{"id":"https://openalex.org/W2049650293","doi":"https://doi.org/10.1063/1.373788","title":"Basic properties of GaAs oxide generated by scanning probe microscope tip-induced nano-oxidation process","display_name":"Basic properties of GaAs oxide generated by scanning probe microscope tip-induced nano-oxidation process","publication_year":2000,"publication_date":"2000-07-15","ids":{"openalex":"https://openalex.org/W2049650293","doi":"https://doi.org/10.1063/1.373788","mag":"2049650293"},"language":"en","primary_location":{"id":"doi:10.1063/1.373788","doi":"https://doi.org/10.1063/1.373788","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.373788","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085847332","display_name":"Yoshitaka Okada","orcid":"https://orcid.org/0000-0002-1547-5477","observed_orcids":["https://orcid.org/0000-0002-1547-5477"]},"institutions":[{"id":"https://openalex.org/I146399215","display_name":"University of Tsukuba","ror":"https://ror.org/02956yf07","country_code":"JP","type":"education","lineage":["https://openalex.org/I146399215"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoshitaka Okada","raw_affiliation_strings":["Institute of Applied Physics, University of Tsukuba, 1-1-1 Tennodai, Tsukuba\u2009305-8573, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Applied Physics, University of Tsukuba, 1-1-1 Tennodai, Tsukuba\u2009305-8573, Japan","institution_ids":["https://openalex.org/I146399215"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082140787","display_name":"Yoshimasa Iuchi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I146399215","display_name":"University of Tsukuba","ror":"https://ror.org/02956yf07","country_code":"JP","type":"education","lineage":["https://openalex.org/I146399215"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoshimasa Iuchi","raw_affiliation_strings":["Institute of Applied Physics, University of Tsukuba, 1-1-1 Tennodai, Tsukuba\u2009305-8573, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Applied Physics, University of Tsukuba, 1-1-1 Tennodai, Tsukuba\u2009305-8573, Japan","institution_ids":["https://openalex.org/I146399215"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113589343","display_name":"Mitsuo Kawabe","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I146399215","display_name":"University of Tsukuba","ror":"https://ror.org/02956yf07","country_code":"JP","type":"education","lineage":["https://openalex.org/I146399215"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Mitsuo Kawabe","raw_affiliation_strings":["Institute of Applied Physics, University of Tsukuba, 1-1-1 Tennodai, Tsukuba\u2009305-8573, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Applied Physics, University of Tsukuba, 1-1-1 Tennodai, Tsukuba\u2009305-8573, Japan","institution_ids":["https://openalex.org/I146399215"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101893887","display_name":"J. S. Harris","orcid":"https://orcid.org/0000-0002-0857-6931","observed_orcids":["https://orcid.org/0000-0002-0857-6931","https://orcid.org/0000-0002-9272-3809"]},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James S. Harris","raw_affiliation_strings":["Department of Electrical Engineering, Stanford University, Stanford, California\u200994305"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Stanford University, Stanford, California\u200994305","institution_ids":["https://openalex.org/I97018004"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3500,"currency":"USD","value_usd":3500},"apc_paid":null,"fwci":2.9591,"has_fulltext":false,"cited_by_count":38,"citation_normalized_percentile":{"value":0.89777762,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":95},"biblio":{"volume":"88","issue":"2","first_page":"1136","last_page":"1140"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.7567999958992004,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.7567999958992004,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12224","display_name":"Nanofabrication and Lithography Techniques","score":0.06909999996423721,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.04749999940395355,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nano-oxidation","display_name":"nano-oxidation","score":0.7649999856948853},{"id":"https://openalex.org/keywords/ga2o3","display_name":"gallium oxide","score":0.8489999771118164},{"id":"https://openalex.org/keywords/arsenic-trioxide","display_name":"arsenic trioxide","score":0.9990000128746033},{"id":"https://openalex.org/keywords/fowler-nordheim-tunneling","display_name":"Fowler-Nordheim tunneling","score":0.9110000133514404},{"id":"https://openalex.org/keywords/electron-transport","display_name":"electron transport","score":0.8489999771118164},{"id":"https://openalex.org/keywords/thermal-stability","display_name":"thermal stability","score":0.7889999747276306}],"concepts":[{"id":"https://openalex.org/C66344492","wikidata":"https://www.wikidata.org/wiki/Q6964032","display_name":"Nanodot","level":2,"score":0.8469604253768921},{"id":"https://openalex.org/C175708663","wikidata":"https://www.wikidata.org/wiki/Q899559","display_name":"X-ray photoelectron spectroscopy","level":2,"score":0.7066779136657715},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.6953253149986267},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.651130199432373},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6449257731437683},{"id":"https://openalex.org/C6518042","wikidata":"https://www.wikidata.org/wiki/Q175646","display_name":"Scanning tunneling microscope","level":2,"score":0.6341093182563782},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.5365379452705383},{"id":"https://openalex.org/C125206250","wikidata":"https://www.wikidata.org/wiki/Q2365355","display_name":"Microprobe","level":2,"score":0.5212576985359192},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.5063589811325073},{"id":"https://openalex.org/C2779281663","wikidata":"https://www.wikidata.org/wiki/Q1549368","display_name":"Thermal oxidation","level":3,"score":0.4416946470737457},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.41954877972602844},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.32087451219558716},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.24990567564964294},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.18816235661506653},{"id":"https://openalex.org/C199289684","wikidata":"https://www.wikidata.org/wiki/Q83353","display_name":"Mineralogy","level":1,"score":0.12931901216506958},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.07198470830917358},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.373788","doi":"https://doi.org/10.1063/1.373788","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.373788","pdf_url":null,"source":{"id":"https://openalex.org/S187991544","display_name":"Journal of Applied Physics","issn_l":"0021-8979","issn":["0021-8979","1089-7550","1520-8850"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-d","jufo-1","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Applied Physics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1972280997","https://openalex.org/W1980584607","https://openalex.org/W1987043183","https://openalex.org/W1996816963","https://openalex.org/W1998541708","https://openalex.org/W1999681405","https://openalex.org/W2010132176","https://openalex.org/W2014199868","https://openalex.org/W2017646543","https://openalex.org/W2018063219","https://openalex.org/W2025221226","https://openalex.org/W2029760606","https://openalex.org/W2033606951","https://openalex.org/W2034216536","https://openalex.org/W2054120706","https://openalex.org/W2082356743","https://openalex.org/W2083955641","https://openalex.org/W2088643608","https://openalex.org/W2091020334","https://openalex.org/W2092221256","https://openalex.org/W2147300494"],"related_works":["https://openalex.org/W2092221256","https://openalex.org/W2164204569","https://openalex.org/W2016964264","https://openalex.org/W6983616268","https://openalex.org/W7098968768","https://openalex.org/W2033606951","https://openalex.org/W2013888591","https://openalex.org/W2076900031","https://openalex.org/W1975381622","https://openalex.org/W1973279345"],"abstract_inverted_index":{"The":[0,18,51],"basic":[1],"properties":[2],"of":[3,21,40,64,85],"GaAs":[4,25,41,61,91],"oxide":[5,26,43,62,92],"generated":[6],"by":[7,29],"atomic":[8],"force":[9],"microscope":[10],"(AFM)":[11],"tip-induced":[12],"nano-oxidation":[13],"process":[14],"have":[15],"been":[16],"investigated.":[17],"chemical":[19],"analysis":[20],"the":[22,37,56,74,78,89],"AFM":[23],"tip-generated":[24,90],"was":[27,105],"performed":[28],"using":[30],"scanning":[31],"microprobe":[32],"x-ray":[33],"photoelectron":[34],"spectroscopy,":[35],"and":[36,49],"main":[38],"constituents":[39],"anodic":[42],"were":[44,94],"determined":[45],"to":[46,96],"be":[47],"Ga2O3":[48],"As2O3.":[50],"electrical":[52],"characterization":[53],"showed":[54],"that":[55],"electron":[57],"transport":[58],"across":[59],"a":[60,69,83],"nanodot":[63],"\u223c5.7":[65],"nm":[66],"thickness,":[67],"from":[68],"doped":[70],"n+-Si":[71],"tip":[72],"into":[73],"n+-GaAs":[75],"substrate":[76],"follows":[77],"Fowler\u2013Nordheim":[79],"tunneling":[80],"mechanism":[81],"over":[82],"range":[84],"applied":[86],"bias.":[87],"Further,":[88],"nanodots":[93],"found":[95],"withstand":[97],"moderate":[98],"thermal":[99],"treatments,":[100],"but":[101],"some":[102],"volume":[103],"reduction":[104],"observed.":[106]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-11-10T11:39:43.021295","created_date":"2016-06-24T00:00:00"}