{"id":"https://openalex.org/W2020235202","doi":"https://doi.org/10.1063/1.105217","title":"Quantitative evaluation of elastic properties of LiTaO3 crystals by line-focus-beam acoustic microscopy","display_name":"Quantitative evaluation of elastic properties of LiTaO3 crystals by line-focus-beam acoustic microscopy","publication_year":1991,"publication_date":"1991-03-04","ids":{"openalex":"https://openalex.org/W2020235202","doi":"https://doi.org/10.1063/1.105217","mag":"2020235202"},"language":"en","primary_location":{"id":"doi:10.1063/1.105217","doi":"https://doi.org/10.1063/1.105217","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.105217","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://tohoku.repo.nii.ac.jp/record/26015/files/ApplPhysLett_58_893.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112693314","display_name":"Jun\u2010ichi Kushibiki","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"J. Kushibiki","raw_affiliation_strings":["Department of Electrical Engineering, Tohoku University, Sendai 980, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tohoku University, Sendai 980, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041066078","display_name":"Hidetoshi Takahashi","orcid":"https://orcid.org/0000-0002-0754-3281","observed_orcids":["https://orcid.org/0000-0002-0754-3281"]},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Takahashi","raw_affiliation_strings":["Department of Electrical Engineering, Tohoku University, Sendai 980, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tohoku University, Sendai 980, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102827234","display_name":"Takeshi Kobayashi","orcid":"https://orcid.org/0000-0003-4029-6363","observed_orcids":["https://orcid.org/0000-0003-4029-6363"]},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Kobayashi","raw_affiliation_strings":["Department of Electrical Engineering, Tohoku University, Sendai 980, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tohoku University, Sendai 980, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113462686","display_name":"Noriyoshi Chubachi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"N. Chubachi","raw_affiliation_strings":["Department of Electrical Engineering, Tohoku University, Sendai 980, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tohoku University, Sendai 980, Japan","institution_ids":["https://openalex.org/I201537933"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I201537933"],"apc_list":null,"apc_paid":null,"fwci":6.7813,"has_fulltext":true,"cited_by_count":42,"citation_normalized_percentile":{"value":0.97151809,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":88,"max":93},"biblio":{"volume":"58","issue":"9","first_page":"893","last_page":"895"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.5054000020027161,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.5054000020027161,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.4487000107765198,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":0.016499999910593033,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/lithium-tantalate","display_name":"lithium tantalate","score":0.921999990940094},{"id":"https://openalex.org/keywords/elastic-properties","display_name":"elastic properties","score":0.9229999780654907},{"id":"https://openalex.org/keywords/leaky-surface-acoustic-waves","display_name":"leaky surface acoustic waves","score":0.9800000190734863},{"id":"https://openalex.org/keywords/elastic-heterogeneity","display_name":"elastic inhomogeneity","score":0.8100000023841858},{"id":"https://openalex.org/keywords/poling","display_name":"poling","score":0.6150000095367432},{"id":"https://openalex.org/keywords/piezoelectric-wafers","display_name":"piezoelectric wafers","score":0.7369999885559082},{"id":"https://openalex.org/keywords/sound-velocity-measurement","display_name":"sound velocity measurement","score":0.49900001287460327}],"concepts":[{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.789421021938324},{"id":"https://openalex.org/C2781117724","wikidata":"https://www.wikidata.org/wiki/Q4674694","display_name":"Acoustic microscopy","level":3,"score":0.7357490062713623},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6989474296569824},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.641247034072876},{"id":"https://openalex.org/C2781372846","wikidata":"https://www.wikidata.org/wiki/Q2101191","display_name":"Poling","level":4,"score":0.631740927696228},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.6052311062812805},{"id":"https://openalex.org/C2777904631","wikidata":"https://www.wikidata.org/wiki/Q410458","display_name":"Lithium tantalate","level":3,"score":0.6023001074790955},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.537623405456543},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.5370131731033325},{"id":"https://openalex.org/C168834538","wikidata":"https://www.wikidata.org/wiki/Q3705329","display_name":"Beam (structure)","level":2,"score":0.5330399870872498},{"id":"https://openalex.org/C162954803","wikidata":"https://www.wikidata.org/wiki/Q424074","display_name":"Surface acoustic wave","level":2,"score":0.5114520788192749},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.5077654123306274},{"id":"https://openalex.org/C204723758","wikidata":"https://www.wikidata.org/wiki/Q3882459","display_name":"Acoustic wave","level":2,"score":0.47982215881347656},{"id":"https://openalex.org/C77017923","wikidata":"https://www.wikidata.org/wiki/Q912313","display_name":"Optical microscope","level":3,"score":0.47883322834968567},{"id":"https://openalex.org/C2778759172","wikidata":"https://www.wikidata.org/wiki/Q424047","display_name":"Scanning acoustic microscope","level":4,"score":0.4784265160560608},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.3270817995071411},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.25905466079711914},{"id":"https://openalex.org/C79090758","wikidata":"https://www.wikidata.org/wiki/Q1045739","display_name":"Ferroelectricity","level":3,"score":0.19509971141815186},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.18695297837257385},{"id":"https://openalex.org/C2777207636","wikidata":"https://www.wikidata.org/wiki/Q424481","display_name":"Lithium niobate","level":2,"score":0.14872711896896362},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11344438791275024},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.07596796751022339},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1063/1.105217","doi":"https://doi.org/10.1063/1.105217","is_oa":false,"landing_page_url":"https://doi.org/10.1063/1.105217","pdf_url":null,"source":{"id":"https://openalex.org/S105243760","display_name":"Applied Physics Letters","issn_l":"0003-6951","issn":["0003-6951","1077-3118","1520-8842"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-3","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320257","host_organization_name":"American Institute of Physics","host_organization_lineage":["https://openalex.org/P4310320257"],"host_organization_lineage_names":["American Institute of Physics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Physics Letters","raw_type":"journal-article"},{"id":"pmh:oai:irdb.nii.ac.jp:00918:0000471295","doi":null,"is_oa":true,"landing_page_url":"https://tohoku.repo.nii.ac.jp/records/26015","pdf_url":"https://tohoku.repo.nii.ac.jp/record/26015/files/ApplPhysLett_58_893.pdf","source":{"id":"https://openalex.org/S7407056385","display_name":"Institutional Repositories DataBase (IRDB)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I184597095","host_organization_name":"National Institute of Informatics","host_organization_lineage":["https://openalex.org/I184597095"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Applied Physics Letters","raw_type":"journal article"}],"best_oa_location":{"id":"pmh:oai:irdb.nii.ac.jp:00918:0000471295","doi":null,"is_oa":true,"landing_page_url":"https://tohoku.repo.nii.ac.jp/records/26015","pdf_url":"https://tohoku.repo.nii.ac.jp/record/26015/files/ApplPhysLett_58_893.pdf","source":{"id":"https://openalex.org/S7407056385","display_name":"Institutional Repositories DataBase (IRDB)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I184597095","host_organization_name":"National Institute of Informatics","host_organization_lineage":["https://openalex.org/I184597095"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Applied Physics Letters","raw_type":"journal article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2020235202.pdf","grobid_xml":"https://content.openalex.org/works/W2020235202.grobid-xml"},"referenced_works_count":10,"referenced_works":["https://openalex.org/W1980150028","https://openalex.org/W2011049905","https://openalex.org/W2011865383","https://openalex.org/W2036087984","https://openalex.org/W2036154146","https://openalex.org/W2038898440","https://openalex.org/W2042322793","https://openalex.org/W2058242280","https://openalex.org/W2063073206","https://openalex.org/W2090973546"],"related_works":["https://openalex.org/W2072340286","https://openalex.org/W7208692335","https://openalex.org/W1965424498","https://openalex.org/W175236980","https://openalex.org/W1965426259","https://openalex.org/W2032930626","https://openalex.org/W2014152092","https://openalex.org/W2087607444","https://openalex.org/W2142594939","https://openalex.org/W2012330580"],"abstract_inverted_index":{"The":[0],"line-focus-beam":[1],"acoustic":[2,26],"microscope":[3],"system":[4],"is":[5,62],"applied":[6],"to":[7,48,64],"investigate":[8],"the":[9,52,60,67],"elastic":[10],"properties":[11],"of":[12,23,59],"LiTaO3.":[13],"Elastic":[14],"inhomogeneities":[15],"are":[16,41],"detected":[17],"quantitatively":[18],"as":[19],"a":[20,49],"significant":[21],"variation":[22],"leaky":[24],"surface":[25],"wave":[27],"(LSAW)":[28],"velocities":[29,40,53],"in":[30,38,43,66],"X-112.2\u00b0Y":[31],"LiTaO3":[32],"wafers.":[33],"Large":[34],"changes,":[35],"about":[36],"2.5%,":[37],"LSAW":[39],"observed":[42],"some":[44],"wafers,":[45],"which":[46],"correspond":[47],"difference":[50],"between":[51],"for":[54],"single":[55],"and":[56],"multidomains.":[57],"One":[58],"causes":[61],"found":[63],"be":[65],"poling":[68],"process":[69],"during":[70],"wafer":[71],"fabrication.":[72]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-08-22T07:34:49.880490","created_date":"2016-06-24T00:00:00"}