{"id":"https://openalex.org/W2036244271","doi":"https://doi.org/10.1557/jmr.1988.0406","title":"Direct observation of ordering in (GaIn) P","display_name":"Direct observation of ordering in (GaIn) P","publication_year":1988,"publication_date":"1988-06-01","ids":{"openalex":"https://openalex.org/W2036244271","doi":"https://doi.org/10.1557/jmr.1988.0406","mag":"2036244271"},"language":"en","primary_location":{"id":"doi:10.1557/jmr.1988.0406","doi":"https://doi.org/10.1557/jmr.1988.0406","is_oa":false,"landing_page_url":"https://doi.org/10.1557/jmr.1988.0406","pdf_url":null,"source":{"id":"https://openalex.org/S19730638","display_name":"Journal of materials research/Pratt's guide to venture capital sources","issn_l":"0884-1616","issn":["0884-1616","0884-2914","1091-8876","1092-8928","2044-5326"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Materials Research","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110536819","display_name":"S. McKernan","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I205783295","display_name":"Cornell University","ror":"https://ror.org/05bnh6r87","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. McKernan","raw_affiliation_strings":["Department of Materials Science and Engineering, Bard Hall. Cornell University, Ithaca, 14853, New York, USA","Dept. of Materials Sci. and Engineering, Bard Hall, Cornell Univ., Ithaca, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, Bard Hall. Cornell University, Ithaca, 14853, New York, USA","institution_ids":["https://openalex.org/I205783295"]},{"raw_affiliation_string":"Dept. of Materials Sci. and Engineering, Bard Hall, Cornell Univ., Ithaca, USA","institution_ids":["https://openalex.org/I205783295"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046376910","display_name":"Bruno Charles De Cooman","orcid":"https://orcid.org/0000-0002-4891-6515","observed_orcids":["https://orcid.org/0000-0002-4891-6515"]},"institutions":[{"id":"https://openalex.org/I205783295","display_name":"Cornell University","ror":"https://ror.org/05bnh6r87","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B. C. De Cooman","raw_affiliation_strings":["Department of Materials Science and Engineering, Bard Hall. Cornell University, Ithaca, 14853, New York, USA","Dept. of Materials Sci. and Engineering, Bard Hall, Cornell Univ., Ithaca, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, Bard Hall. Cornell University, Ithaca, 14853, New York, USA","institution_ids":["https://openalex.org/I205783295"]},{"raw_affiliation_string":"Dept. of Materials Sci. and Engineering, Bard Hall, Cornell Univ., Ithaca, USA","institution_ids":["https://openalex.org/I205783295"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049295186","display_name":"C. B. Carter","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I205783295","display_name":"Cornell University","ror":"https://ror.org/05bnh6r87","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C. B. Carter","raw_affiliation_strings":["Department of Materials Science and Engineering, Bard Hall. Cornell University, Ithaca, 14853, New York, USA","Dept. of Materials Sci. and Engineering, Bard Hall, Cornell Univ., Ithaca, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, Bard Hall. Cornell University, Ithaca, 14853, New York, USA","institution_ids":["https://openalex.org/I205783295"]},{"raw_affiliation_string":"Dept. of Materials Sci. and Engineering, Bard Hall, Cornell Univ., Ithaca, USA","institution_ids":["https://openalex.org/I205783295"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109218952","display_name":"David P. Bour","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I205783295","display_name":"Cornell University","ror":"https://ror.org/05bnh6r87","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. P. Bour","raw_affiliation_strings":["School of Electrical Engineering, Phillips Hall, Cornell University, Ithaca, 14853, New York, USA","School of Electrical Engineering Phillips Hall, Cornell University, Ithaca, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Phillips Hall, Cornell University, Ithaca, 14853, New York, USA","institution_ids":["https://openalex.org/I205783295"]},{"raw_affiliation_string":"School of Electrical Engineering Phillips Hall, Cornell University, Ithaca, USA","institution_ids":["https://openalex.org/I205783295"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108135766","display_name":"J. R. Shealy","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I205783295","display_name":"Cornell University","ror":"https://ror.org/05bnh6r87","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. R. Shealy","raw_affiliation_strings":["School of Electrical Engineering, Phillips Hall, Cornell University, Ithaca, 14853, New York, USA","School of Electrical Engineering Phillips Hall, Cornell University, Ithaca, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Phillips Hall, Cornell University, Ithaca, 14853, New York, USA","institution_ids":["https://openalex.org/I205783295"]},{"raw_affiliation_string":"School of Electrical Engineering Phillips Hall, Cornell University, Ithaca, USA","institution_ids":["https://openalex.org/I205783295"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I205783295"],"apc_list":{"value":3490,"currency":"USD","value_usd":3490},"apc_paid":null,"fwci":7.4096,"has_fulltext":false,"cited_by_count":51,"citation_normalized_percentile":{"value":0.98205424,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":94},"biblio":{"volume":"3","issue":"3","first_page":"406","last_page":"409"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.7246000170707703,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.7246000170707703,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.08810000121593475,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12309","display_name":"solar cell performance optimization","score":0.07980000227689743,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/iii-v-semiconductors","display_name":"III-V semiconductors","score":0.6129999756813049},{"id":"https://openalex.org/keywords/epitaxial-layers","display_name":"epitaxial layers","score":0.6309999823570251},{"id":"https://openalex.org/keywords/ordering","display_name":"ordering","score":0.3449999988079071},{"id":"https://openalex.org/keywords/ordered-domains","display_name":"ordered domains","score":0.5609999895095825},{"id":"https://openalex.org/keywords/planar-defects","display_name":"planar defects","score":0.8149999976158142},{"id":"https://openalex.org/keywords/dark-field-imaging","display_name":"dark-field imaging","score":0.6850000023841858},{"id":"https://openalex.org/keywords/gaas-substrate","display_name":"GaAs substrate","score":0.8619999885559082},{"id":"https://openalex.org/keywords/metal-organic-chemical-vapor-deposition","display_name":"metalorganic chemical vapor deposition","score":0.8379999995231628}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7992209792137146},{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.755450963973999},{"id":"https://openalex.org/C134786449","wikidata":"https://www.wikidata.org/wiki/Q3391255","display_name":"Planar","level":2,"score":0.6276534795761108},{"id":"https://openalex.org/C3018640491","wikidata":"https://www.wikidata.org/wiki/Q255722","display_name":"Vapor phase","level":2,"score":0.6043300628662109},{"id":"https://openalex.org/C93877712","wikidata":"https://www.wikidata.org/wiki/Q132560","display_name":"Electron microscope","level":2,"score":0.45268312096595764},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.4510303735733032},{"id":"https://openalex.org/C53120450","wikidata":"https://www.wikidata.org/wiki/Q899540","display_name":"Dark field microscopy","level":3,"score":0.43027499318122864},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.42933332920074463},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.4038609564304352},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2717021107673645},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.22326359152793884},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.18172180652618408},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.07091271877288818},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.06403139233589172},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.057740479707717896},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1557/jmr.1988.0406","doi":"https://doi.org/10.1557/jmr.1988.0406","is_oa":false,"landing_page_url":"https://doi.org/10.1557/jmr.1988.0406","pdf_url":null,"source":{"id":"https://openalex.org/S19730638","display_name":"Journal of materials research/Pratt's guide to venture capital sources","issn_l":"0884-1616","issn":["0884-1616","0884-2914","1091-8876","1092-8928","2044-5326"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Materials Research","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W109277971","https://openalex.org/W187690736","https://openalex.org/W1999304917","https://openalex.org/W2029024791","https://openalex.org/W2034356793","https://openalex.org/W2048378923","https://openalex.org/W2062086642"],"related_works":["https://openalex.org/W1965254530","https://openalex.org/W3036054392","https://openalex.org/W2058307055","https://openalex.org/W2082327997","https://openalex.org/W2036130090","https://openalex.org/W3105632759","https://openalex.org/W1970132132","https://openalex.org/W2031577336","https://openalex.org/W1997274282","https://openalex.org/W1967681233"],"abstract_inverted_index":null,"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-09-22T06:50:58.402377","created_date":"2016-06-24T00:00:00"}