{"id":"https://openalex.org/W2023149986","doi":"https://doi.org/10.1088/0026-1394/50/1a/08012","title":"Final report on key comparison CCQM-K96: Determination of amount content of dichromate","display_name":"Final report on key comparison CCQM-K96: Determination of amount content of dichromate","publication_year":2013,"publication_date":"2013-01-01","ids":{"openalex":"https://openalex.org/W2023149986","doi":"https://doi.org/10.1088/0026-1394/50/1a/08012","mag":"2023149986"},"language":"en","primary_location":{"id":"doi:10.1088/0026-1394/50/1a/08012","doi":"https://doi.org/10.1088/0026-1394/50/1a/08012","is_oa":false,"landing_page_url":"https://doi.org/10.1088/0026-1394/50/1a/08012","pdf_url":null,"source":{"id":"https://openalex.org/S7291761","display_name":"Metrologia","issn_l":"0026-1394","issn":["0026-1394","1681-7575"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-2","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Metrologia","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005636446","display_name":"Michal M\u00e1ri\u00e1ssy","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Michal M\u00e1ri\u00e1ssy","raw_affiliation_strings":["Slovak Institute of Metrology (SMU), Slovakia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Slovak Institute of Metrology (SMU), Slovakia","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087962500","display_name":"Zuzana Hankov\u00e1","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Zuzana Hankov\u00e1","raw_affiliation_strings":["Slovak Institute of Metrology (SMU), Slovakia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Slovak Institute of Metrology (SMU), Slovakia","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076037231","display_name":"Euijin Hwang","orcid":"https://orcid.org/0000-0001-6495-6886","observed_orcids":["https://orcid.org/0000-0001-6495-6886"]},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Euijin Hwang","raw_affiliation_strings":["Korea Research Institute of Standards and Science (KRISS), Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Korea Research Institute of Standards and Science (KRISS), Korea","institution_ids":["https://openalex.org/I2799611809"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088868618","display_name":"Youngran Lim","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Youngran Lim","raw_affiliation_strings":["Korea Research Institute of Standards and Science (KRISS), Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Korea Research Institute of Standards and Science (KRISS), Korea","institution_ids":["https://openalex.org/I2799611809"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048385768","display_name":"Kenneth W. Pratt","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kenneth W Pratt","raw_affiliation_strings":["National Institute for Standards and Technology (NIST), USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute for Standards and Technology (NIST), USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088594429","display_name":"Akiharu Hioki","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4405273829","display_name":"National Metrology Institute of Japan","ror":"https://ror.org/00j3eeb74","country_code":"JP","type":"government","lineage":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akiharu Hioki","raw_affiliation_strings":["National Metrology Institute of Japan (NMIJ), Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan (NMIJ), Japan","institution_ids":["https://openalex.org/I4405273829"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025720891","display_name":"Toshiaki Asakai","orcid":"https://orcid.org/0000-0002-5605-8354","observed_orcids":["https://orcid.org/0000-0002-5605-8354"]},"institutions":[{"id":"https://openalex.org/I4405273829","display_name":"National Metrology Institute of Japan","ror":"https://ror.org/00j3eeb74","country_code":"JP","type":"government","lineage":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshiaki Asakai","raw_affiliation_strings":["National Metrology Institute of Japan (NMIJ), Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan (NMIJ), Japan","institution_ids":["https://openalex.org/I4405273829"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Wu Bing","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wu Bing","raw_affiliation_strings":["National Institute of Metrology of P. R. China (NIM), China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Metrology of P. R. China (NIM), China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046353349","display_name":"Ma Liandi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ma Liandi","raw_affiliation_strings":["National Institute of Metrology of P. R. China (NIM), China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Metrology of P. R. China (NIM), China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109477840","display_name":"Wei Chao","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Chao","raw_affiliation_strings":["National Institute of Metrology of P. R. China (NIM), China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Metrology of P. R. China (NIM), China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010798299","display_name":"Alena V. Sobina","orcid":"https://orcid.org/0000-0002-5873-7326","observed_orcids":["https://orcid.org/0000-0002-5873-7326"]},"institutions":[{"id":"https://openalex.org/I4391012562","display_name":"Ural Scientific Research Institute for Metrology","ror":"https://ror.org/00fgdrw78","country_code":"RU","type":"facility","lineage":["https://openalex.org/I4391012562"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Alena Sobina","raw_affiliation_strings":["Ural Scientific Research Institute of Metrology (UNIIM), Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ural Scientific Research Institute of Metrology (UNIIM), Russia","institution_ids":["https://openalex.org/I4391012562"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069943680","display_name":"Alexandr Shimolin","orcid":"https://orcid.org/0000-0001-7288-8254","observed_orcids":["https://orcid.org/0000-0001-7288-8254"]},"institutions":[{"id":"https://openalex.org/I4391012562","display_name":"Ural Scientific Research Institute for Metrology","ror":"https://ror.org/00fgdrw78","country_code":"RU","type":"facility","lineage":["https://openalex.org/I4391012562"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Alexandr Shimolin","raw_affiliation_strings":["Ural Scientific Research Institute of Metrology (UNIIM), Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ural Scientific Research Institute of Metrology (UNIIM), Russia","institution_ids":["https://openalex.org/I4391012562"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028572127","display_name":"B. S. Wiler","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I40891861","display_name":"Instituto Nacional de Metrologia, Qualidade e Tecnologia","ror":"https://ror.org/01f8vhd41","country_code":"BR","type":"government","lineage":["https://openalex.org/I2801200668","https://openalex.org/I2802647933","https://openalex.org/I40891861"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Wiler B S Junior","raw_affiliation_strings":["National Institute of Metrology, Quality and Technology (INMETRO), Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Quality and Technology (INMETRO), Brazil","institution_ids":["https://openalex.org/I40891861"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013894451","display_name":"Paulo Paschoal Borges","orcid":"https://orcid.org/0000-0002-9411-6930","observed_orcids":["https://orcid.org/0000-0002-9411-6930"]},"institutions":[{"id":"https://openalex.org/I40891861","display_name":"Instituto Nacional de Metrologia, Qualidade e Tecnologia","ror":"https://ror.org/01f8vhd41","country_code":"BR","type":"government","lineage":["https://openalex.org/I2801200668","https://openalex.org/I2802647933","https://openalex.org/I40891861"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Paulo P Borges","raw_affiliation_strings":["National Institute of Metrology, Quality and Technology (INMETRO), Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Quality and Technology (INMETRO), Brazil","institution_ids":["https://openalex.org/I40891861"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017285785","display_name":"Francisco Javier Matehuala","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4387153439","display_name":"National Metrology Center","ror":"https://ror.org/05v1qt749","country_code":"MX","type":"government","lineage":["https://openalex.org/I4387153439"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Francisco Javier Matehuala","raw_affiliation_strings":["Centro Nacional de Metrologia (CENAM), Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centro Nacional de Metrologia (CENAM), Mexico","institution_ids":["https://openalex.org/I4387153439"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052309356","display_name":"Francisco Segoviano Regalado","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4387153439","display_name":"National Metrology Center","ror":"https://ror.org/05v1qt749","country_code":"MX","type":"government","lineage":["https://openalex.org/I4387153439"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Francisco Segoviano","raw_affiliation_strings":["Centro Nacional de Metrologia (CENAM), Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centro Nacional de Metrologia (CENAM), Mexico","institution_ids":["https://openalex.org/I4387153439"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020359805","display_name":"Griselda Rivera-S\u00e1nchez","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4387153439","display_name":"National Metrology Center","ror":"https://ror.org/05v1qt749","country_code":"MX","type":"government","lineage":["https://openalex.org/I4387153439"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Griselda Rivera","raw_affiliation_strings":["Centro Nacional de Metrologia (CENAM), Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centro Nacional de Metrologia (CENAM), Mexico","institution_ids":["https://openalex.org/I4387153439"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111679824","display_name":"Pedro Ram\u00edrez","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4387153439","display_name":"National Metrology Center","ror":"https://ror.org/05v1qt749","country_code":"MX","type":"government","lineage":["https://openalex.org/I4387153439"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Pedro Ram\u00edrez","raw_affiliation_strings":["Centro Nacional de Metrologia (CENAM), Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centro Nacional de Metrologia (CENAM), Mexico","institution_ids":["https://openalex.org/I4387153439"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059109887","display_name":"Mar\u00eda del Rocio Arvizu Torres","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4387153439","display_name":"National Metrology Center","ror":"https://ror.org/05v1qt749","country_code":"MX","type":"government","lineage":["https://openalex.org/I4387153439"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Mar\u00eda del Rocio Arvizu","raw_affiliation_strings":["Centro Nacional de Metrologia (CENAM), Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centro Nacional de Metrologia (CENAM), Mexico","institution_ids":["https://openalex.org/I4387153439"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027501555","display_name":"Jos\u00e9 Luis Ortiz-Aparicio","orcid":"https://orcid.org/0000-0003-3576-3668","observed_orcids":["https://orcid.org/0000-0003-3576-3668"]},"institutions":[{"id":"https://openalex.org/I4387153439","display_name":"National Metrology Center","ror":"https://ror.org/05v1qt749","country_code":"MX","type":"government","lineage":["https://openalex.org/I4387153439"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Jos\u00e9 Luis Ortiz-Aparicio","raw_affiliation_strings":["Centro Nacional de Metrologia (CENAM), Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centro Nacional de Metrologia (CENAM), Mexico","institution_ids":["https://openalex.org/I4387153439"]}]}],"institutions":[],"countries_distinct_count":7,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3325,"currency":"USD","value_usd":3325},"apc_paid":null,"fwci":1.1028,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.81349864,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"50","issue":"1A","first_page":"08012","last_page":"08012"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.0010999999940395355,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10180","display_name":"Analytical chemistry methods development","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dichromate","display_name":"dichromate","score":0.9610000252723694},{"id":"https://openalex.org/keywords/key-comparison","display_name":"key comparison","score":0.6800000071525574},{"id":"https://openalex.org/keywords/constant-current-coulometry","display_name":"constant current coulometry","score":0.9120000004768372},{"id":"https://openalex.org/keywords/electrochemical-analysis","display_name":"electrochemical analysis","score":0.3440000116825104},{"id":"https://openalex.org/keywords/metrology-institutes","display_name":"metrology institutes","score":0.5839999914169312},{"id":"https://openalex.org/keywords/measurement-capability","display_name":"measurement capability","score":0.3160000145435333},{"id":"https://openalex.org/keywords/inorganic-analysis","display_name":"inorganic analysis","score":0.36000001430511475}],"concepts":[{"id":"https://openalex.org/C109379892","wikidata":"https://www.wikidata.org/wiki/Q1136979","display_name":"Coulometry","level":4,"score":0.785509467124939},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.6805436611175537},{"id":"https://openalex.org/C2993899435","wikidata":"https://www.wikidata.org/wiki/Q109535850","display_name":"Mutual recognition","level":2,"score":0.5198860168457031},{"id":"https://openalex.org/C2778152352","wikidata":"https://www.wikidata.org/wiki/Q5165061","display_name":"Content (measure theory)","level":2,"score":0.4426710903644562},{"id":"https://openalex.org/C2994224358","wikidata":"https://www.wikidata.org/wiki/Q13649246","display_name":"Standard uncertainty","level":3,"score":0.41518595814704895},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3800538182258606},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3368321657180786},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2184799313545227},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.19163170456886292},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.18758773803710938},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.18605059385299683},{"id":"https://openalex.org/C52859227","wikidata":"https://www.wikidata.org/wiki/Q7877","display_name":"Electrochemistry","level":3,"score":0.12897366285324097},{"id":"https://openalex.org/C107872376","wikidata":"https://www.wikidata.org/wiki/Q321355","display_name":"Environmental chemistry","level":1,"score":0.12743982672691345},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.049884259700775146},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C155202549","wikidata":"https://www.wikidata.org/wiki/Q178803","display_name":"International trade","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1088/0026-1394/50/1a/08012","doi":"https://doi.org/10.1088/0026-1394/50/1a/08012","is_oa":false,"landing_page_url":"https://doi.org/10.1088/0026-1394/50/1a/08012","pdf_url":null,"source":{"id":"https://openalex.org/S7291761","display_name":"Metrologia","issn_l":"0026-1394","issn":["0026-1394","1681-7575"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-2","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320083","host_organization_name":"IOP Publishing","host_organization_lineage":["https://openalex.org/P4310320083","https://openalex.org/P4310311669"],"host_organization_lineage_names":["IOP Publishing","Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Metrologia","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"sustainable_development_goals_aurora":[{"score":0.49000000953674316,"display_name":"Partnerships for the goals","id":"https://metadata.un.org/sdg/17"}],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321114","display_name":"Bundesministerium f\u00fcr Bildung und Forschung","ror":"https://ror.org/04pz7b180"},{"id":"https://openalex.org/F4320334763","display_name":"Leibniz-Gemeinschaft","ror":"https://ror.org/01n6r0e97"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2229594761","https://openalex.org/W4406698761","https://openalex.org/W2124985468","https://openalex.org/W1971033539","https://openalex.org/W1992912474","https://openalex.org/W1983168869","https://openalex.org/W2916156230","https://openalex.org/W4403252302","https://openalex.org/W4317613528","https://openalex.org/W2088507828"],"abstract_inverted_index":{"The":[0,100],"key":[1,95],"comparison":[2,96],"CCQM-K96":[3],"was":[4,64],"organized":[5],"jointly":[6],"by":[7,110],"the":[8,18,21,26,41,49,62,70,93,111,115,118],"inorganic":[9],"and":[10,106],"electrochemistry":[11],"working":[12],"groups":[13],"of":[14,20,29,33,37,61,73,92,117],"CCQM":[15],"to":[16,24,114],"test":[17],"abilities":[19],"metrology":[22],"institutes":[23],"measure":[25],"amount":[27],"content":[28],"dichromate.":[30],"Slovak":[31],"Institute":[32],"Metrology":[34],"with":[35],"help":[36],"KRISS":[38],"acted":[39],"as":[40],"coordinating":[42],"laboratories.":[43],"Eight":[44],"NMIs":[45],"took":[46],"part":[47],"in":[48,89],"comparison.":[50],"All":[51],"participants":[52],"used":[53],"high":[54],"accuracy":[55],"constant":[56],"current":[57],"coulometry.":[58],"Good":[59],"agreement":[60],"results":[63],"observed.":[65],"Main":[66],"text.":[67],"To":[68],"reach":[69],"main":[71],"text":[72,84],"this":[74,83],"paper,":[75],"click":[76],"on":[77],"Final":[78],"Report":[79],".":[80,99],"Note":[81],"that":[82,86],"is":[85],"which":[87],"appears":[88],"Appendix":[90],"B":[91],"BIPM":[94],"database":[97],"kcdb.bipm.org/":[98],"final":[101],"report":[102],"has":[103],"been":[104],"peer-reviewed":[105],"approved":[107],"for":[108],"publication":[109],"CCQM,":[112],"according":[113],"provisions":[116],"CIPM":[119],"Mutual":[120],"Recognition":[121],"Arrangement":[122],"(CIPM":[123],"MRA).":[124]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2014,"cited_by_count":3}],"updated_date":"2026-10-27T15:51:10.671819","created_date":"2016-06-24T00:00:00"}