{"id":"https://openalex.org/W2057093047","doi":"https://doi.org/10.1063/1.4821368","title":"Johnson-noise thermometry based on a quantized-voltage noise source at NIST","display_name":"Johnson-noise thermometry based on a quantized-voltage noise source at NIST","publication_year":2013,"publication_date":"2013-01-01","ids":{"openalex":"https://openalex.org/W2057093047","doi":"https://doi.org/10.1063/1.4821368","mag":"2057093047"},"language":"en","primary_location":{"id":"doi:10.1063/1.4821368","doi":"https://doi.org/10.1063/1.4821368","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.4821368","pdf_url":null,"source":{"id":"https://openalex.org/S2764696622","display_name":"AIP conference proceedings","issn_l":"0094-243X","issn":["0094-243X","1551-7616","1935-0465"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"AIP Conference Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015821500","display_name":"Alessio Pollarolo","orcid":"https://orcid.org/0000-0002-7501-9289","observed_orcids":["https://orcid.org/0000-0002-7501-9289","https://orcid.org/0009-0004-8572-7651"]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Pollarolo","raw_affiliation_strings":["National Institute of Standards and Technology, Boulder, CO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Boulder, CO, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017818835","display_name":"T. Jeong","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T. Jeong","raw_affiliation_strings":["National Institute of Standards and Technology, Boulder, CO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Boulder, CO, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081723705","display_name":"Samuel P. Benz","orcid":"https://orcid.org/0000-0002-8679-0765","observed_orcids":["https://orcid.org/0000-0002-8679-0765"]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. P. Benz","raw_affiliation_strings":["National Institute of Standards and Technology, Boulder, CO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Boulder, CO, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020282923","display_name":"Paul D. Dresselhaus","orcid":"https://orcid.org/0000-0003-2493-0504","observed_orcids":["https://orcid.org/0000-0003-2493-0504"]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. D. Dresselhaus","raw_affiliation_strings":["National Institute of Standards and Technology, Boulder, CO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Boulder, CO, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069441015","display_name":"Horst Rogalla","orcid":"https://orcid.org/0000-0003-3946-0891","observed_orcids":["https://orcid.org/0000-0003-3946-0891"]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H. Rogalla","raw_affiliation_strings":["National Institute of Standards and Technology, Boulder, CO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Boulder, CO, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061108315","display_name":"Weston L. Tew","orcid":"https://orcid.org/0000-0002-9979-9136","observed_orcids":["https://orcid.org/0000-0002-9979-9136"]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"W. L. Tew","raw_affiliation_strings":["National Institute of Standards and Technology, Gaithersburg, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1321296531"],"apc_list":null,"apc_paid":null,"fwci":4.3817,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.93493367,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"23","last_page":"28"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.6571999788284302,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.6571999788284302,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.23029999434947968,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.10260000079870224,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/johnson-noise-thermometry","display_name":"Johnson noise thermometry","score":0.9240000247955322},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"voltage reference","score":0.7580000162124634},{"id":"https://openalex.org/keywords/boltzmann-constant","display_name":"Boltzmann constant","score":0.7379999756813049},{"id":"https://openalex.org/keywords/planck-constant","display_name":"Planck constant","score":0.9679999947547913},{"id":"https://openalex.org/keywords/triple-point-of-water","display_name":"triple point of water","score":0.7229999899864197},{"id":"https://openalex.org/keywords/resistance-measurement","display_name":"resistance measurement","score":0.6129999756813049},{"id":"https://openalex.org/keywords/nist","display_name":"NIST","score":0.4569999873638153}],"concepts":[{"id":"https://openalex.org/C111219384","wikidata":"https://www.wikidata.org/wiki/Q6954384","display_name":"NIST","level":2,"score":0.9045488834381104},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.8064709901809692},{"id":"https://openalex.org/C104419016","wikidata":"https://www.wikidata.org/wiki/Q1337490","display_name":"Johnson\u2013Nyquist noise","level":3,"score":0.7757604122161865},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.684695303440094},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.505424976348877},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4957831799983978},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4914339780807495},{"id":"https://openalex.org/C166576357","wikidata":"https://www.wikidata.org/wiki/Q8045715","display_name":"Y-factor","level":5,"score":0.47714516520500183},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4707028865814209},{"id":"https://openalex.org/C52660251","wikidata":"https://www.wikidata.org/wiki/Q17083145","display_name":"Noise temperature","level":3,"score":0.4237772822380066},{"id":"https://openalex.org/C2777155165","wikidata":"https://www.wikidata.org/wiki/Q646","display_name":"Thermometer","level":2,"score":0.4198400378227234},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.36357957124710083},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.2935006022453308},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23005354404449463},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.19854766130447388},{"id":"https://openalex.org/C155332784","wikidata":"https://www.wikidata.org/wiki/Q1151304","display_name":"Low-noise amplifier","level":4,"score":0.19335895776748657},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.1335901916027069},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08097916841506958},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.07830801606178284},{"id":"https://openalex.org/C28490314","wikidata":"https://www.wikidata.org/wiki/Q189436","display_name":"Speech recognition","level":1,"score":0.06536135077476501},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.4821368","doi":"https://doi.org/10.1063/1.4821368","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.4821368","pdf_url":null,"source":{"id":"https://openalex.org/S2764696622","display_name":"AIP conference proceedings","issn_l":"0094-243X","issn":["0094-243X","1551-7616","1935-0465"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"AIP Conference Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2085996585","https://openalex.org/W2123333203","https://openalex.org/W2243436648","https://openalex.org/W2158168847","https://openalex.org/W2756695806","https://openalex.org/W2058424454","https://openalex.org/W2722581998","https://openalex.org/W2318995612","https://openalex.org/W2050119997","https://openalex.org/W1515116858"],"abstract_inverted_index":{"Johnson":[0],"Noise":[1],"Thermometry":[2],"is":[3,36,137],"an":[4,29],"electronic":[5,51],"approach":[6],"to":[7,38,62,96,108,132],"measuring":[8],"temperature.":[9],"For":[10],"several":[11],"years,":[12],"NIST":[13,69],"has":[14],"been":[15],"developing":[16],"a":[17,23,49,83,88,111],"switching-correlator-type":[18],"Johnson-noise":[19],"thermometer":[20],"that":[21],"uses":[22],"quantized":[24],"voltage":[25,31],"noise":[26],"source":[27,115],"as":[28],"accurate":[30],"reference.":[32],"When":[33],"this":[34,123],"method":[35,52],"used":[37],"measure":[39],"resistors":[40,80],"at":[41],"the":[42,46,55,58,63,71,101,106,118,127,140],"triple-point":[43],"of":[44,57,92,117],"water,":[45],"system":[47,73,107],"creates":[48],"direct":[50],"for":[53,74,85],"determining":[54],"ratio":[56],"Boltzmann":[59],"constant":[60,65],"k":[61,86],"Planck":[64],"h.":[66],"In":[67,94,122],"2010,":[68],"optimized":[70],"JNT":[72],"use":[75],"with":[76,87,110],"100":[77,119],"\u03a9":[78,113,120],"sense":[79],"and":[81,99,130,134],"produced":[82],"determination":[84],"relative":[89],"standard":[90],"uncertainty":[91],"12\u00d710\u22126.":[93],"order":[95],"further":[97],"validate":[98],"improve":[100],"measurement":[102],"method,":[103],"we":[104,125],"modified":[105],"operate":[109],"200":[112],"resistor":[114],"instead":[116],"source.":[121],"paper,":[124],"summarize":[126],"technical":[128],"challenges":[129],"achievements":[131],"date":[133],"project":[135],"what":[136],"achievable":[138],"in":[139],"near":[141],"future.":[142]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-10-13T10:08:12.033832","created_date":"2016-06-24T00:00:00"}