{"id":"https://openalex.org/W2036668581","doi":"https://doi.org/10.1007/s11664-008-0457-9","title":"ZnO TFT Devices Built on Glass Substrates","display_name":"ZnO TFT Devices Built on Glass Substrates","publication_year":2008,"publication_date":"2008-05-01","ids":{"openalex":"https://openalex.org/W2036668581","doi":"https://doi.org/10.1007/s11664-008-0457-9","mag":"2036668581"},"language":"en","primary_location":{"id":"doi:10.1007/s11664-008-0457-9","doi":"https://doi.org/10.1007/s11664-008-0457-9","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11664-008-0457-9","pdf_url":null,"source":{"id":"https://openalex.org/S127985767","display_name":"Journal of Electronic Materials","issn_l":"0361-5235","issn":["0361-5235","0381-5235","1543-186X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-40","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Materials","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101442625","display_name":"Jianmin Zhu","orcid":"https://orcid.org/0000-0002-8815-8595","observed_orcids":["https://orcid.org/0000-0002-8815-8595"]},"institutions":[{"id":"https://openalex.org/I102322142","display_name":"Rutgers, The State University of New Jersey","ror":"https://ror.org/05vt9qd57","country_code":"US","type":"education","lineage":["https://openalex.org/I102322142"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Zhu","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Rutgers University, 94 Brett Road, Piscataway, NJ, 08854, USA","Rutgers, University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Rutgers University, 94 Brett Road, Piscataway, NJ, 08854, USA","institution_ids":["https://openalex.org/I102322142"]},{"raw_affiliation_string":"Rutgers, University","institution_ids":["https://openalex.org/I102322142"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009954901","display_name":"H. Chen","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I102322142","display_name":"Rutgers, The State University of New Jersey","ror":"https://ror.org/05vt9qd57","country_code":"US","type":"education","lineage":["https://openalex.org/I102322142"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H. Chen","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Rutgers University, 94 Brett Road, Piscataway, NJ, 08854, USA","Rutgers, University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Rutgers University, 94 Brett Road, Piscataway, NJ, 08854, USA","institution_ids":["https://openalex.org/I102322142"]},{"raw_affiliation_string":"Rutgers, University","institution_ids":["https://openalex.org/I102322142"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087357623","display_name":"Gaurav Saraf","orcid":"https://orcid.org/0009-0006-1198-6671","observed_orcids":["https://orcid.org/0009-0006-1198-6671"]},"institutions":[{"id":"https://openalex.org/I102322142","display_name":"Rutgers, The State University of New Jersey","ror":"https://ror.org/05vt9qd57","country_code":"US","type":"education","lineage":["https://openalex.org/I102322142"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"G. Saraf","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Rutgers University, 94 Brett Road, Piscataway, NJ, 08854, USA","Rutgers, University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Rutgers University, 94 Brett Road, Piscataway, NJ, 08854, USA","institution_ids":["https://openalex.org/I102322142"]},{"raw_affiliation_string":"Rutgers, University","institution_ids":["https://openalex.org/I102322142"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023689818","display_name":"Zhixiong Duan","orcid":"https://orcid.org/0009-0000-0669-8604","observed_orcids":["https://orcid.org/0009-0000-0669-8604"]},"institutions":[{"id":"https://openalex.org/I102322142","display_name":"Rutgers, The State University of New Jersey","ror":"https://ror.org/05vt9qd57","country_code":"US","type":"education","lineage":["https://openalex.org/I102322142"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Z. Duan","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Rutgers University, 94 Brett Road, Piscataway, NJ, 08854, USA","Rutgers, University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Rutgers University, 94 Brett Road, Piscataway, NJ, 08854, USA","institution_ids":["https://openalex.org/I102322142"]},{"raw_affiliation_string":"Rutgers, University","institution_ids":["https://openalex.org/I102322142"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082942119","display_name":"Yicheng Lu","orcid":"https://orcid.org/0000-0001-8338-9266","observed_orcids":["https://orcid.org/0000-0001-8338-9266"]},"institutions":[{"id":"https://openalex.org/I102322142","display_name":"Rutgers, The State University of New Jersey","ror":"https://ror.org/05vt9qd57","country_code":"US","type":"education","lineage":["https://openalex.org/I102322142"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Y. Lu","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Rutgers University, 94 Brett Road, Piscataway, NJ, 08854, USA","Rutgers, University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Rutgers University, 94 Brett Road, Piscataway, NJ, 08854, USA","institution_ids":["https://openalex.org/I102322142"]},{"raw_affiliation_string":"Rutgers, University","institution_ids":["https://openalex.org/I102322142"]}]},{"author_position":"last","author":{"id":null,"display_name":"S.T. Hsu","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S.T. Hsu","raw_affiliation_strings":["Sharp Laboratories of America, Inc., 5700 NW Pacific Rim Boulevard, Camas, WA, 98607, USA","Sharp Laboratories of America, Inc"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sharp Laboratories of America, Inc., 5700 NW Pacific Rim Boulevard, Camas, WA, 98607, USA","institution_ids":[]},{"raw_affiliation_string":"Sharp Laboratories of America, Inc","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5082942119"],"corresponding_institution_ids":["https://openalex.org/I102322142"],"apc_list":{"value":3390,"currency":"USD","value_usd":3390},"apc_paid":null,"fwci":4.9244,"has_fulltext":false,"cited_by_count":46,"citation_normalized_percentile":{"value":0.94864379,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":87,"max":98},"biblio":{"volume":"37","issue":"9","first_page":"1237","last_page":"1240"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.8759999871253967,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.8759999871253967,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.12080000340938568,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10045","display_name":"Organic Electronics and Photovoltaics","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/zno-thin-film-transistors","display_name":"ZnO thin-film transistors","score":0.9679999947547913},{"id":"https://openalex.org/keywords/glass-substrates","display_name":"glass substrates","score":0.984000027179718},{"id":"https://openalex.org/keywords/depletion-mode","display_name":"depletion mode","score":0.9259999990463257},{"id":"https://openalex.org/keywords/metal-organic-chemical-vapor-deposition","display_name":"metalorganic chemical vapor deposition","score":0.8880000114440918},{"id":"https://openalex.org/keywords/sio2-gate-dielectric","display_name":"SiO2 gate dielectric","score":0.984000027179718},{"id":"https://openalex.org/keywords/field-effect-mobility","display_name":"field-effect mobility","score":0.7979999780654907},{"id":"https://openalex.org/keywords/on-off-ratio","display_name":"on/off current ratio","score":0.9520000219345093},{"id":"https://openalex.org/keywords/optical-transmittance","display_name":"optical transmittance","score":0.8980000019073486}],"concepts":[{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.9126940965652466},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7416855096817017},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6829825043678284},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.6291152834892273},{"id":"https://openalex.org/C150493377","wikidata":"https://www.wikidata.org/wiki/Q1427863","display_name":"Transmittance","level":2,"score":0.6276198625564575},{"id":"https://openalex.org/C175665537","wikidata":"https://www.wikidata.org/wiki/Q1924991","display_name":"Metalorganic vapour phase epitaxy","level":4,"score":0.6129999160766602},{"id":"https://openalex.org/C31500677","wikidata":"https://www.wikidata.org/wiki/Q4533278","display_name":"Field effect","level":2,"score":0.5868086814880371},{"id":"https://openalex.org/C57410435","wikidata":"https://www.wikidata.org/wiki/Q505668","display_name":"Chemical vapor deposition","level":2,"score":0.5432949066162109},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.4917602837085724},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4804089367389679},{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.47315534949302673},{"id":"https://openalex.org/C166972891","wikidata":"https://www.wikidata.org/wiki/Q5527011","display_name":"Gate dielectric","level":4,"score":0.43263494968414307},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.1950456202030182},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1673666536808014},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09900662302970886},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s11664-008-0457-9","doi":"https://doi.org/10.1007/s11664-008-0457-9","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s11664-008-0457-9","pdf_url":null,"source":{"id":"https://openalex.org/S127985767","display_name":"Journal of Electronic Materials","issn_l":"0361-5235","issn":["0361-5235","0381-5235","1543-186X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-40","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Materials","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1679720425","https://openalex.org/W1967962577","https://openalex.org/W1995356112","https://openalex.org/W2001827620","https://openalex.org/W2008421687","https://openalex.org/W2008890811","https://openalex.org/W2015638039","https://openalex.org/W2025192354","https://openalex.org/W2026746318","https://openalex.org/W2042198333","https://openalex.org/W2046791610","https://openalex.org/W2065374951","https://openalex.org/W2134960271"],"related_works":["https://openalex.org/W2024560774","https://openalex.org/W2034294335","https://openalex.org/W2280540375","https://openalex.org/W2029119077","https://openalex.org/W128707394","https://openalex.org/W2349094772","https://openalex.org/W2110588432","https://openalex.org/W2322919136","https://openalex.org/W2000851034","https://openalex.org/W116929887"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":5},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}