{"id":"https://openalex.org/W2055065804","doi":"https://doi.org/10.1016/j.snb.2007.02.043","title":"H2 sensing properties in highly oriented SnO2 thin films","display_name":"H2 sensing properties in highly oriented SnO2 thin films","publication_year":2007,"publication_date":"2007-03-06","ids":{"openalex":"https://openalex.org/W2055065804","doi":"https://doi.org/10.1016/j.snb.2007.02.043","mag":"2055065804"},"language":"en","primary_location":{"id":"doi:10.1016/j.snb.2007.02.043","doi":"https://doi.org/10.1016/j.snb.2007.02.043","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.snb.2007.02.043","pdf_url":null,"source":{"id":"https://openalex.org/S98455728","display_name":"Sensors and Actuators B Chemical","issn_l":"0925-4005","issn":["0925-4005","1873-3077"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-1","ki-jl-1","norway-1","poland-200","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors and Actuators B: Chemical","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004247415","display_name":"Yun\u2010Hyuk Choi","orcid":"https://orcid.org/0000-0002-3120-1556","observed_orcids":["https://orcid.org/0000-0002-3120-1556"]},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yun-Hyuk Choi","raw_affiliation_strings":["Department of Materials Science and Engineering and Nano Systems Institute \u2013 National Core Research Center, Seoul National University Seoul 151-742, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering and Nano Systems Institute \u2013 National Core Research Center, Seoul National University Seoul 151-742, Republic of Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065081264","display_name":"Seong\u2010Hyeon Hong","orcid":"https://orcid.org/0000-0001-8350-2724","observed_orcids":["https://orcid.org/0000-0001-8350-2724"]},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Seong-Hyeon Hong","raw_affiliation_strings":["Department of Materials Science and Engineering and Nano Systems Institute \u2013 National Core Research Center, Seoul National University Seoul 151-742, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering and Nano Systems Institute \u2013 National Core Research Center, Seoul National University Seoul 151-742, Republic of Korea","institution_ids":["https://openalex.org/I139264467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5065081264"],"corresponding_institution_ids":["https://openalex.org/I139264467"],"apc_list":{"value":5010,"currency":"USD","value_usd":5010},"apc_paid":null,"fwci":6.5402,"has_fulltext":false,"cited_by_count":72,"citation_normalized_percentile":{"value":0.96551893,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"125","issue":"2","first_page":"504","last_page":"509"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13251","display_name":"Electrical and Thermal Properties of Materials","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10192","display_name":"Catalytic Processes in Materials Science","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sno2-thin-films","display_name":"SnO2 thin films","score":0.7440000176429749},{"id":"https://openalex.org/keywords/sno2","display_name":"SnO2","score":0.8330000042915344},{"id":"https://openalex.org/keywords/hydrogen-sensing","display_name":"hydrogen detection","score":0.9599999785423279},{"id":"https://openalex.org/keywords/crystal-orientation","display_name":"crystal orientation","score":0.8949999809265137},{"id":"https://openalex.org/keywords/sapphire-substrate","display_name":"sapphire substrate","score":0.7289999723434448},{"id":"https://openalex.org/keywords/crystallographic-texture","display_name":"crystallographic texture","score":0.6919999718666077},{"id":"https://openalex.org/keywords/gas-response","display_name":"gas response","score":0.5040000081062317},{"id":"https://openalex.org/keywords/surface-states","display_name":"surface states","score":0.5920000076293945},{"id":"https://openalex.org/keywords/chemical-composition","display_name":"chemical composition","score":0.6840000152587891},{"id":"https://openalex.org/keywords/polycrystalline-films","display_name":"polycrystalline films","score":0.7390000224113464},{"id":"https://openalex.org/keywords/rf-magnetron-sputtering","display_name":"RF magnetron sputtering","score":0.8230000138282776}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.785597562789917},{"id":"https://openalex.org/C175708663","wikidata":"https://www.wikidata.org/wiki/Q899559","display_name":"X-ray photoelectron spectroscopy","level":2,"score":0.7252660989761353},{"id":"https://openalex.org/C137637335","wikidata":"https://www.wikidata.org/wiki/Q899604","display_name":"Crystallite","level":2,"score":0.6619867086410522},{"id":"https://openalex.org/C87976508","wikidata":"https://www.wikidata.org/wiki/Q1498213","display_name":"Microstructure","level":2,"score":0.6459639668464661},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.5843814015388489},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.579494059085846},{"id":"https://openalex.org/C2780064504","wikidata":"https://www.wikidata.org/wiki/Q127583","display_name":"Sapphire","level":3,"score":0.5566777586936951},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.5347752571105957},{"id":"https://openalex.org/C61427134","wikidata":"https://www.wikidata.org/wiki/Q847609","display_name":"Sputter deposition","level":4,"score":0.507426917552948},{"id":"https://openalex.org/C2779870107","wikidata":"https://www.wikidata.org/wiki/Q43010","display_name":"Quartz","level":2,"score":0.5000951290130615},{"id":"https://openalex.org/C22423302","wikidata":"https://www.wikidata.org/wiki/Q898444","display_name":"Sputtering","level":3,"score":0.46950626373291016},{"id":"https://openalex.org/C71907059","wikidata":"https://www.wikidata.org/wiki/Q223323","display_name":"Root mean square","level":2,"score":0.45853716135025024},{"id":"https://openalex.org/C107365816","wikidata":"https://www.wikidata.org/wiki/Q114817","display_name":"Surface roughness","level":2,"score":0.4510641396045685},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.35410213470458984},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.3348100781440735},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.22386717796325684},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.16287481784820557},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.10864230990409851},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.09096589684486389},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.snb.2007.02.043","doi":"https://doi.org/10.1016/j.snb.2007.02.043","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.snb.2007.02.043","pdf_url":null,"source":{"id":"https://openalex.org/S98455728","display_name":"Sensors and Actuators B Chemical","issn_l":"0925-4005","issn":["0925-4005","1873-3077"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-1","ki-jl-1","norway-1","poland-200","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors and Actuators B: Chemical","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W631175681","https://openalex.org/W1557681670","https://openalex.org/W1966759076","https://openalex.org/W1978445715","https://openalex.org/W1980209744","https://openalex.org/W1990309856","https://openalex.org/W1991081333","https://openalex.org/W1992476348","https://openalex.org/W1995835954","https://openalex.org/W2007128591","https://openalex.org/W2010897297","https://openalex.org/W2013029929","https://openalex.org/W2014630674","https://openalex.org/W2016110997","https://openalex.org/W2021875030","https://openalex.org/W2022078487","https://openalex.org/W2023707100","https://openalex.org/W2031641712","https://openalex.org/W2032142992","https://openalex.org/W2032841230","https://openalex.org/W2045284332","https://openalex.org/W2047562119","https://openalex.org/W2055836077","https://openalex.org/W2057460056","https://openalex.org/W2057682580","https://openalex.org/W2066698950","https://openalex.org/W2067195803","https://openalex.org/W2068341175","https://openalex.org/W2072014128","https://openalex.org/W2072785996","https://openalex.org/W2079589885","https://openalex.org/W2087079575","https://openalex.org/W2089924057","https://openalex.org/W2090546489","https://openalex.org/W2090608765","https://openalex.org/W2102123647","https://openalex.org/W2118951035","https://openalex.org/W2120391409","https://openalex.org/W2281179054","https://openalex.org/W2949565344"],"related_works":["https://openalex.org/W2073025318","https://openalex.org/W2025442177","https://openalex.org/W2952058047","https://openalex.org/W2765158289","https://openalex.org/W2057460056","https://openalex.org/W2314924346","https://openalex.org/W2904726628","https://openalex.org/W2321972300","https://openalex.org/W2045295514","https://openalex.org/W2954737147"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":6},{"year":2012,"cited_by_count":5}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}