{"id":"https://openalex.org/W2030004100","doi":"https://doi.org/10.1109/icctd.2010.5646128","title":"An evaluation of image processing methods applied to marble quality classification","display_name":"An evaluation of image processing methods applied to marble quality classification","publication_year":2010,"publication_date":"2010-11-01","ids":{"openalex":"https://openalex.org/W2030004100","doi":"https://doi.org/10.1109/icctd.2010.5646128","mag":"2030004100"},"language":"en","primary_location":{"id":"doi:10.1109/icctd.2010.5646128","doi":"https://doi.org/10.1109/icctd.2010.5646128","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icctd.2010.5646128","pdf_url":null,"source":{"id":"https://openalex.org/S4306419271","display_name":"International Conference on Computer Technology and Development","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 2nd International Conference on Computer Technology and Development","raw_type":"proceedings-article"},"parent_works":[],"lineage":["https://openalex.org/W2030004100"],"child_works_count":0,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5063679614","display_name":"\u00d6zg\u00fcr Akkoyun","orcid":"https://orcid.org/0000-0001-9103-8300","observed_orcids":["https://orcid.org/0000-0001-9103-8300"]},"institutions":[{"id":"https://openalex.org/I123466251","display_name":"Dicle University","ror":"https://ror.org/0257dtg16","country_code":"TR","type":"education","lineage":["https://openalex.org/I123466251"]}],"countries":["TR"],"is_corresponding":true,"raw_author_name":"Ozgur Akkoyun","raw_affiliation_strings":["Mining Engineering Department, Dicle University, Diyarbakir, Turkey"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mining Engineering Department, Dicle University, Diyarbakir, Turkey","institution_ids":["https://openalex.org/I123466251"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5063679614"],"corresponding_institution_ids":["https://openalex.org/I123466251"],"apc_list":null,"apc_paid":null,"fwci":3.2385,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.88557692,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"158","last_page":"162"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.8895999789237976,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.8895999789237976,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.030300000682473183,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12282","display_name":"Mineral Processing and Grinding","score":0.009999999776482582,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/image-processing","display_name":"image processing","score":0.8629999756813049},{"id":"https://openalex.org/keywords/marble","display_name":"marble","score":0.3409999907016754},{"id":"https://openalex.org/keywords/computer-program","display_name":"computer program","score":0.6439999938011169}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7779476642608643},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.7374808192253113},{"id":"https://openalex.org/C104317675","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Digital image processing","level":4,"score":0.5184454321861267},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5174953937530518},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.46751266717910767},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.4541744887828827},{"id":"https://openalex.org/C75294576","wikidata":"https://www.wikidata.org/wiki/Q5165192","display_name":"Contextual image classification","level":3,"score":0.4338957369327545},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.4209863543510437},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.38654476404190063},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.35045158863067627},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.32362619042396545},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icctd.2010.5646128","doi":"https://doi.org/10.1109/icctd.2010.5646128","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icctd.2010.5646128","pdf_url":null,"source":{"id":"https://openalex.org/S4306419271","display_name":"International Conference on Computer Technology and Development","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 2nd International Conference on Computer Technology and Development","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1644706259","https://openalex.org/W1965878636","https://openalex.org/W1968281770","https://openalex.org/W1979813859","https://openalex.org/W1993727134","https://openalex.org/W2034524505","https://openalex.org/W2036393281","https://openalex.org/W2042055595","https://openalex.org/W2070184436","https://openalex.org/W2077455610","https://openalex.org/W2077687543","https://openalex.org/W2110074970","https://openalex.org/W2136318045","https://openalex.org/W2167760605","https://openalex.org/W2184307039","https://openalex.org/W3049435728","https://openalex.org/W3082067856"],"related_works":["https://openalex.org/W2997316440","https://openalex.org/W2785420988","https://openalex.org/W2921009140","https://openalex.org/W4410290437","https://openalex.org/W3044979005","https://openalex.org/W2136318045","https://openalex.org/W2969954868","https://openalex.org/W3088461397","https://openalex.org/W7008746711","https://openalex.org/W4402602260"],"abstract_inverted_index":{"Image":[0],"processing":[1,33],"is":[2,46,58],"an":[3],"interesting":[4],"research":[5],"area":[6],"that":[7,41],"has":[8,23],"progressed":[9],"in":[10,14],"correspondence":[11],"with":[12],"improvements":[13],"computer":[15,39],"related":[16],"technologies.":[17],"In":[18,29],"the":[19,49],"last":[20],"decades,":[21],"it":[22],"quickly":[24],"improved":[25],"and":[26,48],"widely":[27],"spread.":[28],"this":[30],"study,":[31],"image":[32],"methods":[34,45,53],"are":[35],"discussed,":[36],"a":[37],"new":[38],"program":[40],"can":[42],"use":[43],"these":[44,52],"introduced,":[47],"application":[50],"of":[51],"to":[54],"marble":[55],"quality":[56],"classification":[57],"evaluated.":[59]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-11-14T11:04:58.165337","created_date":"2016-06-24T00:00:00"}