{"id":"https://openalex.org/W2038213636","doi":"https://doi.org/10.1016/j.mseb.2010.07.010","title":"Structural and electrical characteristics of ZrO2\u2013TiO2 thin films by sol\u2013gel method","display_name":"Structural and electrical characteristics of ZrO2\u2013TiO2 thin films by sol\u2013gel method","publication_year":2010,"publication_date":"2010-07-21","ids":{"openalex":"https://openalex.org/W2038213636","doi":"https://doi.org/10.1016/j.mseb.2010.07.010","mag":"2038213636"},"language":"en","primary_location":{"id":"doi:10.1016/j.mseb.2010.07.010","doi":"https://doi.org/10.1016/j.mseb.2010.07.010","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.mseb.2010.07.010","pdf_url":null,"source":{"id":"https://openalex.org/S4210190818","display_name":"Materials Science and Engineering B","issn_l":"0921-5107","issn":["0921-5107","1873-4944"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Materials Science and Engineering: B","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102242968","display_name":"Cheng\u2010Hsing Hsu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I125934054","display_name":"National United University","ror":"https://ror.org/04twccc71","country_code":"TW","type":"education","lineage":["https://openalex.org/I125934054"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Cheng-Hsing Hsu","raw_affiliation_strings":["Department of Electrical Engineering, National United University, No. 1 Lien\u2010Da, Kung\u2010Ching Li, Miao\u2010Li 36003, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National United University, No. 1 Lien\u2010Da, Kung\u2010Ching Li, Miao\u2010Li 36003, Taiwan","institution_ids":["https://openalex.org/I125934054"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110157817","display_name":"Ching\u2010Fang Tseng","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I125934054","display_name":"National United University","ror":"https://ror.org/04twccc71","country_code":"TW","type":"education","lineage":["https://openalex.org/I125934054"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ching-Fang Tseng","raw_affiliation_strings":["Department of Electronic Engineering, National United University, No.1 Lien Da, Kung\u2010Ching Li, Miao\u2010Li 36003, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, National United University, No.1 Lien Da, Kung\u2010Ching Li, Miao\u2010Li 36003, Taiwan","institution_ids":["https://openalex.org/I125934054"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103421460","display_name":"Chun\u2010Hung Lai","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I125934054","display_name":"National United University","ror":"https://ror.org/04twccc71","country_code":"TW","type":"education","lineage":["https://openalex.org/I125934054"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chun-Hung Lai","raw_affiliation_strings":["Department of Electronic Engineering, National United University, No.1 Lien Da, Kung\u2010Ching Li, Miao\u2010Li 36003, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, National United University, No.1 Lien Da, Kung\u2010Ching Li, Miao\u2010Li 36003, Taiwan","institution_ids":["https://openalex.org/I125934054"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108362980","display_name":"Hsin\u2010Han Tung","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I125934054","display_name":"National United University","ror":"https://ror.org/04twccc71","country_code":"TW","type":"education","lineage":["https://openalex.org/I125934054"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Hsin-Han Tung","raw_affiliation_strings":["Department of Electrical Engineering, National United University, No. 1 Lien\u2010Da, Kung\u2010Ching Li, Miao\u2010Li 36003, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National United University, No. 1 Lien\u2010Da, Kung\u2010Ching Li, Miao\u2010Li 36003, Taiwan","institution_ids":["https://openalex.org/I125934054"]}]},{"author_position":"last","author":{"id":null,"display_name":"Shih-Yao Lin","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I125934054","display_name":"National United University","ror":"https://ror.org/04twccc71","country_code":"TW","type":"education","lineage":["https://openalex.org/I125934054"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shih-Yao Lin","raw_affiliation_strings":["Department of Electrical Engineering, National United University, No. 1 Lien\u2010Da, Kung\u2010Ching Li, Miao\u2010Li 36003, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National United University, No. 1 Lien\u2010Da, Kung\u2010Ching Li, Miao\u2010Li 36003, Taiwan","institution_ids":["https://openalex.org/I125934054"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I125934054"],"apc_list":{"value":3140,"currency":"USD","value_usd":3140},"apc_paid":null,"fwci":0.742,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.74701034,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"175","issue":"2","first_page":"181","last_page":"184"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.5386000275611877,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.5386000275611877,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.3086000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.10029999911785126,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sol-gel-thin-films","display_name":"sol-gel thin films","score":0.6880000233650208},{"id":"https://openalex.org/keywords/annealing-temperature","display_name":"annealing temperature","score":0.9419999718666077},{"id":"https://openalex.org/keywords/crystal-orientation","display_name":"crystal orientation","score":0.7170000076293945},{"id":"https://openalex.org/keywords/grain-size","display_name":"grain size","score":0.968999981880188},{"id":"https://openalex.org/keywords/leakage-current-density","display_name":"leakage current density","score":0.9419999718666077},{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"resistive random access memory","score":0.7149999737739563},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"non-volatile memory","score":0.8600000143051147},{"id":"https://openalex.org/keywords/resistive-switching","display_name":"resistive switching","score":0.5720000267028809}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.697008490562439},{"id":"https://openalex.org/C38398224","wikidata":"https://www.wikidata.org/wiki/Q48350","display_name":"Sol-gel","level":2,"score":0.5991924405097961},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.44397497177124023},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.17082267999649048}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.mseb.2010.07.010","doi":"https://doi.org/10.1016/j.mseb.2010.07.010","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.mseb.2010.07.010","pdf_url":null,"source":{"id":"https://openalex.org/S4210190818","display_name":"Materials Science and Engineering B","issn_l":"0921-5107","issn":["0921-5107","1873-4944"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-100","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Materials Science and Engineering: B","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321040","display_name":"National Science Council","ror":"https://ror.org/02kv4zf79"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1508018340","https://openalex.org/W1645007147","https://openalex.org/W1967712569","https://openalex.org/W1968056127","https://openalex.org/W1969466968","https://openalex.org/W1969643655","https://openalex.org/W1969819240","https://openalex.org/W1969989204","https://openalex.org/W1974085346","https://openalex.org/W1986643390","https://openalex.org/W1988192967","https://openalex.org/W2000176448","https://openalex.org/W2019010830","https://openalex.org/W2024433625","https://openalex.org/W2045904683","https://openalex.org/W2048936516","https://openalex.org/W2052390316","https://openalex.org/W2053506079","https://openalex.org/W2062748775","https://openalex.org/W2131323489","https://openalex.org/W2319371675","https://openalex.org/W2553975475"],"related_works":["https://openalex.org/W1978297105","https://openalex.org/W2008160799","https://openalex.org/W2029660990","https://openalex.org/W1968534410","https://openalex.org/W7099406173","https://openalex.org/W2319371675","https://openalex.org/W2021467517","https://openalex.org/W2092134978","https://openalex.org/W4205862298","https://openalex.org/W2055665769"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":3}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2016-06-24T00:00:00"}