{"id":"https://openalex.org/W2044595643","doi":"https://doi.org/10.1134/s1027451013040095","title":"Optimization of the scanning process in the X-ray-beam-induced current method","display_name":"Optimization of the scanning process in the X-ray-beam-induced current method","publication_year":2013,"publication_date":"2013-07-01","ids":{"openalex":"https://openalex.org/W2044595643","doi":"https://doi.org/10.1134/s1027451013040095","mag":"2044595643"},"language":"en","primary_location":{"id":"doi:10.1134/s1027451013040095","doi":"https://doi.org/10.1134/s1027451013040095","is_oa":false,"landing_page_url":"https://doi.org/10.1134/s1027451013040095","pdf_url":null,"source":{"id":"https://openalex.org/S4210212305","display_name":"Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques","issn_l":"1027-4510","issn":["1027-4510","1819-7094","3034-5731"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["dongbi-d","jufo-1","norway-1","poland-40","russia-white-list-4"],"host_organization":"https://openalex.org/P4310320267","host_organization_name":"Pleiades Publishing","host_organization_lineage":["https://openalex.org/P4310320267","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Pleiades Publishing","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038410836","display_name":"Rashid R. Fakhrtdinov","orcid":"https://orcid.org/0000-0003-1077-7975","observed_orcids":["https://orcid.org/0000-0003-1077-7975"]},"institutions":[{"id":"https://openalex.org/I1313323035","display_name":"Russian Academy of Sciences","ror":"https://ror.org/05qrfxd25","country_code":"RU","type":"government","lineage":["https://openalex.org/I1313323035"]},{"id":"https://openalex.org/I4210141450","display_name":"Institute of Microelectronics Technology and High Purity Materials","ror":"https://ror.org/034fqtg16","country_code":"RU","type":"facility","lineage":["https://openalex.org/I4210141450"]}],"countries":["RU"],"is_corresponding":true,"raw_author_name":"R. R. Fakhrtdinov","raw_affiliation_strings":["Institute of Microelectronics Technology and High Purity Materials, Russian Academy of Sciences, Chernogolovka, Moscow oblast, Russia","Russian Academy of Sciences"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics Technology and High Purity Materials, Russian Academy of Sciences, Chernogolovka, Moscow oblast, Russia","institution_ids":["https://openalex.org/I1313323035","https://openalex.org/I4210141450"]},{"raw_affiliation_string":"Russian Academy of Sciences","institution_ids":["https://openalex.org/I1313323035"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001636073","display_name":"Maxim V. Grigoriev","orcid":"https://orcid.org/0000-0002-3306-2406","observed_orcids":["https://orcid.org/0000-0002-3306-2406"]},"institutions":[{"id":"https://openalex.org/I1313323035","display_name":"Russian Academy of Sciences","ror":"https://ror.org/05qrfxd25","country_code":"RU","type":"government","lineage":["https://openalex.org/I1313323035"]},{"id":"https://openalex.org/I4210141450","display_name":"Institute of Microelectronics Technology and High Purity Materials","ror":"https://ror.org/034fqtg16","country_code":"RU","type":"facility","lineage":["https://openalex.org/I4210141450"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"M. V. Grigoriev","raw_affiliation_strings":["Institute of Microelectronics Technology and High Purity Materials, Russian Academy of Sciences, Chernogolovka, Moscow oblast, Russia","Russian Academy of Sciences"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics Technology and High Purity Materials, Russian Academy of Sciences, Chernogolovka, Moscow oblast, Russia","institution_ids":["https://openalex.org/I1313323035","https://openalex.org/I4210141450"]},{"raw_affiliation_string":"Russian Academy of Sciences","institution_ids":["https://openalex.org/I1313323035"]}]},{"author_position":"last","author":{"id":null,"display_name":"V. N. Pavlov","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1313323035","display_name":"Russian Academy of Sciences","ror":"https://ror.org/05qrfxd25","country_code":"RU","type":"government","lineage":["https://openalex.org/I1313323035"]},{"id":"https://openalex.org/I4210141450","display_name":"Institute of Microelectronics Technology and High Purity Materials","ror":"https://ror.org/034fqtg16","country_code":"RU","type":"facility","lineage":["https://openalex.org/I4210141450"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"V. N. Pavlov","raw_affiliation_strings":["Institute of Microelectronics Technology and High Purity Materials, Russian Academy of Sciences, Chernogolovka, Moscow oblast, Russia","Russian Academy of Sciences"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics Technology and High Purity Materials, Russian Academy of Sciences, Chernogolovka, Moscow oblast, Russia","institution_ids":["https://openalex.org/I1313323035","https://openalex.org/I4210141450"]},{"raw_affiliation_string":"Russian Academy of Sciences","institution_ids":["https://openalex.org/I1313323035"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5038410836"],"corresponding_institution_ids":["https://openalex.org/I1313323035","https://openalex.org/I4210141450"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"7","issue":"4","first_page":"685","last_page":"686"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.5228999853134155,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.5228999853134155,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","score":0.17520000040531158,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.0478999987244606,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/continuous-scanning","display_name":"continuous scanning","score":0.824999988079071},{"id":"https://openalex.org/keywords/spatial-resolution","display_name":"spatial resolution","score":0.7519999742507935}],"concepts":[{"id":"https://openalex.org/C2777984123","wikidata":"https://www.wikidata.org/wiki/Q9248237","display_name":"Pointwise","level":2,"score":0.6753666400909424},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5594143867492676},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.5526191592216492},{"id":"https://openalex.org/C168834538","wikidata":"https://www.wikidata.org/wiki/Q3705329","display_name":"Beam (structure)","level":2,"score":0.5514718294143677},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.5414933562278748},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4716842770576477},{"id":"https://openalex.org/C3017524520","wikidata":"https://www.wikidata.org/wiki/Q212111","display_name":"Line width","level":2,"score":0.463362455368042},{"id":"https://openalex.org/C2779328170","wikidata":"https://www.wikidata.org/wiki/Q34777","display_name":"X-ray","level":2,"score":0.4594034254550934},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.45851823687553406},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4413111209869385},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.25083017349243164},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2121363878250122},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.19099706411361694},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0757458508014679},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.06052437424659729},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.057139426469802856},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1134/s1027451013040095","doi":"https://doi.org/10.1134/s1027451013040095","is_oa":false,"landing_page_url":"https://doi.org/10.1134/s1027451013040095","pdf_url":null,"source":{"id":"https://openalex.org/S4210212305","display_name":"Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques","issn_l":"1027-4510","issn":["1027-4510","1819-7094","3034-5731"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["dongbi-d","jufo-1","norway-1","poland-40","russia-white-list-4"],"host_organization":"https://openalex.org/P4310320267","host_organization_name":"Pleiades Publishing","host_organization_lineage":["https://openalex.org/P4310320267","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Pleiades Publishing","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1978689905","https://openalex.org/W1979757403","https://openalex.org/W2064431822","https://openalex.org/W2075195856"],"related_works":["https://openalex.org/W2094247440","https://openalex.org/W2529300630","https://openalex.org/W3082367761","https://openalex.org/W2420454575","https://openalex.org/W1985059352","https://openalex.org/W3045940403","https://openalex.org/W2606622094","https://openalex.org/W2606200824","https://openalex.org/W4396799752","https://openalex.org/W2583834858"],"abstract_inverted_index":{"Two":[0],"line-by-line":[1],"scanning":[2,30],"modes":[3],"of":[4],"the":[5,17,29,37],"X-ray-beam-induced":[6],"current":[7],"method\u2014continuous":[8],"and":[9],"pointwise":[10],"procedures\u2014are":[11],"compared.":[12],"It":[13],"is":[14],"demonstrated":[15],"that":[16],"continuous":[18],"procedure":[19],"makes":[20],"it":[21],"possible":[22],"to":[23],"achieve":[24],"a":[25,33],"severalfold":[26],"decrease":[27],"in":[28],"duration":[31],"without":[32],"significant":[34],"influence":[35],"on":[36],"resolution.":[38]},"counts_by_year":[{"year":2017,"cited_by_count":1}],"updated_date":"2026-09-29T14:09:16.559479","created_date":"2016-06-24T00:00:00"}