{"id":"https://openalex.org/W2058029611","doi":"https://doi.org/10.1149/1.2404226","title":"The Field-Dependence of the Dielectric Constant during the Anodic Oxidation of Tantalum, Niobium, and Tungsten","display_name":"The Field-Dependence of the Dielectric Constant during the Anodic Oxidation of Tantalum, Niobium, and Tungsten","publication_year":1972,"publication_date":"1972-01-01","ids":{"openalex":"https://openalex.org/W2058029611","doi":"https://doi.org/10.1149/1.2404226","mag":"2058029611"},"language":"en","primary_location":{"id":"doi:10.1149/1.2404226","doi":"https://doi.org/10.1149/1.2404226","is_oa":true,"landing_page_url":"https://doi.org/10.1149/1.2404226","pdf_url":"https://iopscience.iop.org/article/10.1149/1.2404226/pdf","source":{"id":"https://openalex.org/S138759888","display_name":"Journal of The Electrochemical Society","issn_l":"0013-4651","issn":["0013-4651","1945-7111"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310311669","host_organization_name":"Institute of Physics","host_organization_lineage":["https://openalex.org/P4310311669"],"host_organization_lineage_names":["Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of The Electrochemical Society","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://iopscience.iop.org/article/10.1149/1.2404226/pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057894382","display_name":"Jack L. Ord","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I151746483","display_name":"University of Waterloo","ror":"https://ror.org/01aff2v68","country_code":"CA","type":"education","lineage":["https://openalex.org/I151746483"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"J. L Ord","raw_affiliation_strings":["Department of Physics, University of Waterloo, Waterloo, Ontario, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, University of Waterloo, Waterloo, Ontario, Canada","institution_ids":["https://openalex.org/I151746483"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073747117","display_name":"M. A. Hopper","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I151746483","display_name":"University of Waterloo","ror":"https://ror.org/01aff2v68","country_code":"CA","type":"education","lineage":["https://openalex.org/I151746483"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"M. A. Hopper","raw_affiliation_strings":["Department of Physics, University of Waterloo, Waterloo, Ontario, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, University of Waterloo, Waterloo, Ontario, Canada","institution_ids":["https://openalex.org/I151746483"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061141140","display_name":"W. P. Wang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I151746483","display_name":"University of Waterloo","ror":"https://ror.org/01aff2v68","country_code":"CA","type":"education","lineage":["https://openalex.org/I151746483"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"W. P. Wang","raw_affiliation_strings":["Department of Physics, University of Waterloo, Waterloo, Ontario, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, University of Waterloo, Waterloo, Ontario, Canada","institution_ids":["https://openalex.org/I151746483"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I151746483"],"apc_list":{"value":1950,"currency":"USD","value_usd":1950},"apc_paid":null,"fwci":1.0925,"has_fulltext":true,"cited_by_count":32,"citation_normalized_percentile":{"value":0.74463831,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"119","issue":"4","first_page":"439","last_page":"439"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12340","display_name":"Anodic Oxide Films and Nanostructures","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12340","display_name":"Anodic Oxide Films and Nanostructures","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.004000000189989805,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10736","display_name":"Hydrogen embrittlement and corrosion behaviors in metals","score":0.0012000000569969416,"subfield":{"id":"https://openalex.org/subfields/2506","display_name":"Metals and Alloys"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/anodization","display_name":"anodic oxidation","score":0.9319999814033508},{"id":"https://openalex.org/keywords/tantalum","display_name":"tantalum","score":0.7409999966621399},{"id":"https://openalex.org/keywords/niobium","display_name":"niobium","score":1.0},{"id":"https://openalex.org/keywords/tungsten","display_name":"tungsten","score":1.0},{"id":"https://openalex.org/keywords/dielectric-constant","display_name":"dielectric constant","score":0.8709999918937683},{"id":"https://openalex.org/keywords/electric-field-dependence","display_name":"electric field dependence","score":0.8759999871253967},{"id":"https://openalex.org/keywords/refractive-index","display_name":"refractive index","score":0.8619999885559082},{"id":"https://openalex.org/keywords/oxide-thickness","display_name":"oxide thickness","score":0.9490000009536743},{"id":"https://openalex.org/keywords/oxide-density","display_name":"oxide density","score":0.5479999780654907},{"id":"https://openalex.org/keywords/ionic-conduction","display_name":"ionic conduction","score":0.8970000147819519},{"id":"https://openalex.org/keywords/effective-field-model","display_name":"effective field model","score":0.8899999856948853},{"id":"https://openalex.org/keywords/in-situ-ellipsometry","display_name":"in situ ellipsometry","score":0.8050000071525574},{"id":"https://openalex.org/keywords/galvanostatic-oxidation","display_name":"galvanostatic oxidation","score":0.8289999961853027}],"concepts":[{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.8294298648834229},{"id":"https://openalex.org/C514619126","wikidata":"https://www.wikidata.org/wiki/Q1123","display_name":"Tantalum","level":2,"score":0.7670407295227051},{"id":"https://openalex.org/C42067758","wikidata":"https://www.wikidata.org/wiki/Q174102","display_name":"Refractive index","level":2,"score":0.7036224603652954},{"id":"https://openalex.org/C507968137","wikidata":"https://www.wikidata.org/wiki/Q1046","display_name":"Niobium","level":2,"score":0.6955916881561279},{"id":"https://openalex.org/C542268612","wikidata":"https://www.wikidata.org/wiki/Q743","display_name":"Tungsten","level":2,"score":0.6301122903823853},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5418139696121216},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.5346993803977966},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.46884170174598694},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.382338285446167},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.3204270303249359},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.16603341698646545},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.0728447437286377},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1149/1.2404226","doi":"https://doi.org/10.1149/1.2404226","is_oa":true,"landing_page_url":"https://doi.org/10.1149/1.2404226","pdf_url":"https://iopscience.iop.org/article/10.1149/1.2404226/pdf","source":{"id":"https://openalex.org/S138759888","display_name":"Journal of The Electrochemical Society","issn_l":"0013-4651","issn":["0013-4651","1945-7111"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310311669","host_organization_name":"Institute of Physics","host_organization_lineage":["https://openalex.org/P4310311669"],"host_organization_lineage_names":["Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of The Electrochemical Society","raw_type":"journal-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.845.3851","doi":null,"is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.845.3851","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://jes.ecsdl.org/content/119/4/439.full.pdf","raw_type":"text"}],"best_oa_location":{"id":"doi:10.1149/1.2404226","doi":"https://doi.org/10.1149/1.2404226","is_oa":true,"landing_page_url":"https://doi.org/10.1149/1.2404226","pdf_url":"https://iopscience.iop.org/article/10.1149/1.2404226/pdf","source":{"id":"https://openalex.org/S138759888","display_name":"Journal of The Electrochemical Society","issn_l":"0013-4651","issn":["0013-4651","1945-7111"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-1","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310311669","host_organization_name":"Institute of Physics","host_organization_lineage":["https://openalex.org/P4310311669"],"host_organization_lineage_names":["Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of The Electrochemical Society","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2058029611.pdf","grobid_xml":"https://content.openalex.org/works/W2058029611.grobid-xml"},"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2070580276","https://openalex.org/W2026129986","https://openalex.org/W2028223697","https://openalex.org/W1906589707","https://openalex.org/W2093445529","https://openalex.org/W7097273400","https://openalex.org/W4250659075","https://openalex.org/W2020862154","https://openalex.org/W7095893485","https://openalex.org/W1858250964"],"abstract_inverted_index":{"In":[0],"situ":[1],"ellipsometric":[2],"measurements":[3],"on":[4,27,129],"the":[5,16,20,23,29,33,39,47,52,73,95,107,110,113,116,122,126,137,149,152,161],"galvanostatic":[6],"oxidation":[7,163],"of":[8,22,72,112,121,125,136,148,154],"tantalum,":[9],"niobium,":[10],"and":[11,19,55,78,94],"tungsten":[12],"show":[13],"that":[14,81,101],"both":[15,51],"refractive":[17,53,79],"index":[18,54,80],"thickness":[21,40],"oxide":[24],"change":[25,97],"suddenly":[26],"changing":[28],"current":[30],"applied":[31,117],"to":[32,43,64,106,143],"film.":[34],"For":[35],"all":[36],"three":[37],"metals":[38],"was":[41],"found":[42,63],"increase":[44],"linearly":[45,66],"with":[46,67,87,115],"electric":[48],"field,":[49],"whereas":[50],"low":[56],"frequency":[57],"(1000":[58],"Hz)":[59],"dielectric":[60,76,92,127],"constant":[61,77,128],"were":[62,82],"decrease":[65],"increasing":[68],"field.":[69,118],"The":[70,119],"magnitudes":[71],"changes":[74,103],"in":[75,98,109,151],"detected":[83],"experimentally,":[84],"when":[85],"compared":[86],"theoretical":[88],"predictions":[89],"using":[90],"standard":[91],"theory":[93],"observed":[96],"thickness,":[99],"indicate":[100],"these":[102],"are":[104],"due":[105],"variation":[108],"density":[111],"film":[114],"inclusion":[120],"linear":[123],"dependence":[124],"field":[130,134],"into":[131],"an":[132],"effective":[133],"model":[135],"ionic":[138],"conduction":[139],"process":[140],"is":[141],"shown":[142],"be":[144],"a":[145],"possible":[146],"explanation":[147],"curvature":[150],"plot":[153],"ln(":[155],"i":[156],")":[157],"vs.":[158],"E":[159],"for":[160],"anodic":[162],"process.":[164]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}