{"id":"https://openalex.org/W2021857421","doi":"https://doi.org/10.1117/12.2024740","title":"Finite element analysis based model to study the electric field distribution and leakage current in PV modules under high voltage bias","display_name":"Finite element analysis based model to study the electric field distribution and leakage current in PV modules under high voltage bias","publication_year":2013,"publication_date":"2013-09-24","ids":{"openalex":"https://openalex.org/W2021857421","doi":"https://doi.org/10.1117/12.2024740","mag":"2021857421"},"language":"en","primary_location":{"id":"doi:10.1117/12.2024740","doi":"https://doi.org/10.1117/12.2024740","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2024740","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://stars.library.ucf.edu/scopus2010/6439","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021645707","display_name":"Narendra Shiradkar","orcid":"https://orcid.org/0000-0003-2272-9954","observed_orcids":["https://orcid.org/0000-0003-2272-9954"]},"institutions":[{"id":"https://openalex.org/I106165777","display_name":"University of Central Florida","ror":"https://ror.org/036nfer12","country_code":"US","type":"education","lineage":["https://openalex.org/I106165777"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Narendra Shiradkar","raw_affiliation_strings":["Univ. of Central Florida (United States)","[University of Central Florida, United States]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. of Central Florida (United States)","institution_ids":["https://openalex.org/I106165777"]},{"raw_affiliation_string":"[University of Central Florida, United States]","institution_ids":["https://openalex.org/I106165777"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069470036","display_name":"Eric John Schneller","orcid":"https://orcid.org/0000-0002-2104-0066","observed_orcids":["https://orcid.org/0000-0002-2104-0066"]},"institutions":[{"id":"https://openalex.org/I106165777","display_name":"University of Central Florida","ror":"https://ror.org/036nfer12","country_code":"US","type":"education","lineage":["https://openalex.org/I106165777"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Eric Schneller","raw_affiliation_strings":["Univ. of Central Florida (United States)","[University of Central Florida, United States]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. of Central Florida (United States)","institution_ids":["https://openalex.org/I106165777"]},{"raw_affiliation_string":"[University of Central Florida, United States]","institution_ids":["https://openalex.org/I106165777"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026676738","display_name":"Neelkanth Gurupad Dhere","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I106165777","display_name":"University of Central Florida","ror":"https://ror.org/036nfer12","country_code":"US","type":"education","lineage":["https://openalex.org/I106165777"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Neelkanth G. Dhere","raw_affiliation_strings":["Univ. of Central Florida (United States)","[University of Central Florida, United States]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. of Central Florida (United States)","institution_ids":["https://openalex.org/I106165777"]},{"raw_affiliation_string":"[University of Central Florida, United States]","institution_ids":["https://openalex.org/I106165777"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I106165777"],"apc_list":null,"apc_paid":null,"fwci":2.8986,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.91220966,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":97},"biblio":{"volume":"8825","issue":null,"first_page":"88250G","last_page":"88250G"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.5863999724388123,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.5863999724388123,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.2953999936580658,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10468","display_name":"Photovoltaic System Optimization Techniques","score":0.02250000089406967,"subfield":{"id":"https://openalex.org/subfields/2105","display_name":"Renewable Energy, Sustainability and the Environment"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/photovoltaic-modules","display_name":"photovoltaic modules","score":0.9800000190734863},{"id":"https://openalex.org/keywords/leakage-current","display_name":"leakage current","score":0.9639999866485596},{"id":"https://openalex.org/keywords/electric-field-distribution","display_name":"electric field distribution","score":0.8579999804496765},{"id":"https://openalex.org/keywords/high-bias-voltage","display_name":"high bias voltage","score":0.9900000095367432},{"id":"https://openalex.org/keywords/grounding-configuration","display_name":"grounding configuration","score":0.8399999737739563},{"id":"https://openalex.org/keywords/finite-element-model","display_name":"finite element model","score":0.39100000262260437}],"concepts":[{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.6835455298423767},{"id":"https://openalex.org/C41291067","wikidata":"https://www.wikidata.org/wiki/Q1897785","display_name":"Photovoltaic system","level":2,"score":0.6607382297515869},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6476761102676392},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.48833295702934265},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.4789743423461914},{"id":"https://openalex.org/C168993435","wikidata":"https://www.wikidata.org/wiki/Q6501125","display_name":"Ground","level":2,"score":0.47018635272979736},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.46076253056526184},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42985400557518005},{"id":"https://openalex.org/C88182573","wikidata":"https://www.wikidata.org/wiki/Q1139740","display_name":"High voltage","level":3,"score":0.42017924785614014},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4195536673069},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1909637749195099},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1403212547302246},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1117/12.2024740","doi":"https://doi.org/10.1117/12.2024740","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2024740","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","norway-1"],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},{"id":"pmh:oai:stars.library.ucf.edu:scopus2010-7438","doi":null,"is_oa":true,"landing_page_url":"https://stars.library.ucf.edu/scopus2010/6439","pdf_url":null,"source":{"id":"https://openalex.org/S4210172555","display_name":"Journal of International Crisis and Risk Communication Research","issn_l":"2576-0017","issn":["2576-0017","2576-0025"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","vabb-shw"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Scopus Export 2010-2014","raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:stars.library.ucf.edu:scopus2010-7438","doi":null,"is_oa":true,"landing_page_url":"https://stars.library.ucf.edu/scopus2010/6439","pdf_url":null,"source":{"id":"https://openalex.org/S4210172555","display_name":"Journal of International Crisis and Risk Communication Research","issn_l":"2576-0017","issn":["2576-0017","2576-0025"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","vabb-shw"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Scopus Export 2010-2014","raw_type":"text"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.5690000057220459,"id":"https://metadata.un.org/sdg/7"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W3120213914","https://openalex.org/W1998143502","https://openalex.org/W7133194076","https://openalex.org/W1980261485","https://openalex.org/W2067118624","https://openalex.org/W3120087442","https://openalex.org/W2124104981","https://openalex.org/W6947870032","https://openalex.org/W2048521364","https://openalex.org/W4404411231"],"abstract_inverted_index":{"The":[0,31,115,135,213],"maximum":[1],"system":[2,108],"voltage":[3,29,33,109,127],"for":[4,26,185],"Photovoltaic":[5],"systems":[6],"is":[7,23,87,191,215],"1000":[8],"V":[9],"in":[10,77,99,103,140,171,224,229],"US.":[11],"Some":[12],"modules":[13,102,121],"are":[14],"designed":[15],"to":[16,45,56,69,89,105,144,218],"operate":[17],"even":[18],"at":[19],"1500":[20],"V,":[21],"which":[22],"the":[24,36,42,51,54,57,72,81,91,100,107,119,132,146,151,160,172,186,198,222],"limit":[25],"IEC":[27],"low":[28],"systems.":[30],"high":[32,126],"bias":[34,128],"between":[35],"cell":[37,73],"circuit":[38],"and":[39,70,95,124,204,220,233],"frame":[40],"of":[41,53,66,80,83,112,162,168,188,200,211],"module":[43,55,153,190,230],"leads":[44],"a":[46,178],"leakage":[47,62,96,116,147,163,205,225],"current":[48,63,97,117,148,164,206,226],"flowing":[49,207],"through":[50,150,165,208],"insulation":[52,169,187],"ground.":[58],"Over":[59],"time,":[60],"this":[61,176],"causes":[64],"migration":[65],"various":[67],"species":[68],"from":[71,118],"circuit,":[74],"can":[75],"result":[76],"slow":[78],"degradation":[79,111],"performance":[82],"PV":[84,101,113,120,152,173,189],"module.":[85,212],"It":[86,193],"important":[88],"understand":[90],"electric":[92,201],"field":[93],"distribution":[94,161,199],"pathways":[98],"order":[104],"study":[106],"induced":[110],"modules.":[114,174],"deployed":[122],"outdoor":[123],"under":[125],"strongly":[129],"varies":[130],"with":[131,227],"environmental":[133],"conditions.":[134],"lumped":[136],"resistance":[137],"models":[138],"described":[139],"literature":[141],"that":[142],"attempt":[143],"explain":[145],"flow":[149],"do":[154],"not":[155],"provide":[156],"adequate":[157],"information":[158,196],"about":[159,197],"different":[166,209],"layers":[167,210],"present":[170],"In":[175],"paper,":[177],"Finite":[179],"Element":[180],"Analysis":[181],"(FEA)":[182],"based":[183],"model":[184,214],"described.":[192],"yields":[194],"useful":[195],"field,":[202],"potential":[203],"also":[216],"used":[217],"predict":[219],"analyze":[221],"changes":[223,228],"packaging":[231],"materials":[232],"grounding":[234],"configurations.":[235]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":3}],"updated_date":"2026-09-22T06:50:58.402377","created_date":"2016-06-24T00:00:00"}
