{"id":"https://openalex.org/W2042874121","doi":"https://doi.org/10.1109/s3s.2013.6716527","title":"Enabling energy efficient protocol processing for passive RFID sensors using sub/near-threshold circuit","display_name":"Enabling energy efficient protocol processing for passive RFID sensors using sub/near-threshold circuit","publication_year":2013,"publication_date":"2013-10-01","ids":{"openalex":"https://openalex.org/W2042874121","doi":"https://doi.org/10.1109/s3s.2013.6716527","mag":"2042874121"},"language":"en","primary_location":{"id":"doi:10.1109/s3s.2013.6716527","doi":"https://doi.org/10.1109/s3s.2013.6716527","is_oa":false,"landing_page_url":"https://doi.org/10.1109/s3s.2013.6716527","pdf_url":null,"source":{"id":"https://openalex.org/S4306418822","display_name":"IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111733309","display_name":"Ran Liao","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I115475287","display_name":"Oklahoma State University","ror":"https://ror.org/01g9vbr38","country_code":"US","type":"education","lineage":["https://openalex.org/I115475287"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Liao","raw_affiliation_strings":["Oklahoma State University","Oklahoma State Univ., Stillwater, OK, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Oklahoma State University","institution_ids":["https://openalex.org/I115475287"]},{"raw_affiliation_string":"Oklahoma State Univ., Stillwater, OK, USA","institution_ids":["https://openalex.org/I115475287"]}]},{"author_position":"middle","author":{"id":null,"display_name":"R. Ahmed","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I115475287","display_name":"Oklahoma State University","ror":"https://ror.org/01g9vbr38","country_code":"US","type":"education","lineage":["https://openalex.org/I115475287"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Ahmed","raw_affiliation_strings":["Uf-Dallas","Oklahoma State Univ., Stillwater, OK, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Uf-Dallas","institution_ids":[]},{"raw_affiliation_string":"Oklahoma State Univ., Stillwater, OK, USA","institution_ids":["https://openalex.org/I115475287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063666783","display_name":"Chriswell G. Hutchens","orcid":"https://orcid.org/0009-0003-3411-8701","observed_orcids":["https://orcid.org/0009-0003-3411-8701"]},"institutions":[{"id":"https://openalex.org/I115475287","display_name":"Oklahoma State University","ror":"https://ror.org/01g9vbr38","country_code":"US","type":"education","lineage":["https://openalex.org/I115475287"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C. G. Hutchens","raw_affiliation_strings":["Oklahoma State University","Oklahoma State Univ., Stillwater, OK, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Oklahoma State University","institution_ids":["https://openalex.org/I115475287"]},{"raw_affiliation_string":"Oklahoma State Univ., Stillwater, OK, USA","institution_ids":["https://openalex.org/I115475287"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056457407","display_name":"Robert L. Rennaker","orcid":"https://orcid.org/0000-0003-1260-1973","observed_orcids":["https://orcid.org/0000-0003-1260-1973"]},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. L. Rennaker","raw_affiliation_strings":["Uf-Dallas","UT-Dallas, Dallas, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Uf-Dallas","institution_ids":[]},{"raw_affiliation_string":"UT-Dallas, Dallas, TX, USA","institution_ids":["https://openalex.org/I162577319"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17497832,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10986","display_name":"RFID technology advancements","score":0.9628999829292297,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10986","display_name":"RFID technology advancements","score":0.9628999829292297,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.030500000342726707,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.002899999963119626,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/passive-rfid-sensors","display_name":"passive RFID sensors","score":0.9750000238418579},{"id":"https://openalex.org/keywords/subthreshold-operation","display_name":"subthreshold operation","score":0.8119999766349792},{"id":"https://openalex.org/keywords/near-threshold-operation","display_name":"near-threshold operation","score":0.9100000262260437},{"id":"https://openalex.org/keywords/low-power-design","display_name":"low power design","score":0.7229999899864197},{"id":"https://openalex.org/keywords/low-supply-voltage","display_name":"low supply voltage","score":0.5400000214576721},{"id":"https://openalex.org/keywords/0-18-mum-cmos","display_name":"0.18 \u03bcm CMOS","score":0.828000009059906},{"id":"https://openalex.org/keywords/energy-efficiency","display_name":"energy efficiency","score":0.703000009059906}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6893258094787598},{"id":"https://openalex.org/C3017773396","wikidata":"https://www.wikidata.org/wiki/Q6692774","display_name":"Ultra low power","level":4,"score":0.6310346722602844},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6284260749816895},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5851201415061951},{"id":"https://openalex.org/C2780385302","wikidata":"https://www.wikidata.org/wiki/Q367158","display_name":"Protocol (science)","level":3,"score":0.5810521245002747},{"id":"https://openalex.org/C2742236","wikidata":"https://www.wikidata.org/wiki/Q924713","display_name":"Efficient energy use","level":2,"score":0.5432189702987671},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5319937467575073},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5278879404067993},{"id":"https://openalex.org/C101518730","wikidata":"https://www.wikidata.org/wiki/Q930236","display_name":"Energy harvesting","level":3,"score":0.5275872349739075},{"id":"https://openalex.org/C19247436","wikidata":"https://www.wikidata.org/wiki/Q192727","display_name":"Physical layer","level":3,"score":0.48941317200660706},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.48808348178863525},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.47871851921081543},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4715096056461334},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.4548306465148926},{"id":"https://openalex.org/C117551214","wikidata":"https://www.wikidata.org/wiki/Q6692774","display_name":"Low-power electronics","level":4,"score":0.4261396825313568},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3906799256801605},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.36648789048194885},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.3439061641693115},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2865588665008545},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.22086584568023682},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.14996787905693054},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/s3s.2013.6716527","doi":"https://doi.org/10.1109/s3s.2013.6716527","is_oa":false,"landing_page_url":"https://doi.org/10.1109/s3s.2013.6716527","pdf_url":null,"source":{"id":"https://openalex.org/S4306418822","display_name":"IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8970999717712402,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2750623440","https://openalex.org/W2007256729","https://openalex.org/W2302769694","https://openalex.org/W2144657773","https://openalex.org/W3163548985","https://openalex.org/W2108214473","https://openalex.org/W1980414315","https://openalex.org/W2130714670","https://openalex.org/W1613655637","https://openalex.org/W2766617373"],"abstract_inverted_index":{"Recent":[0],"research":[1],"trend":[2],"of":[3],"passive":[4],"RFID":[5],"based":[6],"sensors":[7],"has":[8],"posed":[9],"stringent":[10],"low":[11,44],"power":[12,45],"requirement":[13],"for":[14,43,56],"energy":[15],"efficient":[16],"communication,":[17],"which":[18,62],"can":[19],"be":[20],"addressed":[21],"by":[22],"sub/near-Vt":[23],"operation":[24],"with":[25],"standard":[26],"CMOS":[27,75],"process.":[28],"This":[29],"paper":[30],"discusses":[31],"new":[32],"design":[33,70],"challenges":[34],"under":[35],"scaled":[36],"voltages":[37],"and":[38,52,59,77],"presents":[39],"critical":[40],"building":[41],"blocks":[42],"protocol":[46],"processing.":[47],"Two":[48],"supply":[49],"viltages":[50],"-0.45V":[51],"0.7V":[53],"are":[54,81],"selected":[55],"powering":[57],"digital":[58],"analog":[60],"circuits":[61],"process":[63,76],"EPC":[64],"Gen-2":[65],"physical":[66],"layer":[67],"data.":[68],"The":[69],"was":[71],"fabricated":[72],"in":[73],"180nm":[74],"probe":[78],"station":[79],"measurement":[80],"reported.":[82]},"counts_by_year":[],"updated_date":"2026-10-14T16:39:01.820549","created_date":"2016-06-24T00:00:00"}