{"id":"https://openalex.org/W2041242016","doi":"https://doi.org/10.1016/j.sse.2005.12.012","title":"Low-temperature processing and properties of nanocrystalline-SiC/crystalline Si heterojunction devices","display_name":"Low-temperature processing and properties of nanocrystalline-SiC/crystalline Si heterojunction devices","publication_year":2006,"publication_date":"2006-02-01","ids":{"openalex":"https://openalex.org/W2041242016","doi":"https://doi.org/10.1016/j.sse.2005.12.012","mag":"2041242016"},"language":"en","primary_location":{"id":"doi:10.1016/j.sse.2005.12.012","doi":"https://doi.org/10.1016/j.sse.2005.12.012","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.sse.2005.12.012","pdf_url":null,"source":{"id":"https://openalex.org/S77418581","display_name":"Solid-State Electronics","issn_l":"0038-1101","issn":["0038-1101","1879-2405"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Solid-State Electronics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090379071","display_name":"H. Colder","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I194210350","display_name":"\u00c9cole Nationale Sup\u00e9rieure d'Ing\u00e9nieurs de Caen","ror":"https://ror.org/01fpqqe90","country_code":"FR","type":"education","lineage":["https://openalex.org/I194210350","https://openalex.org/I4210105918"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"H. Colder","raw_affiliation_strings":["SIFCOM, CNRS-UMR 6176, ENSICAEN, 6 Boulevard du Mar\u00e9chal Juin, 14050 Caen, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SIFCOM, CNRS-UMR 6176, ENSICAEN, 6 Boulevard du Mar\u00e9chal Juin, 14050 Caen, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I194210350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043020857","display_name":"R. Rizk","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I194210350","display_name":"\u00c9cole Nationale Sup\u00e9rieure d'Ing\u00e9nieurs de Caen","ror":"https://ror.org/01fpqqe90","country_code":"FR","type":"education","lineage":["https://openalex.org/I194210350","https://openalex.org/I4210105918"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"R. Rizk","raw_affiliation_strings":["SIFCOM, CNRS-UMR 6176, ENSICAEN, 6 Boulevard du Mar\u00e9chal Juin, 14050 Caen, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SIFCOM, CNRS-UMR 6176, ENSICAEN, 6 Boulevard du Mar\u00e9chal Juin, 14050 Caen, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I194210350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004666901","display_name":"Laurent Pichon","orcid":"https://orcid.org/0000-0002-1364-3983","observed_orcids":["https://orcid.org/0000-0002-1364-3983"]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210139483","display_name":"GREYC","ror":"https://ror.org/043749971","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I194210350","https://openalex.org/I4210105918","https://openalex.org/I4210139483","https://openalex.org/I4210159245","https://openalex.org/I98702875"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"L. Pichon","raw_affiliation_strings":["GREYC, CNRS-UMR 6072, ENSICAEN, 6 Boulevard du Mar\u00e9chal Juin, 14050 Caen, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"GREYC, CNRS-UMR 6072, ENSICAEN, 6 Boulevard du Mar\u00e9chal Juin, 14050 Caen, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210139483"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110342554","display_name":"Olivier Bonnaud","orcid":"https://orcid.org/0000-0002-7922-4917","observed_orcids":["https://orcid.org/0000-0002-7922-4917"]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210100151","display_name":"Institut d'\u00c9lectronique et des Technologies du num\u00e9Rique","ror":"https://ror.org/013q33h79","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I28221208","https://openalex.org/I4210095849","https://openalex.org/I4210100151","https://openalex.org/I56067802","https://openalex.org/I97188460"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"O. Bonnaud","raw_affiliation_strings":["IETR, CNRS-UMR 6164, Campus de Beaulieu, 35042 Rennes, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IETR, CNRS-UMR 6164, Campus de Beaulieu, 35042 Rennes, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210100151"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5090379071"],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I194210350"],"apc_list":{"value":2410,"currency":"USD","value_usd":2410},"apc_paid":null,"fwci":1.3124,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.79634076,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":96},"biblio":{"volume":"50","issue":"2","first_page":"209","last_page":"213"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.00430000014603138,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.0006000000284984708,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nanocrystalline-silicon-carbide","display_name":"nanocrystalline silicon carbide","score":0.8700000047683716},{"id":"https://openalex.org/keywords/low-temperature-processing","display_name":"low-temperature processing","score":0.8080000281333923},{"id":"https://openalex.org/keywords/magnetron-sputtering","display_name":"magnetron sputtering","score":0.9589999914169312},{"id":"https://openalex.org/keywords/leakage-current","display_name":"leakage current","score":0.8289999961853027},{"id":"https://openalex.org/keywords/band-gap","display_name":"band gap","score":0.6620000004768372},{"id":"https://openalex.org/keywords/ideality-factor","display_name":"ideality factor","score":0.9729999899864197},{"id":"https://openalex.org/keywords/defect-recovery","display_name":"defect recovery","score":0.6769999861717224},{"id":"https://openalex.org/keywords/rectification-ratio","display_name":"rectification ratio","score":0.7739999890327454}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7868380546569824},{"id":"https://openalex.org/C140676511","wikidata":"https://www.wikidata.org/wiki/Q6964018","display_name":"Nanocrystalline material","level":2,"score":0.7743738889694214},{"id":"https://openalex.org/C2779667780","wikidata":"https://www.wikidata.org/wiki/Q18206302","display_name":"Crystalline silicon","level":3,"score":0.6839309930801392},{"id":"https://openalex.org/C79794668","wikidata":"https://www.wikidata.org/wiki/Q1616270","display_name":"Heterojunction","level":2,"score":0.6123782396316528},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5205567479133606},{"id":"https://openalex.org/C2780722187","wikidata":"https://www.wikidata.org/wiki/Q412356","display_name":"Silicon carbide","level":2,"score":0.4307302236557007},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.3486708998680115},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.34144526720046997},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.3355526328086853},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.1759680211544037},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/j.sse.2005.12.012","doi":"https://doi.org/10.1016/j.sse.2005.12.012","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.sse.2005.12.012","pdf_url":null,"source":{"id":"https://openalex.org/S77418581","display_name":"Solid-State Electronics","issn_l":"0038-1101","issn":["0038-1101","1879-2405"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Solid-State Electronics","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-00437247v1","doi":null,"is_oa":false,"landing_page_url":"https://hal.science/hal-00437247","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Solid-State Electronics, 2006, 50 (2), pp.209-213","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1963667314","https://openalex.org/W1967511349","https://openalex.org/W1972891501","https://openalex.org/W1980693713","https://openalex.org/W1983956500","https://openalex.org/W1987917505","https://openalex.org/W2017403602","https://openalex.org/W2018992826","https://openalex.org/W2030706797","https://openalex.org/W2037631855","https://openalex.org/W2040330726","https://openalex.org/W2042622842","https://openalex.org/W2061186532","https://openalex.org/W2084954072","https://openalex.org/W2085382408","https://openalex.org/W2095015337","https://openalex.org/W2156043929","https://openalex.org/W2224528759","https://openalex.org/W2502961325","https://openalex.org/W4388955347"],"related_works":["https://openalex.org/W1980693713","https://openalex.org/W2016636861","https://openalex.org/W1977837757","https://openalex.org/W2363100557","https://openalex.org/W1989605128","https://openalex.org/W2538740358","https://openalex.org/W2040330726","https://openalex.org/W2095731960","https://openalex.org/W2524191184","https://openalex.org/W2069687149"],"abstract_inverted_index":null,"counts_by_year":[{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2025-10-10T00:00:00"}