{"id":"https://openalex.org/W2043768113","doi":"https://doi.org/10.1016/0169-4332(95)00579-x","title":"Structural and optical characteristics of pulsed laser deposited ZnSe epilayers","display_name":"Structural and optical characteristics of pulsed laser deposited ZnSe epilayers","publication_year":1996,"publication_date":"1996-04-01","ids":{"openalex":"https://openalex.org/W2043768113","doi":"https://doi.org/10.1016/0169-4332(95)00579-x","mag":"2043768113"},"language":"en","primary_location":{"id":"doi:10.1016/0169-4332(95)00579-x","doi":"https://doi.org/10.1016/0169-4332(95)00579-x","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0169-4332(95)00579-x","pdf_url":null,"source":{"id":"https://openalex.org/S42323631","display_name":"Applied Surface Science","issn_l":"0169-4332","issn":["0169-4332","1873-5584"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-2","ki-jl-1","norway-1","poland-140","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Surface Science","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110859865","display_name":"Abdelhamid Chergui","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210123402","display_name":"Institut de Physique et Chimie des Mat\u00e9riaux de Strasbourg","ror":"https://ror.org/02za18p66","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I4210098836","https://openalex.org/I4210123402","https://openalex.org/I68947357"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Chergui","raw_affiliation_strings":["Institut de Physique et Chimie des Mate\u00b4riaux de Strasbourg, Groupe d'Optique Nonline\u00b4aire et d'Optoe\u00b4lectronique, UM 380046 CNRS-ULP-EHICS, 23 rue du Loess, 67087 Strasbourg Cedex,France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut de Physique et Chimie des Mate\u00b4riaux de Strasbourg, Groupe d'Optique Nonline\u00b4aire et d'Optoe\u00b4lectronique, UM 380046 CNRS-ULP-EHICS, 23 rue du Loess, 67087 Strasbourg Cedex,France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210123402"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064993814","display_name":"J.L. Deiss","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210123402","display_name":"Institut de Physique et Chimie des Mat\u00e9riaux de Strasbourg","ror":"https://ror.org/02za18p66","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I4210098836","https://openalex.org/I4210123402","https://openalex.org/I68947357"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"J.L. Deiss","raw_affiliation_strings":["Institut de Physique et Chimie des Mate\u00b4riaux de Strasbourg, Groupe d'Optique Nonline\u00b4aire et d'Optoe\u00b4lectronique, UM 380046 CNRS-ULP-EHICS, 23 rue du Loess, 67087 Strasbourg Cedex,France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut de Physique et Chimie des Mate\u00b4riaux de Strasbourg, Groupe d'Optique Nonline\u00b4aire et d'Optoe\u00b4lectronique, UM 380046 CNRS-ULP-EHICS, 23 rue du Loess, 67087 Strasbourg Cedex,France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210123402"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112297046","display_name":"J. B. Gr\u00fcn","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210123402","display_name":"Institut de Physique et Chimie des Mat\u00e9riaux de Strasbourg","ror":"https://ror.org/02za18p66","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I4210098836","https://openalex.org/I4210123402","https://openalex.org/I68947357"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"J.B. Grun","raw_affiliation_strings":["Institut de Physique et Chimie des Mate\u00b4riaux de Strasbourg, Groupe d'Optique Nonline\u00b4aire et d'Optoe\u00b4lectronique, UM 380046 CNRS-ULP-EHICS, 23 rue du Loess, 67087 Strasbourg Cedex,France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut de Physique et Chimie des Mate\u00b4riaux de Strasbourg, Groupe d'Optique Nonline\u00b4aire et d'Optoe\u00b4lectronique, UM 380046 CNRS-ULP-EHICS, 23 rue du Loess, 67087 Strasbourg Cedex,France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210123402"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108477971","display_name":"J.-L. Loison","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210123402","display_name":"Institut de Physique et Chimie des Mat\u00e9riaux de Strasbourg","ror":"https://ror.org/02za18p66","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I4210098836","https://openalex.org/I4210123402","https://openalex.org/I68947357"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"J.L. Loison","raw_affiliation_strings":["Institut de Physique et Chimie des Mate\u00b4riaux de Strasbourg, Groupe d'Optique Nonline\u00b4aire et d'Optoe\u00b4lectronique, UM 380046 CNRS-ULP-EHICS, 23 rue du Loess, 67087 Strasbourg Cedex,France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut de Physique et Chimie des Mate\u00b4riaux de Strasbourg, Groupe d'Optique Nonline\u00b4aire et d'Optoe\u00b4lectronique, UM 380046 CNRS-ULP-EHICS, 23 rue du Loess, 67087 Strasbourg Cedex,France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210123402"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071947321","display_name":"Michele Robino","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210123402","display_name":"Institut de Physique et Chimie des Mat\u00e9riaux de Strasbourg","ror":"https://ror.org/02za18p66","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I4210098836","https://openalex.org/I4210123402","https://openalex.org/I68947357"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"M. Robino","raw_affiliation_strings":["Institut de Physique et Chimie des Mate\u00b4riaux de Strasbourg, Groupe d'Optique Nonline\u00b4aire et d'Optoe\u00b4lectronique, UM 380046 CNRS-ULP-EHICS, 23 rue du Loess, 67087 Strasbourg Cedex,France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut de Physique et Chimie des Mate\u00b4riaux de Strasbourg, Groupe d'Optique Nonline\u00b4aire et d'Optoe\u00b4lectronique, UM 380046 CNRS-ULP-EHICS, 23 rue du Loess, 67087 Strasbourg Cedex,France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210123402"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078300835","display_name":"Robert Beserman","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I174306211","display_name":"Technion \u2013 Israel Institute of Technology","ror":"https://ror.org/03qryx823","country_code":"IL","type":"education","lineage":["https://openalex.org/I174306211"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"R. Beserman","raw_affiliation_strings":["Solid State Institute and Physics Department, Technion, Haifa, Israel"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Solid State Institute and Physics Department, Technion, Haifa, Israel","institution_ids":["https://openalex.org/I174306211"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5064993814"],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210123402"],"apc_list":{"value":3930,"currency":"USD","value_usd":3930},"apc_paid":null,"fwci":0.9321,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.73815233,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"96-98","issue":null,"first_page":"874","last_page":"880"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.6015999913215637,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.6015999913215637,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.19580000638961792,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.11309999972581863,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/znse","display_name":"ZnSe","score":0.7730000019073486},{"id":"https://openalex.org/keywords/epitaxial-layers","display_name":"epitaxial layers","score":0.7319999933242798},{"id":"https://openalex.org/keywords/pulsed-laser-deposition","display_name":"pulsed laser deposition","score":0.9950000047683716},{"id":"https://openalex.org/keywords/gaas-substrate","display_name":"GaAs substrate","score":0.9480000138282776},{"id":"https://openalex.org/keywords/thin-films","display_name":"thin films","score":0.6589999794960022},{"id":"https://openalex.org/keywords/growth-temperature","display_name":"growth temperature","score":0.8199999928474426},{"id":"https://openalex.org/keywords/structural-defects","display_name":"structural defects","score":0.859000027179718},{"id":"https://openalex.org/keywords/optical-properties","display_name":"optical properties","score":0.9890000224113464}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.770411491394043},{"id":"https://openalex.org/C175665537","wikidata":"https://www.wikidata.org/wiki/Q1924991","display_name":"Metalorganic vapour phase epitaxy","level":4,"score":0.7528175115585327},{"id":"https://openalex.org/C37982897","wikidata":"https://www.wikidata.org/wiki/Q901321","display_name":"Pulsed laser deposition","level":3,"score":0.7462948560714722},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.6675429344177246},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6206245422363281},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.58650803565979},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.5412116050720215},{"id":"https://openalex.org/C64297162","wikidata":"https://www.wikidata.org/wiki/Q1987070","display_name":"Deposition (geology)","level":3,"score":0.4456249475479126},{"id":"https://openalex.org/C2778979257","wikidata":"https://www.wikidata.org/wiki/Q15928349","display_name":"Pulsed laser","level":3,"score":0.4196644425392151},{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.4099735617637634},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.26676785945892334},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.19627845287322998},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.11417698860168457},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C2816523","wikidata":"https://www.wikidata.org/wiki/Q180184","display_name":"Sediment","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0169-4332(95)00579-x","doi":"https://doi.org/10.1016/0169-4332(95)00579-x","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0169-4332(95)00579-x","pdf_url":null,"source":{"id":"https://openalex.org/S42323631","display_name":"Applied Surface Science","issn_l":"0169-4332","issn":["0169-4332","1873-5584"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-2","ki-jl-1","norway-1","poland-140","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Surface Science","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1651320502","https://openalex.org/W1968694920","https://openalex.org/W1968785478","https://openalex.org/W2003269001","https://openalex.org/W2008835129","https://openalex.org/W2010896937","https://openalex.org/W2015770259","https://openalex.org/W2016346427","https://openalex.org/W2034776802","https://openalex.org/W2035686384","https://openalex.org/W2040146331","https://openalex.org/W2062612346","https://openalex.org/W2074661093","https://openalex.org/W2090513070"],"related_works":["https://openalex.org/W2035686384","https://openalex.org/W1970249491","https://openalex.org/W2053547009","https://openalex.org/W1986990700","https://openalex.org/W1970401292","https://openalex.org/W1622622154","https://openalex.org/W2010559729","https://openalex.org/W2797539361","https://openalex.org/W1990051477","https://openalex.org/W1493576935"],"abstract_inverted_index":null,"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-10-14T16:39:01.820549","created_date":"2016-06-24T00:00:00"}