{"id":"https://openalex.org/W2058259331","doi":"https://doi.org/10.1063/1.2183369","title":"Observation and manipulation of the as-grown maze domain structure in lead germanate by scanning force microscopy","display_name":"Observation and manipulation of the as-grown maze domain structure in lead germanate by scanning force microscopy","publication_year":2006,"publication_date":"2006-06-19","ids":{"openalex":"https://openalex.org/W2058259331","doi":"https://doi.org/10.1063/1.2183369","mag":"2058259331"},"language":"en","primary_location":{"id":"doi:10.1063/1.2183369","doi":"https://doi.org/10.1063/1.2183369","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.2183369","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043727211","display_name":"Eugene I. Shishkin","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"E. I. Shishkin","raw_affiliation_strings":["Ural State University Institute of Physics and Applied Mathematics, , 620083 Ekaterinburg, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ural State University Institute of Physics and Applied Mathematics, , 620083 Ekaterinburg, Russia","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044820990","display_name":"V. Ya. Shur","orcid":"https://orcid.org/0000-0002-6970-7798","observed_orcids":["https://orcid.org/0000-0002-6970-7798"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"V. Ya. Shur","raw_affiliation_strings":["Ural State University Institute of Physics and Applied Mathematics, , 620083 Ekaterinburg, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ural State University Institute of Physics and Applied Mathematics, , 620083 Ekaterinburg, Russia","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087116355","display_name":"Frank Schlaphof","orcid":"https://orcid.org/0009-0008-9007-4164","observed_orcids":["https://orcid.org/0009-0008-9007-4164"]},"institutions":[{"id":"https://openalex.org/I4405271785","display_name":"Dresden Integrated Center for Applied Physics and Photonic Materials","ror":"https://ror.org/031whys72","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4405271785","https://openalex.org/I78650965"]},{"id":"https://openalex.org/I78650965","display_name":"Technische Universit\u00e4t Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"F. Schlaphof","raw_affiliation_strings":["University of Technology Dresden Institute of Applied Photophysics, , D-01062 Dresden, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Technology Dresden Institute of Applied Photophysics, , D-01062 Dresden, Germany","institution_ids":["https://openalex.org/I4405271785","https://openalex.org/I78650965"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064175984","display_name":"Lukas M. Eng","orcid":"https://orcid.org/0000-0002-2484-4158","observed_orcids":["https://orcid.org/0000-0002-2484-4158"]},"institutions":[{"id":"https://openalex.org/I4405271785","display_name":"Dresden Integrated Center for Applied Physics and Photonic Materials","ror":"https://ror.org/031whys72","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4405271785","https://openalex.org/I78650965"]},{"id":"https://openalex.org/I78650965","display_name":"Technische Universit\u00e4t Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"L. M. Eng","raw_affiliation_strings":["University of Technology Dresden Institute of Applied Photophysics, , D-01062 Dresden, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Technology Dresden Institute of Applied Photophysics, , D-01062 Dresden, Germany","institution_ids":["https://openalex.org/I4405271785","https://openalex.org/I78650965"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3841,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.55888714,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":96},"biblio":{"volume":"88","issue":"25","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.9814000129699707,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.9814000129699707,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.007400000002235174,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.004999999888241291,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/lead-germanate","display_name":"lead germanate","score":0.9549999833106995},{"id":"https://openalex.org/keywords/pb5ge3o11","display_name":"Pb5Ge3O11","score":0.9760000109672546},{"id":"https://openalex.org/keywords/ferroelectric-domains","display_name":"ferroelectric domains","score":0.9539999961853027},{"id":"https://openalex.org/keywords/piezoresponse-force-microscopy","display_name":"piezoresponse force microscopy","score":0.8500000238418579},{"id":"https://openalex.org/keywords/kelvin-probe-force-microscopy","display_name":"Kelvin probe force microscopy","score":0.9990000128746033},{"id":"https://openalex.org/keywords/fractal-analysis","display_name":"fractal analysis","score":0.699999988079071},{"id":"https://openalex.org/keywords/domain-stability","display_name":"domain stability","score":0.4059999883174896},{"id":"https://openalex.org/keywords/surface-charging","display_name":"surface charging","score":0.9049999713897705},{"id":"https://openalex.org/keywords/single-crystals","display_name":"single crystals","score":0.4729999899864197}],"concepts":[{"id":"https://openalex.org/C83898325","wikidata":"https://www.wikidata.org/wiki/Q1324110","display_name":"Kelvin probe force microscope","level":3,"score":0.8310948610305786},{"id":"https://openalex.org/C172436747","wikidata":"https://www.wikidata.org/wiki/Q3312359","display_name":"Piezoresponse force microscopy","level":4,"score":0.7748314142227173},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.6843480467796326},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.6353607177734375},{"id":"https://openalex.org/C147230242","wikidata":"https://www.wikidata.org/wiki/Q5358564","display_name":"Electrostatic force microscope","level":3,"score":0.5637689828872681},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5594475269317627},{"id":"https://openalex.org/C79090758","wikidata":"https://www.wikidata.org/wiki/Q1045739","display_name":"Ferroelectricity","level":3,"score":0.5452516674995422},{"id":"https://openalex.org/C2909055331","wikidata":"https://www.wikidata.org/wiki/Q49295","display_name":"Scanning Force Microscopy","level":3,"score":0.4813733398914337},{"id":"https://openalex.org/C71246147","wikidata":"https://www.wikidata.org/wiki/Q16029538","display_name":"Non-contact atomic force microscopy","level":4,"score":0.4175827205181122},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.37504011392593384},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3691067695617676},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.3461869955062866},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3298863172531128},{"id":"https://openalex.org/C41999313","wikidata":"https://www.wikidata.org/wiki/Q489328","display_name":"Molecular physics","level":1,"score":0.3248034119606018},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.28191038966178894},{"id":"https://openalex.org/C102951782","wikidata":"https://www.wikidata.org/wiki/Q49295","display_name":"Atomic force microscopy","level":2,"score":0.18827864527702332},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.16564780473709106},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14439406991004944},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.2183369","doi":"https://doi.org/10.1063/1.2183369","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.2183369","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W131825514","https://openalex.org/W205675238","https://openalex.org/W1519123428","https://openalex.org/W1543751954","https://openalex.org/W1630351610","https://openalex.org/W1643536362","https://openalex.org/W1664811517","https://openalex.org/W1980147142","https://openalex.org/W2010586439","https://openalex.org/W2021396617","https://openalex.org/W2033103471","https://openalex.org/W2060517108","https://openalex.org/W2111077936","https://openalex.org/W2166971627"],"related_works":["https://openalex.org/W3011610584","https://openalex.org/W1602542391","https://openalex.org/W1976972449","https://openalex.org/W2171308383","https://openalex.org/W2290646227","https://openalex.org/W2088321584","https://openalex.org/W2127982325","https://openalex.org/W1969144491","https://openalex.org/W1623651899","https://openalex.org/W1965746391"],"abstract_inverted_index":{"The":[0,23,46,103],"ferroelectric":[1],"domain":[2,31,73],"structure":[3,32,54],"of":[4,51,70,84,106],"single":[5],"crystalline":[6],"Pb5Ge3O11":[7],"was":[8,39,55,65],"inspected":[9],"and":[10,17,36,44,49,59,113,121],"manipulated":[11],"using":[12],"piezoresponse":[13],"force":[14,20],"microscopy":[15,21],"(PFM)":[16],"Kelvin":[18],"probe":[19],"(KPFM).":[22],"irregularly":[24],"shaped":[25],"three-dimensional":[26],"maze":[27,86],"reflecting":[28],"the":[29,34,71,85,93],"as-grown":[30],"on":[33],"micron":[35],"submicron":[37],"scale":[38],"resolved":[40],"with":[41,57],"both":[42],"PFM":[43,94],"KPFM.":[45],"temporal":[47],"stability":[48],"recovery":[50],"that":[52],"equilibrium":[53],"tested":[56],"macroscopic":[58],"local":[60,88],"electric":[61,89],"fields.":[62],"Fractal":[63],"analysis":[64],"applied":[66,91],"for":[67],"quantitative":[68],"characterization":[69],"complicated":[72],"geometry.":[74],"While":[75],"spatially":[76],"extended":[77],"fields":[78,90],"lead":[79],"to":[80,117],"a":[81],"partial":[82],"decay":[83,108],"structure,":[87],"by":[92,111],"tip":[95],"result":[96],"in":[97,99],"addition":[98],"pronounced":[100],"surface":[101],"charging.":[102],"time":[104],"constants":[105],"charge":[107,119],"were":[109],"extracted":[110],"KPFM":[112],"could":[114],"be":[115],"attributed":[116],"mobile":[118],"redistribution":[120],"backswitching.":[122]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2026-10-12T09:40:04.860316","created_date":"2016-06-24T00:00:00"}