{"id":"https://openalex.org/W2055064461","doi":"https://doi.org/10.1016/s0038-1098(98)00486-4","title":"Electrically induced room temperature metastability in semi-insulating GaAs","display_name":"Electrically induced room temperature metastability in semi-insulating GaAs","publication_year":1998,"publication_date":"1998-11-01","ids":{"openalex":"https://openalex.org/W2055064461","doi":"https://doi.org/10.1016/s0038-1098(98)00486-4","mag":"2055064461"},"language":"en","primary_location":{"id":"doi:10.1016/s0038-1098(98)00486-4","doi":"https://doi.org/10.1016/s0038-1098(98)00486-4","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0038-1098(98)00486-4","pdf_url":null,"source":{"id":"https://openalex.org/S82088436","display_name":"Solid State Communications","issn_l":"0038-1098","issn":["0038-1098","1879-2766"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Solid State Communications","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067663921","display_name":"S. Fung","orcid":"https://orcid.org/0000-0001-9905-636X","observed_orcids":["https://orcid.org/0000-0001-9905-636X"]},"institutions":[{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":true,"raw_author_name":"S. Fung","raw_affiliation_strings":["Department of Physics, The University of Hong Kong, Hong Kong, People's Republic of China","Department of Physics, The University of Hong Kong, Hong Kong,#N#People?s?Republic?of?China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, The University of Hong Kong, Hong Kong, People's Republic of China","institution_ids":["https://openalex.org/I889458895"]},{"raw_affiliation_string":"Department of Physics, The University of Hong Kong, Hong Kong,#N#People?s?Republic?of?China","institution_ids":["https://openalex.org/I889458895"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102935568","display_name":"Yan-Xiang Luo","orcid":"https://orcid.org/0000-0002-6425-5104","observed_orcids":["https://orcid.org/0000-0002-6425-5104"]},"institutions":[{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Y.L. Luo","raw_affiliation_strings":["Department of Physics, The University of Hong Kong, Hong Kong, People's Republic of China","Department of Physics, The University of Hong Kong, Hong Kong,#N#People?s?Republic?of?China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, The University of Hong Kong, Hong Kong, People's Republic of China","institution_ids":["https://openalex.org/I889458895"]},{"raw_affiliation_string":"Department of Physics, The University of Hong Kong, Hong Kong,#N#People?s?Republic?of?China","institution_ids":["https://openalex.org/I889458895"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113534237","display_name":"Christopher D. Beling","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"C.D. Beling","raw_affiliation_strings":["Department of Physics, The University of Hong Kong, Hong Kong, People's Republic of China","Department of Physics, The University of Hong Kong, Hong Kong,#N#People?s?Republic?of?China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, The University of Hong Kong, Hong Kong, People's Republic of China","institution_ids":["https://openalex.org/I889458895"]},{"raw_affiliation_string":"Department of Physics, The University of Hong Kong, Hong Kong,#N#People?s?Republic?of?China","institution_ids":["https://openalex.org/I889458895"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018298857","display_name":"T. P. Chen","orcid":"https://orcid.org/0000-0002-1098-9575","observed_orcids":["https://orcid.org/0000-0002-1098-9575"]},"institutions":[{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"T.P. Chen","raw_affiliation_strings":["Department of Physics, The University of Hong Kong, Hong Kong, People's Republic of China","Department of Physics, The University of Hong Kong, Hong Kong,#N#People?s?Republic?of?China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, The University of Hong Kong, Hong Kong, People's Republic of China","institution_ids":["https://openalex.org/I889458895"]},{"raw_affiliation_string":"Department of Physics, The University of Hong Kong, Hong Kong,#N#People?s?Republic?of?China","institution_ids":["https://openalex.org/I889458895"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5067663921"],"corresponding_institution_ids":["https://openalex.org/I889458895"],"apc_list":{"value":2960,"currency":"USD","value_usd":2960},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.19181682,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"108","issue":"12","first_page":"907","last_page":"911"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.9775000214576721,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.9775000214576721,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.00839999970048666,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10382","display_name":"Quantum and electron transport phenomena","score":0.00419999985024333,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metastability","display_name":"metastability","score":0.6370000243186951},{"id":"https://openalex.org/keywords/semi-insulating-gaas","display_name":"semi-insulating GaAs","score":0.9890000224113464},{"id":"https://openalex.org/keywords/reverse-bias-breakdown","display_name":"reverse bias breakdown","score":0.7900000214576721},{"id":"https://openalex.org/keywords/transient-decay","display_name":"transient decay","score":0.9599999785423279},{"id":"https://openalex.org/keywords/conductivity-measurement","display_name":"conductivity measurement","score":0.5400000214576721},{"id":"https://openalex.org/keywords/room-temperature","display_name":"room temperature","score":0.7080000042915344}],"concepts":[{"id":"https://openalex.org/C89464430","wikidata":"https://www.wikidata.org/wiki/Q849516","display_name":"Metastability","level":2,"score":0.9186300039291382},{"id":"https://openalex.org/C2987974824","wikidata":"https://www.wikidata.org/wiki/Q176300","display_name":"Reverse bias","level":3,"score":0.7402704954147339},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6104407906532288},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5256080627441406},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.5137854218482971},{"id":"https://openalex.org/C131540310","wikidata":"https://www.wikidata.org/wiki/Q907564","display_name":"Conductivity","level":2,"score":0.5009322166442871},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.4574607312679291},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.35649940371513367},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.26309192180633545},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19573459029197693},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1304836869239807},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.049953073263168335},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.04620552062988281},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0038-1098(98)00486-4","doi":"https://doi.org/10.1016/s0038-1098(98)00486-4","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0038-1098(98)00486-4","pdf_url":null,"source":{"id":"https://openalex.org/S82088436","display_name":"Solid State Communications","issn_l":"0038-1098","issn":["0038-1098","1879-2766"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Solid State Communications","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W653595462","https://openalex.org/W2003792863","https://openalex.org/W2005790106","https://openalex.org/W2015220054","https://openalex.org/W2024062788","https://openalex.org/W2028073583","https://openalex.org/W2044414839","https://openalex.org/W2044634628","https://openalex.org/W2057538525","https://openalex.org/W2075045725","https://openalex.org/W2078497380","https://openalex.org/W2093000376","https://openalex.org/W2555016021","https://openalex.org/W2990391527"],"related_works":["https://openalex.org/W7009563864","https://openalex.org/W2013693345","https://openalex.org/W2049471114","https://openalex.org/W2163991959","https://openalex.org/W6981456092","https://openalex.org/W4214864799","https://openalex.org/W4206961843","https://openalex.org/W1966779316","https://openalex.org/W2474686186","https://openalex.org/W1992031242"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-09-22T06:50:58.402377","created_date":"2016-06-24T00:00:00"}