{"id":"https://openalex.org/W2025751336","doi":"https://doi.org/10.1016/j.actamat.2011.12.035","title":"Submicron-scale depth profiling of residual stress in amorphous materials by incremental focused ion beam slotting","display_name":"Submicron-scale depth profiling of residual stress in amorphous materials by incremental focused ion beam slotting","publication_year":2012,"publication_date":"2012-03-01","ids":{"openalex":"https://openalex.org/W2025751336","doi":"https://doi.org/10.1016/j.actamat.2011.12.035","mag":"2025751336"},"language":"en","primary_location":{"id":"doi:10.1016/j.actamat.2011.12.035","doi":"https://doi.org/10.1016/j.actamat.2011.12.035","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.actamat.2011.12.035","pdf_url":null,"source":{"id":"https://openalex.org/S64016596","display_name":"Acta Materialia","issn_l":"1359-6454","issn":["1359-6454","1873-2453"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-3","norway-2","poland-200","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Acta Materialia","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008124646","display_name":"B. Winiarski","orcid":"https://orcid.org/0000-0002-7221-0686","observed_orcids":["https://orcid.org/0000-0002-7221-0686"]},"institutions":[{"id":"https://openalex.org/I28407311","display_name":"University of Manchester","ror":"https://ror.org/027m9bs27","country_code":"GB","type":"education","lineage":["https://openalex.org/I28407311"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"B. Winiarski","raw_affiliation_strings":["School of Materials, The University of Manchester, Grosvenor Street, Manchester M1 7HS, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Materials, The University of Manchester, Grosvenor Street, Manchester M1 7HS, UK","institution_ids":["https://openalex.org/I28407311"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020620758","display_name":"Ali Gholinia","orcid":"https://orcid.org/0000-0002-2633-133X","observed_orcids":["https://orcid.org/0000-0002-2633-133X"]},"institutions":[{"id":"https://openalex.org/I28407311","display_name":"University of Manchester","ror":"https://ror.org/027m9bs27","country_code":"GB","type":"education","lineage":["https://openalex.org/I28407311"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"A. Gholinia","raw_affiliation_strings":["School of Materials, The University of Manchester, Grosvenor Street, Manchester M1 7HS, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Materials, The University of Manchester, Grosvenor Street, Manchester M1 7HS, UK","institution_ids":["https://openalex.org/I28407311"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072993123","display_name":"Jiawan Tian","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Tian","raw_affiliation_strings":["Department of Materials Science and Engineering, The University of Tennessee, Knoxville, TN 37996, USA","Department of Materials Science and Engineering, The University of Tennessee, Knoxville,#N#TN 37996,#N#USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, The University of Tennessee, Knoxville, TN 37996, USA","institution_ids":["https://openalex.org/I75027704"]},{"raw_affiliation_string":"Department of Materials Science and Engineering, The University of Tennessee, Knoxville,#N#TN 37996,#N#USA","institution_ids":["https://openalex.org/I75027704"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Y. Yokoyama","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Yokoyama","raw_affiliation_strings":["Materials Science and Engineering, Tohoku University, Sendai, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Materials Science and Engineering, Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027297848","display_name":"Peter Kaehuei Liaw","orcid":"https://orcid.org/0000-0003-0185-3411","observed_orcids":["https://orcid.org/0000-0003-0185-3411","https://orcid.org/0000-0002-3054-5955"]},"institutions":[{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P.K. Liaw","raw_affiliation_strings":["Department of Materials Science and Engineering, The University of Tennessee, Knoxville, TN 37996, USA","Department of Materials Science and Engineering, The University of Tennessee, Knoxville,#N#TN 37996,#N#USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, The University of Tennessee, Knoxville, TN 37996, USA","institution_ids":["https://openalex.org/I75027704"]},{"raw_affiliation_string":"Department of Materials Science and Engineering, The University of Tennessee, Knoxville,#N#TN 37996,#N#USA","institution_ids":["https://openalex.org/I75027704"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078303945","display_name":"Philip John Withers","orcid":"https://orcid.org/0000-0002-1946-5647","observed_orcids":["https://orcid.org/0000-0002-1946-5647"]},"institutions":[{"id":"https://openalex.org/I28407311","display_name":"University of Manchester","ror":"https://ror.org/027m9bs27","country_code":"GB","type":"education","lineage":["https://openalex.org/I28407311"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"P.J. Withers","raw_affiliation_strings":["School of Materials, The University of Manchester, Grosvenor Street, Manchester M1 7HS, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Materials, The University of Manchester, Grosvenor Street, Manchester M1 7HS, UK","institution_ids":["https://openalex.org/I28407311"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5008124646"],"corresponding_institution_ids":["https://openalex.org/I28407311"],"apc_list":{"value":3700,"currency":"USD","value_usd":3700},"apc_paid":null,"fwci":7.8823,"has_fulltext":false,"cited_by_count":34,"citation_normalized_percentile":{"value":0.96838206,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":87,"max":98},"biblio":{"volume":"60","issue":"5","first_page":"2337","last_page":"2349"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12106","display_name":"Surface Treatment and Residual Stress","score":0.39579999446868896,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12106","display_name":"Surface Treatment and Residual Stress","score":0.39579999446868896,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10633","display_name":"Metallic Glasses and Amorphous Alloys","score":0.3440000116825104,"subfield":{"id":"https://openalex.org/subfields/2506","display_name":"Metals and Alloys"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","score":0.0731000006198883,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/residual-stress","display_name":"residual stress","score":0.8460000157356262},{"id":"https://openalex.org/keywords/depth-profiling","display_name":"depth profiling","score":0.9110000133514404},{"id":"https://openalex.org/keywords/bulk-metallic-glasses","display_name":"bulk metallic glasses","score":0.9269999861717224},{"id":"https://openalex.org/keywords/peening","display_name":"peening","score":0.7979999780654907},{"id":"https://openalex.org/keywords/surface-relaxation","display_name":"surface relaxation","score":0.8960000276565552},{"id":"https://openalex.org/keywords/digital-image-correlation","display_name":"digital image correlation","score":0.7760000228881836},{"id":"https://openalex.org/keywords/tikhonov-regularization","display_name":"Tikhonov regularization","score":0.9959999918937683},{"id":"https://openalex.org/keywords/inverse-problems","display_name":"inverse problems","score":0.9269999861717224},{"id":"https://openalex.org/keywords/amorphous-solids","display_name":"amorphous materials","score":0.9480000138282776}],"concepts":[{"id":"https://openalex.org/C37292000","wikidata":"https://www.wikidata.org/wiki/Q1257918","display_name":"Residual stress","level":2,"score":0.8646851778030396},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8626329898834229},{"id":"https://openalex.org/C56052488","wikidata":"https://www.wikidata.org/wiki/Q103382","display_name":"Amorphous solid","level":2,"score":0.6587790250778198},{"id":"https://openalex.org/C161866238","wikidata":"https://www.wikidata.org/wiki/Q258563","display_name":"Focused ion beam","level":3,"score":0.5115107297897339},{"id":"https://openalex.org/C115635565","wikidata":"https://www.wikidata.org/wiki/Q860900","display_name":"Digital image correlation","level":2,"score":0.4903991222381592},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.48218005895614624},{"id":"https://openalex.org/C123266363","wikidata":"https://www.wikidata.org/wiki/Q527601","display_name":"Amorphous metal","level":3,"score":0.4698689877986908},{"id":"https://openalex.org/C152442038","wikidata":"https://www.wikidata.org/wiki/Q2778212","display_name":"Tikhonov regularization","level":3,"score":0.440559059381485},{"id":"https://openalex.org/C84566556","wikidata":"https://www.wikidata.org/wiki/Q484884","display_name":"Peening","level":3,"score":0.4261144995689392},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.41784948110580444},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.28073441982269287},{"id":"https://openalex.org/C135252773","wikidata":"https://www.wikidata.org/wiki/Q1567213","display_name":"Inverse problem","level":2,"score":0.24830755591392517},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.15461167693138123},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.13050222396850586},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.11108404397964478},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2780026712","wikidata":"https://www.wikidata.org/wiki/Q37756","display_name":"Alloy","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/j.actamat.2011.12.035","doi":"https://doi.org/10.1016/j.actamat.2011.12.035","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.actamat.2011.12.035","pdf_url":null,"source":{"id":"https://openalex.org/S64016596","display_name":"Acta Materialia","issn_l":"1359-6454","issn":["1359-6454","1873-2453"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-a","jufo-3","norway-2","poland-200","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Acta Materialia","raw_type":"journal-article"},{"id":"pmh:oai:pure.atira.dk:openaire_cris_publications/fd9b6a6c-300a-43aa-98a6-ed1861da2664","doi":null,"is_oa":false,"landing_page_url":"https://research.manchester.ac.uk/en/publications/fd9b6a6c-300a-43aa-98a6-ed1861da2664","pdf_url":null,"source":{"id":"https://openalex.org/S4306400662","display_name":"Research Explorer (The University of Manchester)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I28407311","host_organization_name":"University of Manchester","host_organization_lineage":["https://openalex.org/I28407311"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Winiarski, B, Gholinia, A, Tian, J, Yokoyama, Y, Liaw, P K & Withers, P J 2012, 'Submicron-scale depth profiling of residual stress in amorphous materials by incremental focused ion beam slotting', Acta Materialia, vol. 60, no. 5, pp. 2337-2349. https://doi.org/10.1016/j.actamat.2011.12.035","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G136484803","display_name":"3D Assessment of Surface Integrity and Performance","funder_award_id":"EP/I029605/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G585348604","display_name":"Fabrication of high quality cast amorphous/heteroamorphous alloys with a small amount of cast defects","funder_award_id":"23560857","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"},{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":69,"referenced_works":["https://openalex.org/W126576980","https://openalex.org/W1574584754","https://openalex.org/W1673437353","https://openalex.org/W1964157549","https://openalex.org/W1964311368","https://openalex.org/W1964764543","https://openalex.org/W1964809501","https://openalex.org/W1967606536","https://openalex.org/W1967813726","https://openalex.org/W1969096313","https://openalex.org/W1971584749","https://openalex.org/W1971822024","https://openalex.org/W1974873972","https://openalex.org/W1978068017","https://openalex.org/W1979959380","https://openalex.org/W1980779516","https://openalex.org/W1982716643","https://openalex.org/W1982965441","https://openalex.org/W1983785039","https://openalex.org/W1985679069","https://openalex.org/W1985907525","https://openalex.org/W1986620200","https://openalex.org/W1987312369","https://openalex.org/W1992208505","https://openalex.org/W1992514481","https://openalex.org/W1993441791","https://openalex.org/W1997218734","https://openalex.org/W2001746858","https://openalex.org/W2002983799","https://openalex.org/W2004574954","https://openalex.org/W2007286409","https://openalex.org/W2008612409","https://openalex.org/W2009319174","https://openalex.org/W2013069357","https://openalex.org/W2014614447","https://openalex.org/W2019941322","https://openalex.org/W2028004842","https://openalex.org/W2029936013","https://openalex.org/W2033600617","https://openalex.org/W2039776545","https://openalex.org/W2041091843","https://openalex.org/W2046944427","https://openalex.org/W2047173473","https://openalex.org/W2052660965","https://openalex.org/W2058632784","https://openalex.org/W2061596037","https://openalex.org/W2062235934","https://openalex.org/W2063714602","https://openalex.org/W2066119611","https://openalex.org/W2067612485","https://openalex.org/W2068516433","https://openalex.org/W2074024354","https://openalex.org/W2075010147","https://openalex.org/W2078238874","https://openalex.org/W2078338128","https://openalex.org/W2085301919","https://openalex.org/W2087714708","https://openalex.org/W2088877497","https://openalex.org/W2090169390","https://openalex.org/W2094983663","https://openalex.org/W2097581451","https://openalex.org/W2106193007","https://openalex.org/W2118142066","https://openalex.org/W2129215874","https://openalex.org/W2146038423","https://openalex.org/W2153533871","https://openalex.org/W2159627091","https://openalex.org/W2166915263","https://openalex.org/W4301525662"],"related_works":["https://openalex.org/W2078338128","https://openalex.org/W2058632784","https://openalex.org/W4231954208","https://openalex.org/W7097660594","https://openalex.org/W1992208505","https://openalex.org/W2052696263","https://openalex.org/W2003543560","https://openalex.org/W2909842995","https://openalex.org/W2289216581","https://openalex.org/W2035729528"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":5},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2026-11-03T10:50:19.383937","created_date":"2016-06-24T00:00:00"}