{"id":"https://openalex.org/W2020232159","doi":"https://doi.org/10.7471/ikeee.2014.18.2.234","title":"Automatic Detection Method for Mura Defects on Display Films Using Morphological Image Processing and Labeling","display_name":"Automatic Detection Method for Mura Defects on Display Films Using Morphological Image Processing and Labeling","publication_year":2014,"publication_date":"2014-06-30","ids":{"openalex":"https://openalex.org/W2020232159","doi":"https://doi.org/10.7471/ikeee.2014.18.2.234","mag":"2020232159"},"language":"en","primary_location":{"id":"doi:10.7471/ikeee.2014.18.2.234","doi":"https://doi.org/10.7471/ikeee.2014.18.2.234","is_oa":true,"landing_page_url":"https://doi.org/10.7471/ikeee.2014.18.2.234","pdf_url":"http://koreascience.or.kr:80/article/JAKO201420539022817.pdf","source":{"id":"https://openalex.org/S4306515640","display_name":"Journal of IKEEE","issn_l":"1226-7244","issn":["1226-7244","2288-243X"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["kci-registered"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of IKEEE","raw_type":"journal-article"},"parent_works":[],"lineage":["https://openalex.org/W2020232159"],"child_works_count":0,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"http://koreascience.or.kr:80/article/JAKO201420539022817.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113280323","display_name":"Sung-Je Cho","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I145808223","display_name":"Hanbat National University","ror":"https://ror.org/00x514t95","country_code":"KR","type":"education","lineage":["https://openalex.org/I145808223"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sung-Je Cho","raw_affiliation_strings":["Department of Electronic Engineering , Hanbat National University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering , Hanbat National University","institution_ids":["https://openalex.org/I145808223"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100363404","display_name":"Seung-Ho Lee","orcid":"https://orcid.org/0000-0002-7738-2989","observed_orcids":["https://orcid.org/0000-0002-7738-2989"]},"institutions":[{"id":"https://openalex.org/I145808223","display_name":"Hanbat National University","ror":"https://ror.org/00x514t95","country_code":"KR","type":"education","lineage":["https://openalex.org/I145808223"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seung-Ho Lee","raw_affiliation_strings":["Department of Electronic Engineering , Hanbat National University","Hanbat National Univ"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering , Hanbat National University","institution_ids":["https://openalex.org/I145808223"]},{"raw_affiliation_string":"Hanbat National Univ","institution_ids":["https://openalex.org/I145808223"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I145808223"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"18","issue":"2","first_page":"234","last_page":"239"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mathematical-morphology","display_name":"mathematical morphology","score":0.9700000286102295},{"id":"https://openalex.org/keywords/gabor-filters","display_name":"Gabor filters","score":0.8119999766349792},{"id":"https://openalex.org/keywords/image-annotation","display_name":"image annotation","score":0.8550000190734863},{"id":"https://openalex.org/keywords/non-uniform-illumination","display_name":"non-uniform illumination","score":0.8379999995231628},{"id":"https://openalex.org/keywords/automatic-defect-detection","display_name":"automated defect detection","score":0.4869999885559082}],"concepts":[{"id":"https://openalex.org/C2776147852","wikidata":"https://www.wikidata.org/wiki/Q6937160","display_name":"Mura","level":3,"score":0.9549337029457092},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.7286851406097412},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7242476940155029},{"id":"https://openalex.org/C34736171","wikidata":"https://www.wikidata.org/wiki/Q918333","display_name":"Preprocessor","level":2,"score":0.6899304389953613},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6291419863700867},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.6214935779571533},{"id":"https://openalex.org/C2779883129","wikidata":"https://www.wikidata.org/wiki/Q2447890","display_name":"Gabor filter","level":3,"score":0.5038082003593445},{"id":"https://openalex.org/C73313986","wikidata":"https://www.wikidata.org/wiki/Q355386","display_name":"Luminance","level":2,"score":0.45500728487968445},{"id":"https://openalex.org/C193828747","wikidata":"https://www.wikidata.org/wiki/Q864118","display_name":"Binary image","level":4,"score":0.423796147108078},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4096137285232544},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.3113602101802826},{"id":"https://openalex.org/C128019096","wikidata":"https://www.wikidata.org/wiki/Q83341","display_name":"Liquid-crystal display","level":2,"score":0.12057468295097351},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.7471/ikeee.2014.18.2.234","doi":"https://doi.org/10.7471/ikeee.2014.18.2.234","is_oa":true,"landing_page_url":"https://doi.org/10.7471/ikeee.2014.18.2.234","pdf_url":"http://koreascience.or.kr:80/article/JAKO201420539022817.pdf","source":{"id":"https://openalex.org/S4306515640","display_name":"Journal of IKEEE","issn_l":"1226-7244","issn":["1226-7244","2288-243X"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["kci-registered"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of IKEEE","raw_type":"journal-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.969.9024","doi":null,"is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.969.9024","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://ocean.kisti.re.kr/downfile/volume/ikeee/JGGJB%40/2014/v18n2/JGGJB%40_2014_v18n2_234.pdf","raw_type":"text"},{"id":"mag:3140786789","doi":null,"is_oa":false,"landing_page_url":"http://www.dbpia.co.kr/Article/NODE07015777","pdf_url":null,"source":{"id":"https://openalex.org/S4306515640","display_name":"Journal of IKEEE","issn_l":"1226-7244","issn":["1226-7244","2288-243X"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["kci-registered"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"\uc804\uae30\uc804\uc790\ud559\ud68c\ub17c\ubb38\uc9c0","raw_type":null}],"best_oa_location":{"id":"doi:10.7471/ikeee.2014.18.2.234","doi":"https://doi.org/10.7471/ikeee.2014.18.2.234","is_oa":true,"landing_page_url":"https://doi.org/10.7471/ikeee.2014.18.2.234","pdf_url":"http://koreascience.or.kr:80/article/JAKO201420539022817.pdf","source":{"id":"https://openalex.org/S4306515640","display_name":"Journal of IKEEE","issn_l":"1226-7244","issn":["1226-7244","2288-243X"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["kci-registered"],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of IKEEE","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2020232159.pdf","grobid_xml":"https://content.openalex.org/works/W2020232159.grobid-xml"},"referenced_works_count":6,"referenced_works":["https://openalex.org/W2016078606","https://openalex.org/W2127044649","https://openalex.org/W2155524740","https://openalex.org/W2160679755","https://openalex.org/W2164653394","https://openalex.org/W2171261408"],"related_works":["https://openalex.org/W2050583474","https://openalex.org/W2766430377","https://openalex.org/W2789351079","https://openalex.org/W2068509546","https://openalex.org/W3173987972","https://openalex.org/W2288285947","https://openalex.org/W2091036075","https://openalex.org/W4403023669","https://openalex.org/W2980359510","https://openalex.org/W2532812313"],"abstract_inverted_index":{"This":[0,22],"paper":[1],"proposes":[2],"a":[3,84,128],"new":[4],"automatic":[5,23],"detection":[6,24,112,114,131],"method":[7,25,121],"to":[8,143],"inspect":[9],"mura":[10,27,69,76,90,98,153],"defects":[11,28,99],"on":[12,29],"display":[13,30,124],"film":[14,125],"surface":[15],"using":[16,62,78,93,147],"morphological":[17,38,63],"image":[18,39,64,155],"processing":[19],"and":[20,43,100],"labeling.":[21,44],"for":[26,151],"films":[31],"comprises":[32],"3":[33],"phases":[34],"of":[35,54,87,109],"preprocessing":[36,57],"with":[37,51,73],"processing,":[40],"Gabor":[41,67,79],"filtering,":[42,68],"Since":[45],"distorted":[46],"results":[47,146],"could":[48],"be":[49],"obtained":[50],"the":[52,89,94,103,107,110,120,130,139,148],"presence":[53],"non-uniform":[55],"illumination,":[56],"step":[58],"reduces":[59],"illumination":[60],"components":[61,77],"processing.":[65],"In":[66],"images":[70],"are":[71],"created":[72],"binary":[74],"coded":[75],"filters.":[80],"Subsequently,":[81],"labeling":[82],"is":[83],"final":[85],"phase":[86],"finding":[88],"defect":[91],"area":[92],"difference":[95],"between":[96],"large":[97],"values":[101],"in":[102,122,154],"periphery.":[104],"To":[105],"evaluate":[106],"accuracy":[108],"proposed":[111],"method,":[113],"rate":[115,132],"was":[116,133,141],"assessed":[117],"by":[118],"applying":[119],"200":[123],"samples.":[126],"As":[127],"result,":[129],"high":[134],"at":[135],"about":[136],"95.5%.":[137],"Moreover,":[138],"study":[140],"able":[142],"acquire":[144],"reliable":[145],"Semu":[149],"index":[150],"luminance":[152],"quality":[156],"inspection.":[157]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}