{"id":"https://openalex.org/W2058777083","doi":"https://doi.org/10.1063/1.2809704","title":"Evaluation and Control of Measurements","display_name":"Evaluation and Control of Measurements","publication_year":1992,"publication_date":"1992-06-01","ids":{"openalex":"https://openalex.org/W2058777083","doi":"https://doi.org/10.1063/1.2809704","mag":"2058777083"},"language":"en","primary_location":{"id":"doi:10.1063/1.2809704","doi":"https://doi.org/10.1063/1.2809704","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.2809704","pdf_url":null,"source":{"id":"https://openalex.org/S180907581","display_name":"Physics Today","issn_l":"0031-9228","issn":["0031-9228","1945-0699"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320061","host_organization_name":"AIP Publishing","host_organization_lineage":["https://openalex.org/P4310320061","https://openalex.org/P4310320257"],"host_organization_lineage_names":["AIP Publishing","American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Physics Today","raw_type":"journal-article"},"volume":null,"type":"book-review","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112363289","display_name":"John Mandel","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"John Mandel","raw_affiliation_strings":["David Sarnoff Research Center Princeton, New Jersey"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"David Sarnoff Research Center Princeton, New Jersey","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033982024","display_name":"James R. Matey","orcid":"https://orcid.org/0000-0002-0508-785X","observed_orcids":["https://orcid.org/0000-0002-0508-785X"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"James R. Matey","raw_affiliation_strings":["David Sarnoff Research Center Princeton, New Jersey"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"David Sarnoff Research Center Princeton, New Jersey","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":43,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"45","issue":"6","first_page":"82","last_page":"83"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.003700000001117587,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.0006000000284984708,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/measurement-and-evaluation","display_name":"measurement and evaluation","score":0.8100000023841858},{"id":"https://openalex.org/keywords/measurement-control","display_name":"measurement control","score":0.949999988079071},{"id":"https://openalex.org/keywords/metrology","display_name":"metrology","score":0.7689999938011169},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"measurement uncertainty","score":0.7699999809265137}],"concepts":[{"id":"https://openalex.org/C39432304","wikidata":"https://www.wikidata.org/wiki/Q188847","display_name":"Environmental science","level":0,"score":0.3772522807121277},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3561520576477051}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.2809704","doi":"https://doi.org/10.1063/1.2809704","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.2809704","pdf_url":null,"source":{"id":"https://openalex.org/S180907581","display_name":"Physics Today","issn_l":"0031-9228","issn":["0031-9228","1945-0699"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-100","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320061","host_organization_name":"AIP Publishing","host_organization_lineage":["https://openalex.org/P4310320061","https://openalex.org/P4310320257"],"host_organization_lineage_names":["AIP Publishing","American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Physics Today","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4248350456","https://openalex.org/W4253551426","https://openalex.org/W2321816341","https://openalex.org/W4246737020","https://openalex.org/W4252037043","https://openalex.org/W7162449463","https://openalex.org/W4214504083","https://openalex.org/W4232224743","https://openalex.org/W2732049158","https://openalex.org/W4255875747"],"abstract_inverted_index":null,"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-10-28T10:33:24.094632","created_date":"2016-06-24T00:00:00"}