Soons","orcid":"https://orcid.org/0000-0002-9485-1636","observed_orcids":["https://orcid.org/0000-0002-9485-1636"]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I4210151571","display_name":"Engineering Laboratory","ror":"https://ror.org/03v61g875","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210151571"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Soons","raw_affiliation_strings":["National Institute of Standards and Technology (NIST), Manufacturing Engineering Laboratory, Gaithersburg, MD 20899-8223, U.S.A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology (NIST), Manufacturing Engineering Laboratory, Gaithersburg, MD 20899-8223, U.S.A","institution_ids":["https://openalex.org/I1321296531","https://openalex.org/I4210151571"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074174763","display_name":"Q. Wang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I4210151571","display_name":"Engineering Laboratory","ror":"https://ror.org/03v61g875","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210151571"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Q. Wang","raw_affiliation_strings":["National Institute of Standards and Technology (NIST), Manufacturing Engineering Laboratory, Gaithersburg, MD 20899-8223, U.S.A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology (NIST), Manufacturing Engineering Laboratory, Gaithersburg, MD 20899-8223, U.S.A","institution_ids":["https://openalex.org/I1321296531","https://openalex.org/I4210151571"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111613244","display_name":"D. DeBra","orcid":"https://orcid.org/0000-0002-3316-5149","observed_orcids":["https://orcid.org/0000-0002-3316-5149"]},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. DeBra","raw_affiliation_strings":["Stanford University, U.S.A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Stanford University, U.S.A","institution_ids":["https://openalex.org/I97018004"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3190,"currency":"USD","value_usd":3190},"apc_paid":null,"fwci":1.9998,"has_fulltext":false,"cited_by_count":46,"citation_normalized_percentile":{"value":0.84748907,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"53","issue":"1","first_page":"451","last_page":"454"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.7070000171661377,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.7070000171661377,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.27469998598098755,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.01600000075995922,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/form-error","display_name":"form error","score":0.7480000257492065},{"id":"https://openalex.org/keywords/fizeau-interferometer","display_name":"Fizeau interferometer","score":0.8230000138282776},{"id":"https://openalex.org/keywords/stitching-algorithm","display_name":"stitching algorithm","score":0.6990000009536743},{"id":"https://openalex.org/keywords/precision-optics","display_name":"precision optics","score":0.5580000281333923},{"id":"https://openalex.org/keywords/silicon-spheres","display_name":"silicon spheres","score":0.8740000128746033},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"measurement uncertainty","score":0.6940000057220459},{"id":"https://openalex.org/keywords/phase-measuring-interferometry","display_name":"phase-measuring interferometry","score":0.5839999914169312}],"concepts":[{"id":"https://openalex.org/C178635117","wikidata":"https://www.wikidata.org/wiki/Q747499","display_name":"RADIUS","level":2,"score":0.8348944187164307},{"id":"https://openalex.org/C11665553","wikidata":"https://www.wikidata.org/wiki/Q1136069","display_name":"Radius of curvature","level":5,"score":0.7432795763015747},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.7043007612228394},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.6223940849304199},{"id":"https://openalex.org/C23576306","wikidata":"https://www.wikidata.org/wiki/Q17004698","display_name":"Astronomical interferometer","level":3,"score":0.6052709817886353},{"id":"https://openalex.org/C2776904371","wikidata":"https://www.wikidata.org/wiki/Q1422100","display_name":"Fizeau interferometer","level":4,"score":0.577204704284668},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5695983171463013},{"id":"https://openalex.org/C95448815","wikidata":"https://www.wikidata.org/wiki/Q48440","display_name":"Solar radius","level":5,"score":0.5146904587745667},{"id":"https://openalex.org/C195065555","wikidata":"https://www.wikidata.org/wiki/Q214881","display_name":"Curvature","level":2,"score":0.5034193396568298},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.4584611654281616},{"id":"https://openalex.org/C72422203","wikidata":"https://www.wikidata.org/wiki/Q7392545","display_name":"SPHERES","level":2,"score":0.44177788496017456},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.4356316328048706},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.41599804162979126},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.3472568988800049},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.18140658736228943},{"id":"https://openalex.org/C175017881","wikidata":"https://www.wikidata.org/wiki/Q1318998","display_name":"Mean curvature","level":3,"score":0.11564180254936218},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.09659966826438904},{"id":"https://openalex.org/C108411613","wikidata":"https://www.wikidata.org/wiki/Q79833","display_name":"Solar wind","level":3,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C72886185","wikidata":"https://www.wikidata.org/wiki/Q129890","display_name":"Coronal mass ejection","level":4,"score":0.0},{"id":"https://openalex.org/C127813850","wikidata":"https://www.wikidata.org/wiki/Q6803617","display_name":"Mean curvature flow","level":4,"score":0.0},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0007-8506(07)60737-9","doi":"https://doi.org/10.1016/s0007-8506(07)60737-9","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0007-8506(07)60737-9","pdf_url":null,"source":{"id":"https://openalex.org/S2898225552","display_name":"CIRP Annals","issn_l":"0007-8506","issn":["0007-8506","1660-2773","1726-0604"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-1","norway-2","poland-200","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"CIRP Annals","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1968767879","https://openalex.org/W2008976309","https://openalex.org/W2012988064","https://openalex.org/W2070348018","https://openalex.org/W2074123300","https://openalex.org/W2104198585","https://openalex.org/W2147507010","https://openalex.org/W2316409072","https://openalex.org/W3132751243"],"related_works":["https://openalex.org/W2093849018","https://openalex.org/W1988482096","https://openalex.org/W6939118803","https://openalex.org/W6922572500","https://openalex.org/W2147507010","https://openalex.org/W3208520817","https://openalex.org/W2104198585","https://openalex.org/W4295808781","https://openalex.org/W2060352953","https://openalex.org/W7216039608"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":3}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}