{"id":"https://openalex.org/W2049290232","doi":"https://doi.org/10.1051/jphyscol:19786548","title":"PROXIMITY EFFECT TUNNEL JUNCTIONS WITH BARRIERS FORMED FROM AMORPHOUS ALLOYS","display_name":"PROXIMITY EFFECT TUNNEL JUNCTIONS WITH BARRIERS FORMED FROM AMORPHOUS ALLOYS","publication_year":1978,"publication_date":"1978-08-01","ids":{"openalex":"https://openalex.org/W2049290232","doi":"https://doi.org/10.1051/jphyscol:19786548","mag":"2049290232"},"language":"en","primary_location":{"id":"doi:10.1051/jphyscol:19786548","doi":"https://doi.org/10.1051/jphyscol:19786548","is_oa":false,"landing_page_url":"https://doi.org/10.1051/jphyscol:19786548","pdf_url":null,"source":{"id":"https://openalex.org/S4210215636","display_name":"Le Journal de Physique Colloques","issn_l":"0449-1947","issn":["0449-1947","2777-3418"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319748","host_organization_name":"EDP Sciences","host_organization_lineage":["https://openalex.org/P4310319748","https://openalex.org/P4310319982"],"host_organization_lineage_names":["EDP Sciences","Science Press"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Le Journal de Physique Colloques","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal.science/jpa-00218036","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045848689","display_name":"Robert B. Laibowitz","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. B. Laibowitz","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018759995","display_name":"Chang C. Tsuei","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C. C. Tsuei","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110705520","display_name":"P. K. Chaudhari","orcid":"https://orcid.org/0000-0002-0813-5554","observed_orcids":["https://orcid.org/0000-0002-0813-5554"]},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. Chaudhari","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082432484","display_name":"Stanley I. Raider","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. I. Raider","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110231566","display_name":"R.E. Drake","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Drake","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074228340","display_name":"J. M. Viggiano","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. M. Viggiano","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598, USA","institution_ids":["https://openalex.org/I4210114115"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210114115"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.26928934,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"39","issue":"C6","first_page":"C6","last_page":"1240"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","score":0.36329999566078186,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","score":0.36329999566078186,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10037","display_name":"Physics of Superconductivity and Magnetism","score":0.33719998598098755,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13531","display_name":"Surface and Thin Film Phenomena","score":0.18400000035762787,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/proximity-effect","display_name":"proximity effect","score":0.9240000247955322},{"id":"https://openalex.org/keywords/tunnel-junctions","display_name":"tunnel junctions","score":0.9679999947547913},{"id":"https://openalex.org/keywords/amorphous-alloys","display_name":"amorphous alloys","score":0.9399999976158142},{"id":"https://openalex.org/keywords/nb-si-alloys","display_name":"Nb-Si alloys","score":0.8190000057220459},{"id":"https://openalex.org/keywords/nb-al-alloys","display_name":"Nb-Al alloys","score":0.9990000128746033},{"id":"https://openalex.org/keywords/niobium","display_name":"niobium","score":0.5709999799728394},{"id":"https://openalex.org/keywords/junction-capacitance","display_name":"junction capacitance","score":0.7229999899864197},{"id":"https://openalex.org/keywords/excess-current","display_name":"excess current","score":0.7689999938011169},{"id":"https://openalex.org/keywords/superconducting-tunnel-junctions","display_name":"superconducting tunnel junctions","score":0.703000009059906}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5785214304924011},{"id":"https://openalex.org/C56052488","wikidata":"https://www.wikidata.org/wiki/Q103382","display_name":"Amorphous solid","level":2,"score":0.4729190468788147},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.37744027376174927},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.3472071886062622},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19803646206855774},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.19191116094589233},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.17371132969856262}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1051/jphyscol:19786548","doi":"https://doi.org/10.1051/jphyscol:19786548","is_oa":false,"landing_page_url":"https://doi.org/10.1051/jphyscol:19786548","pdf_url":null,"source":{"id":"https://openalex.org/S4210215636","display_name":"Le Journal de Physique Colloques","issn_l":"0449-1947","issn":["0449-1947","2777-3418"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319748","host_organization_name":"EDP Sciences","host_organization_lineage":["https://openalex.org/P4310319748","https://openalex.org/P4310319982"],"host_organization_lineage_names":["EDP Sciences","Science Press"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Le Journal de Physique Colloques","raw_type":"journal-article"},{"id":"pmh:oai:edpsciences.org:dkey/10.1051/jphyscol:19786548","doi":null,"is_oa":false,"landing_page_url":"https://jphyscol.journaldephysique.org/10.1051/jphyscol:19786548/pdf","pdf_url":"https://jphyscol.journaldephysique.org/10.1051/jphyscol:19786548/pdf","source":{"id":"https://openalex.org/S4306400744","display_name":"Springer Link (Chiba Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I8488066","host_organization_name":"Chiba Institute of Technology","host_organization_lineage":["https://openalex.org/I8488066"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"https://doi.org/10.1051/jphyscol:19786548","raw_type":"Text"},{"id":"pmh:oai:HAL:jpa-00218036v1","doi":null,"is_oa":true,"landing_page_url":"https://hal.science/jpa-00218036","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal de Physique Colloques, 1978, 39 (C6), pp.C6-1240-C6-1242. ⟨10.1051/jphyscol:19786548⟩","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:HAL:jpa-00218036v1","doi":null,"is_oa":true,"landing_page_url":"https://hal.science/jpa-00218036","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal de Physique Colloques, 1978, 39 (C6), pp.C6-1240-C6-1242. ⟨10.1051/jphyscol:19786548⟩","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2073038073","https://openalex.org/W2046303878","https://openalex.org/W2072597364","https://openalex.org/W2058473824","https://openalex.org/W2009251987","https://openalex.org/W2031222678","https://openalex.org/W1998989754","https://openalex.org/W2008603015","https://openalex.org/W2071549238","https://openalex.org/W2141735868"],"abstract_inverted_index":{"Nous":[0],"avons":[1],"fabriqu\u00e9":[2],"des":[3],"jonctions":[4,28],"tunnel":[5],"multi-r\u00e9seaux":[6],"dans":[7],"lesquelles":[8],"l'\u00e9lectrode":[9],"de":[10,16,19,25,39,50],"base":[11],"est":[12],"un":[13],"alliage":[14],"amorphe":[15],"Nb-Si":[17],"ou":[18],"Nb-Al":[20],"d\u00e9pos\u00e9":[21],"sur":[22],"une":[23,30],"surface":[24],"niobium":[26,40],"Ces":[27],"ont":[29],"capacitance":[31],"plus":[32],"faible":[33],"que":[34,49],"celles":[35],"fabriqu\u00e9es":[36],"\u00e0":[37],"partir":[38],"pur.":[41],"De":[42],"plus,":[43],"en-dessous":[44],"du":[45],"gap,":[46],"nous":[47],"n'observons":[48],"tr\u00e8s":[51],"faibles":[52],"courants":[53],"d'exc\u00e8s.":[54]},"counts_by_year":[],"updated_date":"2026-11-08T12:12:28.789561","created_date":"2016-06-24T00:00:00"}