{"id":"https://openalex.org/W2053326530","doi":"https://doi.org/10.1143/jjap.37.l787","title":"Electrical Resistivity of Eu-Rich EuO Thin Films","display_name":"Electrical Resistivity of Eu-Rich EuO Thin Films","publication_year":1998,"publication_date":"1998-07-01","ids":{"openalex":"https://openalex.org/W2053326530","doi":"https://doi.org/10.1143/jjap.37.l787","mag":"2053326530"},"language":"en","primary_location":{"id":"doi:10.1143/jjap.37.l787","doi":"https://doi.org/10.1143/jjap.37.l787","is_oa":true,"landing_page_url":"https://doi.org/10.1143/jjap.37.l787","pdf_url":"https://iopscience.iop.org/article/10.1143/JJAP.37.L787/pdf","source":{"id":"https://openalex.org/S143744711","display_name":"Japanese Journal of Applied Physics","issn_l":"0021-4922","issn":["0021-4922","1347-4065"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310311669","host_organization_name":"Institute of Physics","host_organization_lineage":["https://openalex.org/P4310311669"],"host_organization_lineage_names":["Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Japanese Journal of Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://iopscience.iop.org/article/10.1143/JJAP.37.L787/pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005107679","display_name":"Toyohiko J. Konno","orcid":"https://orcid.org/0000-0002-3396-1049","observed_orcids":["https://orcid.org/0000-0002-3396-1049","https://orcid.org/0000-0002-2154-0589","https://orcid.org/0000-0002-6352-0711"]},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I4387152242","display_name":"Institute for Materials Research, Tohoku University","ror":"https://ror.org/04664mr26","country_code":"JP","type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I4387152242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toyohiko J. Konno","raw_affiliation_strings":["Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan","institution_ids":["https://openalex.org/I201537933","https://openalex.org/I4387152242"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091461373","display_name":"Kimio Wakoh","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I4387152242","display_name":"Institute for Materials Research, Tohoku University","ror":"https://ror.org/04664mr26","country_code":"JP","type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I4387152242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kimio Wakoh","raw_affiliation_strings":["Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan","institution_ids":["https://openalex.org/I201537933","https://openalex.org/I4387152242"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111378350","display_name":"K. Sumiyama","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I4387152242","display_name":"Institute for Materials Research, Tohoku University","ror":"https://ror.org/04664mr26","country_code":"JP","type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I4387152242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kenji Sumiyama","raw_affiliation_strings":["Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan","institution_ids":["https://openalex.org/I201537933","https://openalex.org/I4387152242"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050949810","display_name":"Kenji Suzuki","orcid":"https://orcid.org/0000-0002-3993-8309","observed_orcids":["https://orcid.org/0000-0002-3993-8309"]},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I4387152242","display_name":"Institute for Materials Research, Tohoku University","ror":"https://ror.org/04664mr26","country_code":"JP","type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I4387152242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kenji Suzuki","raw_affiliation_strings":["Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan","institution_ids":["https://openalex.org/I201537933","https://openalex.org/I4387152242"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2210,"currency":"USD","value_usd":2210},"apc_paid":null,"fwci":0.5565,"has_fulltext":true,"cited_by_count":5,"citation_normalized_percentile":{"value":0.64548617,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"37","issue":"7A","first_page":"L787","last_page":"L787"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10607","display_name":"Magnetic and transport properties of perovskites and related materials","score":0.9423999786376953,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10607","display_name":"Magnetic and transport properties of perovskites and related materials","score":0.9423999786376953,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.016100000590085983,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12588","display_name":"Electronic and Structural Properties of Oxides","score":0.014999999664723873,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/euo-thin-films","display_name":"EuO thin films","score":0.9380000233650208},{"id":"https://openalex.org/keywords/electrical-resistivity","display_name":"electrical resistivity","score":0.9409999847412109},{"id":"https://openalex.org/keywords/off-stoichiometry","display_name":"off-stoichiometry","score":0.9369999766349792},{"id":"https://openalex.org/keywords/curie-temperature","display_name":"Curie temperature","score":0.8199999928474426},{"id":"https://openalex.org/keywords/magnetoresistance","display_name":"magnetoresistance","score":0.9610000252723694},{"id":"https://openalex.org/keywords/low-temperature-electrical-conductivity","display_name":"low-temperature conductivity","score":0.6489999890327454},{"id":"https://openalex.org/keywords/europium-oxide","display_name":"europium oxide","score":0.6970000267028809},{"id":"https://openalex.org/keywords/magnetic-field-dependence","display_name":"magnetic field dependence","score":0.4659999907016754}],"concepts":[{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.902327299118042},{"id":"https://openalex.org/C117958382","wikidata":"https://www.wikidata.org/wiki/Q58347","display_name":"Magnetoresistance","level":3,"score":0.7581655979156494},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.6538947820663452},{"id":"https://openalex.org/C63648874","wikidata":"https://www.wikidata.org/wiki/Q191073","display_name":"Curie temperature","level":3,"score":0.6358597278594971},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.5830397009849548},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5461885929107666},{"id":"https://openalex.org/C144082473","wikidata":"https://www.wikidata.org/wiki/Q213185","display_name":"Stoichiometry","level":2,"score":0.510282039642334},{"id":"https://openalex.org/C39353612","wikidata":"https://www.wikidata.org/wiki/Q5283759","display_name":"Atmospheric temperature range","level":2,"score":0.4153901934623718},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.3583381474018097},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.33213186264038086},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2343895435333252},{"id":"https://openalex.org/C82217956","wikidata":"https://www.wikidata.org/wiki/Q184207","display_name":"Ferromagnetism","level":2,"score":0.18863600492477417},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.12055310606956482},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1132672131061554},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.05033174157142639},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1143/jjap.37.l787","doi":"https://doi.org/10.1143/jjap.37.l787","is_oa":true,"landing_page_url":"https://doi.org/10.1143/jjap.37.l787","pdf_url":"https://iopscience.iop.org/article/10.1143/JJAP.37.L787/pdf","source":{"id":"https://openalex.org/S143744711","display_name":"Japanese Journal of Applied Physics","issn_l":"0021-4922","issn":["0021-4922","1347-4065"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310311669","host_organization_name":"Institute of Physics","host_organization_lineage":["https://openalex.org/P4310311669"],"host_organization_lineage_names":["Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Japanese Journal of Applied Physics","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1143/jjap.37.l787","doi":"https://doi.org/10.1143/jjap.37.l787","is_oa":true,"landing_page_url":"https://doi.org/10.1143/jjap.37.l787","pdf_url":"https://iopscience.iop.org/article/10.1143/JJAP.37.L787/pdf","source":{"id":"https://openalex.org/S143744711","display_name":"Japanese Journal of Applied Physics","issn_l":"0021-4922","issn":["0021-4922","1347-4065"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310311669","host_organization_name":"Institute of Physics","host_organization_lineage":["https://openalex.org/P4310311669"],"host_organization_lineage_names":["Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Japanese Journal of Applied Physics","raw_type":"journal-article"},"sustainable_development_goals":[],"sustainable_development_goals_aurora":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2053326530.pdf","grobid_xml":"https://content.openalex.org/works/W2053326530.grobid-xml"},"referenced_works_count":17,"referenced_works":["https://openalex.org/W1966670256","https://openalex.org/W1985357156","https://openalex.org/W1986067802","https://openalex.org/W1987184442","https://openalex.org/W2006201240","https://openalex.org/W2014180120","https://openalex.org/W2024168238","https://openalex.org/W2026419679","https://openalex.org/W2043278837","https://openalex.org/W2050222000","https://openalex.org/W2053980044","https://openalex.org/W2066216950","https://openalex.org/W2070849318","https://openalex.org/W2087573750","https://openalex.org/W2087670662","https://openalex.org/W2094000560","https://openalex.org/W2134467100"],"related_works":["https://openalex.org/W4569940","https://openalex.org/W2170924264","https://openalex.org/W2025745333","https://openalex.org/W1985357156","https://openalex.org/W1987184442","https://openalex.org/W2019446838","https://openalex.org/W2064855361","https://openalex.org/W2285435517","https://openalex.org/W2038415430","https://openalex.org/W2013960014"],"abstract_inverted_index":{"The":[0,40,81],"electrical":[1],"resistivity":[2,64],"of":[3,26,51,55,99,105,110],"Eu-rich":[4],"EuO":[5,100],"thin":[6],"films":[7,22,101],"was":[8],"studied":[9],"at":[10,71,78],"temperatures":[11],"5\u2264T\u2264150":[12],"K":[13,57,73,89],"and":[14,62],"magnetic":[15],"fields":[16],"0\u2264H\u22645":[17],"T.":[18],"We":[19],"prepared":[20],"two":[21],"with":[23,102],"different":[24],"degrees":[25],"off-stoichiometry":[27],"using":[28],"the":[29,52,87,96,108],"method":[30],"described":[31],"previously.":[32],"[Jpn.":[33],"J.":[34],"Appl.":[35],"Phys.":[36],"35":[37],"(1996)":[38],"6052]":[39],"film":[41],"richer":[42],"in":[43,48,86],"Eu":[44],"exhibited":[45],"an":[46],"increase":[47],"Curie":[49],"temperature":[50,90],"bulk":[53],"value":[54],"70":[56],"to":[58,74],"approximately":[59],"150":[60],"K,":[61],"zero-field":[63],"decreased":[65],"from":[66],"about":[67],"100":[68,72],"\u00b5":[69,76],"\u03a9\u00b7m":[70,77],"5":[75],"20":[79],"K.":[80],"film's":[82],"magnetoresistance":[83],"exceeded":[84],"-80%":[85],"80\u201390":[88],"range.":[91],"These":[92],"results":[93],"show":[94],"that":[95],"stable":[97],"reproduction":[98],"high":[103],"levels":[104],"conductivity":[106],"without":[107],"addition":[109],"a":[111],"third":[112],"element":[113],"is":[114],"now":[115],"possible.":[116]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-10-22T18:32:59.640997","created_date":"2016-06-24T00:00:00"}