{"id":"https://openalex.org/W2049580696","doi":"https://doi.org/10.1116/1.3272732","title":"640 \u00d7 480 pixel active-matrix Spindt-type field emitter array image sensor with high-gain avalanche rushing amorphous photoconductor target","display_name":"640 \u00d7 480 pixel active-matrix Spindt-type field emitter array image sensor with high-gain avalanche rushing amorphous photoconductor target","publication_year":2010,"publication_date":"2010-01-01","ids":{"openalex":"https://openalex.org/W2049580696","doi":"https://doi.org/10.1116/1.3272732","mag":"2049580696"},"language":"en","primary_location":{"id":"doi:10.1116/1.3272732","doi":"https://doi.org/10.1116/1.3272732","is_oa":false,"landing_page_url":"https://doi.org/10.1116/1.3272732","pdf_url":null,"source":{"id":"https://openalex.org/S4210235835","display_name":"Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena","issn_l":"2166-2746","issn":["2166-2746","2166-2754"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083956431","display_name":"Masakazu Nanba","orcid":"https://orcid.org/0009-0003-2011-868X","observed_orcids":["https://orcid.org/0009-0003-2011-868X"]},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]},{"id":"https://openalex.org/I4210107548","display_name":"Japan Broadcasting Corporation (Japan)","ror":"https://ror.org/01s8tz949","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210107548"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Nanba","raw_affiliation_strings":["NHK Science & Technology Research Laboratories , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan and Graduate School of Science and Technology, , 3-5-1 Johoku, Naka-ku, Hamamatsu-shi, Shizuoka 432-8011, Japan","Shizuoka University , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan and Graduate School of Science and Technology, , 3-5-1 Johoku, Naka-ku, Hamamatsu-shi, Shizuoka 432-8011, Japan","NHK Science & Technology Research Laboratories , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan and Graduate School of Science and Technology, , 3-5-1 Johoku, Naka-ku, Hamamatsu-shi, Shizuoka 432-8011, Japan; Shizuoka University , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan and Graduate School of Science and Technology, , 3-5-1 Johoku, Naka-ku, Hamamatsu-shi, Shizuoka 432-8011, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NHK Science & Technology Research Laboratories , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan and Graduate School of Science and Technology, , 3-5-1 Johoku, Naka-ku, Hamamatsu-shi, Shizuoka 432-8011, Japan","institution_ids":["https://openalex.org/I4210107548"]},{"raw_affiliation_string":"Shizuoka University , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan and Graduate School of Science and Technology, , 3-5-1 Johoku, Naka-ku, Hamamatsu-shi, Shizuoka 432-8011, Japan","institution_ids":["https://openalex.org/I1298590031"]},{"raw_affiliation_string":"NHK Science & Technology Research Laboratories , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan and Graduate School of Science and Technology, , 3-5-1 Johoku, Naka-ku, Hamamatsu-shi, Shizuoka 432-8011, Japan; Shizuoka University , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan and Graduate School of Science and Technology, , 3-5-1 Johoku, Naka-ku, Hamamatsu-shi, Shizuoka 432-8011, Japan","institution_ids":["https://openalex.org/I1298590031","https://openalex.org/I4210107548"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102879192","display_name":"Yu Takiguchi","orcid":"https://orcid.org/0000-0002-5807-9183","observed_orcids":["https://orcid.org/0000-0002-5807-9183"]},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]},{"id":"https://openalex.org/I4210107548","display_name":"Japan Broadcasting Corporation (Japan)","ror":"https://ror.org/01s8tz949","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210107548"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Takiguchi","raw_affiliation_strings":["NHK Science & Technology Research Laboratories , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan and Graduate School of Science and Technology, , 3-5-1 Johoku, Naka-ku, Hamamatsu-shi, Shizuoka 432-8011, Japan","Shizuoka University , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan and Graduate School of Science and Technology, , 3-5-1 Johoku, Naka-ku, Hamamatsu-shi, Shizuoka 432-8011, Japan","NHK Science & Technology Research Laboratories , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan and Graduate School of Science and Technology, , 3-5-1 Johoku, Naka-ku, Hamamatsu-shi, Shizuoka 432-8011, Japan; Shizuoka University , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan and Graduate School of Science and Technology, , 3-5-1 Johoku, Naka-ku, Hamamatsu-shi, Shizuoka 432-8011, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NHK Science & Technology Research Laboratories , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan and Graduate School of Science and Technology, , 3-5-1 Johoku, Naka-ku, Hamamatsu-shi, Shizuoka 432-8011, Japan","institution_ids":["https://openalex.org/I4210107548"]},{"raw_affiliation_string":"Shizuoka University , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan and Graduate School of Science and Technology, , 3-5-1 Johoku, Naka-ku, Hamamatsu-shi, Shizuoka 432-8011, Japan","institution_ids":["https://openalex.org/I1298590031"]},{"raw_affiliation_string":"NHK Science & Technology Research Laboratories , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan and Graduate School of Science and Technology, , 3-5-1 Johoku, Naka-ku, Hamamatsu-shi, Shizuoka 432-8011, Japan; Shizuoka University , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan and Graduate School of Science and Technology, , 3-5-1 Johoku, Naka-ku, Hamamatsu-shi, Shizuoka 432-8011, Japan","institution_ids":["https://openalex.org/I1298590031","https://openalex.org/I4210107548"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101771256","display_name":"Yuki Honda","orcid":"https://orcid.org/0000-0001-9405-8382","observed_orcids":["https://orcid.org/0000-0001-9405-8382"]},"institutions":[{"id":"https://openalex.org/I4210107548","display_name":"Japan Broadcasting Corporation (Japan)","ror":"https://ror.org/01s8tz949","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210107548"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Honda","raw_affiliation_strings":["NHK Science & Technology Research Laboratories , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NHK Science & Technology Research Laboratories , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan","institution_ids":["https://openalex.org/I4210107548"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013552926","display_name":"Yoshiyuki Hirano","orcid":"https://orcid.org/0000-0003-3844-3061","observed_orcids":["https://orcid.org/0000-0003-3844-3061"]},"institutions":[{"id":"https://openalex.org/I4210107548","display_name":"Japan Broadcasting Corporation (Japan)","ror":"https://ror.org/01s8tz949","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210107548"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Hirano","raw_affiliation_strings":["NHK Science & Technology Research Laboratories , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NHK Science & Technology Research Laboratories , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan","institution_ids":["https://openalex.org/I4210107548"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111503154","display_name":"Toshihisa Watabe","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210107548","display_name":"Japan Broadcasting Corporation (Japan)","ror":"https://ror.org/01s8tz949","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210107548"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Watabe","raw_affiliation_strings":["NHK Science & Technology Research Laboratories , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NHK Science & Technology Research Laboratories , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan","institution_ids":["https://openalex.org/I4210107548"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113562502","display_name":"N. Egami","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210107548","display_name":"Japan Broadcasting Corporation (Japan)","ror":"https://ror.org/01s8tz949","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210107548"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"N. Egami","raw_affiliation_strings":["NHK Science & Technology Research Laboratories , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NHK Science & Technology Research Laboratories , 1-10-11 Kinuta, Setagaya-ku, Tokyo 157-8510, Japan","institution_ids":["https://openalex.org/I4210107548"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035311066","display_name":"Kenta Miya","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I88302906","display_name":"Futaba (Japan)","ror":"https://ror.org/03b6zzt23","country_code":"JP","type":"company","lineage":["https://openalex.org/I88302906"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Miya","raw_affiliation_strings":["Futaba Corporation , 1080 Yabutsuka, Chosei-mura, Chosei-gun, Chiba 229-4395, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Futaba Corporation , 1080 Yabutsuka, Chosei-mura, Chosei-gun, Chiba 229-4395, Japan","institution_ids":["https://openalex.org/I88302906"]}]},{"author_position":"middle","author":{"id":null,"display_name":"K. Nakamura","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I88302906","display_name":"Futaba (Japan)","ror":"https://ror.org/03b6zzt23","country_code":"JP","type":"company","lineage":["https://openalex.org/I88302906"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Nakamura","raw_affiliation_strings":["Futaba Corporation , 1080 Yabutsuka, Chosei-mura, Chosei-gun, Chiba 229-4395, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Futaba Corporation , 1080 Yabutsuka, Chosei-mura, Chosei-gun, Chiba 229-4395, Japan","institution_ids":["https://openalex.org/I88302906"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014989322","display_name":"Masateru Taniguchi","orcid":"https://orcid.org/0000-0002-0338-8755","observed_orcids":["https://orcid.org/0000-0002-0338-8755"]},"institutions":[{"id":"https://openalex.org/I88302906","display_name":"Futaba (Japan)","ror":"https://ror.org/03b6zzt23","country_code":"JP","type":"company","lineage":["https://openalex.org/I88302906"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Taniguchi","raw_affiliation_strings":["Futaba Corporation , 1080 Yabutsuka, Chosei-mura, Chosei-gun, Chiba 229-4395, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Futaba Corporation , 1080 Yabutsuka, Chosei-mura, Chosei-gun, Chiba 229-4395, Japan","institution_ids":["https://openalex.org/I88302906"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112448874","display_name":"S. Itoh","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I88302906","display_name":"Futaba (Japan)","ror":"https://ror.org/03b6zzt23","country_code":"JP","type":"company","lineage":["https://openalex.org/I88302906"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Itoh","raw_affiliation_strings":["Futaba Corporation , 1080 Yabutsuka, Chosei-mura, Chosei-gun, Chiba 229-4395, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Futaba Corporation , 1080 Yabutsuka, Chosei-mura, Chosei-gun, Chiba 229-4395, Japan","institution_ids":["https://openalex.org/I88302906"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049582015","display_name":"Akira Kobayashi","orcid":"https://orcid.org/0000-0001-9727-1218","observed_orcids":["https://orcid.org/0000-0001-9727-1218"]},"institutions":[{"id":"https://openalex.org/I150993360","display_name":"Hamamatsu Photonics (Japan)","ror":"https://ror.org/03natb733","country_code":"JP","type":"company","lineage":["https://openalex.org/I150993360"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"A. Kobayashi","raw_affiliation_strings":["Hamamatsu Photonics K.K. Electron Tube Division, , 314-5, Shimokanzo, Iwata-shi, Shizuoka 438-0193 Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hamamatsu Photonics K.K. Electron Tube Division, , 314-5, Shimokanzo, Iwata-shi, Shizuoka 438-0193 Japan","institution_ids":["https://openalex.org/I150993360"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.7154,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":{"value":0.84651005,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":98},"biblio":{"volume":"28","issue":"1","first_page":"96","last_page":"103"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.7954000234603882,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.7954000234603882,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13418","display_name":"Photocathodes and Microchannel Plates","score":0.17239999771118164,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11175","display_name":"Gyrotron and Vacuum Electronics Research","score":0.007300000172108412,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-emitter-arrays","display_name":"field emitter arrays","score":0.9079999923706055},{"id":"https://openalex.org/keywords/electron-focusing","display_name":"electron focusing","score":0.6370000243186951},{"id":"https://openalex.org/keywords/magnetic-focusing","display_name":"magnetic focusing","score":0.5730000138282776},{"id":"https://openalex.org/keywords/scanning-circuit","display_name":"scanning circuit","score":0.5559999942779541}],"concepts":[{"id":"https://openalex.org/C2778347521","wikidata":"https://www.wikidata.org/wiki/Q5446995","display_name":"Field emitter array","level":4,"score":0.9221466779708862},{"id":"https://openalex.org/C2776030095","wikidata":"https://www.wikidata.org/wiki/Q5628954","display_name":"HARP","level":2,"score":0.7487455606460571},{"id":"https://openalex.org/C46918542","wikidata":"https://www.wikidata.org/wiki/Q1648344","display_name":"Common emitter","level":2,"score":0.720982015132904},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.6952899694442749},{"id":"https://openalex.org/C70201059","wikidata":"https://www.wikidata.org/wiki/Q3142195","display_name":"Active matrix","level":4,"score":0.6928530931472778},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.6585599184036255},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5959053039550781},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.562444806098938},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5512800216674805},{"id":"https://openalex.org/C155512908","wikidata":"https://www.wikidata.org/wiki/Q210745","display_name":"CMOS sensor","level":3,"score":0.47745779156684875},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.44066646695137024},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4381488561630249},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4117288589477539},{"id":"https://openalex.org/C121029787","wikidata":"https://www.wikidata.org/wiki/Q902877","display_name":"Field electron emission","level":3,"score":0.344216525554657},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.3195425868034363},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.2589995265007019},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.25674575567245483},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25322261452674866},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.16668957471847534},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.13240334391593933},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11120292544364929},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1116/1.3272732","doi":"https://doi.org/10.1116/1.3272732","is_oa":false,"landing_page_url":"https://doi.org/10.1116/1.3272732","pdf_url":null,"source":{"id":"https://openalex.org/S4210235835","display_name":"Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena","issn_l":"2166-2746","issn":["2166-2746","2166-2754"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W614283203","https://openalex.org/W1965019034","https://openalex.org/W1986076936","https://openalex.org/W1994016717","https://openalex.org/W2026274796","https://openalex.org/W2068787064","https://openalex.org/W2109367047","https://openalex.org/W2161606023"],"related_works":["https://openalex.org/W2059368024","https://openalex.org/W2031476079","https://openalex.org/W2345301606","https://openalex.org/W2578231360","https://openalex.org/W2323678418","https://openalex.org/W1994016717","https://openalex.org/W2322351497","https://openalex.org/W2085736943","https://openalex.org/W1912415628","https://openalex.org/W1985339088"],"abstract_inverted_index":{"A":[0],"640\u00d7480":[1],"pixel":[2,75],"field":[3],"emitter":[4],"array":[5],"(FEA)":[6],"image":[7,31],"sensor":[8,69],"with":[9,45],"a":[10,23,49,57],"high-gain":[11],"avalanche":[12],"rushing":[13],"amorphous":[14],"photoconductor":[15],"(HARP)":[16],"target":[17,59],"was":[18,60],"fabricated":[19],"and":[20,48,56,77],"tested":[21],"as":[22],"step":[24],"toward":[25],"the":[26,67,82,86,92],"development":[27],"of":[28],"ultrahigh-sensitivity":[29],"compact":[30],"sensors":[32],"for":[33,73],"high-definition":[34],"television":[35],"cameras.":[36],"For":[37],"this":[38],"sensor,":[39],"an":[40],"active-matrix":[41,87],"Spindt-type":[42],"FEA":[43,88],"integrated":[44],"scanning":[46],"circuits":[47],"magnetic":[50],"electron":[51],"focusing":[52],"system":[53],"were":[54],"designed,":[55],"15-\u03bcm-thick-HARP":[58],"used.":[61],"The":[62],"experimental":[63],"results":[64],"revealed":[65],"that":[66],"prototype":[68],"had":[70],"enough":[71],"resolution":[72],"its":[74],"number":[76],"high":[78],"sensitivity":[79],"due":[80],"to":[81],"electrons":[83],"emitted":[84],"from":[85],"being":[89],"focused":[90],"onto":[91],"HARP":[93],"target.":[94]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2016-06-24T00:00:00"}