{"id":"https://openalex.org/W2053790829","doi":"https://doi.org/10.1016/j.mee.2013.06.014","title":"Single-electron injections in fringing-field-induced charge-trapping memories","display_name":"Single-electron injections in fringing-field-induced charge-trapping memories","publication_year":2013,"publication_date":"2013-07-04","ids":{"openalex":"https://openalex.org/W2053790829","doi":"https://doi.org/10.1016/j.mee.2013.06.014","mag":"2053790829"},"language":"en","primary_location":{"id":"doi:10.1016/j.mee.2013.06.014","doi":"https://doi.org/10.1016/j.mee.2013.06.014","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.mee.2013.06.014","pdf_url":null,"source":{"id":"https://openalex.org/S158028765","display_name":"Microelectronic Engineering","issn_l":"0167-9317","issn":["0167-9317","1873-5568"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronic Engineering","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036310799","display_name":"Kuang-Hao Chiang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I151221077","display_name":"Chung Yuan Christian University","ror":"https://ror.org/02w8ws377","country_code":"TW","type":"education","lineage":["https://openalex.org/I151221077"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"K.H. Chiang","raw_affiliation_strings":["Department of Electronic Engineering, Chung Yuan Christian University, Chung-Li 32023, Taiwan, ROC","Dept. of Electronic Engineering, Chung Yuan Christian University, Chung-Li 32023, Taiwan Roc#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Chung Yuan Christian University, Chung-Li 32023, Taiwan, ROC","institution_ids":["https://openalex.org/I151221077"]},{"raw_affiliation_string":"Dept. of Electronic Engineering, Chung Yuan Christian University, Chung-Li 32023, Taiwan Roc#TAB#","institution_ids":["https://openalex.org/I151221077"]}]},{"author_position":"middle","author":{"id":null,"display_name":"S.W. Chou","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I151221077","display_name":"Chung Yuan Christian University","ror":"https://ror.org/02w8ws377","country_code":"TW","type":"education","lineage":["https://openalex.org/I151221077"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"S.W. Chou","raw_affiliation_strings":["Department of Electronic Engineering, Chung Yuan Christian University, Chung-Li 32023, Taiwan, ROC","Dept. of Electronic Engineering, Chung Yuan Christian University, Chung-Li 32023, Taiwan Roc#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Chung Yuan Christian University, Chung-Li 32023, Taiwan, ROC","institution_ids":["https://openalex.org/I151221077"]},{"raw_affiliation_string":"Dept. of Electronic Engineering, Chung Yuan Christian University, Chung-Li 32023, Taiwan Roc#TAB#","institution_ids":["https://openalex.org/I151221077"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081522099","display_name":"H.C. Hsu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I151221077","display_name":"Chung Yuan Christian University","ror":"https://ror.org/02w8ws377","country_code":"TW","type":"education","lineage":["https://openalex.org/I151221077"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"H.C. Hsu","raw_affiliation_strings":["Department of Electronic Engineering, Chung Yuan Christian University, Chung-Li 32023, Taiwan, ROC","Dept. of Electronic Engineering, Chung Yuan Christian University, Chung-Li 32023, Taiwan Roc#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Chung Yuan Christian University, Chung-Li 32023, Taiwan, ROC","institution_ids":["https://openalex.org/I151221077"]},{"raw_affiliation_string":"Dept. of Electronic Engineering, Chung Yuan Christian University, Chung-Li 32023, Taiwan Roc#TAB#","institution_ids":["https://openalex.org/I151221077"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111278277","display_name":"Erik S. Jeng","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I151221077","display_name":"Chung Yuan Christian University","ror":"https://ror.org/02w8ws377","country_code":"TW","type":"education","lineage":["https://openalex.org/I151221077"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"E.S. Jeng","raw_affiliation_strings":["Department of Electronic Engineering, Chung Yuan Christian University, Chung-Li 32023, Taiwan, ROC","Dept. of Electronic Engineering, Chung Yuan Christian University, Chung-Li 32023, Taiwan Roc#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Chung Yuan Christian University, Chung-Li 32023, Taiwan, ROC","institution_ids":["https://openalex.org/I151221077"]},{"raw_affiliation_string":"Dept. of Electronic Engineering, Chung Yuan Christian University, Chung-Li 32023, Taiwan Roc#TAB#","institution_ids":["https://openalex.org/I151221077"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5036310799"],"corresponding_institution_ids":["https://openalex.org/I151221077"],"apc_list":{"value":2860,"currency":"USD","value_usd":2860},"apc_paid":null,"fwci":0.5893,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.72461906,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":95},"biblio":{"volume":"113","issue":null,"first_page":"66","last_page":"69"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.7480000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.7480000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.1655000001192093,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10382","display_name":"Quantum and electron transport phenomena","score":0.03420000150799751,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/charge-trapping","display_name":"charge trapping","score":0.8019999861717224},{"id":"https://openalex.org/keywords/fringing-capacitance","display_name":"fringing capacitance","score":0.7900000214576721},{"id":"https://openalex.org/keywords/lucky-electron-model","display_name":"lucky electron model","score":0.9670000076293945},{"id":"https://openalex.org/keywords/room-temperature-operation","display_name":"room-temperature operation","score":0.5569999814033508}],"concepts":[{"id":"https://openalex.org/C2777924906","wikidata":"https://www.wikidata.org/wiki/Q34168","display_name":"Trapping","level":2,"score":0.732879638671875},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.7019037008285522},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.6074257493019104},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.5557328462600708},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4898828864097595},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.48240435123443604},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.43114978075027466},{"id":"https://openalex.org/C188082385","wikidata":"https://www.wikidata.org/wiki/Q73792","display_name":"Charge (physics)","level":2,"score":0.4276397228240967},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.360779345035553},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.344684898853302},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.27186256647109985},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.24781140685081482},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.241260826587677},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.mee.2013.06.014","doi":"https://doi.org/10.1016/j.mee.2013.06.014","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.mee.2013.06.014","pdf_url":null,"source":{"id":"https://openalex.org/S158028765","display_name":"Microelectronic Engineering","issn_l":"0167-9317","issn":["0167-9317","1873-5568"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronic Engineering","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W404273155","https://openalex.org/W2010492266","https://openalex.org/W2031940692","https://openalex.org/W2033077449","https://openalex.org/W2040547851","https://openalex.org/W2062328341","https://openalex.org/W2075599784","https://openalex.org/W2083902045","https://openalex.org/W2090766704","https://openalex.org/W2097872863","https://openalex.org/W2100253199","https://openalex.org/W2132383505","https://openalex.org/W2134777311","https://openalex.org/W2141029718","https://openalex.org/W2141899849","https://openalex.org/W2150380184","https://openalex.org/W2151654658","https://openalex.org/W2161385080","https://openalex.org/W4214605453","https://openalex.org/W4285719527","https://openalex.org/W4302567542"],"related_works":["https://openalex.org/W2150380184","https://openalex.org/W2041348860","https://openalex.org/W1549887589","https://openalex.org/W3140960236","https://openalex.org/W2050102431","https://openalex.org/W2108864897","https://openalex.org/W2101384285","https://openalex.org/W2056884446","https://openalex.org/W2004395048","https://openalex.org/W2150669723"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2016-06-24T00:00:00"}