{"id":"https://openalex.org/W2040635906","doi":"https://doi.org/10.1109/tr.1973.5215929","title":"Human Reliability in Computer-Based Business Information Systems","display_name":"Human Reliability in Computer-Based Business Information Systems","publication_year":1973,"publication_date":"1973-08-01","ids":{"openalex":"https://openalex.org/W2040635906","doi":"https://doi.org/10.1109/tr.1973.5215929","mag":"2040635906"},"language":"en","primary_location":{"id":"doi:10.1109/tr.1973.5215929","doi":"https://doi.org/10.1109/tr.1973.5215929","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.1973.5215929","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","ccf-c","cwts-core","dongbi-b","jufo-2","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037458638","display_name":"Robert W. Bailey","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2802026036","display_name":"New Brunswick Community College","ror":"https://ror.org/0329kr519","country_code":"CA","type":"education","lineage":["https://openalex.org/I2802026036"]},{"id":"https://openalex.org/I4210137283","display_name":"New Jersey Health Foundation","ror":"https://ror.org/040may582","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210137283"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"Robert W. Bailey","raw_affiliation_strings":["Bell Laboratories, Inc., New Brunswick, NJ, USA","Bell Laboratories, New Brunswick, N.J. 08903"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bell Laboratories, Inc., New Brunswick, NJ, USA","institution_ids":[]},{"raw_affiliation_string":"Bell Laboratories, New Brunswick, N.J. 08903","institution_ids":["https://openalex.org/I2802026036","https://openalex.org/I4210137283"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062005964","display_name":"Stephen T. DeMers","orcid":"https://orcid.org/0000-0003-1613-2721","observed_orcids":["https://orcid.org/0000-0003-1613-2721"]},"institutions":[{"id":"https://openalex.org/I2802026036","display_name":"New Brunswick Community College","ror":"https://ror.org/0329kr519","country_code":"CA","type":"education","lineage":["https://openalex.org/I2802026036"]},{"id":"https://openalex.org/I4210137283","display_name":"New Jersey Health Foundation","ror":"https://ror.org/040may582","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210137283"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"Stephen T. Demers","raw_affiliation_strings":["Bell Laboratories, Inc., New Brunswick, NJ, USA","Bell Laboratories, New Brunswick, N.J. 08903"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bell Laboratories, Inc., New Brunswick, NJ, USA","institution_ids":[]},{"raw_affiliation_string":"Bell Laboratories, New Brunswick, N.J. 08903","institution_ids":["https://openalex.org/I2802026036","https://openalex.org/I4210137283"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012855270","display_name":"Allen I. Lebowitz","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2802026036","display_name":"New Brunswick Community College","ror":"https://ror.org/0329kr519","country_code":"CA","type":"education","lineage":["https://openalex.org/I2802026036"]},{"id":"https://openalex.org/I4210137283","display_name":"New Jersey Health Foundation","ror":"https://ror.org/040may582","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210137283"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"Allen I. Lebowitz","raw_affiliation_strings":["Bell Laboratories, Inc., New Brunswick, NJ, USA","Bell Laboratories, New Brunswick, N.J. 08903"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bell Laboratories, Inc., New Brunswick, NJ, USA","institution_ids":[]},{"raw_affiliation_string":"Bell Laboratories, New Brunswick, N.J. 08903","institution_ids":["https://openalex.org/I2802026036","https://openalex.org/I4210137283"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.3375286,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"R-22","issue":"3","first_page":"140","last_page":"148"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.8705999851226807,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.8705999851226807,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.07159999758005142,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10525","display_name":"Human-Automation Interaction and Safety","score":0.021199999377131462,"subfield":{"id":"https://openalex.org/subfields/3207","display_name":"Social Psychology"},"field":{"id":"https://openalex.org/fields/32","display_name":"Psychology"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/human-reliability","display_name":"human reliability","score":0.9789999723434448},{"id":"https://openalex.org/keywords/human-error","display_name":"human error","score":0.8429999947547913},{"id":"https://openalex.org/keywords/error-causes","display_name":"error causes","score":0.6079999804496765},{"id":"https://openalex.org/keywords/error-prevention","display_name":"error prevention","score":0.8050000071525574},{"id":"https://openalex.org/keywords/human-machine-interaction","display_name":"human-machine interaction","score":0.7269999980926514},{"id":"https://openalex.org/keywords/documentation","display_name":"documentation","score":0.48500001430511475},{"id":"https://openalex.org/keywords/training","display_name":"training","score":0.6449999809265137},{"id":"https://openalex.org/keywords/system-design","display_name":"system design","score":0.7760000228881836},{"id":"https://openalex.org/keywords/work-environment","display_name":"work environment","score":0.5669999718666077},{"id":"https://openalex.org/keywords/error-rate","display_name":"error rate","score":0.367000013589859}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7086372971534729},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7045289278030396},{"id":"https://openalex.org/C56666940","wikidata":"https://www.wikidata.org/wiki/Q788790","display_name":"Documentation","level":2,"score":0.6822783946990967},{"id":"https://openalex.org/C169806903","wikidata":"https://www.wikidata.org/wiki/Q5937752","display_name":"Human error","level":2,"score":0.6812334060668945},{"id":"https://openalex.org/C191147762","wikidata":"https://www.wikidata.org/wiki/Q186289","display_name":"Human reliability","level":3,"score":0.5850050449371338},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5082632899284363},{"id":"https://openalex.org/C40969351","wikidata":"https://www.wikidata.org/wiki/Q3516228","display_name":"Word error rate","level":2,"score":0.49256402254104614},{"id":"https://openalex.org/C2781039887","wikidata":"https://www.wikidata.org/wiki/Q1391724","display_name":"Factor (programming language)","level":2,"score":0.46901386976242065},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.42072558403015137},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.4190460443496704},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3285561800003052},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.2834671139717102},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.23956209421157837},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15930190682411194},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.08014756441116333},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.0},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.1973.5215929","doi":"https://doi.org/10.1109/tr.1973.5215929","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.1973.5215929","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-class-a","anvur-scientific","ccf-c","cwts-core","dongbi-b","jufo-2","norway-1","poland-140","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320338291","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W216311336","https://openalex.org/W233230993","https://openalex.org/W264671732","https://openalex.org/W1514091227","https://openalex.org/W1516311415","https://openalex.org/W1540930044","https://openalex.org/W1576844744","https://openalex.org/W1716091274","https://openalex.org/W1975533698","https://openalex.org/W1986366597","https://openalex.org/W2006915130","https://openalex.org/W2007310963","https://openalex.org/W2014876801","https://openalex.org/W2032031068","https://openalex.org/W2036060347","https://openalex.org/W2037403258","https://openalex.org/W2060170951","https://openalex.org/W2073524501","https://openalex.org/W2074094522","https://openalex.org/W2074739924","https://openalex.org/W2078592330","https://openalex.org/W2088752125","https://openalex.org/W2138934130","https://openalex.org/W2143976629","https://openalex.org/W2154349255","https://openalex.org/W2323142435","https://openalex.org/W2792017004","https://openalex.org/W3160935899","https://openalex.org/W4206180018","https://openalex.org/W4254798455","https://openalex.org/W4289252975"],"related_works":["https://openalex.org/W2101666697","https://openalex.org/W2388997529","https://openalex.org/W4254275923","https://openalex.org/W257610441","https://openalex.org/W2388405609","https://openalex.org/W1974549718","https://openalex.org/W1997972445","https://openalex.org/W2120927876","https://openalex.org/W2731040058","https://openalex.org/W2032276035"],"abstract_inverted_index":{"The":[0,55],"study":[1,32],"of":[2,33],"human":[3,34],"reliability":[4,35],"has":[5],"traditionally":[6],"taken":[7],"an":[8],"``error-rate''":[9],"approach,":[10],"with":[11],"the":[12,31,44,85],"emphasis":[13],"on":[14],"identifying":[15,37],"and":[16,20,69],"reporting":[17],"supposedly":[18],"consistent":[19],"basic":[21],"error-rate":[22],"levels":[23],"for":[24],"various":[25],"manual":[26],"activities.":[27],"This":[28,71],"paper":[29],"approaches":[30],"by":[36,83],"numerous":[38],"factors":[39,86],"that":[40,46,76,87],"tend":[41],"to":[42,90],"increase":[43],"probability":[45],"errors":[47,79,89],"will":[48],"occur":[49],"in":[50],"computer-based":[51],"business":[52],"information":[53],"systems.":[54],"major":[56],"causal":[57,72],"factor":[58,73],"categories":[59],"are":[60],"personal,":[61],"design,":[62],"documentation,":[63],"training,":[64],"source":[65],"data,":[66],"man-machine":[67],"interface,":[68],"environment.":[70],"approach":[74],"suggests":[75],"most":[77],"human-generated":[78],"can":[80],"be":[81],"prevented":[82],"eliminating":[84],"cause":[88],"occur.":[91]},"counts_by_year":[],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2016-06-24T00:00:00"}