{"id":"https://openalex.org/W2040929014","doi":"https://doi.org/10.1063/1.91550","title":"An n+-n-p germanium avalanche photodiode","display_name":"An n+-n-p germanium avalanche photodiode","publication_year":1980,"publication_date":"1980-04-01","ids":{"openalex":"https://openalex.org/W2040929014","doi":"https://doi.org/10.1063/1.91550","mag":"2040929014"},"language":"en","primary_location":{"id":"doi:10.1063/1.91550","doi":"https://doi.org/10.1063/1.91550","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.91550","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026972621","display_name":"Takao Kaneda","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Kaneda","raw_affiliation_strings":["Fujitsu Laboratories, Nakahara, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories, Nakahara, Kawasaki, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070884839","display_name":"Shuzo Kagawa","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Kagawa","raw_affiliation_strings":["Fujitsu Laboratories, Nakahara, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories, Nakahara, Kawasaki, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100512927","display_name":"T. Mikawa","orcid":"https://orcid.org/0009-0000-9052-5916","observed_orcids":["https://orcid.org/0009-0000-9052-5916"]},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Mikawa","raw_affiliation_strings":["Fujitsu Laboratories, Nakahara, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories, Nakahara, Kawasaki, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082329961","display_name":"Yoshikazu Toyama","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Toyama","raw_affiliation_strings":["Fujitsu Laboratories, Nakahara, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories, Nakahara, Kawasaki, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112189614","display_name":"H. Ando","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2251713219","display_name":"NTT (Japan)","ror":"https://ror.org/00berct97","country_code":"JP","type":"company","lineage":["https://openalex.org/I2251713219"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Ando","raw_affiliation_strings":["Musashino Electrical Communication Laboratory of NTT, Midoricho, Musashino, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Musashino Electrical Communication Laboratory of NTT, Midoricho, Musashino, Tokyo, Japan","institution_ids":["https://openalex.org/I2251713219"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":6.6881,"has_fulltext":false,"cited_by_count":21,"citation_normalized_percentile":{"value":0.9658556,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"36","issue":"7","first_page":"572","last_page":"574"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.7329000234603882,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.7329000234603882,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.05130000039935112,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.03269999846816063,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/germanium-avalanche-photodiode","display_name":"germanium avalanche photodiode","score":0.9459999799728394},{"id":"https://openalex.org/keywords/low-noise-photodetectors","display_name":"low-noise photodetectors","score":0.7599999904632568},{"id":"https://openalex.org/keywords/excess-noise-factor","display_name":"excess noise factor","score":0.8230000138282776},{"id":"https://openalex.org/keywords/internal-quantum-efficiency","display_name":"internal quantum efficiency","score":0.949999988079071},{"id":"https://openalex.org/keywords/1-3-mum","display_name":"1.3 \u03bcm wavelength","score":0.9139999747276306}],"concepts":[{"id":"https://openalex.org/C550623735","wikidata":"https://www.wikidata.org/wiki/Q867","display_name":"Germanium","level":3,"score":0.8564108610153198},{"id":"https://openalex.org/C109679912","wikidata":"https://www.wikidata.org/wiki/Q175932","display_name":"Avalanche photodiode","level":3,"score":0.7120777368545532},{"id":"https://openalex.org/C205507967","wikidata":"https://www.wikidata.org/wiki/Q900625","display_name":"Quantum efficiency","level":2,"score":0.6665052175521851},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.6420785784721375},{"id":"https://openalex.org/C751236","wikidata":"https://www.wikidata.org/wiki/Q175943","display_name":"Photodiode","level":2,"score":0.5993573665618896},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5810319185256958},{"id":"https://openalex.org/C95341827","wikidata":"https://www.wikidata.org/wiki/Q175898","display_name":"Avalanche diode","level":4,"score":0.5488473176956177},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5322784185409546},{"id":"https://openalex.org/C198291218","wikidata":"https://www.wikidata.org/wiki/Q190382","display_name":"Ionization","level":3,"score":0.49974703788757324},{"id":"https://openalex.org/C32921249","wikidata":"https://www.wikidata.org/wiki/Q2001256","display_name":"Impact ionization","level":4,"score":0.45093995332717896},{"id":"https://openalex.org/C6260449","wikidata":"https://www.wikidata.org/wiki/Q41364","display_name":"Wavelength","level":2,"score":0.4444343149662018},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4410454332828522},{"id":"https://openalex.org/C193361668","wikidata":"https://www.wikidata.org/wiki/Q7523761","display_name":"Single-photon avalanche diode","level":4,"score":0.43168947100639343},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.4191855788230896},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3763081431388855},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.34950608015060425},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.342771977186203},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.22207626700401306},{"id":"https://openalex.org/C119321828","wikidata":"https://www.wikidata.org/wiki/Q1267190","display_name":"Breakdown voltage","level":3,"score":0.101339191198349},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.073062002658844},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1063/1.91550","doi":"https://doi.org/10.1063/1.91550","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.91550","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1971008757","https://openalex.org/W1989350905","https://openalex.org/W2003425845","https://openalex.org/W2006614205","https://openalex.org/W2011995528","https://openalex.org/W2043653221","https://openalex.org/W2112876374","https://openalex.org/W2128023129","https://openalex.org/W2156905277","https://openalex.org/W3145757629"],"related_works":["https://openalex.org/W2011995528","https://openalex.org/W2076370952","https://openalex.org/W2082447325","https://openalex.org/W2156905277","https://openalex.org/W2087224329","https://openalex.org/W2067150823","https://openalex.org/W2019595753","https://openalex.org/W2995575510","https://openalex.org/W2545186715","https://openalex.org/W1991440563"],"abstract_inverted_index":{"Low-noise":[0],"germanium":[1],"avalanche":[2],"photodiodes":[3],"of":[4,50,57,69],"an":[5],"n+-n-p":[6,12,33],"structure":[7],"have":[8,14,24,35],"been":[9],"investigated.":[10],"Deep":[11],"junctions":[13,21],"a":[15,25,36,55],"lower":[16],"noise":[17,43],"than":[18],"shallow":[19],"n+-p":[20,63],"because":[22],"holes":[23],"higher":[26,37],"ionization":[27],"coefficient":[28],"in":[29],"germanium,":[30],"and":[31],"these":[32],"diodes":[34],"hole-to-electron":[38],"collection":[39],"efficiency.":[40],"An":[41,65],"excess":[42],"factor":[44,49],"F\u22487":[45],"at":[46,54,73],"the":[47],"multiplication":[48],"10":[51],"are":[52],"obtained":[53,72],"wavelength":[56],"1.3":[58,74],"\u03bcm,":[59],"whereas":[60],"F\u224810":[61],"for":[62],"diodes.":[64],"internal":[66],"quantum":[67],"efficiency":[68],"70\u201380%":[70],"is":[71],"\u03bcm.":[75]},"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}