{"id":"https://openalex.org/W2034224955","doi":"https://doi.org/10.1109/isaf.2007.4393310","title":"LTCCsystem with new high- and high-Q material co-fired with conventional low- base material for wireless communications","display_name":"LTCCsystem with new high- and high-Q material co-fired with conventional low- base material for wireless communications","publication_year":2007,"publication_date":"2007-05-01","ids":{"openalex":"https://openalex.org/W2034224955","doi":"https://doi.org/10.1109/isaf.2007.4393310","mag":"2034224955"},"language":"en","primary_location":{"id":"doi:10.1109/isaf.2007.4393310","doi":"https://doi.org/10.1109/isaf.2007.4393310","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isaf.2007.4393310","pdf_url":null,"source":{"id":"https://openalex.org/S4210188928","display_name":"IEEE International Symposium on Applications of Ferroelectrics (ISAF)","issn_l":"1099-4734","issn":["1099-4734","2375-0448"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 Sixteenth IEEE International Symposium on the Applications of Ferroelectrics","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Y. Higuchi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I924388194","display_name":"Murata (Japan)","ror":"https://ror.org/04hd8bd67","country_code":"JP","type":"company","lineage":["https://openalex.org/I924388194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Higuchi","raw_affiliation_strings":["Murata Manufacturing Co., Ltd, 10-1 Higashikoutari 1-chome, Nagaokakyou-shi, Kyoto 617-8555, JAPAN","Murata Manuf. Co., Ltd., Kyoto"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Murata Manufacturing Co., Ltd, 10-1 Higashikoutari 1-chome, Nagaokakyou-shi, Kyoto 617-8555, JAPAN","institution_ids":["https://openalex.org/I924388194"]},{"raw_affiliation_string":"Murata Manuf. Co., Ltd., Kyoto","institution_ids":["https://openalex.org/I924388194"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078569457","display_name":"Yasutaka Sugimoto","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I924388194","display_name":"Murata (Japan)","ror":"https://ror.org/04hd8bd67","country_code":"JP","type":"company","lineage":["https://openalex.org/I924388194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Sugimoto","raw_affiliation_strings":["Murata Manufacturing Co., Ltd, 10-1 Higashikoutari 1-chome, Nagaokakyou-shi, Kyoto 617-8555, JAPAN","Murata Manuf. Co., Ltd., Kyoto"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Murata Manufacturing Co., Ltd, 10-1 Higashikoutari 1-chome, Nagaokakyou-shi, Kyoto 617-8555, JAPAN","institution_ids":["https://openalex.org/I924388194"]},{"raw_affiliation_string":"Murata Manuf. Co., Ltd., Kyoto","institution_ids":["https://openalex.org/I924388194"]}]},{"author_position":"middle","author":{"id":null,"display_name":"J. Harada","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I924388194","display_name":"Murata (Japan)","ror":"https://ror.org/04hd8bd67","country_code":"JP","type":"company","lineage":["https://openalex.org/I924388194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"J. Harada","raw_affiliation_strings":["Murata Manufacturing Co., Ltd, 10-1 Higashikoutari 1-chome, Nagaokakyou-shi, Kyoto 617-8555, JAPAN","Murata Manuf. Co., Ltd., Kyoto"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Murata Manufacturing Co., Ltd, 10-1 Higashikoutari 1-chome, Nagaokakyou-shi, Kyoto 617-8555, JAPAN","institution_ids":["https://openalex.org/I924388194"]},{"raw_affiliation_string":"Murata Manuf. Co., Ltd., Kyoto","institution_ids":["https://openalex.org/I924388194"]}]},{"author_position":"middle","author":{"id":null,"display_name":"H. Takagi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I924388194","display_name":"Murata (Japan)","ror":"https://ror.org/04hd8bd67","country_code":"JP","type":"company","lineage":["https://openalex.org/I924388194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Takagi","raw_affiliation_strings":["Murata Manufacturing Co., Ltd, 10-1 Higashikoutari 1-chome, Nagaokakyou-shi, Kyoto 617-8555, JAPAN","Murata Manuf. Co., Ltd., Kyoto"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Murata Manufacturing Co., Ltd, 10-1 Higashikoutari 1-chome, Nagaokakyou-shi, Kyoto 617-8555, JAPAN","institution_ids":["https://openalex.org/I924388194"]},{"raw_affiliation_string":"Murata Manuf. Co., Ltd., Kyoto","institution_ids":["https://openalex.org/I924388194"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109121323","display_name":"Yukio Sakabe","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I924388194","display_name":"Murata (Japan)","ror":"https://ror.org/04hd8bd67","country_code":"JP","type":"company","lineage":["https://openalex.org/I924388194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Sakabe","raw_affiliation_strings":["Murata Manufacturing Co., Ltd, 10-1 Higashikoutari 1-chome, Nagaokakyou-shi, Kyoto 617-8555, JAPAN","Murata Manuf. Co., Ltd., Kyoto"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Murata Manufacturing Co., Ltd, 10-1 Higashikoutari 1-chome, Nagaokakyou-shi, Kyoto 617-8555, JAPAN","institution_ids":["https://openalex.org/I924388194"]},{"raw_affiliation_string":"Murata Manuf. Co., Ltd., Kyoto","institution_ids":["https://openalex.org/I924388194"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I924388194"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.124275,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"497","last_page":"498"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12155","display_name":"Microwave Dielectric Ceramics Synthesis","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12155","display_name":"Microwave Dielectric Ceramics Synthesis","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13251","display_name":"Electrical and Thermal Properties of Materials","score":0.0020000000949949026,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13249","display_name":"Dielectric properties of ceramics","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/low-temperature-co-fired-ceramic","display_name":"low temperature co-fired ceramic","score":0.8339999914169312},{"id":"https://openalex.org/keywords/ltcc","display_name":"LTCC","score":0.6050000190734863},{"id":"https://openalex.org/keywords/high-permittivity-dielectrics","display_name":"high permittivity dielectrics","score":0.6489999890327454},{"id":"https://openalex.org/keywords/high-quality-factor","display_name":"high quality factor","score":0.8339999914169312},{"id":"https://openalex.org/keywords/constrained-sintering","display_name":"constrained sintering","score":0.9980000257492065}],"concepts":[{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.8362520933151245},{"id":"https://openalex.org/C2777581544","wikidata":"https://www.wikidata.org/wiki/Q844613","display_name":"Sintering","level":2,"score":0.7648888826370239},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6520228981971741},{"id":"https://openalex.org/C68649174","wikidata":"https://www.wikidata.org/wiki/Q1379116","display_name":"Base station","level":2,"score":0.5831010937690735},{"id":"https://openalex.org/C42058472","wikidata":"https://www.wikidata.org/wiki/Q810214","display_name":"Base (topology)","level":2,"score":0.5447162389755249},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.5249381065368652},{"id":"https://openalex.org/C134132462","wikidata":"https://www.wikidata.org/wiki/Q45621","display_name":"Ceramic","level":2,"score":0.4973051846027374},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4342869818210602},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3835103213787079},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3771057724952698},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3293485641479492},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.30761510133743286},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21864202618598938},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.16798678040504456},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.06930765509605408},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isaf.2007.4393310","doi":"https://doi.org/10.1109/isaf.2007.4393310","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isaf.2007.4393310","pdf_url":null,"source":{"id":"https://openalex.org/S4210188928","display_name":"IEEE International Symposium on Applications of Ferroelectrics (ISAF)","issn_l":"1099-4734","issn":["1099-4734","2375-0448"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 Sixteenth IEEE International Symposium on the Applications of Ferroelectrics","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1520982623","https://openalex.org/W1545450999","https://openalex.org/W1945521875"],"related_works":["https://openalex.org/W2032551356","https://openalex.org/W2016027810","https://openalex.org/W2902702559","https://openalex.org/W4412128963","https://openalex.org/W2346663682","https://openalex.org/W2040019554","https://openalex.org/W2037476064","https://openalex.org/W2894666119","https://openalex.org/W2336996962","https://openalex.org/W3012212201"],"abstract_inverted_index":{"A":[0],"new":[1],"LTCC":[2,26,45],"material":[3,18,27],"with":[4,22,31,56],"characteristics":[5],"of":[6,35,51],"high":[7,9,58],",":[8],"Q":[10],"and":[11,28,47],"low":[12,32],"TCC":[13],"have":[14],"been":[15],"developed.":[16],"This":[17],"can":[19],"be":[20,41,54],"co-fired":[21],"a":[23],"conventional":[24],"base":[25],"buried":[29],"resistors":[30],"temperature":[33],"coefficients":[34],"resistance":[36],"(TCR).The":[37],"constrained":[38],"sintering":[39],"could":[40,53],"applied":[42],"to":[43],"this":[44],"system":[46],"so":[48],"the":[49],"dimensions":[50],"substrates":[52],"controlled":[55],"quite":[57],"accuracy.":[59]},"counts_by_year":[],"updated_date":"2026-10-26T11:51:55.731654","created_date":"2016-06-24T00:00:00"}