{"id":"https://openalex.org/W2029477258","doi":"https://doi.org/10.1016/0038-1098(91)90444-z","title":"Characterization of porous silicon layers by grazing- incidence X-ray fluorescence and diffraction","display_name":"Characterization of porous silicon layers by grazing- incidence X-ray fluorescence and diffraction","publication_year":1991,"publication_date":"1991-09-01","ids":{"openalex":"https://openalex.org/W2029477258","doi":"https://doi.org/10.1016/0038-1098(91)90444-z","mag":"2029477258"},"language":"en","primary_location":{"id":"doi:10.1016/0038-1098(91)90444-z","doi":"https://doi.org/10.1016/0038-1098(91)90444-z","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0038-1098(91)90444-z","pdf_url":null,"source":{"id":"https://openalex.org/S82088436","display_name":"Solid State Communications","issn_l":"0038-1098","issn":["0038-1098","1879-2766"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Solid State Communications","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021527546","display_name":"A. Bensaid","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Bensaid","raw_affiliation_strings":["CNRS, Laboratoire de Cristallographie, 166X, 38042 Grenoble Cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNRS, Laboratoire de Cristallographie, 166X, 38042 Grenoble Cedex, France","institution_ids":["https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061933810","display_name":"Ga\u00ebtan Patrat","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"G. Patrat","raw_affiliation_strings":["CNRS, Laboratoire de Cristallographie, 166X, 38042 Grenoble Cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNRS, Laboratoire de Cristallographie, 166X, 38042 Grenoble Cedex, France","institution_ids":["https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113076284","display_name":"Michel Brunel","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"M. Brunel","raw_affiliation_strings":["CNRS, Laboratoire de Cristallographie, 166X, 38042 Grenoble Cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNRS, Laboratoire de Cristallographie, 166X, 38042 Grenoble Cedex, France","institution_ids":["https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065094321","display_name":"Francois de Bergevin","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"F. de Bergevin","raw_affiliation_strings":["CNRS, Laboratoire de Cristallographie, 166X, 38042 Grenoble Cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNRS, Laboratoire de Cristallographie, 166X, 38042 Grenoble Cedex, France","institution_ids":["https://openalex.org/I1294671590"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001757575","display_name":"Roland H\u00e9rino","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I177483745","display_name":"Universit\u00e9 Joseph Fourier","ror":"https://ror.org/02aj0kh94","country_code":"FR","type":"education","lineage":["https://openalex.org/I177483745","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"R. H\u00e9rino","raw_affiliation_strings":["Laboratoire de Spectrom\u00e9trie Physique, Universit\u00e9 Joseph Fourier de Grenoble BP 87, 38402 St Martin d'H\u00e8res Cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratoire de Spectrom\u00e9trie Physique, Universit\u00e9 Joseph Fourier de Grenoble BP 87, 38402 St Martin d'H\u00e8res Cedex, France","institution_ids":["https://openalex.org/I177483745"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2960,"currency":"USD","value_usd":2960},"apc_paid":null,"fwci":3.0659,"has_fulltext":false,"cited_by_count":49,"citation_normalized_percentile":{"value":0.91469599,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"79","issue":"11","first_page":"923","last_page":"928"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11169","display_name":"Silicon Nanostructures and Photoluminescence","score":0.9545999765396118,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11169","display_name":"Silicon Nanostructures and Photoluminescence","score":0.9545999765396118,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11733","display_name":"X-ray Spectroscopy and Fluorescence Analysis","score":0.01679999940097332,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12613","display_name":"X-ray Diffraction in Crystallography","score":0.010099999606609344,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/porous-silicon","display_name":"porous silicon","score":0.9990000128746033},{"id":"https://openalex.org/keywords/grazing-incidence-x-ray-fluorescence","display_name":"grazing incidence X-ray fluorescence","score":0.8669999837875366},{"id":"https://openalex.org/keywords/grazing-incidence-x-ray-diffraction","display_name":"grazing incidence X-ray diffraction","score":0.9869999885559082},{"id":"https://openalex.org/keywords/critical-angle","display_name":"critical angle","score":0.7120000123977661},{"id":"https://openalex.org/keywords/total-external-reflection","display_name":"total external reflection","score":0.6779999732971191},{"id":"https://openalex.org/keywords/density-profile","display_name":"density profile","score":0.36899998784065247},{"id":"https://openalex.org/keywords/depth-dependent-density","display_name":"depth-dependent density","score":0.5740000009536743},{"id":"https://openalex.org/keywords/diffuse-scattering","display_name":"diffuse scattering","score":0.8299999833106995},{"id":"https://openalex.org/keywords/pore-size","display_name":"pore size","score":0.7300000190734863},{"id":"https://openalex.org/keywords/pore-structure","display_name":"pore structure","score":0.546999990940094},{"id":"https://openalex.org/keywords/lattice-distortion","display_name":"lattice distortion","score":0.7329999804496765},{"id":"https://openalex.org/keywords/full-width-at-half-maximum","display_name":"full width at half maximum","score":0.6079999804496765}],"concepts":[{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.7519246935844421},{"id":"https://openalex.org/C39693636","wikidata":"https://www.wikidata.org/wiki/Q847354","display_name":"Bragg's law","level":3,"score":0.667546272277832},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.6524107456207275},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.6370129585266113},{"id":"https://openalex.org/C2776685891","wikidata":"https://www.wikidata.org/wiki/Q428660","display_name":"Porous silicon","level":3,"score":0.6305867433547974},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6241445541381836},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5037466883659363},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.4707739055156708},{"id":"https://openalex.org/C170395517","wikidata":"https://www.wikidata.org/wiki/Q234943","display_name":"Total internal reflection","level":2,"score":0.46917062997817993},{"id":"https://openalex.org/C6648577","wikidata":"https://www.wikidata.org/wiki/Q622669","display_name":"Porosity","level":2,"score":0.46311819553375244},{"id":"https://openalex.org/C50515024","wikidata":"https://www.wikidata.org/wiki/Q826582","display_name":"X-ray crystallography","level":3,"score":0.4602137804031372},{"id":"https://openalex.org/C82261727","wikidata":"https://www.wikidata.org/wiki/Q1154504","display_name":"Diffuse reflection","level":2,"score":0.43485569953918457},{"id":"https://openalex.org/C2779116783","wikidata":"https://www.wikidata.org/wiki/Q1196575","display_name":"Angle of incidence (optics)","level":2,"score":0.4250304102897644},{"id":"https://openalex.org/C91881484","wikidata":"https://www.wikidata.org/wiki/Q191807","display_name":"Fluorescence","level":2,"score":0.4148108959197998},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.12922030687332153},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11671218276023865},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.10554420948028564},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.09817224740982056}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0038-1098(91)90444-z","doi":"https://doi.org/10.1016/0038-1098(91)90444-z","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0038-1098(91)90444-z","pdf_url":null,"source":{"id":"https://openalex.org/S82088436","display_name":"Solid State Communications","issn_l":"0038-1098","issn":["0038-1098","1879-2766"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Solid State Communications","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1968347064","https://openalex.org/W1983280120","https://openalex.org/W2041299196","https://openalex.org/W2063821550","https://openalex.org/W2066600857","https://openalex.org/W2086529087","https://openalex.org/W2093845398","https://openalex.org/W2127412981"],"related_works":["https://openalex.org/W1999964906","https://openalex.org/W2033027527","https://openalex.org/W2157246330","https://openalex.org/W7047570636","https://openalex.org/W2071622486","https://openalex.org/W2055149382","https://openalex.org/W4200626131","https://openalex.org/W2080358433","https://openalex.org/W2048123096","https://openalex.org/W1979367556"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":4},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":5},{"year":2012,"cited_by_count":3}],"updated_date":"2026-10-13T10:08:12.033832","created_date":"2016-06-24T00:00:00"}