{"id":"https://openalex.org/W2044636735","doi":"https://doi.org/10.1117/12.560829","title":"Phase-shifting multiwavelength dynamic interferometer","display_name":"Phase-shifting multiwavelength dynamic interferometer","publication_year":2004,"publication_date":"2004-08-02","ids":{"openalex":"https://openalex.org/W2044636735","doi":"https://doi.org/10.1117/12.560829","mag":"2044636735"},"language":"en","primary_location":{"id":"doi:10.1117/12.560829","doi":"https://doi.org/10.1117/12.560829","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.560829","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074054548","display_name":"Michael B. North-Morris","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210163383","display_name":"4D Technology (United States)","ror":"https://ror.org/00b2x9z76","country_code":"US","type":"company","lineage":["https://openalex.org/I4210163383"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael B. North-Morris","raw_affiliation_strings":["4D Technology Corp. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"4D Technology Corp. (United States)","institution_ids":["https://openalex.org/I4210163383"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033276871","display_name":"James E. Millerd","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210163383","display_name":"4D Technology (United States)","ror":"https://ror.org/00b2x9z76","country_code":"US","type":"company","lineage":["https://openalex.org/I4210163383"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James E. Millerd","raw_affiliation_strings":["4D Technology Corp. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"4D Technology Corp. (United States)","institution_ids":["https://openalex.org/I4210163383"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108481259","display_name":"Neal J. Brock","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210163383","display_name":"4D Technology (United States)","ror":"https://ror.org/00b2x9z76","country_code":"US","type":"company","lineage":["https://openalex.org/I4210163383"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Neal J. Brock","raw_affiliation_strings":["4D Technology Corp. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"4D Technology Corp. (United States)","institution_ids":["https://openalex.org/I4210163383"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111463920","display_name":"John B. Hayes","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210163383","display_name":"4D Technology (United States)","ror":"https://ror.org/00b2x9z76","country_code":"US","type":"company","lineage":["https://openalex.org/I4210163383"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John B. Hayes","raw_affiliation_strings":["4D Technology Corp. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"4D Technology Corp. (United States)","institution_ids":["https://openalex.org/I4210163383"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210163383"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":31,"citation_normalized_percentile":{"value":0.14527746,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"5531","issue":null,"first_page":"64","last_page":"64"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phase-shifting-interferometry","display_name":"phase-shifting interferometry","score":0.9070000052452087},{"id":"https://openalex.org/keywords/two-wavelength-measurement","display_name":"two-wavelength measurement","score":0.8080000281333923},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"dynamic range","score":0.5839999914169312},{"id":"https://openalex.org/keywords/vibration-sensitivity","display_name":"vibration sensitivity","score":0.8999999761581421},{"id":"https://openalex.org/keywords/fringe-visibility","display_name":"fringe visibility","score":0.6380000114440918},{"id":"https://openalex.org/keywords/acquisition-time-reduction","display_name":"acquisition time reduction","score":0.49900001287460327},{"id":"https://openalex.org/keywords/dynamic-interferometry","display_name":"dynamic interferometry","score":0.4950000047683716}],"concepts":[{"id":"https://openalex.org/C23576306","wikidata":"https://www.wikidata.org/wiki/Q17004698","display_name":"Astronomical interferometer","level":3,"score":0.9142129421234131},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.9123700857162476},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.7580844759941101},{"id":"https://openalex.org/C6260449","wikidata":"https://www.wikidata.org/wiki/Q41364","display_name":"Wavelength","level":2,"score":0.5970910787582397},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5604528188705444},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5274779200553894},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.5047687292098999},{"id":"https://openalex.org/C95418871","wikidata":"https://www.wikidata.org/wiki/Q1666046","display_name":"Interferometric visibility","level":4,"score":0.4418479800224304},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.44053366780281067},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.08165702223777771},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.560829","doi":"https://doi.org/10.1117/12.560829","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.560829","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1964147777","https://openalex.org/W1982219304","https://openalex.org/W4234009313","https://openalex.org/W1979257855","https://openalex.org/W2966156577","https://openalex.org/W2806573795","https://openalex.org/W4393186219","https://openalex.org/W2066309620","https://openalex.org/W2060621643","https://openalex.org/W2132706959"],"abstract_inverted_index":{"The":[0,53],"benefits":[1],"of":[2,11,66,94,106],"using":[3],"two-wavelength":[4],"measurements":[5,30,74],"to":[6,35,39],"extend":[7],"the":[8,73,79,92,102,107],"dynamic":[9],"range":[10],"an":[12],"interferometric":[13],"measurement":[14,84],"are":[15,47],"well":[16],"known.":[17],"We":[18],"present":[19],"a":[20,50],"new":[21],"multi-wavelength":[22],"interferometer":[23],"that":[24,86],"uses":[25],"two":[26],"successive":[27],"single":[28,51],"frame":[29],"obtained":[31],"rapidly":[32],"in":[33,49,91],"time":[34,56],"significantly":[36],"reduce":[37],"sensitivity":[38],"vibration.":[40,95],"At":[41],"each":[42],"wavelength,":[43],"four":[44],"phase-shifted":[45],"interferograms":[46],"captured":[48],"image.":[52],"total":[54],"acquisition":[55],"for":[57],"both":[58],"wavelengths":[59],"is":[60],"100":[61],"microseconds,":[62],"over":[63],"three":[64],"orders":[65],"magnitude":[67],"shorter":[68],"than":[69],"conventional":[70],"interferometers.":[71],"Consequently,":[72],"do":[75],"not":[76],"suffer":[77],"from":[78],"fringe":[80],"contrast":[81],"reduction":[82],"and":[83,112],"errors":[85],"plague":[87],"temporal":[88],"phase-shifting":[89],"interferometers":[90],"presence":[93],"In":[96],"this":[97],"paper":[98],"we":[99],"will":[100],"discuss":[101],"basic":[103],"operating":[104],"principle":[105],"interferometer,":[108],"analyze":[109],"its":[110],"performance":[111],"show":[113],"some":[114],"interesting":[115],"measurements.":[116]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2016-06-24T00:00:00"}