{"id":"https://openalex.org/W2051575422","doi":"https://doi.org/10.1063/1.1400093","title":"Determination of diffusion length in samples of diffusion-length size or smaller and with arbitrary top and back surface recombination velocities","display_name":"Determination of diffusion length in samples of diffusion-length size or smaller and with arbitrary top and back surface recombination velocities","publication_year":2001,"publication_date":"2001-10-01","ids":{"openalex":"https://openalex.org/W2051575422","doi":"https://doi.org/10.1063/1.1400093","mag":"2051575422"},"language":"en","primary_location":{"id":"doi:10.1063/1.1400093","doi":"https://doi.org/10.1063/1.1400093","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.1400093","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070048943","display_name":"Keung L. Luke","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I59897056","display_name":"California State University, Long Beach","ror":"https://ror.org/0080fxk18","country_code":"US","type":"education","lineage":["https://openalex.org/I59897056"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Keung L. Luke","raw_affiliation_strings":["Department of Physics and Astronomy, California State University, Long Beach, California\u200990840"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics and Astronomy, California State University, Long Beach, California\u200990840","institution_ids":["https://openalex.org/I59897056"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5070048943"],"corresponding_institution_ids":["https://openalex.org/I59897056"],"apc_list":{"value":3500,"currency":"USD","value_usd":3500},"apc_paid":null,"fwci":0.801,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.74891634,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":97},"biblio":{"volume":"90","issue":"7","first_page":"3413","last_page":"3418"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.4652999937534332,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.4652999937534332,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.17630000412464142,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.16030000150203705,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/diffusion-length","display_name":"diffusion length","score":0.9200000166893005},{"id":"https://openalex.org/keywords/electron-beam-induced-current","display_name":"electron beam induced current","score":0.9300000071525574},{"id":"https://openalex.org/keywords/surface-recombination-velocity","display_name":"surface recombination velocity","score":0.9419999718666077},{"id":"https://openalex.org/keywords/back-surface-recombination-velocity","display_name":"back surface recombination velocity","score":0.9990000128746033},{"id":"https://openalex.org/keywords/semiconductor-characterization","display_name":"semiconductor characterization","score":0.40799999237060547}],"concepts":[{"id":"https://openalex.org/C69357855","wikidata":"https://www.wikidata.org/wiki/Q163214","display_name":"Diffusion","level":2,"score":0.7847249507904053},{"id":"https://openalex.org/C156695909","wikidata":"https://www.wikidata.org/wiki/Q3373825","display_name":"Recombination","level":3,"score":0.7062191367149353},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.4786566495895386},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.46622633934020996},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.44641247391700745},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.36445632576942444},{"id":"https://openalex.org/C41999313","wikidata":"https://www.wikidata.org/wiki/Q489328","display_name":"Molecular physics","level":1,"score":0.3587167263031006},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.3216753602027893},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.308777391910553},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2679213285446167},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.2240775227546692},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.15738141536712646},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13545364141464233},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.07070055603981018},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.1400093","doi":"https://doi.org/10.1063/1.1400093","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.1400093","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W340623998","https://openalex.org/W1525449458","https://openalex.org/W1969287161","https://openalex.org/W1980872524","https://openalex.org/W1981340221","https://openalex.org/W2006407919","https://openalex.org/W2007290028","https://openalex.org/W2012672684","https://openalex.org/W2021298580","https://openalex.org/W2045572216","https://openalex.org/W2114603064","https://openalex.org/W2133206704","https://openalex.org/W3147740451","https://openalex.org/W4244808418"],"related_works":["https://openalex.org/W2059619156","https://openalex.org/W2062055213","https://openalex.org/W3035905453","https://openalex.org/W2045572216","https://openalex.org/W1984556623","https://openalex.org/W1984543247","https://openalex.org/W3029115735","https://openalex.org/W1995917089","https://openalex.org/W1987668870","https://openalex.org/W2009226639"],"abstract_inverted_index":{"Higher-quality":[0],"semiconductor":[1],"materials":[2],"and":[3,70,84,103,112,115,123],"smaller":[4],"devices":[5],"present":[6],"new":[7],"challenges":[8],"to":[9,23,57,71,75],"the":[10,27,42,59,77,82,86,90],"electron-beam-induced":[11],"current":[12],"technique":[13],"as":[14],"device":[15,93],"sizes":[16],"become":[17],"less":[18],"than":[19],"or":[20],"approximately":[21],"equal":[22],"diffusion":[24,43,87,116],"length.":[25],"Oftentimes":[26],"regions":[28],"of":[29,53,101,110,120],"interest":[30],"are":[31,96],"bounded":[32],"by":[33],"surfaces":[34],"with":[35],"arbitrary":[36],"surface":[37,98,107],"recombination":[38,99,108],"velocities.":[39],"How":[40],"can":[41,66],"length":[44,88],"in":[45,79],"such":[46],"a":[47],"region":[48],"be":[49,67],"determined?":[50],"The":[51],"aim":[52],"this":[54,64],"article":[55],"is":[56],"lay":[58],"theoretical":[60],"foundation":[61],"showing":[62],"how":[63],"determination":[65],"carried":[68],"out":[69],"provide":[72],"useful":[73],"results":[74],"guide":[76],"experimentalist":[78],"both":[80],"making":[81],"measurements":[83],"extracting":[85],"from":[89],"data.":[91],"Practical":[92],"conditions":[94],"considered":[95],"top":[97],"velocity":[100,109],"1\u00d7103":[102],"1\u00d7104":[104,111],"cm/s;":[105,114],"back":[106],"1\u00d7106":[113],"length/sample":[117],"thickness":[118],"ratios":[119],"0.5,":[121],"1.0,":[122],"2.0,":[124],"respectively.":[125]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":4},{"year":2012,"cited_by_count":1}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2016-06-24T00:00:00"}