{"id":"https://openalex.org/W2024258542","doi":"https://doi.org/10.1117/12.875770","title":"Low-light hyperspectral imager for characterization of biological samples based on an sCMOS image sensor","display_name":"Low-light hyperspectral imager for characterization of biological samples based on an sCMOS image sensor","publication_year":2011,"publication_date":"2011-02-10","ids":{"openalex":"https://openalex.org/W2024258542","doi":"https://doi.org/10.1117/12.875770","mag":"2024258542"},"language":"en","primary_location":{"id":"doi:10.1117/12.875770","doi":"https://doi.org/10.1117/12.875770","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.875770","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064921963","display_name":"Julio E. Hernandez-Palacios","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I163244428","display_name":"Norwegian Defence Research Establishment","ror":"https://ror.org/0098gnz32","country_code":"NO","type":"facility","lineage":["https://openalex.org/I163244428"]},{"id":"https://openalex.org/I184942183","display_name":"University of Oslo","ror":"https://ror.org/01xtthb56","country_code":"NO","type":"education","lineage":["https://openalex.org/I184942183"]},{"id":"https://openalex.org/I4210088371","display_name":"Norsk Elektro Optikk (Norway)","ror":"https://ror.org/005w2t155","country_code":"NO","type":"company","lineage":["https://openalex.org/I4210088371"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"J. Hernandez-Palacios","raw_affiliation_strings":["Norsk Elektro Optikk AS (Norway)","Norwegian Defense Research Establishment (Norway)","Univ. of Oslo (Norway)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Norsk Elektro Optikk AS (Norway)","institution_ids":["https://openalex.org/I4210088371"]},{"raw_affiliation_string":"Norwegian Defense Research Establishment (Norway)","institution_ids":["https://openalex.org/I163244428"]},{"raw_affiliation_string":"Univ. of Oslo (Norway)","institution_ids":["https://openalex.org/I184942183"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073420230","display_name":"Lise Lyngsnes Randeberg","orcid":"https://orcid.org/0000-0003-2608-3759","observed_orcids":["https://orcid.org/0000-0003-2608-3759"]},"institutions":[{"id":"https://openalex.org/I204778367","display_name":"Norwegian University of Science and Technology","ror":"https://ror.org/05xg72x27","country_code":"NO","type":"education","lineage":["https://openalex.org/I204778367"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"L. L. Randeberg","raw_affiliation_strings":["Norwegian Univ. of Science and Technology (Norway)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Norwegian Univ. of Science and Technology (Norway)","institution_ids":["https://openalex.org/I204778367"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111368630","display_name":"Ingvild J. Haug","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I204778367","display_name":"Norwegian University of Science and Technology","ror":"https://ror.org/05xg72x27","country_code":"NO","type":"education","lineage":["https://openalex.org/I204778367"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"I. J. Haug","raw_affiliation_strings":["Norwegian Univ. of Science and Technology (Norway)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Norwegian Univ. of Science and Technology (Norway)","institution_ids":["https://openalex.org/I204778367"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063149537","display_name":"Ivar Baarstad","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210088371","display_name":"Norsk Elektro Optikk (Norway)","ror":"https://ror.org/005w2t155","country_code":"NO","type":"company","lineage":["https://openalex.org/I4210088371"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"I. Baarstad","raw_affiliation_strings":["Norsk Elektro Optikk AS (Norway)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Norsk Elektro Optikk AS (Norway)","institution_ids":["https://openalex.org/I4210088371"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112747726","display_name":"Trond L\u00f8ke","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210088371","display_name":"Norsk Elektro Optikk (Norway)","ror":"https://ror.org/005w2t155","country_code":"NO","type":"company","lineage":["https://openalex.org/I4210088371"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"T. L\u00f8ke","raw_affiliation_strings":["Norsk Elektro Optikk AS (Norway)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Norsk Elektro Optikk AS (Norway)","institution_ids":["https://openalex.org/I4210088371"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089361652","display_name":"T. Skauli","orcid":"https://orcid.org/0000-0003-2360-2621","observed_orcids":["https://orcid.org/0000-0003-2360-2621"]},"institutions":[{"id":"https://openalex.org/I163244428","display_name":"Norwegian Defence Research Establishment","ror":"https://ror.org/0098gnz32","country_code":"NO","type":"facility","lineage":["https://openalex.org/I163244428"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"T. Skauli","raw_affiliation_strings":["Norwegian Defense Research Establishment (Norway)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Norwegian Defense Research Establishment (Norway)","institution_ids":["https://openalex.org/I163244428"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.11227831,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"7891","issue":null,"first_page":"78910V","last_page":"78910V"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10977","display_name":"Optical Imaging and Spectroscopy Techniques","score":0.0027000000700354576,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T10689","display_name":"Remote-Sensing Image Classification","score":0.001500000013038516,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hyperspectral-imaging","display_name":"hyperspectral imaging","score":0.8920000195503235},{"id":"https://openalex.org/keywords/low-light-imaging","display_name":"low-light imaging","score":0.8479999899864197},{"id":"https://openalex.org/keywords/fluorescence-imaging","display_name":"fluorescence imaging","score":0.9570000171661377},{"id":"https://openalex.org/keywords/readout-noise","display_name":"readout noise","score":0.8460000157356262},{"id":"https://openalex.org/keywords/ccd-comparison","display_name":"CCD comparison","score":0.6200000047683716},{"id":"https://openalex.org/keywords/image-artifacts","display_name":"image artifacts","score":0.5609999895095825},{"id":"https://openalex.org/keywords/operating-temperature","display_name":"operating temperature","score":0.5189999938011169},{"id":"https://openalex.org/keywords/image-processing","display_name":"image processing","score":0.7440000176429749}],"concepts":[{"id":"https://openalex.org/C159078339","wikidata":"https://www.wikidata.org/wiki/Q959005","display_name":"Hyperspectral imaging","level":2,"score":0.9149731397628784},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.6133435368537903},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.6006034016609192},{"id":"https://openalex.org/C2778617687","wikidata":"https://www.wikidata.org/wiki/Q2448456","display_name":"Fluorophore","level":3,"score":0.5630269646644592},{"id":"https://openalex.org/C78660771","wikidata":"https://www.wikidata.org/wiki/Q5508206","display_name":"Full spectral imaging","level":3,"score":0.5389886498451233},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5355536937713623},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5341694951057434},{"id":"https://openalex.org/C155512908","wikidata":"https://www.wikidata.org/wiki/Q210745","display_name":"CMOS sensor","level":3,"score":0.5309174656867981},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4940338730812073},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.45160236954689026},{"id":"https://openalex.org/C65597285","wikidata":"https://www.wikidata.org/wiki/Q5090469","display_name":"Chemical imaging","level":3,"score":0.42884787917137146},{"id":"https://openalex.org/C3232514","wikidata":"https://www.wikidata.org/wiki/Q7575196","display_name":"Spectral imaging","level":2,"score":0.41573044657707214},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.3528019189834595},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.27560126781463623},{"id":"https://openalex.org/C91881484","wikidata":"https://www.wikidata.org/wiki/Q191807","display_name":"Fluorescence","level":2,"score":0.24322232604026794},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.1639193296432495},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15283891558647156},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.10527598857879639}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.875770","doi":"https://doi.org/10.1117/12.875770","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.875770","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1995071709","https://openalex.org/W2008790367","https://openalex.org/W2136285443","https://openalex.org/W4311346042","https://openalex.org/W2997044209","https://openalex.org/W2911618503","https://openalex.org/W2058734149","https://openalex.org/W2042341431","https://openalex.org/W2910123071","https://openalex.org/W6902459434"],"abstract_inverted_index":{"The":[0,15,68,82,99],"new":[1,140],"\"scientific":[2],"CMOS\"":[3],"(sCMOS)":[4],"sensor":[5,54],"technology":[6],"has":[7,41,84],"been":[8,42,66,85],"tested":[9],"for":[10,32],"use":[11],"in":[12,47,61],"hyperspectral":[13,33,39],"imaging.":[14],"sCMOS":[16,53,141],"offers":[17],"extremely":[18],"low":[19,48],"readout":[20],"noise":[21],"combined":[22],"with":[23,75,116],"high":[24,27,112,122],"resolution":[25],"and":[26,78,136],"speed,":[28],"making":[29],"it":[30],"attractive":[31],"imaging":[34,60],"applications.":[35],"A":[36],"commercial":[37],"HySpex":[38],"camera":[40,83,105],"modified":[43],"to":[44,87,110,120],"be":[45],"used":[46],"light":[49,63],"conditions":[50],"integrating":[51],"an":[52],"array.":[55,127],"Initial":[56],"tests":[57],"of":[58,80,90,102,114,125,133,138],"fluorescence":[59],"challenging":[62],"settings":[64],"have":[65],"performed.":[67],"imaged":[69],"objects":[70],"are":[71],"layered":[72],"phantoms":[73],"labelled":[74],"controlled":[76],"location":[77],"concentration":[79],"fluorophore.":[81],"compared":[86],"a":[88,111],"state":[89],"the":[91,103,121,126,134,139],"art":[92],"spectral":[93],"imager":[94],"based":[95],"on":[96],"CCD":[97],"technology.":[98,142],"image":[100],"quality":[101],"sCMOS-based":[104],"suffers":[106],"from":[107],"artifacts":[108],"due":[109],"density":[113],"pixels":[115],"excessive":[117],"noise,":[118],"attributed":[119],"operating":[123],"temperature":[124],"Image":[128],"processing":[129],"results":[130],"illustrate":[131],"some":[132],"benefits":[135],"challenges":[137]},"counts_by_year":[{"year":2016,"cited_by_count":1}],"updated_date":"2026-09-22T06:50:58.402377","created_date":"2016-06-24T00:00:00"}