{"id":"https://openalex.org/W2035355643","doi":"https://doi.org/10.1117/12.151214","title":"1.8-inch poly-Si TFT-LCDs with novel TFT structure and storage capacitance arrangement","display_name":"1.8-inch poly-Si TFT-LCDs with novel TFT structure and storage capacitance arrangement","publication_year":1993,"publication_date":"1993-08-13","ids":{"openalex":"https://openalex.org/W2035355643","doi":"https://doi.org/10.1117/12.151214","mag":"2035355643"},"language":"en","primary_location":{"id":"doi:10.1117/12.151214","doi":"https://doi.org/10.1117/12.151214","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.151214","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077786769","display_name":"Takashi Sugawara","orcid":"https://orcid.org/0000-0003-4621-8710","observed_orcids":["https://orcid.org/0000-0003-4621-8710"]},"institutions":[{"id":"https://openalex.org/I864419238","display_name":"Mitsubishi Materials (Japan)","ror":"https://ror.org/03p5evc41","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I864419238"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takashi Sugawara","raw_affiliation_strings":["Mitsubishi Materials & Electronic Devices Lab. (Japan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mitsubishi Materials & Electronic Devices Lab. (Japan)","institution_ids":["https://openalex.org/I864419238"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037417355","display_name":"Kazuhiro Kobayashi","orcid":"https://orcid.org/0000-0001-7801-147X","observed_orcids":["https://orcid.org/0000-0001-7801-147X"]},"institutions":[{"id":"https://openalex.org/I864419238","display_name":"Mitsubishi Materials (Japan)","ror":"https://ror.org/03p5evc41","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I864419238"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazuhiro Kobayashi","raw_affiliation_strings":["Mitsubishi Materials & Electronic Devices Lab. (Japan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mitsubishi Materials & Electronic Devices Lab. (Japan)","institution_ids":["https://openalex.org/I864419238"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048405445","display_name":"H. Murai","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I864419238","display_name":"Mitsubishi Materials (Japan)","ror":"https://ror.org/03p5evc41","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I864419238"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroyuki Murai","raw_affiliation_strings":["Mitsubishi Materials & Electronic Devices Lab. (Japan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mitsubishi Materials & Electronic Devices Lab. (Japan)","institution_ids":["https://openalex.org/I864419238"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Christiaan Baert","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Christiaan Baert","raw_affiliation_strings":["Interuniv. Microelectronics Ctr. (Belgium)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Interuniv. Microelectronics Ctr. (Belgium)","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113498080","display_name":"Takao Sakamoto","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I864419238","display_name":"Mitsubishi Materials (Japan)","ror":"https://ror.org/03p5evc41","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I864419238"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takao Sakamoto","raw_affiliation_strings":["Mitsubishi Materials & Electronic Devices Lab. (Japan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mitsubishi Materials & Electronic Devices Lab. (Japan)","institution_ids":["https://openalex.org/I864419238"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030870545","display_name":"Hidetada Tokioka","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I864419238","display_name":"Mitsubishi Materials (Japan)","ror":"https://ror.org/03p5evc41","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I864419238"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hidetada Tokioka","raw_affiliation_strings":["Mitsubishi Materials & Electronic Devices Lab. (Japan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mitsubishi Materials & Electronic Devices Lab. (Japan)","institution_ids":["https://openalex.org/I864419238"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113594324","display_name":"Y. Masutani","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I864419238","display_name":"Mitsubishi Materials (Japan)","ror":"https://ror.org/03p5evc41","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I864419238"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuichi Masutani","raw_affiliation_strings":["Mitsubishi Materials & Electronic Devices Lab. (Japan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mitsubishi Materials & Electronic Devices Lab. (Japan)","institution_ids":["https://openalex.org/I864419238"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087996994","display_name":"H. Namizaki","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I864419238","display_name":"Mitsubishi Materials (Japan)","ror":"https://ror.org/03p5evc41","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I864419238"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hirofumi Namizaki","raw_affiliation_strings":["Mitsubishi Materials & Electronic Devices Lab. (Japan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mitsubishi Materials & Electronic Devices Lab. (Japan)","institution_ids":["https://openalex.org/I864419238"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113869663","display_name":"Masahiro Nunoshita","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I864419238","display_name":"Mitsubishi Materials (Japan)","ror":"https://ror.org/03p5evc41","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I864419238"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masahiro Nunoshita","raw_affiliation_strings":["Mitsubishi Materials & Electronic Devices Lab. (Japan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mitsubishi Materials & Electronic Devices Lab. (Japan)","institution_ids":["https://openalex.org/I864419238"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.21622583,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"1911","issue":null,"first_page":"162","last_page":"168"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10045","display_name":"Organic Electronics and Photovoltaics","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/thin-film-transistors","display_name":"thin-film transistors","score":0.9539999961853027},{"id":"https://openalex.org/keywords/storage-capacitance","display_name":"storage capacitance","score":0.7300000190734863},{"id":"https://openalex.org/keywords/off-current-reduction","display_name":"off-current reduction","score":0.7950000166893005},{"id":"https://openalex.org/keywords/on-off-ratio","display_name":"on/off current ratio","score":0.9589999914169312},{"id":"https://openalex.org/keywords/line-defects","display_name":"line defects","score":0.609000027179718}],"concepts":[{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.8732370138168335},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.7098314166069031},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6437171697616577},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6271768808364868},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.475801557302475},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.457265704870224},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.15395912528038025},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14687129855155945},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1435176134109497},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1273828148841858},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.151214","doi":"https://doi.org/10.1117/12.151214","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.151214","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2035962933","https://openalex.org/W2524288575","https://openalex.org/W2544652217","https://openalex.org/W2150813099","https://openalex.org/W2060716047","https://openalex.org/W2540888818","https://openalex.org/W1578424773","https://openalex.org/W2097923970","https://openalex.org/W1994361803","https://openalex.org/W2069518559"],"abstract_inverted_index":{"We":[0],"have":[1,21,42,105,120],"fabricated":[2],"1.8-inch":[3,126],"and":[4,13,47,71,77],"86,400-pixel":[5],"poly-Si":[6,127],"TFT-LCDs":[7],"with":[8,109],"a":[9,14,22,30,50,124,131],"novel":[10,58],"TFT":[11,107],"structure":[12,25],"storage":[15],"capacitance":[16],"(Cst)":[17],"arrangement.":[18],"The":[19,93],"TFTs":[20],"self-aligned":[23],"offset":[24],"which":[26],"is":[27,82],"made":[28],"by":[29],"simple":[31],"process":[32],"without":[33],"using":[34,116],"an":[35],"additional":[36],"mask.":[37],"With":[38],"this":[39],"structure,":[40],"we":[41,104,119],"reduced":[43],"the":[44,78,85,90,100],"OFF":[45],"current,":[46],"hence,":[48],"attained":[49],"high":[51],"ON/OFF":[52],"current":[53],"ratio":[54],"of":[55,99],"107.":[56],"A":[57],"Cst":[59,64,72,80,94],"line":[60,81,88,95],"arrangement":[61],"called":[62],"'modified":[63],"on":[65],"gate'":[66],"was":[67],"adopted.":[68],"Gate":[69],"lines":[70,73],"are":[74],"arranged":[75],"alternatively,":[76],"(n-1)-th":[79],"connected":[83],"to":[84],"n-th":[86],"gate":[87,101,113],"at":[89],"line's":[91],"end.":[92],"works":[96],"as":[97],"redundancy":[98],"line.":[102],"Consequently,":[103],"obtained":[106],"arrays":[108],"no":[110],"line-defects":[111],"(240":[112],"lines).":[114],"By":[115],"these":[117],"techniques,":[118],"succeeded":[121],"in":[122],"fabricating":[123],"high-performance":[125],"TFT-LCD":[128],"panel":[129],"for":[130],"projection":[132],"TV.":[133]},"counts_by_year":[],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2016-06-24T00:00:00"}