{"id":"https://openalex.org/W2055950374","doi":"https://doi.org/10.1016/0040-6090(87)90258-6","title":"Measurement of optical losses and damage resistance of ZnSNa3AlF6 and TiO2SiO2 laser mirrors depending on coating design","display_name":"Measurement of optical losses and damage resistance of ZnSNa3AlF6 and TiO2SiO2 laser mirrors depending on coating design","publication_year":1987,"publication_date":"1987-09-01","ids":{"openalex":"https://openalex.org/W2055950374","doi":"https://doi.org/10.1016/0040-6090(87)90258-6","mag":"2055950374"},"language":"en","primary_location":{"id":"doi:10.1016/0040-6090(87)90258-6","doi":"https://doi.org/10.1016/0040-6090(87)90258-6","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0040-6090(87)90258-6","pdf_url":null,"source":{"id":"https://openalex.org/S84339699","display_name":"Thin Solid Films","issn_l":"0040-6090","issn":["0040-6090","1879-2731"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thin Solid Films","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079496107","display_name":"Eberhard Welsch","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I76198965","display_name":"Friedrich Schiller University Jena","ror":"https://ror.org/05qpz1x62","country_code":"DE","type":"education","lineage":["https://openalex.org/I76198965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"E. Welsch","raw_affiliation_strings":["Sektion Physik, Friedrich-Schiller-Universit\u00e4t Jena, Max-Wien-Platz 01, 6900 Jena G.D.R"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sektion Physik, Friedrich-Schiller-Universit\u00e4t Jena, Max-Wien-Platz 01, 6900 Jena G.D.R","institution_ids":["https://openalex.org/I76198965"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087403338","display_name":"Heinz-Gunter Walther","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I76198965","display_name":"Friedrich Schiller University Jena","ror":"https://ror.org/05qpz1x62","country_code":"DE","type":"education","lineage":["https://openalex.org/I76198965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"H.G. Walther","raw_affiliation_strings":["Sektion Physik, Friedrich-Schiller-Universit\u00e4t Jena, Max-Wien-Platz 01, 6900 Jena G.D.R"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sektion Physik, Friedrich-Schiller-Universit\u00e4t Jena, Max-Wien-Platz 01, 6900 Jena G.D.R","institution_ids":["https://openalex.org/I76198965"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067552171","display_name":"D. Sch\u00e4fer","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"D. Sch\u00e4fer","raw_affiliation_strings":["Zentralinstitut f\u00fcr Optick und Spektroskopie, Akademie der Wissenschaften der DDR, Rudower Chaussee 06, 1199 Berlin G.D.R"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Zentralinstitut f\u00fcr Optick und Spektroskopie, Akademie der Wissenschaften der DDR, Rudower Chaussee 06, 1199 Berlin G.D.R","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108551001","display_name":"R. Wolf","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I116397343","display_name":"Hochschule Mittweida","ror":"https://ror.org/024ga3r86","country_code":"DE","type":"education","lineage":["https://openalex.org/I116397343"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"R. Wolf","raw_affiliation_strings":["Ingenieurhochschule Mittweida, Platz der DSF, 9250 Mittweida G.D.R"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ingenieurhochschule Mittweida, Platz der DSF, 9250 Mittweida G.D.R","institution_ids":["https://openalex.org/I116397343"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3120,"currency":"USD","value_usd":3120},"apc_paid":null,"fwci":0.6918,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.63557185,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"152","issue":"3","first_page":"433","last_page":"442"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10732","display_name":"Laser Material Processing Techniques","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.0,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/laser-induced-damage-resistance","display_name":"laser damage resistance","score":0.6949999928474426},{"id":"https://openalex.org/keywords/optical-loss","display_name":"optical loss","score":0.6110000014305115},{"id":"https://openalex.org/keywords/quarter-wave-stack","display_name":"quarter-wave stack","score":0.5979999899864197},{"id":"https://openalex.org/keywords/optical-absorption","display_name":"optical absorption","score":0.6650000214576721},{"id":"https://openalex.org/keywords/light-scattering","display_name":"light scattering","score":0.7509999871253967},{"id":"https://openalex.org/keywords/coating-design","display_name":"coating design","score":0.7749999761581421},{"id":"https://openalex.org/keywords/laser-induced-thermal-stress","display_name":"laser-induced thermal stress","score":0.9599999785423279},{"id":"https://openalex.org/keywords/488-nm","display_name":"488 nm","score":0.6850000023841858},{"id":"https://openalex.org/keywords/515-nm","display_name":"515 nm","score":0.9750000238418579}],"concepts":[{"id":"https://openalex.org/C2781448156","wikidata":"https://www.wikidata.org/wiki/Q1570182","display_name":"Coating","level":2,"score":0.767828106880188},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.6752200126647949},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.633282482624054},{"id":"https://openalex.org/C125287762","wikidata":"https://www.wikidata.org/wiki/Q1758948","display_name":"Absorption (acoustics)","level":2,"score":0.6205856800079346},{"id":"https://openalex.org/C71597924","wikidata":"https://www.wikidata.org/wiki/Q2890543","display_name":"Optical coating","level":3,"score":0.5797958970069885},{"id":"https://openalex.org/C64297162","wikidata":"https://www.wikidata.org/wiki/Q1987070","display_name":"Deposition (geology)","level":3,"score":0.5299343466758728},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.4884113669395447},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.463384747505188},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.4572427570819855},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.40867748856544495},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.35090845823287964},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C2816523","wikidata":"https://www.wikidata.org/wiki/Q180184","display_name":"Sediment","level":2,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0040-6090(87)90258-6","doi":"https://doi.org/10.1016/0040-6090(87)90258-6","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0040-6090(87)90258-6","pdf_url":null,"source":{"id":"https://openalex.org/S84339699","display_name":"Thin Solid Films","issn_l":"0040-6090","issn":["0040-6090","1879-2731"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thin Solid Films","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1979109959","https://openalex.org/W2027651575","https://openalex.org/W2039650527","https://openalex.org/W2042053270","https://openalex.org/W2044649163","https://openalex.org/W2057144455"],"related_works":["https://openalex.org/W3145930411","https://openalex.org/W2008517746","https://openalex.org/W2060303577","https://openalex.org/W1563360043","https://openalex.org/W1995784954","https://openalex.org/W2018575331","https://openalex.org/W7163509182","https://openalex.org/W2002206291","https://openalex.org/W7058446737","https://openalex.org/W4281398464"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-09-23T05:00:35.095934","created_date":"2016-06-24T00:00:00"}