{"id":"https://openalex.org/W2020182641","doi":"https://doi.org/10.1016/0368-2048(90)80163-5","title":"A novel SEM with spin polarization analysis","display_name":"A novel SEM with spin polarization analysis","publication_year":1990,"publication_date":"1990-01-01","ids":{"openalex":"https://openalex.org/W2020182641","doi":"https://doi.org/10.1016/0368-2048(90)80163-5","mag":"2020182641"},"language":"en","primary_location":{"id":"doi:10.1016/0368-2048(90)80163-5","doi":"https://doi.org/10.1016/0368-2048(90)80163-5","is_oa":true,"landing_page_url":"https://doi.org/10.1016/0368-2048(90)80163-5","pdf_url":null,"source":{"id":"https://openalex.org/S133911941","display_name":"Journal of Electron Spectroscopy and Related Phenomena","issn_l":"0368-2048","issn":["0368-2048","1873-2526"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electron Spectroscopy and Related Phenomena","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1016/0368-2048(90)80163-5","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038247872","display_name":"R. Browning","orcid":"https://orcid.org/0000-0002-1404-0789","observed_orcids":["https://orcid.org/0000-0002-1404-0789"]},"institutions":[{"id":"https://openalex.org/I4392738099","display_name":"Stanford SystemX Alliance","ror":"https://ror.org/0551gkb08","country_code":"US","type":"facility","lineage":["https://openalex.org/I4392738099","https://openalex.org/I97018004"]},{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Browning","raw_affiliation_strings":["Center for Integrated Systems, Stanford University, Stanford, Ca 94305, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Integrated Systems, Stanford University, Stanford, Ca 94305, USA","institution_ids":["https://openalex.org/I4392738099","https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048342242","display_name":"T. R. VanZandt","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4392738099","display_name":"Stanford SystemX Alliance","ror":"https://ror.org/0551gkb08","country_code":"US","type":"facility","lineage":["https://openalex.org/I4392738099","https://openalex.org/I97018004"]},{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T. Vanzandt","raw_affiliation_strings":["Center for Integrated Systems, Stanford University, Stanford, Ca 94305, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Integrated Systems, Stanford University, Stanford, Ca 94305, USA","institution_ids":["https://openalex.org/I4392738099","https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110076920","display_name":"C. R. Helms","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4392738099","display_name":"Stanford SystemX Alliance","ror":"https://ror.org/0551gkb08","country_code":"US","type":"facility","lineage":["https://openalex.org/I4392738099","https://openalex.org/I97018004"]},{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C.R. Helms","raw_affiliation_strings":["Center for Integrated Systems, Stanford University, Stanford, Ca 94305, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Integrated Systems, Stanford University, Stanford, Ca 94305, USA","institution_ids":["https://openalex.org/I4392738099","https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014649814","display_name":"Helmut R. Poppa","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210085935","display_name":"IBM Research - Almaden","ror":"https://ror.org/005w8dd04","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210085935","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H. Poppa","raw_affiliation_strings":["IBM Almaden Research Center, 650 Harry Road, San Jose, Ca 94120-6099, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Almaden Research Center, 650 Harry Road, San Jose, Ca 94120-6099, USA","institution_ids":["https://openalex.org/I4210085935"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034953707","display_name":"Martin Landolt","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I35440088","display_name":"ETH Zurich","ror":"https://ror.org/05a28rw58","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I35440088"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"M. Landolt","raw_affiliation_strings":["ETH, CH-8093 Zurich, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ETH, CH-8093 Zurich, Switzerland","institution_ids":["https://openalex.org/I35440088"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3170,"currency":"USD","value_usd":3170},"apc_paid":{"value":3170,"currency":"USD","value_usd":3170},"fwci":1.4053,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.77173465,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"51","issue":null,"first_page":"315","last_page":"320"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.0010000000474974513,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scanning-electron-microscopy","display_name":"scanning electron microscopy","score":0.8230000138282776},{"id":"https://openalex.org/keywords/field-emission-electron-source","display_name":"field emission electron source","score":0.7850000262260437},{"id":"https://openalex.org/keywords/magnetic-domains","display_name":"magnetic domains","score":0.7979999780654907},{"id":"https://openalex.org/keywords/fe-si-single-crystal","display_name":"Fe-Si single crystal","score":0.8830000162124634},{"id":"https://openalex.org/keywords/magnetization","display_name":"magnetization","score":0.4779999852180481},{"id":"https://openalex.org/keywords/signal-contrast","display_name":"signal contrast","score":0.43700000643730164}],"concepts":[{"id":"https://openalex.org/C26834552","wikidata":"https://www.wikidata.org/wiki/Q3275846","display_name":"Analyser","level":2,"score":0.9119389057159424},{"id":"https://openalex.org/C73922627","wikidata":"https://www.wikidata.org/wiki/Q754943","display_name":"Single crystal","level":2,"score":0.5035967230796814},{"id":"https://openalex.org/C125245961","wikidata":"https://www.wikidata.org/wiki/Q221656","display_name":"Brightness","level":2,"score":0.49845337867736816},{"id":"https://openalex.org/C67649825","wikidata":"https://www.wikidata.org/wiki/Q196538","display_name":"Microscope","level":2,"score":0.4965386986732483},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.49459072947502136},{"id":"https://openalex.org/C205049153","wikidata":"https://www.wikidata.org/wiki/Q2698605","display_name":"Polarization (electrochemistry)","level":2,"score":0.47915974259376526},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4343870282173157},{"id":"https://openalex.org/C121524040","wikidata":"https://www.wikidata.org/wiki/Q11942175","display_name":"Polarizer","level":3,"score":0.4203314185142517},{"id":"https://openalex.org/C125206250","wikidata":"https://www.wikidata.org/wiki/Q2365355","display_name":"Microprobe","level":2,"score":0.41454631090164185},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.38066813349723816},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20801028609275818},{"id":"https://openalex.org/C199289684","wikidata":"https://www.wikidata.org/wiki/Q83353","display_name":"Mineralogy","level":1,"score":0.11813575029373169},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.1122843325138092},{"id":"https://openalex.org/C125743686","wikidata":"https://www.wikidata.org/wiki/Q108779","display_name":"Birefringence","level":2,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0368-2048(90)80163-5","doi":"https://doi.org/10.1016/0368-2048(90)80163-5","is_oa":true,"landing_page_url":"https://doi.org/10.1016/0368-2048(90)80163-5","pdf_url":null,"source":{"id":"https://openalex.org/S133911941","display_name":"Journal of Electron Spectroscopy and Related Phenomena","issn_l":"0368-2048","issn":["0368-2048","1873-2526"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electron Spectroscopy and Related Phenomena","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1016/0368-2048(90)80163-5","doi":"https://doi.org/10.1016/0368-2048(90)80163-5","is_oa":true,"landing_page_url":"https://doi.org/10.1016/0368-2048(90)80163-5","pdf_url":null,"source":{"id":"https://openalex.org/S133911941","display_name":"Journal of Electron Spectroscopy and Related Phenomena","issn_l":"0368-2048","issn":["0368-2048","1873-2526"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-c","jufo-1","norway-1","poland-70","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electron Spectroscopy and Related Phenomena","raw_type":"journal-article"},"sustainable_development_goals":[],"sustainable_development_goals_aurora":[{"id":"https://metadata.un.org/sdg/7","score":0.8799999952316284,"display_name":"Affordable and clean energy"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2000601999","https://openalex.org/W2035564687","https://openalex.org/W2075282252"],"related_works":["https://openalex.org/W2073626187","https://openalex.org/W7097724832","https://openalex.org/W2054998626","https://openalex.org/W1979983939","https://openalex.org/W2006601356","https://openalex.org/W2016192307","https://openalex.org/W2071627316","https://openalex.org/W2023427491","https://openalex.org/W3176013716","https://openalex.org/W3171463305"],"abstract_inverted_index":{"A":[0],"scanning":[1],"electron":[2,43],"microscope":[3],"with":[4,41],"polarization":[5],"analysis":[6],"has":[7,28,37],"been":[8],"built":[9],"using":[10],"an":[11,29],"Auger":[12],"microprobe":[13],"and":[14,27,47,102],"a":[15,21,38,52,86],"Mott":[16,48,65],"analyser.":[17],"The":[18,35,60],"instrument":[19,36],"uses":[20],"high":[22],"brightness":[23],"field":[24],"emission":[25],"source":[26],"analytical":[30],"spatial":[31],"resolution":[32],"of":[33,63,73,80,85,105],"<100nm.":[34],"novel":[39],"geometry,":[40],"the":[42,56,57,64,70,74,83,96,103,106],"gun,":[44],"energy":[45],"analyser,":[46],"analyser":[49,66],"coaxial":[50],"on":[51],"axis":[53],"normal":[54],"to":[55,69],"sample":[58,75],"surface.":[59,76],"detection":[61],"plane":[62],"is":[67,109],"parallel":[68],"in-plane":[71],"magnetization":[72],"Spin":[77],"polarized":[78],"micrographs":[79],"domains":[81],"at":[82,93],"surface":[84],"Fe-4%Si":[87],"single":[88],"crystal":[89],"show":[90],"that,":[91],"even":[92],"low":[94],"magnifications,":[95],"scan":[97],"related":[98],"asymmetries":[99],"are":[100],"minor,":[101],"interpretation":[104],"signal":[107],"contrast":[108],"straightforward.":[110]},"counts_by_year":[],"updated_date":"2026-10-30T12:39:25.321706","created_date":"2016-06-24T00:00:00"}