{"id":"https://openalex.org/W2048675609","doi":"https://doi.org/10.1016/0040-6090(90)90270-n","title":"Calculation of semiconductor band bending due to a superficial zone including electronic states: Application to Schottky diodes","display_name":"Calculation of semiconductor band bending due to a superficial zone including electronic states: Application to Schottky diodes","publication_year":1990,"publication_date":"1990-10-01","ids":{"openalex":"https://openalex.org/W2048675609","doi":"https://doi.org/10.1016/0040-6090(90)90270-n","mag":"2048675609"},"language":"en","primary_location":{"id":"doi:10.1016/0040-6090(90)90270-n","doi":"https://doi.org/10.1016/0040-6090(90)90270-n","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0040-6090(90)90270-n","pdf_url":null,"source":{"id":"https://openalex.org/S84339699","display_name":"Thin Solid Films","issn_l":"0040-6090","issn":["0040-6090","1879-2731"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thin Solid Films","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112226433","display_name":"J.M. Palau","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4387154756","display_name":"Universit\u00e9 Montpellier 2","ror":"https://ror.org/00wh4bp03","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307","https://openalex.org/I4387154756"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"J.M. Palau","raw_affiliation_strings":["Laboratoire d'Etude des Surfaces, Interfaces et Composants (UA CNRS D07870), CP 088, Universit\u00e9 de Montpellier II, Sciences et Techniques du Languedoc, place Eug\u00e8ne Bataillon, 34095 Montpellier Cedex 2 France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratoire d'Etude des Surfaces, Interfaces et Composants (UA CNRS D07870), CP 088, Universit\u00e9 de Montpellier II, Sciences et Techniques du Languedoc, place Eug\u00e8ne Bataillon, 34095 Montpellier Cedex 2 France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4387154756"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110009864","display_name":"Michel Dumas","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4387154756","display_name":"Universit\u00e9 Montpellier 2","ror":"https://ror.org/00wh4bp03","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307","https://openalex.org/I4387154756"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"M. Dumas","raw_affiliation_strings":["Laboratoire d'Etude des Surfaces, Interfaces et Composants (UA CNRS D07870), CP 088, Universit\u00e9 de Montpellier II, Sciences et Techniques du Languedoc, place Eug\u00e8ne Bataillon, 34095 Montpellier Cedex 2 France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratoire d'Etude des Surfaces, Interfaces et Composants (UA CNRS D07870), CP 088, Universit\u00e9 de Montpellier II, Sciences et Techniques du Languedoc, place Eug\u00e8ne Bataillon, 34095 Montpellier Cedex 2 France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4387154756"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3120,"currency":"USD","value_usd":3120},"apc_paid":null,"fwci":0.5561,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.55504305,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":96},"biblio":{"volume":"191","issue":"1","first_page":"21","last_page":"30"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13531","display_name":"Surface and Thin Film Phenomena","score":0.002099999925121665,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/surface-states","display_name":"surface states","score":0.7260000109672546},{"id":"https://openalex.org/keywords/schottky-diodes","display_name":"Schottky diodes","score":0.8849999904632568},{"id":"https://openalex.org/keywords/schottky-barrier","display_name":"Schottky barrier","score":0.8149999976158142},{"id":"https://openalex.org/keywords/metal-semiconductor-interface","display_name":"metal-semiconductor interface","score":0.8410000205039978},{"id":"https://openalex.org/keywords/penetration-depth","display_name":"penetration depth","score":0.7319999933242798},{"id":"https://openalex.org/keywords/metal-work-function","display_name":"metal work function","score":0.6259999871253967}],"concepts":[{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.8278833627700806},{"id":"https://openalex.org/C19181183","wikidata":"https://www.wikidata.org/wiki/Q4854235","display_name":"Band bending","level":2,"score":0.7759371995925903},{"id":"https://openalex.org/C16115445","wikidata":"https://www.wikidata.org/wiki/Q2391942","display_name":"Schottky barrier","level":3,"score":0.7378054857254028},{"id":"https://openalex.org/C205200001","wikidata":"https://www.wikidata.org/wiki/Q176066","display_name":"Schottky diode","level":3,"score":0.6853106021881104},{"id":"https://openalex.org/C79689650","wikidata":"https://www.wikidata.org/wiki/Q2387099","display_name":"Surface states","level":3,"score":0.5769612193107605},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.4765080511569977},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.47194617986679077},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.4529333710670471},{"id":"https://openalex.org/C193493375","wikidata":"https://www.wikidata.org/wiki/Q1306232","display_name":"Penetration depth","level":2,"score":0.4450744390487671},{"id":"https://openalex.org/C5667319","wikidata":"https://www.wikidata.org/wiki/Q1924839","display_name":"Metal\u2013semiconductor junction","level":4,"score":0.42079344391822815},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.41720470786094666},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.2753913402557373},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2147863209247589},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1996157467365265},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.14511853456497192},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0702136754989624}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0040-6090(90)90270-n","doi":"https://doi.org/10.1016/0040-6090(90)90270-n","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0040-6090(90)90270-n","pdf_url":null,"source":{"id":"https://openalex.org/S84339699","display_name":"Thin Solid Films","issn_l":"0040-6090","issn":["0040-6090","1879-2731"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thin Solid Films","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":43,"referenced_works":["https://openalex.org/W1966201462","https://openalex.org/W1982683074","https://openalex.org/W1984171780","https://openalex.org/W1991239646","https://openalex.org/W1998413223","https://openalex.org/W2000264963","https://openalex.org/W2003145439","https://openalex.org/W2005715793","https://openalex.org/W2007566610","https://openalex.org/W2009736808","https://openalex.org/W2010611564","https://openalex.org/W2015589472","https://openalex.org/W2016352668","https://openalex.org/W2016665574","https://openalex.org/W2018374841","https://openalex.org/W2029351639","https://openalex.org/W2029526589","https://openalex.org/W2031766713","https://openalex.org/W2037177433","https://openalex.org/W2042029649","https://openalex.org/W2052602322","https://openalex.org/W2052604782","https://openalex.org/W2054569179","https://openalex.org/W2057190878","https://openalex.org/W2057665591","https://openalex.org/W2058056952","https://openalex.org/W2063343185","https://openalex.org/W2065511708","https://openalex.org/W2065858459","https://openalex.org/W2068775036","https://openalex.org/W2069934397","https://openalex.org/W2072609871","https://openalex.org/W2081025036","https://openalex.org/W2081523206","https://openalex.org/W2083603520","https://openalex.org/W2085435307","https://openalex.org/W2087138857","https://openalex.org/W2091457354","https://openalex.org/W2094213722","https://openalex.org/W2105558388","https://openalex.org/W3021238137","https://openalex.org/W3189290307","https://openalex.org/W6671464395"],"related_works":["https://openalex.org/W2037342669","https://openalex.org/W2043422819","https://openalex.org/W6922455660","https://openalex.org/W2038985397","https://openalex.org/W2010611564","https://openalex.org/W60573583","https://openalex.org/W2016731780","https://openalex.org/W1964939731","https://openalex.org/W2010139815","https://openalex.org/W2051834232"],"abstract_inverted_index":null,"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":2}],"updated_date":"2026-10-27T15:51:10.671819","created_date":"2016-06-24T00:00:00"}