{"id":"https://openalex.org/W2023633705","doi":"https://doi.org/10.1016/s0040-6090(99)00641-0","title":"Studies of amorphous carbon using X-ray photoelectron spectroscopy, near-edge X-ray-absorption fine structure and Raman spectroscopy","display_name":"Studies of amorphous carbon using X-ray photoelectron spectroscopy, near-edge X-ray-absorption fine structure and Raman spectroscopy","publication_year":1999,"publication_date":"1999-10-01","ids":{"openalex":"https://openalex.org/W2023633705","doi":"https://doi.org/10.1016/s0040-6090(99)00641-0","mag":"2023633705"},"language":"en","primary_location":{"id":"doi:10.1016/s0040-6090(99)00641-0","doi":"https://doi.org/10.1016/s0040-6090(99)00641-0","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0040-6090(99)00641-0","pdf_url":null,"source":{"id":"https://openalex.org/S84339699","display_name":"Thin Solid Films","issn_l":"0040-6090","issn":["0040-6090","1879-2731"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thin Solid Films","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068224978","display_name":"Matthias Ramm","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210143797","display_name":"Sony (Japan)","ror":"https://ror.org/04wzv3n59","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210143797"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Matthias Ramm","raw_affiliation_strings":["Sony Corporation Frontier Science Laboratories, 2-1-1, Shinsakuragaoka, Hodogaya-ku, Yokohama 240-0036, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sony Corporation Frontier Science Laboratories, 2-1-1, Shinsakuragaoka, Hodogaya-ku, Yokohama 240-0036, Japan","institution_ids":["https://openalex.org/I4210143797"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059282390","display_name":"Masafumi Ata","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210143797","display_name":"Sony (Japan)","ror":"https://ror.org/04wzv3n59","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210143797"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masafumi Ata","raw_affiliation_strings":["Sony Corporation Frontier Science Laboratories, 2-1-1, Shinsakuragaoka, Hodogaya-ku, Yokohama 240-0036, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sony Corporation Frontier Science Laboratories, 2-1-1, Shinsakuragaoka, Hodogaya-ku, Yokohama 240-0036, Japan","institution_ids":["https://openalex.org/I4210143797"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108393766","display_name":"Klaus\u2010Werner Brzezinka","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1330165540","display_name":"Federal Institute For Materials Research and Testing","ror":"https://ror.org/03x516a66","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1330165540"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Klaus-Werner Brzezinka","raw_affiliation_strings":["Bundesanstalt f\u00fcr Materialforschung und -pr\u00fcfung, Unter den Eichen 44-46, D-12203, Berlin, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bundesanstalt f\u00fcr Materialforschung und -pr\u00fcfung, Unter den Eichen 44-46, D-12203, Berlin, Germany","institution_ids":["https://openalex.org/I1330165540"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102918114","display_name":"Thomas J. Gross","orcid":"https://orcid.org/0000-0002-9351-6000","observed_orcids":["https://orcid.org/0000-0002-9351-6000"]},"institutions":[{"id":"https://openalex.org/I1330165540","display_name":"Federal Institute For Materials Research and Testing","ror":"https://ror.org/03x516a66","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1330165540"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Thomas Gross","raw_affiliation_strings":["Bundesanstalt f\u00fcr Materialforschung und -pr\u00fcfung, Unter den Eichen 44-46, D-12203, Berlin, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bundesanstalt f\u00fcr Materialforschung und -pr\u00fcfung, Unter den Eichen 44-46, D-12203, Berlin, Germany","institution_ids":["https://openalex.org/I1330165540"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073337027","display_name":"Wolfgang E. S. Unger","orcid":"https://orcid.org/0000-0002-7670-4042","observed_orcids":["https://orcid.org/0000-0002-7670-4042"]},"institutions":[{"id":"https://openalex.org/I1330165540","display_name":"Federal Institute For Materials Research and Testing","ror":"https://ror.org/03x516a66","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1330165540"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Wolfgang Unger","raw_affiliation_strings":["Bundesanstalt f\u00fcr Materialforschung und -pr\u00fcfung, Unter den Eichen 44-46, D-12203, Berlin, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bundesanstalt f\u00fcr Materialforschung und -pr\u00fcfung, Unter den Eichen 44-46, D-12203, Berlin, Germany","institution_ids":["https://openalex.org/I1330165540"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5068224978"],"corresponding_institution_ids":["https://openalex.org/I4210143797"],"apc_list":{"value":3120,"currency":"USD","value_usd":3120},"apc_paid":null,"fwci":0.8771,"has_fulltext":false,"cited_by_count":48,"citation_normalized_percentile":{"value":0.66925184,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":98},"biblio":{"volume":"354","issue":"1-2","first_page":"106","last_page":"110"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10956","display_name":"Fullerene Chemistry and Applications","score":0.6606000065803528,"subfield":{"id":"https://openalex.org/subfields/1605","display_name":"Organic Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10956","display_name":"Fullerene Chemistry and Applications","score":0.6606000065803528,"subfield":{"id":"https://openalex.org/subfields/1605","display_name":"Organic Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.1664000004529953,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11733","display_name":"X-ray Spectroscopy and Fluorescence Analysis","score":0.06989999860525131,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/amorphous-carbon","display_name":"amorphous carbon","score":0.968999981880188},{"id":"https://openalex.org/keywords/c60","display_name":"C60","score":0.9570000171661377},{"id":"https://openalex.org/keywords/plasma-deposition","display_name":"plasma deposition","score":0.8410000205039978},{"id":"https://openalex.org/keywords/amorphization","display_name":"amorphization","score":0.675000011920929},{"id":"https://openalex.org/keywords/electronic-structure","display_name":"electronic structure","score":0.6589999794960022},{"id":"https://openalex.org/keywords/valence-band","display_name":"valence band","score":0.7139999866485596},{"id":"https://openalex.org/keywords/c-1s-core-level","display_name":"C 1s core level","score":0.8539999723434448},{"id":"https://openalex.org/keywords/shake-up-satellites","display_name":"shake-up satellites","score":0.8259999752044678},{"id":"https://openalex.org/keywords/pi-resonance","display_name":"\u03c0* resonance","score":0.7580000162124634},{"id":"https://openalex.org/keywords/surface-functionalization","display_name":"surface functionalization","score":0.8059999942779541}],"concepts":[{"id":"https://openalex.org/C175708663","wikidata":"https://www.wikidata.org/wiki/Q899559","display_name":"X-ray photoelectron spectroscopy","level":2,"score":0.8574322462081909},{"id":"https://openalex.org/C110715899","wikidata":"https://www.wikidata.org/wiki/Q3570341","display_name":"XANES","level":3,"score":0.8356895446777344},{"id":"https://openalex.org/C40003534","wikidata":"https://www.wikidata.org/wiki/Q862228","display_name":"Raman spectroscopy","level":2,"score":0.793006420135498},{"id":"https://openalex.org/C56052488","wikidata":"https://www.wikidata.org/wiki/Q103382","display_name":"Amorphous solid","level":2,"score":0.6165208220481873},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.614999532699585},{"id":"https://openalex.org/C201931942","wikidata":"https://www.wikidata.org/wiki/Q798012","display_name":"Amorphous carbon","level":3,"score":0.6090973615646362},{"id":"https://openalex.org/C32891209","wikidata":"https://www.wikidata.org/wiki/Q483666","display_name":"Spectroscopy","level":2,"score":0.5537425875663757},{"id":"https://openalex.org/C119824511","wikidata":"https://www.wikidata.org/wiki/Q13553575","display_name":"Absorption spectroscopy","level":2,"score":0.5141603946685791},{"id":"https://openalex.org/C168900304","wikidata":"https://www.wikidata.org/wiki/Q171407","display_name":"Valence (chemistry)","level":2,"score":0.4834066927433014},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4589051604270935},{"id":"https://openalex.org/C140205800","wikidata":"https://www.wikidata.org/wiki/Q5860","display_name":"Carbon fibers","level":3,"score":0.4423200786113739},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.41302692890167236},{"id":"https://openalex.org/C150244406","wikidata":"https://www.wikidata.org/wiki/Q4384383","display_name":"X-ray absorption fine structure","level":3,"score":0.4121299088001251},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.2357461154460907},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.2174045443534851},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.09594589471817017},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C104779481","wikidata":"https://www.wikidata.org/wiki/Q50707","display_name":"Composite number","level":2,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0040-6090(99)00641-0","doi":"https://doi.org/10.1016/s0040-6090(99)00641-0","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0040-6090(99)00641-0","pdf_url":null,"source":{"id":"https://openalex.org/S84339699","display_name":"Thin Solid Films","issn_l":"0040-6090","issn":["0040-6090","1879-2731"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thin Solid Films","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1965231365","https://openalex.org/W1970644796","https://openalex.org/W2007812062","https://openalex.org/W2025659062","https://openalex.org/W2036703856","https://openalex.org/W2038667716","https://openalex.org/W2041767969","https://openalex.org/W2048286286","https://openalex.org/W2057747805","https://openalex.org/W2062743422","https://openalex.org/W2064903819","https://openalex.org/W2111937898","https://openalex.org/W2163728385","https://openalex.org/W2171898868"],"related_works":["https://openalex.org/W2066807692","https://openalex.org/W7071770935","https://openalex.org/W1969638285","https://openalex.org/W2077442099","https://openalex.org/W1972633044","https://openalex.org/W2080385125","https://openalex.org/W7144531729","https://openalex.org/W2036816576","https://openalex.org/W2973282764","https://openalex.org/W2962963201"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":5}],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2016-06-24T00:00:00"}