{"id":"https://openalex.org/W2054718237","doi":"https://doi.org/10.1109/mdt.2007.76","title":"Modeling Power Supply Noise in Delay Testing","display_name":"Modeling Power Supply Noise in Delay Testing","publication_year":2007,"publication_date":"2007-05-01","ids":{"openalex":"https://openalex.org/W2054718237","doi":"https://doi.org/10.1109/mdt.2007.76","mag":"2054718237"},"language":"en","primary_location":{"id":"doi:10.1109/mdt.2007.76","doi":"https://doi.org/10.1109/mdt.2007.76","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2007.76","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100378412","display_name":"Jing Wang","orcid":"https://orcid.org/0000-0001-9856-2092","observed_orcids":["https://orcid.org/0000-0001-9856-2092"]},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jing Wang","raw_affiliation_strings":["Texas A and M University, USA","Texas A&M University\u2013College Station"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas A and M University, USA","institution_ids":["https://openalex.org/I91045830"]},{"raw_affiliation_string":"Texas A&M University\u2013College Station","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027337337","display_name":"D.M.H. Walker","orcid":"https://orcid.org/0000-0002-4839-3830","observed_orcids":["https://orcid.org/0000-0002-4839-3830"]},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D.M. Walker","raw_affiliation_strings":["Texas A and M University, USA","Texas A&M University\u2013College Station"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas A and M University, USA","institution_ids":["https://openalex.org/I91045830"]},{"raw_affiliation_string":"Texas A&M University\u2013College Station","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084907779","display_name":"Xiang L\u00fc","orcid":"https://orcid.org/0000-0001-7169-7771","observed_orcids":["https://orcid.org/0000-0001-7169-7771","https://orcid.org/0000-0002-8383-1082","https://orcid.org/0009-0001-1434-4563"]},"institutions":[{"id":"https://openalex.org/I4210100828","display_name":"SEMI","ror":"https://ror.org/013ykv656","country_code":"FR","type":"other","lineage":["https://openalex.org/I4210100828"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Xiang Lu","raw_affiliation_strings":["P.A. Semi, Inc","P.A. Semi"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"P.A. Semi, Inc","institution_ids":[]},{"raw_affiliation_string":"P.A. Semi","institution_ids":["https://openalex.org/I4210100828"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039616323","display_name":"A.K. Majhi","orcid":"https://orcid.org/0000-0002-9517-7911","observed_orcids":["https://orcid.org/0000-0002-9517-7911"]},"institutions":[{"id":"https://openalex.org/I4210123704","display_name":"NXP (Germany)","ror":"https://ror.org/0268h4j55","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"A. Majhi","raw_affiliation_strings":["NXP Semiconductors, France","[NXP Semiconductors]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, France","institution_ids":[]},{"raw_affiliation_string":"[NXP Semiconductors]","institution_ids":["https://openalex.org/I4210123704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013997501","display_name":"Bram Kruseman","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210123704","display_name":"NXP (Germany)","ror":"https://ror.org/0268h4j55","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"B. Kruseman","raw_affiliation_strings":["NXP Semiconductors, France","[NXP Semiconductors]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, France","institution_ids":[]},{"raw_affiliation_string":"[NXP Semiconductors]","institution_ids":["https://openalex.org/I4210123704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019421632","display_name":"G. Gronthoud","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210123704","display_name":"NXP (Germany)","ror":"https://ror.org/0268h4j55","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"G. Gronthoud","raw_affiliation_strings":["NXP Semiconductors, France","[NXP Semiconductors]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, France","institution_ids":[]},{"raw_affiliation_string":"[NXP Semiconductors]","institution_ids":["https://openalex.org/I4210123704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073001928","display_name":"Luis Elvira Villagra","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210123704","display_name":"NXP (Germany)","ror":"https://ror.org/0268h4j55","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"L.E. Villagra","raw_affiliation_strings":["NXP Semiconductors, France","[NXP Semiconductors]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, France","institution_ids":[]},{"raw_affiliation_string":"[NXP Semiconductors]","institution_ids":["https://openalex.org/I4210123704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003569747","display_name":"P.J.A. van de Wiel","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210123704","display_name":"NXP (Germany)","ror":"https://ror.org/0268h4j55","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"P.J.A. van de Wiel","raw_affiliation_strings":["NXP Semiconductors, France","[NXP Semiconductors]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, France","institution_ids":[]},{"raw_affiliation_string":"[NXP Semiconductors]","institution_ids":["https://openalex.org/I4210123704"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074964895","display_name":"S. Eichenberger","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210123704","display_name":"NXP (Germany)","ror":"https://ror.org/0268h4j55","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"S. Eichenberger","raw_affiliation_strings":["NXP Semiconductors, France","[NXP Semiconductors]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, France","institution_ids":[]},{"raw_affiliation_string":"[NXP Semiconductors]","institution_ids":["https://openalex.org/I4210123704"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":6.718,"has_fulltext":false,"cited_by_count":28,"citation_normalized_percentile":{"value":0.96324569,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"24","issue":"3","first_page":"226","last_page":"234"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power-supply-noise","display_name":"power supply noise","score":0.996999979019165},{"id":"https://openalex.org/keywords/delay-testing","display_name":"delay testing","score":0.9150000214576721},{"id":"https://openalex.org/keywords/noise-modeling","display_name":"noise modeling","score":0.7680000066757202},{"id":"https://openalex.org/keywords/test-response-compaction","display_name":"test compaction","score":0.9549999833106995},{"id":"https://openalex.org/keywords/overkill","display_name":"overkill","score":0.7820000052452087},{"id":"https://openalex.org/keywords/power-system-analysis","display_name":"power system analysis","score":0.7630000114440918},{"id":"https://openalex.org/keywords/test-overhead","display_name":"test overhead","score":0.30300000309944153}],"concepts":[{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.7023988962173462},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5779220461845398},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5302056074142456},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5039026141166687},{"id":"https://openalex.org/C2777561913","wikidata":"https://www.wikidata.org/wiki/Q19599527","display_name":"Power integrity","level":4,"score":0.4445143938064575},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.4286549389362335},{"id":"https://openalex.org/C151799858","wikidata":"https://www.wikidata.org/wiki/Q587008","display_name":"Switched-mode power supply","level":3,"score":0.41001763939857483},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.36637187004089355},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.360260009765625},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29512378573417664},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.2158709168434143},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.14824721217155457},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.11081355810165405},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.06852281093597412},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdt.2007.76","doi":"https://doi.org/10.1109/mdt.2007.76","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2007.76","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320310164","display_name":"Texas A and M University","ror":"https://ror.org/01f5ytq51"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1568407911","https://openalex.org/W2018607921","https://openalex.org/W2101278273","https://openalex.org/W2106006800","https://openalex.org/W2109791184","https://openalex.org/W2142868932","https://openalex.org/W2152042493","https://openalex.org/W2153912424","https://openalex.org/W2155202144","https://openalex.org/W2162547872","https://openalex.org/W4230566481","https://openalex.org/W4233794767","https://openalex.org/W4236133696","https://openalex.org/W4237840841","https://openalex.org/W4238696474"],"related_works":["https://openalex.org/W2162547872","https://openalex.org/W2155202144","https://openalex.org/W7098104184","https://openalex.org/W2105439963","https://openalex.org/W1793316485","https://openalex.org/W1994241124","https://openalex.org/W2102528002","https://openalex.org/W2024373614","https://openalex.org/W2170506040","https://openalex.org/W6884882167"],"abstract_inverted_index":{"Excessive":[0],"power":[1,32,41],"supply":[2,15],"noise":[3,16,28,42],"during":[4],"test":[5,24],"can":[6,45],"cause":[7,46],"overkill.":[8],"This":[9],"article":[10],"discusses":[11],"two":[12],"models":[13,29],"for":[14],"in":[17],"delay":[18],"testing":[19],"and":[20,49],"their":[21],"application":[22],"to":[23],"compaction.":[25],"The":[26],"proposed":[27],"avoid":[30],"complicated":[31],"network":[33],"analysis,":[34],"making":[35],"them":[36],"much":[37],"faster":[38],"than":[39],"existing":[40],"analysis":[43],"tools.":[44],"performance":[47],"degradation":[48]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":3},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}