{"id":"https://openalex.org/W2020579532","doi":"https://doi.org/10.1007/bf02660335","title":"Doping properties of selected impurities in Hg1\u2212x Cdx Te","display_name":"Doping properties of selected impurities in Hg1\u2212x Cdx Te","publication_year":1977,"publication_date":"1977-01-01","ids":{"openalex":"https://openalex.org/W2020579532","doi":"https://doi.org/10.1007/bf02660335","mag":"2020579532"},"language":"en","primary_location":{"id":"doi:10.1007/bf02660335","doi":"https://doi.org/10.1007/bf02660335","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf02660335","pdf_url":null,"source":{"id":"https://openalex.org/S127985767","display_name":"Journal of Electronic Materials","issn_l":"0361-5235","issn":["0361-5235","0381-5235","1543-186X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-40","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Materials","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Eric S. Johnson","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I82514191","display_name":"Honeywell (United States)","ror":"https://ror.org/02t71h845","country_code":"US","type":"company","lineage":["https://openalex.org/I82514191"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Eric S. Johnson","raw_affiliation_strings":["Honeywell Corporate Research Center, 10701 Lyndale Avenue, 55420, South Bloomington, Minnesota","Honeywell Corporate Research Center, South Bloomington"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Honeywell Corporate Research Center, 10701 Lyndale Avenue, 55420, South Bloomington, Minnesota","institution_ids":["https://openalex.org/I82514191"]},{"raw_affiliation_string":"Honeywell Corporate Research Center, South Bloomington","institution_ids":["https://openalex.org/I82514191"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111843112","display_name":"Joseph L. Schmit","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I82514191","display_name":"Honeywell (United States)","ror":"https://ror.org/02t71h845","country_code":"US","type":"company","lineage":["https://openalex.org/I82514191"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. L. Schmit","raw_affiliation_strings":["Honeywell Corporate Research Center, 10701 Lyndale Avenue, 55420, South Bloomington, Minnesota","Honeywell Corporate Research Center, South Bloomington"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Honeywell Corporate Research Center, 10701 Lyndale Avenue, 55420, South Bloomington, Minnesota","institution_ids":["https://openalex.org/I82514191"]},{"raw_affiliation_string":"Honeywell Corporate Research Center, South Bloomington","institution_ids":["https://openalex.org/I82514191"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I82514191"],"apc_list":{"value":3390,"currency":"USD","value_usd":3390},"apc_paid":null,"fwci":4.0016,"has_fulltext":false,"cited_by_count":61,"citation_normalized_percentile":{"value":0.92763631,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"6","issue":"1","first_page":"25","last_page":"38"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.0013000000035390258,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.0005000000237487257,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hgcdte","display_name":"HgCdTe","score":0.8920000195503235},{"id":"https://openalex.org/keywords/impurity-doping","display_name":"impurity doping","score":0.6819999814033508},{"id":"https://openalex.org/keywords/impurity-diffusion","display_name":"impurity diffusion","score":0.7229999899864197},{"id":"https://openalex.org/keywords/acceptors","display_name":"acceptors","score":0.6439999938011169},{"id":"https://openalex.org/keywords/donors","display_name":"donors","score":0.9940000176429749},{"id":"https://openalex.org/keywords/lithium","display_name":"lithium","score":0.6129999756813049},{"id":"https://openalex.org/keywords/copper","display_name":"copper","score":0.8270000219345093},{"id":"https://openalex.org/keywords/silver","display_name":"silver","score":0.9929999709129333},{"id":"https://openalex.org/keywords/gallium","display_name":"gallium","score":0.9750000238418579},{"id":"https://openalex.org/keywords/aluminum","display_name":"aluminum","score":0.9649999737739563},{"id":"https://openalex.org/keywords/silicon","display_name":"silicon","score":0.9909999966621399},{"id":"https://openalex.org/keywords/phosphorus","display_name":"phosphorus","score":0.9990000128746033},{"id":"https://openalex.org/keywords/arsenic","display_name":"arsenic","score":0.9980000257492065},{"id":"https://openalex.org/keywords/bromine","display_name":"bromine","score":0.9980000257492065},{"id":"https://openalex.org/keywords/tin","display_name":"tin","score":0.902999997138977},{"id":"https://openalex.org/keywords/diffusion-temperature","display_name":"diffusion temperature","score":0.49000000953674316}],"concepts":[{"id":"https://openalex.org/C71987851","wikidata":"https://www.wikidata.org/wiki/Q7216430","display_name":"Impurity","level":2,"score":0.8566676378250122},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.7190768122673035},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.6844974160194397},{"id":"https://openalex.org/C69357855","wikidata":"https://www.wikidata.org/wiki/Q163214","display_name":"Diffusion","level":2,"score":0.6712883114814758},{"id":"https://openalex.org/C544153396","wikidata":"https://www.wikidata.org/wiki/Q11426","display_name":"Metal","level":2,"score":0.5487563610076904},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.3769075274467468},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3515845537185669},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.20288100838661194},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.14383310079574585},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.053925514221191406},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/bf02660335","doi":"https://doi.org/10.1007/bf02660335","is_oa":false,"landing_page_url":"https://doi.org/10.1007/bf02660335","pdf_url":null,"source":{"id":"https://openalex.org/S127985767","display_name":"Journal of Electronic Materials","issn_l":"0361-5235","issn":["0361-5235","0381-5235","1543-186X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-40","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Materials","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W612374700","https://openalex.org/W1617337742","https://openalex.org/W1998735724","https://openalex.org/W2011393093","https://openalex.org/W2050106906","https://openalex.org/W2054501394","https://openalex.org/W2073621554","https://openalex.org/W2136326510","https://openalex.org/W2600419165"],"related_works":["https://openalex.org/W1680563283","https://openalex.org/W2332979111","https://openalex.org/W2094888618","https://openalex.org/W3115637513","https://openalex.org/W4244567696","https://openalex.org/W1998920752","https://openalex.org/W1970074712","https://openalex.org/W1563106303","https://openalex.org/W1973950561","https://openalex.org/W2003528126"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1}],"updated_date":"2026-10-20T09:52:01.089006","created_date":"2016-06-24T00:00:00"}