{"id":"https://openalex.org/W2038486554","doi":"https://doi.org/10.1016/s1567-1739(02)00095-0","title":"A p-channel SMC poly-Si thin film-transistor with a GOLDD structure","display_name":"A p-channel SMC poly-Si thin film-transistor with a GOLDD structure","publication_year":2002,"publication_date":"2002-08-01","ids":{"openalex":"https://openalex.org/W2038486554","doi":"https://doi.org/10.1016/s1567-1739(02)00095-0","mag":"2038486554"},"language":"en","primary_location":{"id":"doi:10.1016/s1567-1739(02)00095-0","doi":"https://doi.org/10.1016/s1567-1739(02)00095-0","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s1567-1739(02)00095-0","pdf_url":null,"source":{"id":"https://openalex.org/S159232998","display_name":"Current Applied Physics","issn_l":"1567-1739","issn":["1567-1739","1878-1675"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","kci-registered","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Current Applied Physics","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024842957","display_name":"Yong Duck Son","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I35928602","display_name":"Kyung Hee University","ror":"https://ror.org/01zqcg218","country_code":"KR","type":"education","lineage":["https://openalex.org/I35928602"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Yong Duck Son","raw_affiliation_strings":["Department of Physics, Kyung Hee University, Seoul 130-701, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Kyung Hee University, Seoul 130-701, South Korea","institution_ids":["https://openalex.org/I35928602"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079975165","display_name":"Kyu Sik Cho","orcid":"https://orcid.org/0000-0002-1429-915X","observed_orcids":["https://orcid.org/0000-0002-1429-915X"]},"institutions":[{"id":"https://openalex.org/I35928602","display_name":"Kyung Hee University","ror":"https://ror.org/01zqcg218","country_code":"KR","type":"education","lineage":["https://openalex.org/I35928602"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyu Sik Cho","raw_affiliation_strings":["Department of Physics, Kyung Hee University, Seoul 130-701, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Kyung Hee University, Seoul 130-701, South Korea","institution_ids":["https://openalex.org/I35928602"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110294004","display_name":"Seong Yeol Yoo","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I35928602","display_name":"Kyung Hee University","ror":"https://ror.org/01zqcg218","country_code":"KR","type":"education","lineage":["https://openalex.org/I35928602"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seong Yeol Yoo","raw_affiliation_strings":["Department of Physics, Kyung Hee University, Seoul 130-701, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Kyung Hee University, Seoul 130-701, South Korea","institution_ids":["https://openalex.org/I35928602"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015113613","display_name":"Jong Uk Kwak","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I35928602","display_name":"Kyung Hee University","ror":"https://ror.org/01zqcg218","country_code":"KR","type":"education","lineage":["https://openalex.org/I35928602"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jong Uk Kwak","raw_affiliation_strings":["Department of Physics, Kyung Hee University, Seoul 130-701, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Kyung Hee University, Seoul 130-701, South Korea","institution_ids":["https://openalex.org/I35928602"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100632157","display_name":"Kyung Ho Kim","orcid":"https://orcid.org/0000-0003-3587-0877","observed_orcids":["https://orcid.org/0000-0003-3587-0877"]},"institutions":[{"id":"https://openalex.org/I35928602","display_name":"Kyung Hee University","ror":"https://ror.org/01zqcg218","country_code":"KR","type":"education","lineage":["https://openalex.org/I35928602"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyung Ho Kim","raw_affiliation_strings":["Department of Physics, Kyung Hee University, Seoul 130-701, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Kyung Hee University, Seoul 130-701, South Korea","institution_ids":["https://openalex.org/I35928602"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5046235309","display_name":"Jin Hyuk Jang","orcid":"https://orcid.org/0000-0002-7572-5669","observed_orcids":["https://orcid.org/0000-0002-7572-5669"]},"institutions":[{"id":"https://openalex.org/I35928602","display_name":"Kyung Hee University","ror":"https://ror.org/01zqcg218","country_code":"KR","type":"education","lineage":["https://openalex.org/I35928602"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jin Jang","raw_affiliation_strings":["Department of Physics, Kyung Hee University, Seoul 130-701, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Kyung Hee University, Seoul 130-701, South Korea","institution_ids":["https://openalex.org/I35928602"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5024842957"],"corresponding_institution_ids":["https://openalex.org/I35928602"],"apc_list":{"value":2640,"currency":"USD","value_usd":2640},"apc_paid":null,"fwci":0.3496,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.68386904,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"2","issue":"4","first_page":"269","last_page":"272"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9926999807357788,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9926999807357788,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.0038999998942017555,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10045","display_name":"Organic Electronics and Photovoltaics","score":0.0017000000225380063,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/p-channel-thin-film-transistors","display_name":"p-channel thin-film transistors","score":0.8880000114440918},{"id":"https://openalex.org/keywords/polycrystalline-silicon","display_name":"polycrystalline silicon","score":0.9649999737739563},{"id":"https://openalex.org/keywords/off-state-leakage-current","display_name":"off-state leakage current","score":0.9769999980926514},{"id":"https://openalex.org/keywords/field-effect-mobility","display_name":"field-effect mobility","score":0.9390000104904175},{"id":"https://openalex.org/keywords/amorphous-silicon-crystallization","display_name":"amorphous silicon crystallization","score":0.6299999952316284}],"concepts":[{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.8828456401824951},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7906171679496765},{"id":"https://openalex.org/C2780565262","wikidata":"https://www.wikidata.org/wiki/Q737038","display_name":"Polycrystalline silicon","level":4,"score":0.7841231226921082},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.650669515132904},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5706972479820251},{"id":"https://openalex.org/C203036418","wikidata":"https://www.wikidata.org/wiki/Q284256","display_name":"Crystallization","level":2,"score":0.5469250679016113},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.48253390192985535},{"id":"https://openalex.org/C2780901251","wikidata":"https://www.wikidata.org/wiki/Q426473","display_name":"Silicide","level":3,"score":0.4323716163635254},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4317566156387329},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.37336474657058716},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.217426598072052},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.08892202377319336},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.07117190957069397},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s1567-1739(02)00095-0","doi":"https://doi.org/10.1016/s1567-1739(02)00095-0","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s1567-1739(02)00095-0","pdf_url":null,"source":{"id":"https://openalex.org/S159232998","display_name":"Current Applied Physics","issn_l":"1567-1739","issn":["1567-1739","1878-1675"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","kci-registered","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Current Applied Physics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1965215593","https://openalex.org/W1971563767","https://openalex.org/W1989756903","https://openalex.org/W2040825527","https://openalex.org/W2065299813","https://openalex.org/W2103144163","https://openalex.org/W2115506273","https://openalex.org/W2124013960","https://openalex.org/W2535329051","https://openalex.org/W6664220349","https://openalex.org/W6677340708"],"related_works":["https://openalex.org/W1967490571","https://openalex.org/W2170193085","https://openalex.org/W2129915025","https://openalex.org/W2116580792","https://openalex.org/W1994361803","https://openalex.org/W2146056913","https://openalex.org/W1971899562","https://openalex.org/W2143537104","https://openalex.org/W2165732513","https://openalex.org/W2160400064"],"abstract_inverted_index":null,"counts_by_year":[{"year":2013,"cited_by_count":1}],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}