{"id":"https://openalex.org/W2064935218","doi":"https://doi.org/10.1115/fedsm2008-55153","title":"Compensating for the Phosphorescent Persistence in Intensified Cameras for Micro-PIV","display_name":"Compensating for the Phosphorescent Persistence in Intensified Cameras for Micro-PIV","publication_year":2008,"publication_date":"2008-01-01","ids":{"openalex":"https://openalex.org/W2064935218","doi":"https://doi.org/10.1115/fedsm2008-55153","mag":"2064935218"},"language":"en","primary_location":{"id":"doi:10.1115/fedsm2008-55153","doi":"https://doi.org/10.1115/fedsm2008-55153","is_oa":false,"landing_page_url":"https://doi.org/10.1115/fedsm2008-55153","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Volume 2: Fora","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085325031","display_name":"Adric C. Eckstein","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Adric Eckstein","raw_affiliation_strings":["Virginia Polytechnic Institute and State University, Blacksburg, VA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Virginia Polytechnic Institute and State University, Blacksburg, VA","institution_ids":["https://openalex.org/I859038795"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036194518","display_name":"Pavlos P. Vlachos","orcid":"https://orcid.org/0000-0002-8040-9257","observed_orcids":["https://orcid.org/0000-0002-8040-9257"]},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Pavlos Vlachos","raw_affiliation_strings":["Virginia Polytechnic Institute and State University, Blacksburg, VA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Virginia Polytechnic Institute and State University, Blacksburg, VA","institution_ids":["https://openalex.org/I859038795"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I859038795"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.12543501,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"595","last_page":"596"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.8422999978065491,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.8422999978065491,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.05350000038743019,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10360","display_name":"Fluid Dynamics and Turbulent Flows","score":0.05000000074505806,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/micro-particle-image-velocimetry","display_name":"micro-PIV","score":0.8870000243186951},{"id":"https://openalex.org/keywords/image-intensifier","display_name":"image intensifier","score":0.7940000295639038},{"id":"https://openalex.org/keywords/image-artifacts","display_name":"image artifacts","score":0.4390000104904175},{"id":"https://openalex.org/keywords/background-noise","display_name":"background noise","score":0.8840000033378601},{"id":"https://openalex.org/keywords/high-frequency-measurement","display_name":"high-frequency measurement","score":0.4580000042915344},{"id":"https://openalex.org/keywords/signal-to-noise-ratio","display_name":"signal-to-noise ratio","score":0.7829999923706055},{"id":"https://openalex.org/keywords/flow-visualization","display_name":"flow visualization","score":0.4690000116825104}],"concepts":[{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.6596914529800415},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5948486924171448},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5843712091445923},{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.5732447504997253},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5157966613769531},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.5107502937316895},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5043660402297974},{"id":"https://openalex.org/C155512908","wikidata":"https://www.wikidata.org/wiki/Q210745","display_name":"CMOS sensor","level":3,"score":0.4924091100692749},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.46304991841316223},{"id":"https://openalex.org/C17504453","wikidata":"https://www.wikidata.org/wiki/Q861692","display_name":"Image intensifier","level":2,"score":0.45961564779281616},{"id":"https://openalex.org/C13944312","wikidata":"https://www.wikidata.org/wiki/Q7512748","display_name":"Signal-to-noise ratio (imaging)","level":2,"score":0.45014458894729614},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.44922935962677},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.44054141640663147},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4199536442756653},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.31870564818382263},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.17310819029808044},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.15971386432647705},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15442794561386108},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.14716622233390808},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1115/fedsm2008-55153","doi":"https://doi.org/10.1115/fedsm2008-55153","is_oa":false,"landing_page_url":"https://doi.org/10.1115/fedsm2008-55153","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Volume 2: Fora","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8100000023841858}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2550903063","https://openalex.org/W2299980685","https://openalex.org/W7219458127","https://openalex.org/W2064469149","https://openalex.org/W2901934841","https://openalex.org/W2322189477","https://openalex.org/W2073931905","https://openalex.org/W787253830","https://openalex.org/W2330803728","https://openalex.org/W1565765519"],"abstract_inverted_index":{"Micro-PIV":[0],"experiments":[1,34],"rely":[2],"upon":[3],"the":[4,11,29,36,95,104,107],"use":[5,37,105],"of":[6,38,97,106,113,119],"a":[7,40,117],"microscope":[8],"to":[9,28,48,61,81],"achieve":[10],"higher":[12],"spatial":[13],"resolution.":[14],"However,":[15,76],"several":[16],"optical":[17],"limitations":[18],"are":[19,79],"introduced":[20],"at":[21,116],"these":[22,92],"scales":[23],"[1\u20133].":[24],"In":[25],"addition,":[26],"due":[27],"low":[30,126],"illumination":[31],"levels,":[32],"micro-PIV":[33],"require":[35],"either":[39],"cooled":[41],"CCD":[42,54],"camera":[43],"or":[44],"an":[45,68],"image":[46],"intensifier":[47],"provide":[49],"increased":[50],"signal-to-noise":[51],"ratio.":[52],"Although":[53],"cameras":[55,66,78],"offer":[56,67],"superior":[57],"sensitivity":[58],"and":[59,94],"signal":[60],"noise":[62],"ratio,":[63],"intensified":[64,77,109],"CMOS":[65,110],"attractive":[69],"alternative":[70],"for":[71,101],"performing":[72],"high":[73],"frequency":[74],"measurements.":[75],"known":[80],"introduce":[82],"artifacts":[83],"such":[84,99],"as":[85,125,127],"added":[86],"background":[87],"noise.":[88],"This":[89],"study":[90],"examines":[91],"issues":[93],"feasibility":[96],"employing":[98],"technologies":[100],"microPIV":[102],"through":[103],"IDT-X5":[108],"camera,":[111],"capable":[112],"500":[114],"Hz":[115],"resolution":[118],"2352\u00d71728":[120],"pixels,":[121],"with":[122],"pulse":[123],"separations":[124],"2\u03bcs.":[128]},"counts_by_year":[],"updated_date":"2026-09-22T06:50:58.402377","created_date":"2016-06-24T00:00:00"}