{"id":"https://openalex.org/W2043661301","doi":"https://doi.org/10.1364/ol.36.000265","title":"Measurement of the dielectric constant of thin films by terahertz time-domain spectroscopic ellipsometry","display_name":"Measurement of the dielectric constant of thin films by terahertz time-domain spectroscopic ellipsometry","publication_year":2011,"publication_date":"2011-01-13","ids":{"openalex":"https://openalex.org/W2043661301","doi":"https://doi.org/10.1364/ol.36.000265","mag":"2043661301","pmid":"https://pubmed.ncbi.nlm.nih.gov/21263521"},"language":"en","primary_location":{"id":"doi:10.1364/ol.36.000265","doi":"https://doi.org/10.1364/ol.36.000265","is_oa":false,"landing_page_url":"https://doi.org/10.1364/ol.36.000265","pdf_url":null,"source":{"id":"https://openalex.org/S134390580","display_name":"Optics Letters","issn_l":"0146-9592","issn":["0146-9592","1071-2763","1539-4794"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-2","ki-jl-2","medline","norway-2","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310315679","host_organization_name":"Optica Publishing Group","host_organization_lineage":["https://openalex.org/P4310315679"],"host_organization_lineage_names":["Optica Publishing Group"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optics Letters","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref","pubmed"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037172032","display_name":"Naoki Matsumoto","orcid":"https://orcid.org/0000-0003-2861-7152","observed_orcids":["https://orcid.org/0000-0003-2861-7152"]},"institutions":[{"id":"https://openalex.org/I924388194","display_name":"Murata (Japan)","ror":"https://ror.org/04hd8bd67","country_code":"JP","type":"company","lineage":["https://openalex.org/I924388194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Naoki Matsumoto","raw_affiliation_strings":["Murata Manufacturing Co., Ltd., Nagaokakyo, Kyoto 617-8555, Japan. n_matsumoto@murata.co.jp","Murata Manufacturing Co. Ltd., Nagaokakyo, Kyoto 617-8555, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Murata Manufacturing Co., Ltd., Nagaokakyo, Kyoto 617-8555, Japan. n_matsumoto@murata.co.jp","institution_ids":["https://openalex.org/I924388194"]},{"raw_affiliation_string":"Murata Manufacturing Co. Ltd., Nagaokakyo, Kyoto 617-8555, Japan","institution_ids":["https://openalex.org/I924388194"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024179492","display_name":"Tadasu Hosokura","orcid":"https://orcid.org/0009-0005-5485-142X","observed_orcids":["https://orcid.org/0009-0005-5485-142X"]},"institutions":[{"id":"https://openalex.org/I924388194","display_name":"Murata (Japan)","ror":"https://ror.org/04hd8bd67","country_code":"JP","type":"company","lineage":["https://openalex.org/I924388194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tadasu Hosokura","raw_affiliation_strings":["Murata Manufacturing Co., Ltd., Nagaokakyo, Kyoto 617-8555, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Murata Manufacturing Co., Ltd., Nagaokakyo, Kyoto 617-8555, Japan","institution_ids":["https://openalex.org/I924388194"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038481366","display_name":"Takeshi Nagashima","orcid":"https://orcid.org/0000-0002-5215-0495","observed_orcids":["https://orcid.org/0000-0002-5215-0495"]},"institutions":[{"id":"https://openalex.org/I4405287467","display_name":"Institute of Laser Engineering, The University of Osaka","ror":"https://ror.org/058adca49","country_code":"JP","type":"facility","lineage":["https://openalex.org/I4405287467","https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takeshi Nagashima","raw_affiliation_strings":["Institute of Laser Engineering, Osaka University, Suita, Osaka 565-0871, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Laser Engineering, Osaka University, Suita, Osaka 565-0871, Japan","institution_ids":["https://openalex.org/I4405287467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034354377","display_name":"Masanori Hangyo","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4405287467","display_name":"Institute of Laser Engineering, The University of Osaka","ror":"https://ror.org/058adca49","country_code":"JP","type":"facility","lineage":["https://openalex.org/I4405287467","https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masanori Hangyo","raw_affiliation_strings":["Institute of Laser Engineering, Osaka University, Suita, Osaka 565-0871, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Laser Engineering, Osaka University, Suita, Osaka 565-0871, Japan","institution_ids":["https://openalex.org/I4405287467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":5.6347,"has_fulltext":false,"cited_by_count":87,"citation_normalized_percentile":{"value":0.96152795,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":87,"max":99},"biblio":{"volume":"36","issue":"2","first_page":"265","last_page":"265"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12050","display_name":"Optical Polarization and Ellipsometry","score":0.000699999975040555,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.0005000000237487257,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/complex-permittivity","display_name":"complex permittivity","score":0.8610000014305115},{"id":"https://openalex.org/keywords/thin-films","display_name":"thin films","score":0.9750000238418579},{"id":"https://openalex.org/keywords/drude-model","display_name":"Drude model","score":0.9980000257492065},{"id":"https://openalex.org/keywords/srtio3-thin-films","display_name":"SrTiO3 thin films","score":0.9890000224113464},{"id":"https://openalex.org/keywords/in-situ-measurement","display_name":"in situ measurement","score":0.4399999976158142}],"concepts":[{"id":"https://openalex.org/C18293161","wikidata":"https://www.wikidata.org/wiki/Q898774","display_name":"Ellipsometry","level":3,"score":0.8382300138473511},{"id":"https://openalex.org/C107816215","wikidata":"https://www.wikidata.org/wiki/Q647887","display_name":"Terahertz radiation","level":2,"score":0.8079972267150879},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.7943947315216064},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7373425364494324},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.6802037358283997},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.6510531306266785},{"id":"https://openalex.org/C2776445377","wikidata":"https://www.wikidata.org/wiki/Q910043","display_name":"Drude model","level":2,"score":0.6070101857185364},{"id":"https://openalex.org/C42067758","wikidata":"https://www.wikidata.org/wiki/Q174102","display_name":"Refractive index","level":2,"score":0.4718461036682129},{"id":"https://openalex.org/C41700454","wikidata":"https://www.wikidata.org/wiki/Q1852282","display_name":"Reflection coefficient","level":2,"score":0.4664306938648224},{"id":"https://openalex.org/C193493375","wikidata":"https://www.wikidata.org/wiki/Q1306232","display_name":"Penetration depth","level":2,"score":0.4481378197669983},{"id":"https://openalex.org/C65682993","wikidata":"https://www.wikidata.org/wiki/Q1056451","display_name":"Reflection (computer programming)","level":2,"score":0.4376218914985657},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.37599998712539673},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2996200919151306},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20316153764724731},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1364/ol.36.000265","doi":"https://doi.org/10.1364/ol.36.000265","is_oa":false,"landing_page_url":"https://doi.org/10.1364/ol.36.000265","pdf_url":null,"source":{"id":"https://openalex.org/S134390580","display_name":"Optics Letters","issn_l":"0146-9592","issn":["0146-9592","1071-2763","1539-4794"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-2","ki-jl-2","medline","norway-2","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310315679","host_organization_name":"Optica Publishing Group","host_organization_lineage":["https://openalex.org/P4310315679"],"host_organization_lineage_names":["Optica Publishing Group"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optics Letters","raw_type":"journal-article"},{"id":"pmid:21263521","doi":null,"is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/21263521","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optics letters","raw_type":"Journal Article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1985014582","https://openalex.org/W1987683393","https://openalex.org/W1989708981","https://openalex.org/W2024938939","https://openalex.org/W2028747072","https://openalex.org/W2045568253","https://openalex.org/W2057830813","https://openalex.org/W2076758982","https://openalex.org/W2089821145","https://openalex.org/W2090279421","https://openalex.org/W2093552121","https://openalex.org/W2133051965","https://openalex.org/W2157609259"],"related_works":["https://openalex.org/W2028167731","https://openalex.org/W4403182503","https://openalex.org/W2098157151","https://openalex.org/W2043292651","https://openalex.org/W2089821145","https://openalex.org/W4394678794","https://openalex.org/W2085955851","https://openalex.org/W2023359672","https://openalex.org/W1483869985","https://openalex.org/W3007559334"],"abstract_inverted_index":{"We":[0],"present":[1],"a":[2,72,97,110],"reflection-type":[3],"terahertz":[4],"time-domain":[5],"spectroscopic":[6],"ellipsometry":[7],"(THz-TDSE)":[8],"technique":[9],"for":[10],"measuring":[11],"the":[12,22,30,33,59,64,69,75,79,86,107],"complex":[13,26,34],"dielectric":[14,27,46,102],"constants":[15,28,47,103],"of":[16,21,32,48,58,68,71,74,78,88,109],"thin-film":[17],"materials":[18],"without":[19],"replacement":[20],"sample.":[23],"THz-TDSE":[24],"provides":[25],"from":[29],"ratio":[31],"amplitude":[35],"reflection":[36],"coefficients":[37],"between":[38],"p-":[39],"and":[40],"s-polarized":[41],"THz":[42,80],"waves.":[43,81],"The":[44,100],"measured":[45],"doped":[49],"GaAs":[50],"thin":[51,93],"films":[52,94],"show":[53],"good":[54],"agreement":[55],"with":[56,106],"predictions":[57,108],"Drude":[60],"model,":[61],"even":[62],"though":[63],"film":[65],"thickness":[66],"is":[67],"order":[70],"tenth":[73],"penetration":[76],"depth":[77],"In":[82],"addition,":[83],"we":[84],"demonstrate":[85],"measurements":[87],"soft-phonon":[89],"dispersion":[90],"in":[91],"SrTiO(3)":[92],"deposited":[95],"on":[96],"Pt":[98],"layer.":[99],"obtained":[101],"agree":[104],"well":[105],"generalized":[111],"harmonic":[112],"oscillator":[113],"model.":[114]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":9},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":8},{"year":2014,"cited_by_count":7},{"year":2013,"cited_by_count":10},{"year":2012,"cited_by_count":6}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}