{"id":"https://openalex.org/W2044927232","doi":"https://doi.org/10.1117/12.559917","title":"Progress of multicolor single detector to detector array development for remote sensing","display_name":"Progress of multicolor single detector to detector array development for remote sensing","publication_year":2004,"publication_date":"2004-11-04","ids":{"openalex":"https://openalex.org/W2044927232","doi":"https://doi.org/10.1117/12.559917","mag":"2044927232"},"language":"en","primary_location":{"id":"doi:10.1117/12.559917","doi":"https://doi.org/10.1117/12.559917","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.559917","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://ntrs.nasa.gov/api/citations/20040110960/downloads/20040110960.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113941977","display_name":"M. N. Abedin","orcid":"https://orcid.org/0009-0005-5858-180X","observed_orcids":["https://orcid.org/0009-0005-5858-180X"]},"institutions":[{"id":"https://openalex.org/I1319063186","display_name":"Langley Research Center","ror":"https://ror.org/0399mhs52","country_code":"US","type":"facility","lineage":["https://openalex.org/I1319063186","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Nurul Abedin","raw_affiliation_strings":["NASA Langley Research Ctr. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NASA Langley Research Ctr. (United States)","institution_ids":["https://openalex.org/I1319063186"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039540147","display_name":"Tamer F. Refaat","orcid":"https://orcid.org/0000-0001-8032-5806","observed_orcids":["https://orcid.org/0000-0001-8032-5806"]},"institutions":[{"id":"https://openalex.org/I4210159476","display_name":"Science and Technology Corporation (United States)","ror":"https://ror.org/05pw5zy84","country_code":"US","type":"company","lineage":["https://openalex.org/I4210159476"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tamer F. Refaat","raw_affiliation_strings":["Science and Technology Corp. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Science and Technology Corp. (United States)","institution_ids":["https://openalex.org/I4210159476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109084929","display_name":"Ishwara B. Bhat","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I165799507","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94","country_code":"US","type":"education","lineage":["https://openalex.org/I165799507"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ishwara B. Bhat","raw_affiliation_strings":["Rensselaer Polytechnic Institute, United States"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rensselaer Polytechnic Institute, United States","institution_ids":["https://openalex.org/I165799507"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109928407","display_name":"Yegao Xiao","orcid":"https://orcid.org/0009-0001-9842-2484","observed_orcids":["https://orcid.org/0009-0001-9842-2484"]},"institutions":[{"id":"https://openalex.org/I165799507","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94","country_code":"US","type":"education","lineage":["https://openalex.org/I165799507"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yegao Xiao","raw_affiliation_strings":["Rensselaer Polytechnic Institute, United States"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rensselaer Polytechnic Institute, United States","institution_ids":["https://openalex.org/I165799507"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086772702","display_name":"Sumith V. Bandara","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1334627681","display_name":"Jet Propulsion Laboratory","ror":"https://ror.org/027k65916","country_code":"US","type":"facility","lineage":["https://openalex.org/I122411786","https://openalex.org/I1334627681","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sumith V. Bandara","raw_affiliation_strings":["Jet Propulsion Lab. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jet Propulsion Lab. (United States)","institution_ids":["https://openalex.org/I1334627681"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029769998","display_name":"Sarath D. Gunapala","orcid":"https://orcid.org/0000-0001-8107-1051","observed_orcids":["https://orcid.org/0000-0001-8107-1051"]},"institutions":[{"id":"https://openalex.org/I1334627681","display_name":"Jet Propulsion Laboratory","ror":"https://ror.org/027k65916","country_code":"US","type":"facility","lineage":["https://openalex.org/I122411786","https://openalex.org/I1334627681","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sarath D. Gunapala","raw_affiliation_strings":["Jet Propulsion Lab. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jet Propulsion Lab. (United States)","institution_ids":["https://openalex.org/I1334627681"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.2452,"has_fulltext":true,"cited_by_count":21,"citation_normalized_percentile":{"value":0.74432386,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"5543","issue":null,"first_page":"239","last_page":"239"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11111","display_name":"Spectroscopy and Laser Applications","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12309","display_name":"solar cell performance optimization","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/focal-plane-arrays","display_name":"focal plane arrays","score":0.8539999723434448},{"id":"https://openalex.org/keywords/wafer-bonding","display_name":"wafer bonding","score":0.7250000238418579},{"id":"https://openalex.org/keywords/p-n-junction","display_name":"p-n junction","score":0.6200000047683716},{"id":"https://openalex.org/keywords/quantum-efficiency","display_name":"quantum efficiency","score":0.7870000004768372},{"id":"https://openalex.org/keywords/dark-current","display_name":"dark current","score":0.8429999947547913},{"id":"https://openalex.org/keywords/spectral-response","display_name":"spectral response","score":0.9169999957084656},{"id":"https://openalex.org/keywords/layer-thickness-optimization","display_name":"layer thickness optimization","score":0.9110000133514404},{"id":"https://openalex.org/keywords/atmospheric-trace-gases","display_name":"atmospheric trace gases","score":0.6159999966621399},{"id":"https://openalex.org/keywords/carbon-dioxide","display_name":"carbon dioxide","score":0.6460000276565552},{"id":"https://openalex.org/keywords/ozone","display_name":"ozone","score":0.7300000190734863},{"id":"https://openalex.org/keywords/water-vapor","display_name":"water vapor","score":0.8519999980926514},{"id":"https://openalex.org/keywords/methane","display_name":"methane","score":0.9570000171661377},{"id":"https://openalex.org/keywords/remote-sensors","display_name":"remote sensing instrumentation","score":0.44200000166893005}],"concepts":[{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.829108476638794},{"id":"https://openalex.org/C125287762","wikidata":"https://www.wikidata.org/wiki/Q1758948","display_name":"Absorption (acoustics)","level":2,"score":0.6015981435775757},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5813112258911133},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.5490539073944092},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5470274090766907},{"id":"https://openalex.org/C205507967","wikidata":"https://www.wikidata.org/wiki/Q900625","display_name":"Quantum efficiency","level":2,"score":0.5198295712471008},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4799690246582031},{"id":"https://openalex.org/C2780478481","wikidata":"https://www.wikidata.org/wiki/Q1189460","display_name":"Large format","level":2,"score":0.44726720452308655},{"id":"https://openalex.org/C23125352","wikidata":"https://www.wikidata.org/wiki/Q210765","display_name":"Photodetector","level":2,"score":0.4416184425354004},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4180492162704468},{"id":"https://openalex.org/C159774933","wikidata":"https://www.wikidata.org/wiki/Q902086","display_name":"Attenuation coefficient","level":2,"score":0.41750502586364746},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.258301317691803},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.169956237077713},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1117/12.559917","doi":"https://doi.org/10.1117/12.559917","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.559917","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},{"id":"pmh:oai:casi.ntrs.nasa.gov:20040110960","doi":null,"is_oa":true,"landing_page_url":"http://hdl.handle.net/2060/20040110960","pdf_url":"https://ntrs.nasa.gov/api/citations/20040110960/downloads/20040110960.pdf","source":{"id":"https://openalex.org/S4377196257","display_name":"NASA STI Repository (National Aeronautics and Space Administration)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4210124779","host_organization_name":"National Aeronautics and Space Administration","host_organization_lineage":["https://openalex.org/I4210124779"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"CASI","raw_type":"SPIE-5543-25"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.80.1385","doi":null,"is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.80.1385","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://techreports.larc.nasa.gov/ltrs/PDF/2004/mtg/NASA-2004-49spie-mna.pdf","raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:casi.ntrs.nasa.gov:20040110960","doi":null,"is_oa":true,"landing_page_url":"http://hdl.handle.net/2060/20040110960","pdf_url":"https://ntrs.nasa.gov/api/citations/20040110960/downloads/20040110960.pdf","source":{"id":"https://openalex.org/S4377196257","display_name":"NASA STI Repository (National Aeronautics and Space Administration)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4210124779","host_organization_name":"National Aeronautics and Space Administration","host_organization_lineage":["https://openalex.org/I4210124779"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"CASI","raw_type":"SPIE-5543-25"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306101","display_name":"National Aeronautics and Space Administration","ror":"https://ror.org/027ka1x80"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2044927232.pdf","grobid_xml":"https://content.openalex.org/works/W2044927232.grobid-xml"},"referenced_works_count":7,"referenced_works":["https://openalex.org/W580341738","https://openalex.org/W1660854887","https://openalex.org/W2012465327","https://openalex.org/W2018272558","https://openalex.org/W2024887441","https://openalex.org/W2121093722","https://openalex.org/W4243826237"],"related_works":["https://openalex.org/W2154374415","https://openalex.org/W910932390","https://openalex.org/W1981804638","https://openalex.org/W2054692333","https://openalex.org/W1994026831","https://openalex.org/W2582408786","https://openalex.org/W1986286962","https://openalex.org/W2093269655","https://openalex.org/W2011406487","https://openalex.org/W756565482"],"abstract_inverted_index":{"Knowledge":[0],"of":[1,7,51,76,81,105,119,124,153,175,189,202,207,215],"the":[2,21,70,94,103,133,154,165,216],"spatial":[3],"and":[4,15,23,66,73,85,127,145,186,198,206,209],"temporal":[5],"distribution":[6],"atmospheric":[8,52],"species":[9,53],"such":[10,37],"as":[11],"CO2,":[12],"O3,":[13],"H2O,":[14],"CH4":[16],"is":[17,60,111,193,219],"important":[18],"for":[19,36,62,90,97,157,163,168],"understanding":[20],"chemistry":[22],"physical":[24],"cycles":[25],"involving":[26,45],"Earth's":[27],"atmosphere.":[28],"Although":[29],"several":[30],"remote":[31,57],"sensing":[32,58],"techniques":[33,44],"are":[34,40,88],"suitable":[35],"measurements":[38,201],"they":[39],"considered":[41],"high":[42,82],"cost":[43],"complicated":[46],"instrumentation.":[47],"Therefore,":[48],"simultaneous":[49],"measurement":[50],"using":[54],"a":[55,106],"single":[56,107],"instrument":[59,71],"significant":[61],"minimizing":[63],"cost,":[64],"size":[65],"complexity.":[67],"While":[68],"maintaining":[69],"sensitivity":[72],"range,":[74],"quality":[75],"multicolor":[77,99,109],"detector,":[78],"in":[79,113],"terms":[80],"quantum":[83,173],"efficiency":[84,174],"low":[86],"noise":[87],"vital":[89],"these":[91],"missions.":[92],"As":[93],"first":[95],"step":[96],"developing":[98],"focal":[100],"plan":[101],"array,":[102],"structure":[104,192,205],"element":[108],"detector":[110,117],"presented":[112],"this":[114],"paper.":[115],"The":[116,171,184,213],"consists":[118],"three":[120],"p-n":[121,211],"junction":[122],"layers":[123,166],"Si,":[125],"GaSb":[126,208],"InAs":[128,182,210],"wafer":[129],"bonded":[130],"to":[131,137,142,148],"cover":[132],"spectral":[134,199],"range":[135],"UV":[136],"900":[138],"nm,":[139],"800":[140],"nm":[141],"1.7":[143],"micron,":[144,150],"1.5":[146],"micron":[147],"3.4":[149],"respectively.":[151],"Modeling":[152],"absorption":[155],"coefficient":[156],"each":[158,176,190],"material":[159,217],"was":[160],"carried":[161],"out":[162],"optimizing":[164],"thicknesses":[167],"maximum":[169],"absorption.":[170],"resulted":[172],"layer":[177,191],"has":[178],"been":[179],"determined":[180],"except":[181],"layer.":[183],"optical":[185],"electrical":[187],"characterization":[188],"reported":[194],"including":[195],"dark":[196],"current":[197],"response":[200],"Si":[203],"pin":[204],"junctions.":[212],"effect":[214],"processing":[218],"discussed.":[220]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":6},{"year":2014,"cited_by_count":1}],"updated_date":"2026-11-10T11:39:43.021295","created_date":"2016-06-24T00:00:00"}