{"id":"https://openalex.org/W2043908315","doi":"https://doi.org/10.4028/www.scientific.net/amr.528.214","title":"The Effects of Selenization Temperature on the Properties of CIGS Thin Film Prepared by Cu-In-Ga-Se Precursors","display_name":"The Effects of Selenization Temperature on the Properties of CIGS Thin Film Prepared by Cu-In-Ga-Se Precursors","publication_year":2012,"publication_date":"2012-06-01","ids":{"openalex":"https://openalex.org/W2043908315","doi":"https://doi.org/10.4028/www.scientific.net/amr.528.214","mag":"2043908315"},"language":"en","primary_location":{"id":"doi:10.4028/www.scientific.net/amr.528.214","doi":"https://doi.org/10.4028/www.scientific.net/amr.528.214","is_oa":true,"landing_page_url":"https://doi.org/10.4028/www.scientific.net/amr.528.214","pdf_url":null,"source":{"id":"https://openalex.org/S67425620","display_name":"Advanced materials research","issn_l":"1022-6680","issn":["1022-6680","1662-8985"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310317839","host_organization_name":"Trans Tech Publications","host_organization_lineage":["https://openalex.org/P4310317839"],"host_organization_lineage_names":["Trans Tech Publications"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced Materials Research","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.4028/www.scientific.net/amr.528.214","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027600052","display_name":"Han Bin Wang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Han Bin Wang","raw_affiliation_strings":["Shandong University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shandong University","institution_ids":["https://openalex.org/I154099455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015658062","display_name":"Xi Jian Zhang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xi Jian Zhang","raw_affiliation_strings":["Shandong University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shandong University","institution_ids":["https://openalex.org/I154099455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031883971","display_name":"Qing Pu Wang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qing Pu Wang","raw_affiliation_strings":["Shandong University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shandong University","institution_ids":["https://openalex.org/I154099455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113629505","display_name":"Xue Yan Zhang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xue Yan Zhang","raw_affiliation_strings":["Shandong University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shandong University","institution_ids":["https://openalex.org/I154099455"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100455489","display_name":"Xiaoyu Liu","orcid":"https://orcid.org/0000-0001-9214-8763","observed_orcids":["https://orcid.org/0000-0001-9214-8763","https://orcid.org/0009-0009-1729-0714"]},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiao Yu Liu","raw_affiliation_strings":["Shandong University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shandong University","institution_ids":["https://openalex.org/I154099455"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I154099455"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15777925,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"528","issue":null,"first_page":"214","last_page":"218"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cigs-thin-films","display_name":"CIGS thin films","score":0.9940000176429749},{"id":"https://openalex.org/keywords/selenization-temperature","display_name":"selenization temperature","score":0.9269999861717224},{"id":"https://openalex.org/keywords/chalcopyrite-phase","display_name":"chalcopyrite phase","score":0.9449999928474426},{"id":"https://openalex.org/keywords/crystallographic-texture","display_name":"crystallographic texture","score":0.8289999961853027},{"id":"https://openalex.org/keywords/film-morphology","display_name":"film morphology","score":0.781000018119812},{"id":"https://openalex.org/keywords/thin-film-solar-cells","display_name":"thin-film solar cells","score":0.6169999837875366}],"concepts":[{"id":"https://openalex.org/C191716631","wikidata":"https://www.wikidata.org/wiki/Q31887","display_name":"Copper indium gallium selenide solar cells","level":3,"score":0.9341952800750732},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7950432300567627},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.7222980856895447},{"id":"https://openalex.org/C2778188036","wikidata":"https://www.wikidata.org/wiki/Q111044","display_name":"Chalcopyrite","level":3,"score":0.6957237720489502},{"id":"https://openalex.org/C35288751","wikidata":"https://www.wikidata.org/wiki/Q745127","display_name":"Soda-lime glass","level":2,"score":0.5911586284637451},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.5458075404167175},{"id":"https://openalex.org/C61441594","wikidata":"https://www.wikidata.org/wiki/Q132814","display_name":"Evaporation","level":2,"score":0.49895286560058594},{"id":"https://openalex.org/C22423302","wikidata":"https://www.wikidata.org/wiki/Q898444","display_name":"Sputtering","level":3,"score":0.4867689609527588},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.4621120095252991},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.43557560443878174},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3421159088611603},{"id":"https://openalex.org/C544778455","wikidata":"https://www.wikidata.org/wiki/Q753","display_name":"Copper","level":2,"score":0.32450103759765625},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.3090499937534332},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.21366482973098755},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.15839147567749023},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.14475005865097046},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.4028/www.scientific.net/amr.528.214","doi":"https://doi.org/10.4028/www.scientific.net/amr.528.214","is_oa":true,"landing_page_url":"https://doi.org/10.4028/www.scientific.net/amr.528.214","pdf_url":null,"source":{"id":"https://openalex.org/S67425620","display_name":"Advanced materials research","issn_l":"1022-6680","issn":["1022-6680","1662-8985"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310317839","host_organization_name":"Trans Tech Publications","host_organization_lineage":["https://openalex.org/P4310317839"],"host_organization_lineage_names":["Trans Tech Publications"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced Materials Research","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.4028/www.scientific.net/amr.528.214","doi":"https://doi.org/10.4028/www.scientific.net/amr.528.214","is_oa":true,"landing_page_url":"https://doi.org/10.4028/www.scientific.net/amr.528.214","pdf_url":null,"source":{"id":"https://openalex.org/S67425620","display_name":"Advanced materials research","issn_l":"1022-6680","issn":["1022-6680","1662-8985"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","norway-1"],"host_organization":"https://openalex.org/P4310317839","host_organization_name":"Trans Tech Publications","host_organization_lineage":["https://openalex.org/P4310317839"],"host_organization_lineage_names":["Trans Tech Publications"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced Materials Research","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320309532","display_name":"Syracuse University","ror":"https://ror.org/025r5qe02"},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1975301277","https://openalex.org/W2015464622","https://openalex.org/W2022925449","https://openalex.org/W2026074322","https://openalex.org/W2041579382","https://openalex.org/W2042161460","https://openalex.org/W2043716287","https://openalex.org/W2095019265","https://openalex.org/W2097382568","https://openalex.org/W2123545157"],"related_works":["https://openalex.org/W2075086508","https://openalex.org/W2057455298","https://openalex.org/W2020282335","https://openalex.org/W3145111063","https://openalex.org/W2024519266","https://openalex.org/W2078944336","https://openalex.org/W1975301277","https://openalex.org/W1995349550","https://openalex.org/W2375528807","https://openalex.org/W7084247842"],"abstract_inverted_index":{"CIGS":[0,23,58,94],"thin":[1,24,59,95],"films":[2,25,68,96],"were":[3,26,31,45,75],"prepared":[4],"by":[5,38],"selenization":[6,17,73],"of":[7,16,22,63,67,72,79],"Cu-In-Ga-Se":[8,29],"precursors,":[9],"as":[10,69],"a":[11,70],"new":[12],"method,":[13],"the":[14,20,107],"effects":[15],"temperature":[18,74],"on":[19],"properties":[21],"studied.":[27],"First,":[28],"precursors":[30,44],"deposited":[32],"onto":[33],"Mo-coated":[34],"soda":[35],"lime":[36],"glass":[37],"evaporation":[39],"and":[40,65,86],"sputtering":[41],"method.":[42],"Then,":[43],"selenized":[46,97],"at":[47,98],"various":[48],"temperatures":[49],"in":[50],"N2":[51],"atmosphere":[52],"for":[53],"120":[54],"min":[55],"to":[56],"form":[57],"films.":[60],"The":[61],"degree":[62],"reaction":[64],"morphology":[66],"function":[71],"analyzed.":[76],"By":[77],"means":[78],"field":[80],"emission":[81],"scanning":[82],"electron":[83],"microscope":[84],"(SEM)":[85],"X-ray":[87],"diffraction":[88],"(XRD),":[89],"it":[90],"was":[91],"found":[92],"that":[93],"450\u00b0C":[99],"exhibit":[100],"chalcopyrite":[101],"phase":[102],"with":[103],"preferred":[104],"orientation":[105],"along":[106],"(112)":[108],"plane.":[109]},"counts_by_year":[],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}