{"id":"https://openalex.org/W2030769554","doi":"https://doi.org/10.1016/j.vacuum.2013.07.021","title":"Temperature dependence of Debye\u2013Waller factors of semiconductors","display_name":"Temperature dependence of Debye\u2013Waller factors of semiconductors","publication_year":2013,"publication_date":"2013-07-24","ids":{"openalex":"https://openalex.org/W2030769554","doi":"https://doi.org/10.1016/j.vacuum.2013.07.021","mag":"2030769554"},"language":"en","primary_location":{"id":"doi:10.1016/j.vacuum.2013.07.021","doi":"https://doi.org/10.1016/j.vacuum.2013.07.021","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.vacuum.2013.07.021","pdf_url":null,"source":{"id":"https://openalex.org/S86481247","display_name":"Vacuum","issn_l":"0042-207X","issn":["0042-207X","1879-2715"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Vacuum","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100712609","display_name":"Nguy\u1ec5n V\u0103n H\u00f9ng","orcid":"https://orcid.org/0000-0002-9178-2815","observed_orcids":["https://orcid.org/0000-0002-9178-2815"]},"institutions":[{"id":"https://openalex.org/I67868205","display_name":"VNU University of Science","ror":"https://ror.org/05w54hk79","country_code":"VN","type":"education","lineage":["https://openalex.org/I177233841","https://openalex.org/I67868205"]}],"countries":["VN"],"is_corresponding":true,"raw_author_name":"Nguyen Van Hung","raw_affiliation_strings":["Department of Physics, Hanoi University of Science, 334 Nguyen Trai, Thanh Xuan, Hanoi, Viet Nam"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Hanoi University of Science, 334 Nguyen Trai, Thanh Xuan, Hanoi, Viet Nam","institution_ids":["https://openalex.org/I67868205"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084354598","display_name":"Cu Sy Thang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4405252720","display_name":"Institute of Geological Sciences","ror":"https://ror.org/05x2wrh98","country_code":"VN","type":"facility","lineage":["https://openalex.org/I4405252720","https://openalex.org/I70349855"]},{"id":"https://openalex.org/I70349855","display_name":"Vietnam Academy of Science and Technology","ror":"https://ror.org/02wsd5p50","country_code":"VN","type":"government","lineage":["https://openalex.org/I70349855"]}],"countries":["VN"],"is_corresponding":false,"raw_author_name":"Cu Sy Thang","raw_affiliation_strings":["Institute of Geological Sciences (IGS), Vietnam Academy of Science and Technology (VAST), 18 Hoang Quoc Viet, Cau Giay, Hanoi, Viet Nam"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Geological Sciences (IGS), Vietnam Academy of Science and Technology (VAST), 18 Hoang Quoc Viet, Cau Giay, Hanoi, Viet Nam","institution_ids":["https://openalex.org/I4405252720","https://openalex.org/I70349855"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083415290","display_name":"Nguyen Cong Toan","orcid":"https://orcid.org/0000-0002-7833-863X","observed_orcids":["https://orcid.org/0000-0002-7833-863X"]},"institutions":[{"id":"https://openalex.org/I67868205","display_name":"VNU University of Science","ror":"https://ror.org/05w54hk79","country_code":"VN","type":"education","lineage":["https://openalex.org/I177233841","https://openalex.org/I67868205"]}],"countries":["VN"],"is_corresponding":false,"raw_author_name":"Nguyen Cong Toan","raw_affiliation_strings":["Department of Physics, Hanoi University of Science, 334 Nguyen Trai, Thanh Xuan, Hanoi, Viet Nam"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Hanoi University of Science, 334 Nguyen Trai, Thanh Xuan, Hanoi, Viet Nam","institution_ids":["https://openalex.org/I67868205"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057167125","display_name":"Ho Khac Hieu","orcid":"https://orcid.org/0000-0002-0635-2889","observed_orcids":["https://orcid.org/0000-0002-0635-2889"]},"institutions":[{"id":"https://openalex.org/I257903683","display_name":"Hanoi University of Civil Engineering","ror":"https://ror.org/01351mb48","country_code":"VN","type":"education","lineage":["https://openalex.org/I257903683"]}],"countries":["VN"],"is_corresponding":false,"raw_author_name":"Ho Khac Hieu","raw_affiliation_strings":["National University of Civil Engineering, 55 Giai Phong, Hai Ba Trung, Hanoi, Viet Nam"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National University of Civil Engineering, 55 Giai Phong, Hai Ba Trung, Hanoi, Viet Nam","institution_ids":["https://openalex.org/I257903683"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100712609"],"corresponding_institution_ids":["https://openalex.org/I67868205"],"apc_list":{"value":2860,"currency":"USD","value_usd":2860},"apc_paid":null,"fwci":1.8165,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.81781318,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":97},"biblio":{"volume":"101","issue":null,"first_page":"63","last_page":"66"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11733","display_name":"X-ray Spectroscopy and Fluorescence Analysis","score":0.9911999702453613,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11733","display_name":"X-ray Spectroscopy and Fluorescence Analysis","score":0.9911999702453613,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12613","display_name":"X-ray Diffraction in Crystallography","score":0.003000000026077032,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.0017000000225380063,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/debye-waller-factor","display_name":"Debye-Waller factor","score":0.8769999742507935},{"id":"https://openalex.org/keywords/temperature-dependence","display_name":"temperature dependence","score":0.8769999742507935},{"id":"https://openalex.org/keywords/mean-square-relative-displacement","display_name":"mean square relative displacement","score":0.8930000066757202},{"id":"https://openalex.org/keywords/mean-square-displacement","display_name":"mean square displacement","score":0.9990000128746033},{"id":"https://openalex.org/keywords/semiconductors","display_name":"semiconductors","score":0.800000011920929},{"id":"https://openalex.org/keywords/exafs","display_name":"EXAFS","score":0.7649999856948853},{"id":"https://openalex.org/keywords/statistical-moment-method","display_name":"statistical moment method","score":0.8960000276565552},{"id":"https://openalex.org/keywords/zinc-blende-structure","display_name":"zinc-blende structure","score":0.8889999985694885},{"id":"https://openalex.org/keywords/diamond-structure","display_name":"diamond lattice","score":0.9810000061988831},{"id":"https://openalex.org/keywords/silicon","display_name":"silicon","score":0.5509999990463257},{"id":"https://openalex.org/keywords/germanium","display_name":"germanium","score":1.0},{"id":"https://openalex.org/keywords/gallium-arsenide","display_name":"GaAs","score":0.9200000166893005},{"id":"https://openalex.org/keywords/gallium-phosphide","display_name":"gallium phosphide","score":0.9829999804496765},{"id":"https://openalex.org/keywords/indium-phosphide","display_name":"indium phosphide","score":0.9959999918937683},{"id":"https://openalex.org/keywords/indium-antimonide","display_name":"indium antimonide","score":0.9980000257492065},{"id":"https://openalex.org/keywords/thermodynamic-properties","display_name":"thermodynamic properties","score":0.8040000200271606},{"id":"https://openalex.org/keywords/alloy-composition-effects","display_name":"alloy composition effects","score":0.3709999918937683}],"concepts":[{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.7962344288825989},{"id":"https://openalex.org/C107551265","wikidata":"https://www.wikidata.org/wiki/Q1458245","display_name":"Displacement (psychology)","level":2,"score":0.6133759021759033},{"id":"https://openalex.org/C187128312","wikidata":"https://www.wikidata.org/wiki/Q1565055","display_name":"Mean squared displacement","level":3,"score":0.5917773842811584},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.5582025647163391},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4847971498966217},{"id":"https://openalex.org/C107861141","wikidata":"https://www.wikidata.org/wiki/Q908783","display_name":"Extended X-ray absorption fine structure","level":3,"score":0.483690083026886},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.457692950963974},{"id":"https://openalex.org/C40899509","wikidata":"https://www.wikidata.org/wiki/Q40603","display_name":"Debye","level":2,"score":0.4553866386413574},{"id":"https://openalex.org/C2776921476","wikidata":"https://www.wikidata.org/wiki/Q5283","display_name":"Diamond","level":2,"score":0.44775882363319397},{"id":"https://openalex.org/C179254644","wikidata":"https://www.wikidata.org/wiki/Q13222844","display_name":"Moment (physics)","level":2,"score":0.42731761932373047},{"id":"https://openalex.org/C25376523","wikidata":"https://www.wikidata.org/wiki/Q1151031","display_name":"Debye model","level":2,"score":0.426025390625},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.35327064990997314},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.26415809988975525},{"id":"https://openalex.org/C119824511","wikidata":"https://www.wikidata.org/wiki/Q13553575","display_name":"Absorption spectroscopy","level":2,"score":0.2556861639022827},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22407403588294983},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.16457006335258484},{"id":"https://openalex.org/C147597530","wikidata":"https://www.wikidata.org/wiki/Q369472","display_name":"Computational chemistry","level":1,"score":0.11634495854377747},{"id":"https://openalex.org/C74650414","wikidata":"https://www.wikidata.org/wiki/Q11397","display_name":"Classical mechanics","level":1,"score":0.09075629711151123},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.06799954175949097},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.05880779027938843},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C59593255","wikidata":"https://www.wikidata.org/wiki/Q901663","display_name":"Molecular dynamics","level":2,"score":0.0},{"id":"https://openalex.org/C542102704","wikidata":"https://www.wikidata.org/wiki/Q183257","display_name":"Psychotherapist","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.vacuum.2013.07.021","doi":"https://doi.org/10.1016/j.vacuum.2013.07.021","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.vacuum.2013.07.021","pdf_url":null,"source":{"id":"https://openalex.org/S86481247","display_name":"Vacuum","issn_l":"0042-207X","issn":["0042-207X","1879-2715"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Vacuum","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1970466151","https://openalex.org/W1971170254","https://openalex.org/W1977786914","https://openalex.org/W1977999307","https://openalex.org/W1983028377","https://openalex.org/W1984838507","https://openalex.org/W1987631090","https://openalex.org/W1988635009","https://openalex.org/W2004885293","https://openalex.org/W2011456818","https://openalex.org/W2012519040","https://openalex.org/W2017645992","https://openalex.org/W2020651103","https://openalex.org/W2028255999","https://openalex.org/W2034970130","https://openalex.org/W2037782625","https://openalex.org/W2044137690","https://openalex.org/W2051326589","https://openalex.org/W2055844789","https://openalex.org/W2076925184","https://openalex.org/W2077890132","https://openalex.org/W2078713770","https://openalex.org/W2088328556","https://openalex.org/W2094836684"],"related_works":["https://openalex.org/W2239953345","https://openalex.org/W4405761050","https://openalex.org/W1983028377","https://openalex.org/W3003648860","https://openalex.org/W1990767203","https://openalex.org/W2129467896","https://openalex.org/W4281615602","https://openalex.org/W1907607482","https://openalex.org/W4386769825","https://openalex.org/W2996834625"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2}],"updated_date":"2026-10-01T08:54:57.152042","created_date":"2016-06-24T00:00:00"}